IEC 60749-29:2011

IEC 60749-29 ®
Edition 2.0 2011-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Semiconductor devices – Mechanical and climatic test methods –
Part 29: Latch-up test
Dispositifs à semiconducteurs – Méthodes d'essai mécaniques et climatiques –
Partie 29: Essai de verrouillage

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IEC 60749-29 ®
Edition 2.0 2011-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Semiconductor devices – Mechanical and climatic test methods –
Part 29: Latch-up test
Dispositifs à semiconducteurs – Méthodes d'essai mécaniques et climatiques –
Partie 29: Essai de verrouillage

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX T
ICS 31.080.01 ISBN 978-2-88912-434-3

– 2 – 60749-29  IEC:2011
CONTENTS
FOREWORD . 3
1 Scope and object . 5
2 Terms and definitions . 5
3 Classification and levels . 8
3.1 Classification . 8
3.2 Levels . 8
4 Apparatus and material . 8
4.1 Latch-up tester . 8
4.1.1 General . 8
4.1.2 V and their qualification method. 9
supply
4.1.3 Trigger source qualification method . 9
4.2 Automated test equipment (ATE) . 10
4.3 Heat source . 10
5 Procedure . 10
5.1 General latch-up test procedure . 10
5.2 Detailed latch-up test procedure . 13
5.2.1 I-test . 13
5.2.2 V overvoltage test . 17
supply
5.2.3 Testing dynamic devices . 19
5.2.4 DUT disposition . 19
5.2.5 Record keeping . 19
6 Failure criteria . 20
7 Summary . 20
Annex A (informative) Examples of special pins that are connected to passive
components . 21
Annex B (informative) Calculation of operating ambient or operating case temperature
for a given operating junction temperature . 23

qualification circuit . 9
Figure 1 – V
supply
Figure 2 – Trigger source qualification circuit . 10
Figure 3 – Latch-up test flow . 11
Figure 4 – Test waveform for positive I-test . 14
Figure 5 – Test waveform for negative I-test . 15
Figure 6 – Equivalent circuit for positive input/output I-test latch-up testing . 16
Figure 7 – Equivalent circuit for negative input/output I-test latch-up testing . 17
Figure 8 – Test waveform for V overvoltage . 18
supply
Figure 9 – Equivalent circuit for V overvoltage test latch-up testing . 19
supply
Figure A.1 – Examples of special pins that are connected to passive components . 22

a
Table 1 – Test matrix . 12
Table 2 – Timing specifications for I-test and V overvoltage test . 13
supply
60749-29  IEC:2011 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
SEMICONDUCTOR DEVICES –
MECHANICAL AND CLIMATIC TEST METHODS –

Part 29: Latch-up test
FOREWORD
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International Standard IEC 60749-29 has been prepared by IEC technical committee 47:
Semiconductor devices.
This second edition cancels and replaces the first edition published in 2003 and constitutes a
technical revision. The significant changes with respect to the previous edition include:
– a number of minor technical changes;
– the addition of two new annexes covering the testing of special pins and temperature
calculations.
– 4 – 60749-29  IEC:2011
The text of this standard is based on the following documents:
FDIS Report on voting
47/2083/FDIS 47/2090/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 60749 series, under the general title Semiconductor devices –
Mechanical and climatic test methods, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publicat
...