EN 61083-1:2001

SLOVENSKI SIST EN 61083-1:2002
izdaja
STANDARD
oktober 2002
Instruments and software used for measurement in high-voltage impulse tests - Part
1: Requirements for instruments (IEC 61083-1:2001)
ICS 17.220.20 Referenčna številka
©  Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno

EUROPEAN STANDARD EN 61083-1
NORME EUROPÉENNE
EUROPÄISCHE NORM July 2001
ICS 17.220.20; 19.080 Supersedes EN 61083-1:1993 and HD 479 S1:1986
English version
Instruments and software used for measurement
in high-voltage impulse tests
Part 1: Requirements for instruments
(IEC 61083-1:2001)
Appareils et logiciels utilisés pour les Messgeräte und Software bei
mesures pendant les essais de choc Stoßspannungs- und Stoßstromprüfungen
à haute tension Teil 1: Anforderungen an Messgeräte
Partie 1: Prescriptions pour les appareils (IEC 61083-1:2001)
(CEI 61083-1:2001)
This European Standard was approved by CENELEC on 2001-03-01. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic,
Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway,
Portugal, Spain, Sweden, Switzerland and United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2001 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61083-1:2001 E
Foreword
The text of document 42/164/FDIS, future edition 2 of IEC 61083-1, prepared by IEC TC 42, High-
voltage testing techniques, was submitted to the IEC-CENELEC parallel vote and was approved by
CENELEC as EN 61083-1 on 2001-03-01.
This European Standard supersedes EN 61083-1:1993 and HD 479 S1:1986.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2002-03-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2004-03-01
Annexes designated "normative" are part of the body of the standard.
Annexes designated "informative" are given for information only.
In this standard, annexes A, B, C and ZA are normative and annex D is informative.
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 61083-1:2001 was approved by CENELEC as a European
Standard without any modification.
__________
- 3 - EN 61083-1:2001
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
This European Standard incorporates by dated or undated reference, provisions from other
publications. These normative references are cited at the appropriate places in the text and the
publications are listed hereafter. For dated references, subsequent amendments to or revisions of any
of these publications apply to this European Standard only when incorporated in it by amendment or
revision. For undated references the latest edition of the publication referred to applies (including
amendments).
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
Publication Year Title EN/HD Year
IEC 60060-1 1989 High-voltage test techniques HD 588.1 S1 1991
+ corr. Mar. 1990 Part 1: General definitions and test
requirements
IEC 60060-2 1994 Part 2: Measuring systems EN 60060-2 1994
A1 1996 - -
- - A11 1998
IEC 61000-4-4 1995 Electromagnetic compatibility (EMC) EN 61000-4-4 1995
Part 4-4: Testing and measurement
techniques - Electrical fast
transient/burst immunity test
NORME
CEI
INTERNATIONALE IEC
61083-1
INTERNATIONAL
Deuxième édition
STANDARD
Second edition
2001-06
Appareils et logiciels utilisés pour les mesures
pendant les essais de choc à haute tension –
Partie 1:
Prescriptions pour les appareils
Instruments and software used for measurement
in high-voltage impulse tests –
Part 1:
Requirements for instruments
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microfilms, sans l'accord écrit de l'éditeur. writing from the publisher.
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Pour prix, voir catalogue en vigueur
For price, see current catalogue

61083-1 © IEC:2001 – 3 –
CONTENTS
FOREWORD . 7
1 General . 11
1.1 Scope . 11
1.2 Normative references. 11
1.3 Terms and definitions . 13
1.3.1 General definitions. 13
1.3.2 Definitions specific for digital recorders and analogue oscilloscopes . 15
1.3.3 Definitions specific for digital recorders. 15
1.4 Operating conditions. 19
1.5 Calibration and test methods . 19
1.5.1 Impulse calibration. 19
1.5.2 Step calibration. 21
1.5.3 Constancy of scale factor within time interval. 23
1.5.4 Time base. 23
1.5.5 Rise time . 23
1.5.6 Voltage deflection characteristic of analogue oscilloscopes. 23
1.5.7 Determination of static differential and integral non-linearities. 25
1.5.8 Differential non-linearity under dynamic conditions. 25
1.5.9 Internal noise level. 25
1.5.10 Interference . 25
1.6 Input impedance . 27
2 Digital recorders for impulse tests . 27
2.1 Requirements for impulse measurements . 27
2.1.1 Requirements for digital recorders used in approved measuring
systems . 27
2.1.2 Individual requirements . 27
2.1.3 Requirements for digital recorders used in reference measuring
systems . 31
2.1.4 Tests. 31
2.1.5 Record of performance. 35
3 Analogue oscilloscopes for impulse tests. 37
3.1 Requirements for impulse measurements . 37
3.1.1 Requirements for analogue oscilloscopes used in approved
measuring systems . 37
3.1.2 Individual requirements . 37
3.1.3 Tests. 39
3.1.4 Record of performance. 41
4 Peak voltmeters for impulse tests . 43
4.1 Requirements for impulse measurements . 43
4.1.1 General requirements for peak voltmeters. 43
4.1.2 Individual requirements . 43
4.1.3 Tests. 45
4.1.4 Record of performance. 47

61083-1 © IEC:2001 – 5 –
Annex A (normative) Procedure for determination of non-linearities of a digital
recorder . 55
Annex B (normative) Electromagnetic interference in high-voltage laboratories . 61
Annex C (normative) Calibration method for analogue oscilloscopes – Separate
calibration of voltage and time. 67
Annex D (informative) Analysis of impulse waveform. 69
Figure 1 – Integral non-linearity s(k) at code k. 49
Figure 2 – Differential non-linearity d(k) and code bin width w(k) under d.c. conditions. 49
Figure 3 – Calibration by comparison . 51
Figure 4 – Separate calibration of voltage and time. 51
Figure 5 – Step calibration . 53
Figure A.1 – Determination of non-linearities. 59
Figure B.1 – Current injection into the shield of the cable. 65
Figure B.2 – Application of electric and magnetic fields . 65
Table 1 – Operating conditions. 19
Table 2 – Requirements for reference impulse generators. 21
Table 3 – Tests required for digital recorders . 33
Table 4 – Tests required for analogue oscilloscopes . 39
Table 5 – Tests required for peak voltmeters. 45

61083-1 © IEC:2001 – 7 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
––––––––––––––
INSTRUMENTS AND SOFTWARE USED FOR MEASUREMENT
IN HIGH-VOLTAGE IMPULSE TESTS –
Part 1: Requirements for instruments
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, the IEC publishes International Standards. Their preparation is
entrusted to technical committees; any IEC National Committee interested in the subject dealt with may
participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. The IEC collaborates closely with the International
Organization for Standardization (ISO) in accordance with conditions determined by agreement between the
two organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an
international consensus of opinion on the relevant subjects since each technical committee has representation
from all interested National Committees.
3) The documents produced have the form of recommendations for international use and are published in the form
of standards, technical specifications, technical reports or guides and they are accepted by the National
Committees in that sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject
of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61083-1 has been prepared by IEC technical committee 42: High-
voltage testing techniques.
This second edition cancels and replaces the first edition published in 1991 of which it
constitutes a technical revision. This edition also replaces the first edition of IEC 60790
published in 1984.
Future standards in this series will carry the new general title as cited above. Titles of existing
standards in this series will be updated at the time of the next edition.
The text of this standard is based on the following documents:
FDIS Report on voting
42/164/FDIS 42/166/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.

61083-1 © IEC:2001 – 9 –
This publication has been drafted in accordance with the ISO/IEC Directives, Part 3.
Words in bold are defined in 1.3.
Annexes A, B and C form an integral part of this standard.
Annex D is for information only.
The committee has decided that the contents of this publication will remain unchanged until
2008. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.
61083-1 © IEC:2001 – 11 –
INSTRUMENTS AND SOFTWARE USED FOR MEASUREMENT
IN HIGH-VOLTAGE IMPULSE TESTS –
Part 1: Requirements for instruments
1 General
1.1 Scope
This part of IEC 61083 is applicable to digital recorders, including digital oscilloscopes,
analogue oscilloscopes and peak voltmeters used for measurements during tests with high
impulse voltages and high impulse currents. It specifies the measuring characteristics and
calibrations required to meet the measuring uncertainties and procedures specified in
IEC 60060-2.
This part
• defines the terms specifically related to digital recorders, analogue oscilloscopes and
peak voltmeters,
• specifies the necessary requirements for such instruments to ensure their compliance with
the requirements for high-voltage and for high-current impulse tests, and
• establishes the tests and procedures necessary to demonstrate their compliance.
Only digital recorders that permit access to raw data from permanent or temporary storage
are covered by this standard. The raw data, with relevant scaling information, may be
• printed graphically, or
• stored in digital format.
1.2 Normative references
The following normative documents contain provisions which, through reference in this text,
constitute provisions of this part of IEC 61083. For dated references, subsequent
amendments to, or revisions of, any of these publications do not apply. However, parties to
agreements based on this part of IEC 61083 are encouraged to investigate the possibility of
applying the most recent editions of the normative documents indicated below. For undated
references, the latest edition of the normative document referred to applies. Members of IEC
and ISO maintain registers of currently valid International Standards.
IEC 60060-1:1989, High-voltage test techniques – Part 1: General definitions and test
requirements
IEC 60060-2:1994, High-voltage test techniques – Part 2: Measuring systems
Amendment 1 (1996)
IEC 61000-4-4:1995, Electromagnetic compatibility (EMC) – Part 4: Testing and measurement
techniques – Section 4: Electrical fast transient/burst immunity test. Basic EMC Publication

61083-1 © IEC:2001 – 13 –
1.3 Terms and definitions
For the purposes of this part of IEC 61083, the following terms and definitions apply.
1.3.1 General definitions
1.3.1.1
digital recorder
instrument, including a digital oscilloscope, which can make a temporary digital record of a
high-voltage or high-current impulse, that can be converted into a permanent record. The
digital record can be displayed in the form of an analogue graph
NOTE The waveform may be displayed on a screen, plotted or printed. This process may change the appearance
of the waveform due to the processing involved.
1.3.1.2
analogue oscilloscope
instrument, which can make a temporary analogue record of a scaled high-voltage or high-
current impulse, that can be converted into a permanent record. The permanent record can be
displayed in the form of a graph or photograph of the screen of the oscilloscope
1.3.1.3
peak voltmeter
instrument, which can measure the peak value of a scaled high-voltage or high-current
impulse without short-duration overshoot or high-frequency oscillation (see clause 4)
1.3.1.4
warm-up time
time interval from when the instrument is first switched on to when the instrument meets
operational requirements
1.3.1.5
operating range
range of input voltage for which the instrument can be used within the uncertainty limits given
in this standard
1.3.1.6
output of an instrument
1.3.1.6.1
output of a digital recorder
numerical value recorded by a digital recorder at a specific instant
1.3.1.6.2
output of an analogue oscilloscope
deflection of the trace of an analogue oscilloscope at a specific instant
1.3.1.6.3
output of a peak voltmeter
display of a peak voltmeter
1.3.1.7
offset
output of an instrument for zero input

61083-1 © IEC:2001 – 15 –
1.3.1.8
full-scale deflection
minimum input voltage, which produces the nominal maximum output of the instrument in the
specified range
1.3.1.9
non-linearity of amplitude
deviation of the actual output of an instrument from the nominal value, which is determined
by dividing the input voltage by the scale factor
NOTE The static non-linearity for a d.c. input voltage may be different from the non-linearity under dynamic
condition.
1.3.1.10
scale factor
factor by which the output corrected for offset is multiplied in order to determine the
measured value of the input quantity. The scale factor includes the ratio of any built-in or
external attenuator and is determined by calibration
1.3.1.10.1
static scale factor
scale factor for a direct voltage input
1.3.1.10.2
impulse scale factor
scale factor for an input representing the shape of the relevant impulse
1.3.2 Definitions specific for digital recorders and analogue oscilloscopes
1.3.2.1
rise time
time interval within which the response to an applied step passes from 10 % to 90 % of its
steady-state amplitude
1.3.2.2
time-scale factor
factor by which the interval measured from the record is multiplied in order to determine the
value of that time interval
1.3.2.3
non-linearity of time base
variation of the time-scale factors measured in different parts of the trace or digital record
from their mean value
1.3.3 Definitions specific for digital recorders
1.3.3.1
rated resolution r
rated resolution is expressed by the reciprocal of two to the power of the rated number of
–N
bits N of the A/D converter, namely r = 2
1.3.3.2
sampling rate
number of samples taken per unit of time
NOTE The sampling time interval is the reciprocal of the sampling rate.

61083-1 © IEC:2001 – 17 –
1.3.3.3
record length
duration of the record expressed either in a time unit or as the total number of samples
1.3.3.4
raw data
original record of sampled and quantized information obtained when a digital recorder
converts an analogue signal into a digital form
The correction of the output for offset to give a zero-based record is permitted, as is
multiplying the record by a constant scale factor. Records processed in this way are still
considered as raw data
NOTE 1 This information may be made available in binary, octal, hexadecimal or decimal form.
NOTE 2 The scaling information relevant to the digital record should also be stored.
1.3.3.5
processed data
data obtained by any processing (other than correction for offset and/or multiplying by a
constant scale factor) of the raw data
NOTE Digital recorders, which do not allow access to the raw data, are not covered by this standard.
1.3.3.6
base line
value of the output of the recorder during the initial flat part of the record of the impulse. It is
the mean of at least 20 samples in the initial flat part of the record
1.3.3.7
quantization characteristic
characteristic showing the relationship between the output of the digital recorder and the
direct voltage on the input which produces this output (see figure 1)
NOTE The average slope of the quantization characteristic is equal to the reciprocal of the static scale factor.
1.3.3.8
code k
integer used to identify a digital level
1.3.3.9
code bin width w(k)
range of input voltage allocated to code k (see figure 2)
1.3.3.10
average code bin width w
product of the full-scale deflection and the rated resolution (see figure 2)
NOTE The average code bin width is approximately equal to the static scale factor.
1.3.3.11
integral non-linearity s(k)
difference between corresponding points on the measured quantization characteristic and
on the ideal quantization characteristic that is based on the static scale factor (see figure 1)

61083-1 © IEC:2001 – 19 –
1.3.3.12
differential non-linearity d(k)
difference between a measured code bin width and the average code bin width divided by
the average code bin width (see figure 2):
w()k − w
d()k =
w
1.4 Operating conditions
The range of operating conditions given in table 1 are those under which the instrument shall
operate and meet the accuracy requirements specified for the instrument.
Table 1 – Operating conditions
Condition Range
Environment
Ambient temperature 5 °C to 40 °C
Ambient relative humidity (non-condensing) 10 % to 90 %
Mains supply
Supply voltage Rated voltage ±10 % (r.m.s.)
Rated voltage ±12 % (a.c. peak)
Supply frequency Rated frequency ±5 %
Any exceptions to the values given in table 1 shall be explicitly and clearly stated in the
record of performance with an indication that they are exceptions.
1.5 Calibration and test methods
1.5.1 Impulse calibration
Impulse calibration is the reference method to establish the impulse scale factor of approved
digital recorders, analogue oscilloscopes and peak voltmeters. It is also the reference
method to check the time parameter determination from the records of digital recorders and
analogue oscilloscopes. Requirements on reference calibration impulses for calibrating
instruments used in approved measuring systems are given in table 2. The waveshapes are
chosen from table 2 according to the type and polarity of the high voltage or current impulses
to be measured. The peak value and time parameters of the applied calibration impulses shall
be within the limits given in table 2, and the actual values shall be entered in the record of
performance.
The polarity of the calibration impulses shall be that of the impulse to be measured. The
output corresponding to the calibration impulse shall be evaluated for at least 10 impulses.
The maximum deviation of the output peak values from their mean value shall be less than
1 % of the mean value. The impulse scale factor is the quotient of the input peak value and
the mean peak value of the outputs.
The time parameters of at least 10 impulses shall be evaluated. The maximum deviation of
each time parameter shall be less than 2 % of the mean value.

61083-1 © IEC:2001 – 21 –
This impulse calibration shall be made on each range of use for tests. Care should be taken
to avoid overloading the devices with low input impedance.
NOTE A digital recorder can be calibrated for an exponential current impulse using the full lightning impulse of a
reference impulse generator, and switching impulse for 10/350 impulse current (the 10/350 µs impulse current is
under consideration for inclusion in the future revision of the IEC 60060 series).
Table 2 – Requirements for reference impulse generators
1)
Impulse type Parameter being Value Uncertainty Short-term
2)
measured stability
%
%
Full and standard Time-to-half value 55 µs to 65 µs ≤ 2 ≤ 0,2
chopped lightning
impulse
Front time 0,8 µs to 0,9 µs
≤ 2 ≤ 0,5
Peak voltage Within operating range
≤ 0,7 ≤ 0,2
Front chopped Time-to-chopping 0,45 µs to 0,55 µs ≤ 2 ≤ 1
lightning impulse
Peak voltage Within operating range
≤ 1 ≤ 0,2
Switching impulse Time-to-peak 15 µs to 300 µs ≤ 2 ≤ 0,2
Time-to-half value 2 600 µs to 4 200 µs
≤ 2 ≤ 0,2
Peak voltage Within operating range
≤ 0,7 ≤ 0,2
Rectangular impulse Duration 0,5 ms to 3,5 ms ≤ 2 ≤ 0,5
Within operating range
Peak value ≤ 2 ≤ 1
1)
The uncertainty is determined in accordance with annex H of IEC 60060-2 by a traceable calibration where
the mean of a sequence of at least 10 impulses is evaluated.
2)
The short-term stability is the standard deviation of a sequence of at least 10 impulses.
1.5.2 Step calibration
A direct voltage V , which is known to within 0,1 % and within the operating range of the
CAL
instrument, is applied to the input and then short-circuited to ground by an appropriate
switching device, preferably based on a mercury-wetted relay. The resultant transition to zero
level is recorded as the output O(t) (an example is shown in figure 5) and evaluated within the
time interval specified in 1.5.3. Several records of the response may be averaged to reduce
the random noise. The deviation of the sample values O(t) from their mean O shall be within
s
the limits specified for the scale factor when t ranges within the time interval given in 1.5.3.
At least 10 records of steps shall be evaluated in this manner. The deviation of each of the 10
O values from their overall mean, O , shall also be within the limits specified for the scale
s sm
factor. The impulse scale factor is the quotient of the input voltage V and O . The rise
CAL sm
time of the step shall be less than 10 % of the lower limit of the time interval specified
in 1.5.3.
This voltage calibration shall be made in each range of use for tests. Care should be taken to
avoid overloading of recorders with low input impedance.
This test shall be done using both polarities. If the scale factors determined agree to within
±1 %, then this method is valid. If not, impulse calibration according to 1.5.1 of appropriate
polarity shall be used.
61083-1 © IEC:2001 – 23 –
1.5.3 Constancy of scale factor within time interval
A direct voltage within the operating range of the digital recorder or analogue
oscilloscope is applied to the input and then short-circuited to ground by an appropriate
switching device, preferably based on a mercury-wetted relay. The resultant transition to zero
level of the step response is recorded and evaluated within the following time intervals:
0,5 T to T for full lightning impulses and exponential current impulses;
1 2max
0,5 T to T for front-chopped impulses;
c c
0,5 T to T for switching impulses, and 10/350 µs current impulses;
p 2max
0,5 (T – T ) to T for rectangular current impulses.
t d t
Within these time intervals, the settling level of the recorded step response shall be constant
within the limits specified for the impulse scale factor.
Several records of the response may be averaged to reduce the random noise.
This scale factor constancy calibration shall be made in each range used for tests.
NOTE T , T and T are defined in IEC 60060-1. T is the maximum value of T , that is to be measured by the
1 2 c 2max 2
system.
1.5.4 Time base
The time-base of the instrument is calibrated using a time-mark generator or a high-frequency
oscillator. Values of the time-scale factor shall be measured from the record at
approximately 20 %, 40 %, 60 %, 80 % and 100 % of the time sweep.
This time-base calibration shall be made in each sampling rate used for tests.
1.5.5 Rise time
Apply a step with a rise time which is less than 20 % of the limit specified for the instrument.
Measure the rise time of the output as the time from 10 % to 90 % of the settling level. The
amplitude of the applied step shall be (95 ± 5) % of the full-scale deflection.
This rise-time shall be determined for each vertical setting used for tests.
1.5.6 Voltage deflection characteristic of analogue oscilloscopes
Direct voltages from 0 %, 10 %, 20 % … 100 % of the full-scale deflection are applied to the
oscilloscope. For each input voltage, the vertical deflection of the trace is measured. The
relationship between the vertical deflection and the input is the deflection characteristic from
which the voltage deflection coefficient is determined.
NOTE The deflection characteristic measured for a given input range is, in general, representative for all ranges.
The influence of the attenuators is determined by impulse calibration (see 1.5.1 or 1.5.2). Care should be taken to
avoid thermal overloading of low-input impedance attenuators.

61083-1 © IEC:2001 – 25 –
1.5.7 Determination of static differential and integral non-linearities
–N
A direct voltage of 0,2⋅n⋅2 full-scale deflection is applied to the recorder low-voltage input
N
where n is increased from 1 to 5⋅2 . For each d.c. input voltage, a record of the output is
taken and the mean of at least 100 samples is calculated. The relationship between the mean
output and input values is the quantization characteristic from which the static integral and
differential non-linearities are determined (see figures 1 and 2). A procedure of determination
of these non-linearities is given in annex A.
NOTE The differential and integral non-linearities measured for a given input range is, in general, representative
for all ranges of the . The influence of any attenuator is determined by impulse or step calibration
digital recorder
(see 1.5.1 or 1.5.2). Care should be taken to avoid thermal overloading of low-input impedance attenuators.
1.5.8 Differential non-linearity under dynamic conditions
Apply a symmetrical triangular wave to the recorder low-voltage input. The amplitude shall be
within (95 ± 5) % of full-scale deflection. The slope shall be greater than or equal to
f.s.d/0,4T , where f.s.d. is the full-scale deflection (for T , see 2.1.2.1). The frequency of the
x x
triangular wave shall not be harmonically related to the sampling frequency. Take a record
and calculate a histogram of the occurrence of every digital level. Repeat M times and
calculate the cumulative histogram. M shall be large enough so that the mean value of the
occurrence is greater than or equal to 100.
This procedure should produce a histogram with an approximately uniform part and large
peaks on each side. This uniform part shall be larger than or equal to 80 % full-scale
deflection. The deviation of each point from the average over this approximately uniform part
divided by this average gives the differential non-linearity.
NOTE The dynamic differential non-linearity measured for a given input range is, in general, representative for
all ranges of the digital recorder. The influence of any attenuator is determined by impulse or step calibration
(see 1.5.1 or 1.5.2). Care should be taken to avoid thermal overloading of low-input impedance attenuators.
1.5.9 Internal noise level
1.5.9.1 Digital recorders
A direct voltage within the range of the digital recorder shall be applied. Enough records
shall be taken at a specified sampling rate to acquire at least 1 000 samples. The standard
deviation of these samples is taken as the internal noise level.
NOTE This data can be collected during the determination of static differential and integral non-linearities
according to annex A.
1.5.9.2 Oscilloscopes
A direct voltage within the range of the oscilloscope shall be applied at a specified sweep.
Half the peak-to-peak variation of the vertical deflection is taken as the internal noise level.
1.5.10 Interference
The interference tests according to B.3.1 shall be made.

61083-1 © IEC:2001 – 27 –
1.6 Input impedance
Depending on the type of measuring system used, the input impedance of the instrument
should match the nominal impedance of the coaxial cable within ±2 % (for example, for
resistor dividers or shunts) or be not less than 1 MΩ with not more than 50 pF in parallel (for
example, for capacitive or damped capacitive dividers).
NOTE The matching impedance may also be externally connected immediately at the input of the instrument.
2 Digital recorders for impulse tests
2.1 Requirements for impulse measurements
2.1.1 Requirements for digital recorders used in approved measuring systems
The overall uncertainty of a digital recorder used in an approved measuring system
according to IEC 60060-2 shall be not more than (at a confidence level of not less than 95 %,
see annex H of IEC 60060-2)
• 2 % in the peak voltage (current) measurement of full and standard-chopped lightning
impulses, switching impulses and rectangular impulses;
• 3 % in the peak voltage measurement of front-chopped lightning impulses;
• 4 % in the measurement of the time parameters (front time, time to chopping, etc.) of the
impulse.
These uncertainties shall be estimated according to annex H of IEC 60060-2.
The digital recorder shall allow storage of the raw data at least until the test is accepted.
2.1.2 Individual requirements
In order to stay within the limits given in 2.1.1, the limits for individual contributions given in
2.1.2 should usually be met. In some cases, one or more of these limits may be exceeded
provided the permitted overall uncertainty is not exceeded.
2.1.2.1 Sampling rate
The sampling rate shall be not less than 30/T where T is the time interval to be measured.
x x
NOTE T = 0,6 T is the time interval between T and T of the lightning impulse to be measured. For a 1,2/50
x 1 30 90
lightning impulse, the permitted lower value of front time T is 0,84 µs. Therefore, a of at least
sampling rate
6 –1
60 × 10 s is required.
To measure front oscillations the sampling rate shall be at least 6 f where f is the
max max
maximum frequency of front oscillations that should be reproduced by the measuring system
(see 9.1.2 of IEC 60060-2).
61083-1 © IEC:2001 – 29 –
2.1.2.2 Rated resolution
–8
A rated resolution of 2 (0,4 % of the full-scale deflection) or better is required for tests
where the impulse parameters are to be evaluated. For tests which involve signal processing
–9
other than impulse parameter evaluation, a rated resolution of 2 (0,2 % of the full-scale
deflection) or better is recommended.
NOTE The best resolution available from an analogue oscilloscope is about 0,3 % of the full-scale deflection.
Hence the above limit of 0,2 % full-scale deflection ensures that a digital recorder used for comparative
measurements, for example, to determine the transfer impedance of transformers, will perform at least as well as
an oscilloscope.
2.1.2.3 Impulse scale factor
The impulse scale factor shall be determined with an uncertainty of not more than 1 %. It
shall be constant within ±1 % over the time intervals given in 1.5.3.
2.1.2.4 Rise time
The rise time shall not be more than 3 % of T where T is the time interval to be measured.
x x
For the measurement of lightning impulses, the rise time shall be not more than 15 ns in
order to reproduce superimposed oscillations within the frequency limits given in 9.1.2 of
IEC 60060-2.
NOTE Rise times less than, or of the order of, one sampling interval cannot be accurately determined without
special repetitive triggering features.
2.1.2.5 Interference
The maximum amplitude of any deflection from the base magnitude in the interference test
shall be less than 1 % of the full-scale deflection in the ranges used for impulse tests.
NOTE An interference performance test is required by IEC 60060-2 for the complete impulse measuring system.
2.1.2.6 Record length
The record length shall be sufficiently long to allow the required parameter (for example, T
or T ) to be evaluated or a specific phenomenon to be observed. Specific record lengths
P
should be specified by the relevant technical committee.
2.1.2.7 Non-linearity of amplitude
The static integral non-linearity shall be within ±0,5 % of full-scale deflection. The
differential non-linearity shall be within ±0,8 w , for both static and dynamic tests.
2.1.2.8 Non-linearity of time base
The integral non-linearity of the time base shall be not more than 0,5 % of T where T is
x x
the time interval to be measured.
2.1.2.9 Internal noise level
The internal noise level shall be less than 0,4 % of the full-scale deflection for
measurements of the waveform parameters and less than 0,1 % of the full-scale deflection
for measurements involving signal processing.

61083-1 © IEC:2001 – 31 –
2.1.2.10 Operating range
The lower limit of the operating range shall be not less than 4/N of full-scale deflection
where N is the number of bits.
NOTE 1 This means that the peak amplitude is not less than 50 % of the full-scale deflection for an 8-bit digital
recorder, 40 % for a 10-bit digital recorder or 33 % for a 12-bit digital recorder.
NOTE 2 For tests which require comparison of records, a lower limit of the operating range of not less that 6/N
of the full-scale deflection is recommended.
2.1.3 Requirements for digital recorders used in reference measuring systems
2.1.3.1 General requirements
These instruments are used in reference measuring systems specified in IEC 60060-2 for the
calibration of approved measuring systems by comparison measurements. The peak and time
parameters are in general determined as the mean of at least 10 measurements. The overall
uncertainty of a digital recorder used in a reference measuring system according to
IEC 60060-2 shall be not more than (at a confidence level of not less than 95 %; see annex H
of IEC 60060-2)
• 0,7 % in the peak voltage (current) measurement of full and standard-chopped lightning
impulses, switching impulses and rectangular impulses;
• 2 % in the peak voltage measurement of front-chopped lightning impulses;
• 3 % in the measurement of the time parameters (front time, time to chopping, etc.) of the
impulse.
2.1.3.2 Individual requirements
In order to stay within the limits given in 2.1.3.1, the limits given in 2.1.2 and the following
additional requirements shall be met.
• The sampling rate shall be not less than 30/T . For front-chopped impulses, the
x
6 –1
sampling rate shall be not less than 100⋅10 s .
• The lower limit of the operating range shall be not less than 6/N of the full-scale
deflection.
• The impulse scale factor shall be determined with an uncertainty of not more than 0,5 %.
• It shall be constant within ±0,5 % over the time intervals given in 1.5.3.
• The interference voltage shall be not more than 0,5 %.
2.1.4 Tests
The tests required for digital recorders by this standard are shown in table 3.
All calibration equipment shall be traceable, either directly or indirectly, to international or
national standards. The procedures of the calibrations shall be recorded.

61083-1 © IEC:2001 – 33 –
Table 3 – Tests required for digital recorders
Reference to test requirement Test classification
Refer-
Complete Complete Type test Routine Per- Perform-
ence to
Type of test
recorder at one recorder at each test form- ance
test
setting of the setting of the ance check
method
input attenuator input attenuator test
Static integral non- 1.5.7 2.1.2.7 X
linearity
Static differential non- 1.5.7 2.1.2.7 X
linearity
Dynamic
differential 1.5.8 2.1.2.7 X
non-linearity
Non-linearity of time 1.5.4 2.1.2.8 X
base
Impulse scale factor 1.5.1 or 2.1.2.3 X X X
1.5.2
Constancy of scale 1.5.3 2.1.2.3 X X X
factor
Rise time 1.5.5 2.1.2.4 X
Internal noise level 1.5.9 2.1.2.9 X
Interference 1.5.10, 2.1.2.5, B.3.1 X
B.3
2.1.4.1 Type tests
Type tests shall be performed for one digital recorder of a series. These type tests are to be
performed by the manufacturer of the digital recorder. If type test results are not available
from the manufacturer, tests to verify the equipment shall be arranged by the user.
2.1.4.2 Routine tests
Routine tests shall be performed for each . These routine tests are to be
digital recorder
performed by the manufacturer of the digital recorder. If routine test results are not available
from the manufacturer, tests to verify the equipment shall be arranged by the user.
Routine tests shall also be carried out after repair of the digital recorder.
2.1.4.3 Performance tests
Performance tests shall be performed on each new digital recorder and be repeated once a
year. The date and results of each performance test shall be recorded in the record of
performance.
A performance test on the instrument is also required if performance checks on the instrument
indicate that the impulse scale factor has changed by more than 1 %.

61083-1 © IEC:2001 – 35 –
2.1.4.4 Performance checks
Performance checks on the instrument are required only if performance checks on the
complete measuring system indicate that the assigned scale factor has changed significantly
(see 4.2 of IEC 60060-2).
Performance checks shall be made for each setting of the instrument that is to be used in the
impulse tests. This check shall include the possible external attenuator, if it was not calibrated
with divider or shunt.
If it
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