iTeh Standards logo
EURUSD
Your shopping cart is empty.
ISO

ISO/TC 202/SC 1 - Terminology

Terminologie

General Information

Status
Active
Parent
ISO/TC 202 - Microbeam analysis

Frequently Asked Questions

ISO/TC 202/SC 1 is a Subcommittee within the International Organization for Standardization (ISO). It is named "Terminology". This committee has published 6 standards.

ISO/TC 202/SC 1 develops ISO standards. Currently, there are 6 published standards from this subcommittee.

The International Organization for Standardization (ISO) is an independent, non-governmental international organization that develops and publishes international standards. Founded in 1947 and headquartered in Geneva, Switzerland, ISO brings together experts from 170+ member countries to share knowledge and develop voluntary, consensus-based standards that support innovation and provide solutions to global challenges.

A Subcommittee (SC) in ISO operates under a Technical Committee and focuses on a specific subset of the TC's scope. Subcommittees develop standards and technical specifications in their specialized area, reporting to their parent Technical Committee. They may also have working groups for detailed technical work.

Standardization Organization
ICS
Directive
Mandate
50
ISO
ISO 17297:2025(Main)
Microbeam analysis - Focused ion beam application for TEM specimen preparation - Vocabulary

This document defines the most commonly used terms for transmission electron microscopy (TEM) specimen preparation using focused ion beam (FIB).

  • Standard
    14 pages
    English language
    sale 15% off
ISO
ISO 22493:2014(Main)
Microbeam analysis - Scanning electron microscopy - Vocabulary

ISO 22493:2014 defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts, classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also included, where appropriate. ISO 22493:2014is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of ISO 22493:2014 are applicable to documents relevant to related fields (e.g. EPMA, AEM, EDS) for the definition of terms which are relevant to such fields.

  • Standard
    20 pages
    English language
    sale 15% off
ISO
ISO 15932:2013(Main)
Microbeam analysis - Analytical electron microscopy - Vocabulary

ISO 15932:2013 defines terms used in the practice of AEM. It covers both general and specific concepts classified according to their hierarchy in a systematic order. It is applicable to all standardization documents relevant to the practice of AEM. In addition, some parts of this International Standard are applicable to those documents relevant to the practice of related fields (e.g. TEM, STEM, SEM, EPMA, EDX) for the definition of those terms common to them.

  • Standard
    21 pages
    English language
    sale 15% off
  • Standard
    22 pages
    French language
    sale 15% off
ISO
ISO 23833:2013(Main)
Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary

ISO 23833:2013 defines terms used in the practices of electron probe microanalysis (EPMA). It covers both general and specific concepts classified according to their hierarchy in a systematic order. ISO 23833:2013 is applicable to all standardization documents relevant to the practices of EPMA. In addition, some parts of ISO 23833:2013 are applicable to those documents relevant to the practices of related fields (SEM, AEM, EDX, etc.) for definition of those terms common to them.

  • Standard
    27 pages
    English language
    sale 15% off
  • Standard
    26 pages
    French language
    sale 15% off
ISO
ISO 22493:2008(Main)
Microbeam analysis - Scanning electron microscopy - Vocabulary

ISO 22493:2008 defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also included, where appropriate. The vocabulary is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of the vocabulary are applicable to documents relevant to related fields (e.g. EPMA, AEM, EDS) for the definition of terms which are relevant to such fields.

  • Standard
    22 pages
    English language
    sale 15% off
  • Standard
    22 pages
    French language
    sale 15% off
ISO
ISO 23833:2006(Main)
Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary

ISO 23833:2006 is a bilingual (English/French) vocabulary which defines terms used in the practices of electron probe microanalysis (EPMA). It covers both general and specific concepts classified according to their hierarchy in a systematic order. It is applicable to all standardization documents relevant to the practices of EPMA. In addition, some parts of the standard are applicable to those documents relevant to the practices of related fields (e.g. SEM, AEM, EDX) for definition of those terms common to them.

  • Standard
    12 pages
    English language
    sale 15% off
50