IEC 61000-4-20:2010
(Main)Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
IEC 61000-4-20:2010 relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These types include open structures (for example, striplines and electromagnetic pulse simulators) and closed structures (for example, TEM cells). These structures can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type. The object of this standard is to describe:
- TEM waveguide characteristics, including typical frequency ranges and EUT-size limitations;
- TEM waveguide validation methods for EMC tests;
- the EUT (i.e. EUT cabinet and cabling) definition;
- test set-ups, procedures, and requirements for radiated emission testing in TEM waveguides and
- test set-ups, procedures, and requirements for radiated immunity testing in TEM waveguides.
IEC 61000-4-20:2010 does not intend to specify the tests to be applied to any particular apparatus or system(s). The main intention of this standard is to provide a general basic reference for all interested product committees of the IEC. For radiated emissions testing, product committees should select emission limits and test methods in consultation with CISPR standards. For radiated immunity testing, product committees remain responsible for the appropriate choice of immunity tests and immunity test limits to be applied to equipment within their scope. This standard describes test methods that are separate from those of IEC 61000-4-3. This second edition cancels and replaces the first edition published in 2003 and its amendment 1 (2006), and constitutes a technical revision. It has the status of a basic EMC publication in accordance with IEC Guide 107. The main changes with respect to the first edition of this standard and its amendment are the following:
- consistency of terms (e.g. test, measurement, etc.) has been improved;
- clauses covering test considerations, evaluations and the test report have been added;
- references to large TEM waveguides have been eliminated;
- a new informative annex has been added to deal with calibration of E-field probes.
Compatibilité électromagnétique (CEM) - Partie 4-20: Techniques d'essai et de mesure - Essais d'émission et d'immunité dans les guides d'onde TEM
La CEI 61000-4-20:2010 concerne les méthodes d'essai d'émission et d'immunité pour les matériels électriques et électroniques utilisant différents types de guides d'onde transverses électromagnétiques (TEM). Ces types comprennent des structures ouvertes (par exemple, des lignes ouvertes et des simulateurs d'impulsion électromagnétique), et des structures fermées (par exemple des cellules TEM), qui peuvent être elles-mêmes classées en guides d'onde TEM à un accès, à deux accès, ou à accès multiples. La gamme de fréquences dépend des exigences d'essai spécifiques et du type spécifique de guide d'onde TEM. L'objet de cette norme est de décrire:
- les caractéristiques des guides d'onde TEM, y compris les gammes de fréquences types et les limites de tailles des matériels en essai (EST);
- les méthodes de validation des guides d'onde TEM pour les essais CEM;
- la définition de l'EST (c'est-à-dire l'armoire et le câblage de l'EST);
- les montages d'essai, les procédures et les exigences pour les essais d'émissions rayonnées dans les guides d'onde TEM, et
- les montages d'essai, les procédures et les exigences pour les essais d'immunité rayonnée dans les guides d'onde TEM.
La CEI 61000-4-20:2010 ne vise pas à spécifier les essais devant s'appliquer à des appareils ou systèmes particuliers. Le but principal de cette norme est de donner une référence de base d'ordre général à tous les comités de produits CEI concernés. Pour les essais d'émission rayonnée, il convient que les comités de produits sélectionnent des limites d'émission et des méthodes d'essai en consultation avec le CISPR. Pour les essais d'immunité rayonnée, les comités de produits restent responsables du choix approprié des essais d'immunité et des limites à appliquer aux matériels relevant de leur domaine d'application. Cette norme décrit des méthodes d'essai qui sont indépendantes de celles de la CEI 61000-4-3. Cette deuxième édition annule et remplace la première édition parue en 2003 et son amendement 1 (2006) et constitue une révision technique. Elle a le statut de publication fondamentale en CEM conformément au Guide 107 de la CEI. Les principaux changements par rapport à la première édition de la présente norme et à son amendement sont les suivants:
- amélioration de la cohérence des termes (par exemple essai, mesure, etc.);
- addition d'articles couvrant les considérations d'essai, les évaluations et le rapport d'essai;
- suppression des références aux guides d'onde TEM de grande taille:
- addition d'une nouvelle annexe informative dédiée à l'étalonnage des sondes de champ électrique.
General Information
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Standards Content (Sample)
IEC 61000-4-20
Edition 2.0 2010-08
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-20: Testing and measurement techniques – Emission and immunity
testing in transverse electromagnetic (TEM) waveguides
Compatibilité électromagnétique (CEM) –
Partie 4-20: Techniques d’essai et de mesure – Essais d’émission et d’immunité
dans les guides d’onde TEM
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IEC 61000-4-20
Edition 2.0 2010-08
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-20: Testing and measurement techniques – Emission and immunity
testing in transverse electromagnetic (TEM) waveguides
Compatibilité électromagnétique (CEM) –
Partie 4-20: Techniques d’essai et de mesure – Essais d’émission et d’immunité
dans les guides d’onde TEM
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
XC
CODE PRIX
ICS 33.100.10; 33.100.20 ISBN 978-2-88912-149-6
– 2 – 61000-4-20 © IEC:2010
CONTENTS
FOREWORD.4
INTRODUCTION.6
1 Scope and object.7
2 Normative references .7
3 Terms, definitions and abbreviations .8
3.1 Terms and definitions .8
3.2 Abbreviations .11
4 General .11
5 TEM waveguide requirements.12
5.1 General .12
5.2 General requirements for the use of TEM waveguides .12
5.2.1 TEM mode verification .12
5.2.2 Test volume and maximum EUT size .12
5.2.3 Validation of usable test volume .13
5.3 Special requirements and recommendations for certain types of TEM
waveguides .15
5.3.1 Set-up of open TEM waveguides .15
5.3.2 Alternative TEM mode verification for a two-port TEM waveguide .16
6 Overview of EUT types .16
6.1 General .16
6.2 Small EUT .16
6.3 Large EUT.16
7 Laboratory test conditions .17
7.1 General .17
7.2 Climatic conditions .17
7.3 Electromagnetic conditions.17
8 Evaluation and reporting of test results.17
Annex A (normative) Emission testing in TEM waveguides.19
Annex B (normative) Immunity testing in TEM waveguides.40
Annex C (normative) HEMP transient testing in TEM waveguides .46
Annex D (informative) TEM waveguide characterization.53
Annex E (informative) Calibration method for E-field probes in TEM waveguides .61
Bibliography.71
Figure A.1 – Routing the exit cable to the corner at the ortho-angle and the lower edge
of the test volume .30
Figure A.2 – Basic ortho-axis positioner or manipulator .31
Figure A.3 – Three orthogonal axis-rotation positions for emission measurements.32
Figure A.4 – Twelve-face (surface) and axis orientations for a typical EUT .33
Figure A.5 – Open-area test site (OATS) geometry .34
Figure A.6 – Two-port TEM cell (symmetric septum) .35
Figure A.7 – One-port TEM cell (asymmetric septum) .36
Figure A.8 – Stripline (two plates) .38
Figure A.9 – Stripline (four plates, balanced feeding).39
61000-4-20 © IEC:2010 – 3 –
Figure B.1 – Example of test set-up for single-polarization TEM waveguides .44
Figure B.2 – Uniform area calibration points in TEM waveguide .45
Figure C.1 – Frequency domain spectral magnitude between 100 kHz and 300 MHz .52
Figure D.1 – Simple waveguide (no TEM mode).59
Figure D.2 – Example waveguides for TEM-mode propagation.59
Figure D.3 – Polarization vector.59
Figure D.4 – Transmission line model for TEM propagation .59
Figure D.5 – One- and two-port TEM waveguides .60
Figure E.1 – An example of the measurement points for the validation.62
Figure E.2 – Setup for validation of perturbation .63
Figure E.3 – Setup for measuring net power to a transmitting device .66
Figure E.4 – Example of setup for calibration of E-field probe .67
Figure E.5 – Setup for calibration of E-field probe by another method.69
Figure E.6 – Equivalent circuit of antenna and measurement apparatus.70
Table 1 – Values K for expanded uncertainty with normal distribution .15
Table B.1 – Uniform area calibration points.42
Table B.2 – Test levels .42
Table C.1 – Radiated immunity test levels defined in the present standard .52
Table E.1 – Calibration frequencies .63
Table E.2 – Calibration field strength level.64
– 4 – 61000-4-20 © IEC:2010
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-20: Testing and measurement techniques –
Emission and immunity testing in
transverse electromagnetic (TEM) waveguides
FOREWORD
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