IEC 60749-5:2003
(Main)Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 5: Essai continu de durée de vie sous température et humidité avec polarisation
Décrit un essai continu de durée de vie utilisant la température et l'humidité avec polarisation pour évaluer la fiabilité des dispositifs à semiconducteurs sous boîtier non hermétique dans les environnements humides.
General Information
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Dispositifs à semiconducteurs –
Méthodes d'essais mécaniques et climatiques –
Partie 5:
Essai continu de durée de vie sous température
et humidité avec polarisation
Semiconductor devices –
Mechanical and climatic test methods –
Part 5:
Steady-state temperature humidity
bias life test
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Méthodes d'essais mécaniques et climatiques –
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Mechanical and climatic test methods –
Part 5:
Steady-state temperature humidity
bias life test
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électronique ou mécanique, y compris la photocopie et les photocopying and microfilm, without permission in writing from
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MECHANICAL AND CLIMATIC TEST METHODS –
Part 5: Steady-state temperature humidity bias life test
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MÉTHODES D’ESSAIS MÉCANIQUES ET CLIMATIQUES –
Partie 5: Essai continu de durée de vie sous température
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