EN IEC 63616:2026

SLOVENSKI STANDARD
01-marec-2026
Merjenje prevodnosti kovinskih tankih plasti pri mikrovalovnih in milimetrskih
frekvencah - Metoda uravnoteženega krožnega diska z resonatorjem (IEC
63616:2025)
Measurement of the conductivity for metal thin films at microwave and millimeter-wave
frequencies - Balanced-type circular disk resonator method (IEC 63616:2025)
Messung der Leitfähigkeit von Metalldünnschichten bei Mikrowellen- und
Millimeterwellenfrequenzen nach dem symmetrischen Kreisscheibenresonatorverfahren
(IEC 63616:2025)
Mesurage de la conductivité des films minces métalliques aux hyperfréquences et aux
fréquences à ondes millimétriques - Méthode du résonateur à disque circulaire de type
symétrique (IEC 63616:2025)
Ta slovenski standard je istoveten z: EN IEC 63616:2026
ICS:
17.220.20 Merjenje električnih in Measurement of electrical
magnetnih veličin and magnetic quantities
29.050 Superprevodnost in prevodni Superconductivity and
materiali conducting materials
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN IEC 63616

NORME EUROPÉENNE
EUROPÄISCHE NORM January 2026
ICS 17.220.20; 29.050
English Version
Measurement of the conductivity for metal thin films at
microwave and millimeter-wave frequencies - Balanced-type
circular disk resonator method
(IEC 63616:2025)
Mesurage de la conductivité des films minces métalliques Messung der Leitfähigkeit von Metalldünnschichten bei
aux hyperfréquences et aux fréquences à ondes Mikrowellen- und Millimeterwellenfrequenzen nach dem
millimétriques - Méthode du résonateur à disque circulaire symmetrischen Kreisscheibenresonatorverfahren
de type symétrique (IEC 63616:2025)
(IEC 63616:2025)
This European Standard was approved by CENELEC on 2026-01-02. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
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same status as the official versions.
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Türkiye and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2026 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN IEC 63616:2026 E
European foreword
The text of document 46F/722/FDIS, future edition 1 of IEC 63616, prepared by SC 46F "RF and
microwave passive components" of IEC/TC 46 "Cables, wires, waveguides, RF connectors, RF and
microwave passive components and accessories" was submitted to the IEC-CENELEC parallel vote
and approved by CENELEC as EN IEC 63616:2026.
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2027-01-31
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2029-01-31
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
Any feedback and questions on this document should be directed to the users’ national committee. A
complete listing of these bodies can be found on the CENELEC website.
Endorsement notice
The text of the International Standard IEC 63616:2025 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following note has to be added for the standard indicated:
IEC 61788-7:2020 NOTE Approved as EN IEC 61788-7:2020 (not modified)

IEC 63616 ®
Edition 1.0 2025-11
INTERNATIONAL
STANDARD
Measurement of the conductivity for metal thin films at microwave and
millimeter-wave frequencies - Balanced-type circular disk resonator method

ICS 17.220.20; 29.050 ISBN 978-2-8327-0894-1

IEC 63616:2025-11(en)
IEC 63616:2025 © IEC 2025
CONTENTS
FOREWORD . 2
1 Scope . 4
2 Normative references . 4
3 Terms and definitions . 4
4 Measurement parameters . 4
5 Theory and calculation equations . 5
6 Measurement system . 8
7 Measurement procedure . 9
7.1 Preparation of measurement apparatus . 9
7.2 Adjustment of measurement conditions . 9
7.3 Calibration of a vector network analyzer . 9
7.4 Measurement of the BCDR . 9
7.5 Determination of conductivity . 9
7.6 Periodic checkup of resonator . 10
Annex A (informative) Example of conductivity measurement results. 11
Bibliography . 13

Figure 1 – Structure of a BCDR. 5
Figure 2 – Configurations of the BCDR for conductivity measurements of metal foils . 6
Figure 3 – Configurations of the BCDR for interfacial conductivity measurements of
metal layers on substrates . 7
Figure 4 – Schematic diagram of a vector network analyzer measurement system . 8
Figure A.1 – Measured transmissions of the BCDRs with the two configurations . 11

Table A.1 – Parameters of the copper-clad substrate sample . 11
Table A.2 – Measurement results of interfacial conductivity . 12

IEC 63616:2025 © IEC 2025
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
Measurement of the conductivity for metal thin films
at microwave and millimeter-wave frequencies -
Balanced-type circular disk resonator method

FOREWORD
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IEC 63616 has been prepared by subcommittee 46F: RF and microwave passive components,
of IEC technical committee 46: Cables, wires, waveguides, RF connectors, RF and microwave
passive components and accessories. It is an International Standard.
The text of this International Standard is based on the following documents:
Draft Report on voting
46F/722/FDIS 46F/734/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this International Standard is English.
IEC 63616:2025 © IEC 2025
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
– reconfirmed,
– withdrawn, or
– revised.
IEC 63616:2025 © IEC 2025
1 Scope
This document relates to a conductivity measurement method of thin metal films at microwave
and millimeter-wave frequencies. This method has been developed to evaluate the conductivity
of a metal foil used for adhering to a substrate or the interfacial conductivity of a metal layer
formed on a dielectric substrate. It uses higher-order modes of a balanced-type circular disk
resonator and provides broadband conductivity measurements by using a single resonator.
In comparison with the conventional method d
...