EN IEC 61340-4-7:2025

SLOVENSKI STANDARD
oSIST prEN IEC 61340-4-7:2022
01-junij-2022
Elektrostatika - 4-7. del: Standardne preskusne metode za posebno uporabo -
Ionizacija
Electrostatics - Part 4-7: Standard test methods for specific applications - Ionization
Elektrostatik - Teil 4-7: Standard-Prüfverfahren für spezielle Anwendungen – Ionisation
Electrostatique - Partie 4-7: Méthodes d'essai normalisées pour des applications
spécifiques - Ionisation
Ta slovenski standard je istoveten z: prEN IEC 61340-4-7:2022
ICS:
17.220.99 Drugi standardi v zvezi z Other standards related to
elektriko in magnetizmom electricity and magnetism
oSIST prEN IEC 61340-4-7:2022 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

oSIST prEN IEC 61340-4-7:2022
oSIST prEN IEC 61340-4-7:2022
101/650/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 61340-4-7 ED3
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2022-04-08 2022-07-01
SUPERSEDES DOCUMENTS:
101/629/CD, 101/635A/CC
IEC TC 101 : ELECTROSTATICS
SECRETARIAT: SECRETARY:
Germany Mr Hartmut Berndt
OF INTEREST TO THE FOLLOWING COMMITTEES: PROPOSED HORIZONTAL STANDARD:

Other TC/SCs are requested to indicate their interest, if any,
in this CDV to the secretary.
FUNCTIONS CONCERNED:
EMC ENVIRONMENT QUALITY ASSURANCE SAFETY

SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING
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CENELEC, is drawn to the fact that this Committee Draft for
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The CENELEC members are invited to vote through the
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This document is still under study and subject to change. It should not be used for reference purposes.
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TITLE:
Electrostatics - Part 4-7: Standard test methods for specific applications - Ionization

PROPOSED STABILITY DATE: 2027
NOTE FROM TC/SC OFFICERS:
electronic file, to make a copy and to print out the content for the sole purpose of preparing National Committee positions.
You may not copy or "mirror" the file or printed version of the document, or any part of it, for any other purpose without
permission in writing from IEC.

oSIST prEN IEC 61340-4-7:2022
oSIST prEN IEC 61340-4-7:2022
IEC 61340-4-7/Ed3/CDV  IEC (E) – 2 – 101/650/CDV
1 CONTENTS
2 FOREWORD . 4
3 INTRODUCTION . 6
4 1 Scope . 7
5 2 Normative references . 7
6 3 Terms and definitions . 7
7 4 Test fixture and instrumentation . 9
8 5 Specific requirements for equipment categories . 11
9 5.1 Specific requirements for all ionization equipment . 11
10 5.2 Room ionization . 12
11 5.3 Laminar flow hood ionization . 14
12 5.4 Work surface ionization . 16
13 5.5 Compressed gas ionizers – Guns and nozzles . 19
14 Annex A (informative) Theoretical background and additional information on the
15 standard test method for the performance of ionizers . 21
16 A.1 Introductory remarks . 21
17 A.2 Air ions . 21
18 A.3 Mobility and ion current . 21
19 A.4 Neutralization current . 21
20 A.5 Neutralization rate . 22
21 A.6 Ion depletion and field suppression . 22
22 A.7 Charged plate monitor and charge neutralization . 22
23 A.8 Relationship between charged plate monitor decay time and actual object . 23
24 A.9 Offset voltage . 23
25 A.10 Preparation of test area . 23
26 A.11 Ion transport in airflow . 24
27 A.12 Obstruction of airflow around the charged plate monitor . 24
28 A.13 Effect of “air blanket” . 24
29 A.14 Sources of measurement error . 25
30 A.14.1 Typical decay time variability . 25
31 A.14.2 Plate isolation . 25
32 A.14.3 Charging voltage . 25
33 A.14.4 Materials near the plate . 25
34 A.14.5 Other field-producing devices in test area . 25
35 A.14.6 Effect of offset voltage on decay time . 25
36 A.15 Importance of ionization equipment maintenance . 26
37 Annex B (normative) Method of measuring the capacitance of an isolated conductive
38 plate . 27
39 B.1 Method . 27
40 B.2 Equipment . 27
41 B.3 Procedure . 27
42 B.4 Example. 28
43 B.5 Sources of error . 28
44 B.5.1 Measuring equipment . 28
45 B.5.2 Poor plate isolation . 29
46 B.5.3 Objects in the environment . 29
47 B.5.4 Stray capacitance . 29

oSIST prEN IEC 61340-4-7:2022
IEC 61340-4-7/Ed3/CDV  IEC (E) – 3 – 101/650/CDV
48 Annex C (informative) Safety considerations . 30
49 C.1 General . 30
50 C.2 Electrical . 30
51 C.3 Ozone . 30
52 C.4 Radioactive . 30
53 C.5 X-ray . 30
54 C.6 Installation . 30
55 Bibliography . 30
57 Figure 1 – Charged plate monitor components for non-contacting plate measurement . 10
58 Figure 2 – Charged plate monitor components for contacting plate measurement . 10
59 Figure 3 – Conductive plate detail for the non-contacting CPM . 11
60 Figure 4 – Conductive plate detail for the voltage follower CPM . 11
61 Figure 5 – Test locations for room ionization – AC grids and DC bar systems . 13
62 Figure 6 – Test locations for room ionization – Single polarity emitter systems . 13
63 Figure 7 – Test locations for room ionization – Dual DC line systems . 14
64 Figure 8 – Test locations for room ionization – Pulsed DC emitter systems . 14
65 Figure 9 – Test locations for vertical laminar flow hood – Top view . 15
66 Figure 10 – Test locations for vertical laminar flow hood – Side view . 15
67 Figure 11 – Test locations for horizontal laminar flow hood – Top view . 16
68 Figure 12 – Test locations for horizontal laminar flow hood – Side view . 16
69 Figure 13 – Test locations for benchtop ionizer – Top view . 17
70 Figure 14 – Test locations for benchtop ionizer – Side view . 18
71 Figure 15 – Test locations for overhead ionizer – Top view . 18
72 Figure 16 – Test locations for overhead ionizer – Side view . 19
73 Figure 17 – Test locations for compressed gas ionizer (gun or nozzle) – Side view . 20
75 Table 1 – Test set-ups and test locations/points (TP) . 12
76 Table B.1 – Example measurement data . 28
oSIST prEN IEC 61340-4-7:2022
IEC 61340-4-7/Ed3/CDV  IEC (E) – 4 – 101/650/CDV
79 INTERNATIONAL ELECTROTECHNICAL COMMISSION
80 ____________
82 ELECTROSTATICS –
84 Part 4-7: Standard test methods for specific applications –
85 Ionization
88 FOREWORD
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