EN IEC 61788-17:2021

SLOVENSKI STANDARD
01-september-2021
Nadomešča:
SIST EN 61788-17:2013
Superprevodnost - 17. del: Meritve elektronskih karakteristik - Krajevno kritična
tokovna gostota in njena porazdelitev po površinsko obširnih razsežnih
superprevodnih plasteh (IEC 61788-17:2021)
Superconductivity - Part 17: Electronic characteristic measurements - Local critical
current density and its distribution in large-area superconducting films (IEC 61788-
17:2021)
Supraleitfähigkeit - Teil 17: Messungen der elektronischen Charakteristik - Lokale
kritische Stromdichte und deren Verteilung in großflächigen supraleitenden Schichten
(IEC 61788-17:2021)
Supraconductivité - Partie 17: Mesures de caractéristiques électroniques - Densité de
courant critique local et sa distribution dans les films supraconducteurs de grande
surface (IEC 61788-17:2021)
Ta slovenski standard je istoveten z: EN IEC 61788-17:2021
ICS:
17.220.20 Merjenje električnih in Measurement of electrical
magnetnih veličin and magnetic quantities
29.050 Superprevodnost in prevodni Superconductivity and
materiali conducting materials
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN IEC 61788-17

NORME EUROPÉENNE
EUROPÄISCHE NORM
June 2021
ICS 17.220.20; 29.050 Supersedes EN 61788-17:2013 and all of its
amendments and corrigenda (if any)
English Version
Superconductivity - Part 17: Electronic characteristic
measurements - Local critical current density and its distribution
in large-area superconducting films
(IEC 61788-17:2021)
Supraconductivité - Partie 17: Mesures de caractéristiques Supraleitfähigkeit - Teil 17: Messungen der elektronischen
électroniques - Densité de courant critique local et sa Charakteristik - Lokale kritische Stromdichte und deren
distribution dans les films supraconducteurs de grande Verteilung in großflächigen supraleitenden Schichten
surface (IEC 61788-17:2021)
(IEC 61788-17:2021)
This European Standard was approved by CENELEC on 2021-06-02. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
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Turkey and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2021 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN IEC 61788-17:2021 E

European foreword
The text of document 90/462/FDIS, future edition 2 of IEC 61788-17, prepared by IEC/TC 90
"Superconductivity" was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2022-03-02
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2024-06-02
document have to be withdrawn
This document supersedes EN 61788-17:2013 and all of its amendments and corrigenda (if any).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
Endorsement notice
The text of the International Standard IEC 61788-17:2021 was approved by CENELEC as a European
Standard without any modification.
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
NOTE 1  Where an International Publication has been modified by common modifications, indicated by (mod),
the relevant EN/HD applies.
NOTE 2  Up-to-date information on the latest versions of the European Standards listed in this annex is available
here: www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 60050-815 - International Electrotechnical Vocabulary - - -
Part 815: Superconductivity
IEC 61788-17 ®
Edition 2.0 2021-04
INTERNATIONAL
STANDARD
colour
inside
Superconductivity –
Part 17: Electronic characteristic measurements – Local critical current density

and its distribution in large-area superconducting films

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 17.220.20; 29.050 ISBN 978-2-8322-9663-9

– 2 – IEC 61788-17:2021 © IEC 2021
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 8
2 Normative references . 8
3 Terms and definitions . 8
4 Requirements . 9
5 Apparatus . 10
5.1 Measurement equipment . 10
5.2 Components for inductive measurements . 11
6 Measurement procedure . 12
6.1 General . 12
6.2 Determination of the experimental coil coefficient . 12
6.3 Measurement of J in sample films. 16
c
6.4 Measurement of J with only one frequency . 16
c
6.5 Examples of the theoretical and experimental coil coefficients . 17
7 Uncertainty in the test method . 18
7.1 Major sources of systematic effects that affect the U measurement . 18
7.2 Effect of deviation from the prescribed value in the coil-to-film distance . 19
7.3 Uncertainty in the experimental coil coefficient and the obtained J . 20
c
7.4 Effects of the film edge . 20
7.5 Specimen protection . 20
8 Test report . 21
8.1 Identification of test specimen . 21
8.2 Report of J values . 21
c
8.3 Report of test conditions . 21
Annex A (informative) Additional information relating to Clauses 1 to 8 . 22
A.1 Comments on other methods for measuring the local J of large-area HTS
c
films . 22
A.2 Requirements . 22
A.3 Theory of the third-harmonic voltage generation . 23
A.4 Calculation of the induced electric fields . 24
A.5 Theoretical coil coefficient k and experimental coil coefficient k′ . 25
A.6 Scaling of the U –I curves and the constant-inductance criterion to
3 0
determine I . 25
th
A.7 Effects of reversible flux motion . 27
Annex B (informative) Optional measurement systems . 28
B.1 Overview. 28
B.2 Harmonic noises arising from the power source and their reduction . 29
Annex C (informative) Evaluation of the uncertainty . 33
C.1 Evaluation of the uncertainty in the experimental coil coefficient . 33
C.2 Uncertainty in the calculation of induced electric fields. 34
C.3 Experimental results on the effect of the deviation of the coil-to-film distance . 35

IEC 61788-17:2021 © IEC 2021 – 3 –
C.4 Examples of the Type-A uncertainties of J and n-values, originating from
c
the experimental uncertainty in the U measurement . 35
C.5 Evaluation of the uncertainty in the obtained J . 36
c
C.6 Experimental results that reveal the effect of the film edge . 37
Bibliography . 39

Figure 1 – Diagram for an electric circuit used for inductive J measurement
c
of HTS films . 10
Figure 2 – Illustration showing techniques to press the sample coil to HTS films . 11
Figure 3 – Example of a calibration wafer used to determine the coil coefficient . 12
Figure 4 – Illustration of the sample coil and the magnetic field during measurement . 13
Figure 5 – Illustration of the sample coil and its magnetic field generation . 14
Figure 6 – E-J characteristics measured by a transport method and the U inductive
method . 16
Figure 7 – Illustration of coils 1 and 3 in Table 2 . 17
Figure 8 – The coil-factor function F(r) = 2H /I calculated for the three coils. 18
0 0
Figure 9 – The coil-to-film distance Z dependence of the theoretical coil coefficient k . 19
Figure A.1 – Illustration of the sample coil and the magnetic field during measurement . 24
Figure A.2 – U and U /I plotted against I in a YBCO thin film measured in applied
3 3 0 0
DC magnetic fields, and the scaling observed when normalized by I (insets) . 26
th
Figure A.3 – Example of the normalized third-harmonic voltages (U /fI ) measured
3 0
with various frequencies . 26
Figure B.1 – Schematic diagram for the variable-RL-cancel circuit . 29
Figure B.2 – Diagram for an electrical circuit used for the two-coil method . 29
Figure B.3 – Harmonic noises arising from the power source . 30
Figure B.4 – Noise reduction using a cancel coil with a superconducting film . 30
Figure B.5 – Normalized harmonic noises (U /fI ) arising from the power source . 31
3 0
Figure B.6 – Normalized noise voltages after the reduction using a cancel coil with a
superconducting film . 31
Figure B.7 – Normalized noise voltages after the reduction using a cancel coil without
a superconducting film .
...