EN 16602-70-01:2014

SLOVENSKI STANDARD
01-januar-2015
=DJRWDYOMDQMHYDUQLKSURL]YRGRYYYHVROMVNLWHKQLNLýLVWRþDLQNRQWUROD
RQHVQDåHQRVWL
Space product assurance - Cleanliness and contamination control
Raumfahrtproduktsicherung - Reinheit und Verunreinigungskontrolle
Assurance produit des projets spatiaux - Contrôle de la propreté et de la contamination
Ta slovenski standard je istoveten z: EN 16602-70-01:2014
ICS:
49.140 Vesoljski sistemi in operacije Space systems and
operations
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD
EN 16602-70-01
NORME EUROPÉENNE
EUROPÄISCHE NORM
October 2014
ICS 49.140
English version
Space product assurance - Cleanliness and contamination
control
Assurance produit des projets spatiaux - Contrôle de la Raumfahrtproduktsicherung - Reinheit und
propreté et de la contamination Verunreinigungskontrolle
This European Standard was approved by CEN on 13 March 2014.

CEN and CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving
this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning
such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CEN and CENELEC
member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CEN and CENELEC member into its own language and notified to the CEN-CENELEC Management Centre
has the same status as the official versions.

CEN and CENELEC members are the national standards bodies and national electrotechnical committees of Austria, Belgium, Bulgaria,
Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece,
Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Slovakia,
Slovenia, Spain, Sweden, Switzerland, Turkey and United Kingdom.

CEN-CENELEC Management Centre:
Avenue Marnix 17, B-1000 Brussels
© 2014 CEN/CENELEC All rights of exploitation in any form and by any means reserved Ref. No. EN 16602-70-01:2014 E
worldwide for CEN national Members and for CENELEC
Members.
Table of contents
Foreword . 6
Introduction . 7
1 Scope . 8
2 Normative references . 9
3 Terms, definitions and abbreviated terms . 10
3.1 Terms from other standards . 10
3.2 Terms specific to the present standard . 10
3.3 Abbreviated terms. 14
4 Principles . 16
5 Requirements . 17
5.1 Cleanliness and contamination control programme. 17
5.1.1 General . 17
5.1.2 Documentation . 17
5.1.3 Contamination budget . 18
5.1.4 Contamination predictions . 18
5.1.5 Contamination prediction with respect to budget . 19
5.1.6 Cleanliness and contamination process flow chart . 19
5.2 Phases . 20
5.2.1 Design . 20
5.2.2 MAIT . 22
5.2.3 pre-launch and launch . 23
5.2.4 Mission . 24
5.3 Environments . 25
5.3.1 Cleanrooms. 25
5.3.2 Vacuum facilities . 33
5.3.3 Other facilities . 34
5.4 Activities . 34
5.4.1 Cleaning of hardware . 34
5.4.2 Cleanliness monitoring of space hardware . 36
5.4.3 Cleanliness verification . 39
5.4.4 Packaging, containerization, transportation, storage . 42
Annex A (normative) Cleanliness requirement specification (CRS) - DRD . 44
A.1 DRD identification . 44
A.1.1 Requirement identification and source document . 44
A.1.2 Purpose and objective . 44
A.2 Expected response . 45
A.2.1 Scope and content . 45
A.2.2 Special remarks . 46
Annex B (normative) Cleanliness and contamination control plan (C&CCP)
- DRD . 47
B.1 DRD identification . 47
B.1.1 Requirement identification and source document . 47
B.1.2 Purpose and objective . 47
B.2 Expected response . 48
B.2.1 Scope and content . 48
B.2.2 Special remarks . 50
Annex C (informative) Cleanliness and contamination control process
overview . 51
Annex D (informative) Guidelines for general cleanliness and
contamination control . 52
D.1 General . 52
D.2 Contamination attributes . 52
D.2.1 Typical contaminants and their sources . 52
D.2.2 Transport mechanisms . 58
D.2.3 Main effects of contamination on space systems . 59
Annex E (informative) Cleanliness-oriented design . 61
Annex F (informative) Modelling guidelines . 63
Annex G (informative) Airborne particulate cleanliness classes
equivalence . 64
Annex H (informative) Particulate levels on surfaces . 65
H.1 Standard method 1: Particle distribution . 65
H.2 Standard method 2: Obscuration factor . 65
H.2.1 Overview . 65
H.2.2 Correlation for particles on surfaces . 65
Annex I (informative) Compatibility of various solvents with listed
materials. 67
Annex J (informative) evaporation residue of commercially available
solvents . 69
Annex K (informative) Molecular contaminant content of some wipe
materials. 70
Annex L (informative) Effects of humidity on materials and components . 71
Annex M (informative) Cleaning methods . 72
M.1 Removal of particulate contamination . 72
M.1.1 Overview . 72
M.1.2 Vacuum cleaning and wiping . 72
M.1.3 Gas jet cleaning . 72
M.1.4 Tapes and films trapping . 73
M.2 Removal of molecular contamination . 73
M.2.1 Overview . 73
M.2.2 Mechanical cleaning . 73
M.2.3 Solvent and detergent cleaning . 73
M.2.4 Films trapping . 73
M.2.5 Gas jet cleaning . 73
M.2.6 Plasma cleaning . 74
M.2.7 Bakeout . 74
M.2.8 Ultra-violet-ozone cleaning . 74
Bibliography . 75

Figures
Figure 5-1: Graphical representation of ISO-class concentration limits for selected ISO
classes . 27
Figure C-1 : Cleanliness and contamination control process overview . 51

Tables
Table 5-1: Outgassing criteria for materials in the vicinity of sensitive items around RT . 21
Table 5-2: Outgassing criteria for materials in the vicinity of sensitive items at
temperature below RT . 21
Table 5-3: Outgassing criteria for materials in the vicinity of cryogenic surfaces . 21
Table 5-4: Selected airborne particulate cleanliness classes for cleanrooms and other
controlled environment . 28
Table 5-5: Correlation airborne and PFO for cleanrooms . 29
Table G-1 : Classification system . 64
Table H-1 : Correlation between ideal class of IEST-STD-CC1246D and obscuration
factor . 66
Table I-1 : Examples of compatibility of various solvents with listed materials . 68
Table J-1 : Commercially available solvents evaporation residue . 69
Table K-1 : Molecular contaminant content of some wipe materials . 70
Table L-1 : Effect of humidity on materials and components . 71

Foreword
This document (EN 16602-70-01:2014) has been prepared by Technical
Committee CEN/CLC/TC 5 “Space”, the secretariat of which is held by DIN.
This standard (EN 16602-70-01:2014) originates from ECSS-Q-ST-70-01C.
This European Standard shall be given the status of a national standard, either
by publication of an identical text or by endorsement, at the latest by April 2015,
and conflicting national standards shall be withdrawn at the latest by April
2015.
Attention is drawn to the possibility that some of the elements of this document
may be the subject of patent rights. CEN [and/or CENELEC] shall not be held
responsible for identifying any or all such patent rights.
This document has been prepared under a mandate given to CEN by the
European Commission and the European Free Trade Association.
This document has been developed to cover specifically space systems and has
therefore precedence over any EN covering the same scope but with a wider
domain of applicability (e.g. : aerospace).
According to the CEN-CENELEC Internal Regulations, the national standards
organizations of the following countries are bound to implement this European
Standard: Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France,
Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania,
Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania,
Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United
Kingdom.
Introduction
The objective of this Standard is to ensure a successful mission by the definition
of acceptable contamination levels for space system elements, their
achievement, and maintenance, throughout
• performance assessment versus contamination,
• facilities and tools definition for contamination control and monitoring,
• materials and processes selection, and
• planning of activities.
Scope
The purpose of this standard is to define:
• The selection of critical items, the definition of cleanliness requirements
to satisfy the mission performance requirements and control the levels to
be met by personnel, items, facilities and operations of space projects.
• The management, including organization, reviews and audits, acceptance
status and documentation control.
It covers design, development, production, testing, operation of space products,
launch and mission.
In this standard are also guidelines given for identification of possible failures
and malfunctions due to contamination and guidelines for achieving and
maintaining the required cleanliness levels during ground activities, launch and
mission.
This Standard applies to all types and combinations of projects, organizations
and products, and during all the project phases, except manned missions.
It also applies to those ground systems that have a hardware interface to space
systems, such as MGSE integration stands.
This Standard does not address magnetic, electrical or electrostatic cleanliness.
This Standard does not address completely biocontamination aspects.
However, references to relevant ECSS standards are provided.
This standard may be tailored for the specific characteristic and constrains of a
space project in conformance with ECSS-S-ST-00.

Normative references
The following normative documents contain provisions which, through
reference in this text, constitute provisions of this ECSS Standard. For dated
references, subsequent amendments to, or revision of any of these publications
do not apply, However, parties to agreements based on this ECSS Standard are
encouraged to investigate the possibility of applying the more recent editions of
the normative documents indicated below. For undated references, the latest
edition of the publication referred to applies.

EN reference Reference in text Title
EN 16601-00-01 ECSS-S-ST-00-01 ECSS system — Glossary of terms
EN 16602-10-09 ECSS-Q-ST-10-09 Space product assurance – Nonconformance control
system
EN 16602-20 ECSS-Q-ST-20 Space product assurance — Quality assurance
EN 16602-20-07 ECSS-Q-ST-20-07 Space product assurance — Quality assurance for test
centres
EN 16602-70 ECSS-Q-ST-70 Space product assurance — Materials, mechanical
parts and processes
EN 16602-70-02 ECSS-Q-ST-70-02 Space product assurance — Thermal vacuum
outgassing test for the screening of space materials
EN 16602-70-29 ECSS-Q-ST-70-29 Space product assurance — Determination of
offgassing products from materials and assembled
articles to used in manned space vehicle crew
compartment
EN 16602-70-50 ECSS-Q-ST-70-50 Space product assurance — Particle contamination
monitoring for spacecraft systems and cleanrooms
EN 16602-70-53 ECSS-Q-ST-70-53 Space product assurance — Material and hardware
compatibility test for sterilization processes
EN 16602-70-55 ECSS-Q-ST-70-55 Space product assurance — Microbial examination of
flight hardware and cleanrooms
EN 16602-70-58 ECSS-Q-ST-70-58 Space product assurance — Bioburden control of
cleanrooms
ISO 14644 Cleanrooms and associated controlled environments
IEST-STD-CC1246D Product cleanliness levels and contamination control
program
Terms, definitions and abbreviated terms
3.1 Terms from other standards
For the purpose of this Standard, the terms and definitions from ECSS-ST-00-01
and ECSS-Q-ST-70 apply.
3.2 Terms specific to the present standard
3.2.1 airborne particle
particle suspended in air
3.2.2 airborne particle cleanliness class
level of cleanliness specified by the maximum allowable number of particles per
cubic metre (or cubic foot) of air
3.2.3 bakeout
activity of increasing the temperature of hardware to accelerate its outgassing
rates with the intent of reducing the content of molecular contaminants within
the hardware
NOTE Bakeout is usually performed in a vacuum
environment, but can be done in a controlled
atmosphere.
3.2.4 biocontamination
contamination of materials, devices, individuals, surfaces, liquids, gases or air
with viable particles
[ISO 14698-1:2003, 3.1.4] [ISO 14698-2:2003, 3.4]
3.2.5 cleaning
actions to reduce the contamination level
3.2.6 cleanliness (contamination) control
any organized action to control the level of contamination
3.2.7 cleanliness level
quantitative level of contamination
3.2.8 cleanliness verification
activity intended to verify that the actual cleanliness conditions of the space
system, the cleanrooms or the vacuum chambers are in conformance with the
applicable specifications and other cleanliness requirements
3.2.9 cleanroom
room in which the concentration of airborne particles is controlled, and which is
constructed and used in a manner to minimize the introduction, generation and
retention of particles inside the room, and in which other relevant parameters,
e.g. temperature, humidity and pressure, are controlled as necessary
[ISO 14644-6]
3.2.10 clean zone
dedicated space in which the concentration of airborne particles is controlled,
and which is constructed and used in a manner to minimize the introduction,
generation and retention of particles inside the room, and in which other
relevant parameters, e.g. temperature, humidity and pressure, are controlled as
necessary
[ISO 14644-6]
NOTE This zone can be open or enclosed and can or can
not be located within a cleanroom.
3.2.11 contaminant
any unwanted molecular or particulate matter (including microbiological
matter) on the surface or in the environment of interest, that can affect or
degrade the relevant performance or life time
3.2.12 contaminate, to
act of introducing any contaminant
3.2.13 contamination budget
permissible contamination levels defined at different stages of the life of the
instrument and satellite
3.2.14 contamination potential
potential amount of contaminant in the source which can produce
contamination
3.2.15 controlled area
environmentally controlled area, operated as a cleanroom, with two pre-filter
stages but without the final stage of HEPA (or better) filters used in cleanrooms
3.2.16 fibre
particle with a length to diameter ratio of 10 or more
3.2.17 FTIR spectrometer
analyser (chemical identification) of organic and inorganic contamination using
infrared wavelengths
3.2.18 HEPA particle filter
throwaway, extended-medium, dry type filter in a rigid frame that has a
minimum particle-collection efficiency of 99,97 % (that is a maximum particle
penetration of 0,03 %) for 0,3 µm thermally generated DOP or specified
alternative aerosol
3.2.19 induced contaminant environment
environment created by the presence of contaminating items
3.2.20 molecular contamination
airborne or surface contamination (vapour, gas, liquid, or solid) without
observable dimensions (i.e. with dimensions at molecular level)
3.2.21 monitoring
to perform routine, quantitative measurements of environmental parameters in
and around cleanrooms, clean zones, and other clean areas, including
contamination parameters
3.2.22 non-volatile residue (NVR)
quantity of residual soluble, suspended, and particulate matter remaining after
the controlled evaporation of a volatile liquid at a specified temperature
3.2.23 obscuration factor (OF)
ratio of the projected area of all particles to the total surface area on which they
rest
3.2.24 offgassing
evolution of gaseous products from a liquid or solid material into an
atmosphere
3.2.25 outgassed quantity
total quantity of outgassed species expressed as a mass (e.g. gram or percent of
the initial specimen) or as pressure × volume (e.g. hPa × m )
3.2.26 outgassing
evolution of gaseous species from a material, usually in vacuum
NOTE Outgassing also occurs in a higher-pressure
environment.
3.2.27 particle
unit of matter with observable length, width and thickness
3.2.28 particle fallout
accumulated deposit of particulate matter on a surface
3.2.29 particle size
apparent maximum linear dimension of a particle in the plane of observation as
observed with an optical microscope, or the equivalent diameter of a particle
detected by automatic instrumentation
NOTE The equivalent diameter is the diameter of a
reference sphere having known properties and
producing the same response in the sensing
instrument as the particle being measured.
3.2.30 particulate
of or relating to minute separate particles
3.2.31 particulate contamination (PAC)
airborne or surface contamination due to particles
3.2.32 plume
exhaust (molecules or particles) of thrusters and engines
3.2.33 purging
supply of clean gas to protect the critical hardware from contamination
3.2.34 quartz crystal microbalance (QCM)
device for measuring small quantities of mass deposited on a quartz crystal
using the properties of a crystal oscillator
3.2.35 ram direction
in the direction of velocity vector
3.2.36 sensitive item
item whose contamination may affect its performance or life time
3.2.37 ULPA particle filter
throwaway, extended-medium, dry-type filter in a rigid frame that has a
minimum particle-collection efficiency of 99,999 % (that is, a maximum particle
penetration of 0,001 %) for particles in the size range of 0,1 µm to 0,2 µm
3.2.38 venting
conveying unwanted gaseous products through an aperture
3.2.39 visibly clean
absence of surface contamination when examined with a specific light source,
angle of incidence and viewing distance using normal or magnified vision
3.2.40 wake direction
direction opposite to the velocity vector
3.2.41 witness sample
sample used to collect contaminants during exposure, usually in an
environmentally controlled area, and then analysed or measured
3.3 Abbreviated terms
For the purpose of this Standard, the abbreviated terms from ECSS-S-ST-00-01
and the following apply:
Abbreviation Meaning
American Chemical Society
ACS
assembly, integration and testing
AIT
assembly, integration and verification
AIV
atomic oxygen
AO
beginning of life
BOL
contamination control
CC
cleanliness and contamination control plan
C&CCP
cleanliness requirement specification
CRS
collected volatile condensable material
CVCM
deionised water
DIW
declared materials list
DML
dioctylphthalate
DOP
environmental control and life support
ECLS
electrical ground support equipment
EGSE
electromagnetic compatibility
EMC
end of life
EOL
extra vehicular activity
EVA
Fourier transform infrared
FTIR
ground support equipment
GSE
high-efficiency particulate air filter
HEPA
internal contamination control
ICC
isopropyl alcohol
IPA
infrared
IR
low Earth orbit
LEO
mechanical ground support equipment
MGSE
multi layer insulation
MLI
molecular contamination
MOC
manufacturing readiness review
MRR
non-volatile residue
NVR
obscuration factor
OF
particulate contamination
PAC
product definition review
PDR
particle fallout
PFO
parts, materials and processes
PMP
quartz crystal microbalance
QCM
relative humidity
RH
room temperature
RT
recovered mass loss
RML
system requirement review
SRR
thermal balance
TB
total mass loss
TML
test readiness review
TRR
thermal vacuum
TV
ultra-violet
UV
ultra-low-particle air filter
ULPA
vacuum balance quartz crystal
VBQC
volatile condensable material
VCM
Principles
The cleanliness and contamination control process is applied all along the
project life cycle, from the definition of the C&CCP programme during the early
phases (see clause 5.1) until its implementation during phases B, C, D, E and F
(see clause 5.2) through the systematic verification of the cleanliness
requirements baseline including: predictions through contamination modelling
and the establishment of agreed procedures (see clause 5.3 and 5.4) for:
environments control (see clause 5.3) packaging, containerization,
transportation and storage of the space system.
NOTE Figure C-1 of Annex C gives an overview of an
example of a cleanliness and contamination process.
Requirements
5.1 Cleanliness and contamination control programme
5.1.1 General
a. The supplier shall define and implement a cleanliness and contamination
control programme for each level of configuration.
NOTE 1 Surveys can also be made to determine the
contamination control requirements, based on
mission objectives and scenarios.
NOTE 2 The objective of this programme is, starting from
the mission performance requirements, to establish
cleanliness and contamination levels to be
achieved at different manufacturing, AIT and
mission stages.
NOTE 3 In general, the organization of regular workshops
dedicated to cleanliness and contamination control
for a specific programme is a good practice.
b. The supplier shall establish measures for the coordination and resolution
of cleanliness and contamination control issues among the parties
involved in the project.
5.1.2 Documentation
5.1.2.1 Contamination requirements specification
a. The supplier shall define and document cleanliness requirements in a
cleanliness requirement specification (CRS), in conformance with the
DRD in Annex A.
b. The CRS shall be defined as early as possible in the programme, in order
to properly address it during the design phase and provided at the latest
at SRR, as part of the review data package.
NOTE Cleanliness is of fundamental importance for the
space system’s performance.
c. The CRS should be prepared in collaboration with users and engineers
from the different disciplines.
NOTE Users can be, for example, experimenters or
scientists.
d. In case the CRS cannot be produced at an early stage of the design, a
cleanliness control policy document shall be used.
NOTE 1 The cleanliness control policy document gives the
correlation data between acceptable performance
losses and the contamination levels from library
search or from tests that are performed.
NOTE 2 The cleanliness control policy document can
become the CRS during the development of the
design.
5.1.2.2 Contamination and Cleanliness Control Plan
a. In reply to the CRS, the supplier shall establish a cleanliness and
contamination control plan (C&CCP) in conformance with the DRD in
Annex B (C&CCP DRD), to be provided at the latest at PDR, as part of
the review data package.
5.1.3 Contamination budget
a. As part of the CRS (see Annex A), a contamination budget (allocations)
shall be established.
NOTE This budget determines the maximum allowed on
ground and in-orbit molecular and particulate
contamination levels.
b. The specified contamination levels shall be derived from the acceptable
performance losses simulated through dedicated modelling.
5.1.4 Contamination predictions
a. As part of the C&CCP (see Annex B), particulate and molecular
contamination predictions shall be established.
NOTE Contamination predictions are done in order to
estimate the expected on ground and in-orbit
molecular and particulate contamination levels.
b. These predictions shall be updated to evaluate the molecular and
particulate contamination levels generated during all on ground activities
and during launch and in-orbit phases.
NOTE Ground activities can be MAIT, storage,
transportation, launch preparation.
c. Modelling techniques shall be used to predict “in orbit“ contamination
levels.
NOTE Examples of modelling techniques are given in
Annex F.
d. For each on ground activity, for launch and in-orbit phases, the following
items shall be identified in the contamination prediction:
1. the seen environment,
2. the sensitive surfaces,
3. the duration of the exposure to this environment, and
4. the potential means of protection.
e. During all on ground activities, the contamination predictions shall be
consolidated with the results of molecular and particulate monitoring.
5.1.5 Contamination prediction with respect to
budget
a. The contamination predictions for all the different phases shall be
compared to the cleanliness requirements, i.e. contamination budget.
NOTE For example, for of such phases are MAIT, BOL
and EOL
b. If the contamination predictions or when available actual measurements,
result in a higher than the specified level, then corrective actions and
precautions to reduce contamination shall be investigated and
implemented.
NOTE The linear dependency of MOC and PAC as a
function of time is not always valid for longer
periods.
5.1.6 Cleanliness and contamination process flow
chart
a. The supplier shall establish a contamination and contamination process
flow chart.
NOTE An example of cleanliness and contamination process
flow chart is given in Figure C-1 of Annex C.
b. Whenever the CRS requirements are not met, countermeasures should be
prioritized from the most to the least preferred.
NOTE The most preferred is categorized as “1”and the least
preferred as “4” in the example given in Figure C-1.
5.2 Phases
5.2.1 Design
5.2.1.1 General design aspects
a. The level of sensitivity to contamination shall be one of the drivers in the
initial design.
b. The design shall be cleanliness oriented.
NOTE 1 A way to implement a cleanliness oriented design
is given in Annex E.
NOTE 2 Such design can contribute to achieve the
contamination levels defined by the CRS on
ground as well during the launch and mission.
NOTE 3 A way to achieve the target contamination levels
can be found in Annex D.
c. When the design baseline is incompatible with cleanliness requirements,
the design changes shall be identified and corrective actions shall be
taken in close cooperation with all levels involved.
5.2.1.2 Materials selection
a. When the offgassing effect of a material is a selection criteria, the supplier
shall apply ECSS-Q-ST-70-29.
NOTE For modelling the molecular contamination during
on-ground activities, when outgassing data are too
conservative, offgassing data are advisable.
b. For the particulate contamination, the supplier shall apply ECSS-Q-ST-
70-50.
c. When the microbiological contamination effect is a selection criteria, the
supplier shall apply ECSS-Q-ST-70-55.
d. When sterilization and material compatibility is a selection criteria, the
supplier shall apply ECSS-Q-ST-70-53.
e. For the outgassing screening of materials, the supplier shall apply ECSS-
Q-ST-70-02.
f. The outgassing requirements shall be based on the quantity of material
concerned, and the specific environmental conditions.
NOTE Specific environmental conditions can be available
volumes and temperatures.
g. When contamination sensitive items are involved or for materials in the
vicinity of cryogenic surfaces, more stringent requirements shall apply.
NOTE Those more stringent requirements are specified in
clauses 5.2.1.2h to 5.2.1.2j.
h. The outgassing criteria for materials in the vicinity of sensitive items
around RT shall conform to Table 5-1.
i. The outgassing criteria for materials in the vicinity of sensitive items at
temperature below RT shall conform to Table 5-2.
j. The outgassing criteria for materials in the vicinity of cryogenic surfaces
shall conform to Table 5-3.
k. Volatile metals shall not be used.
NOTE 1 This is especially the case when the temperatures
are above room temperatures.
NOTE 2 Some metals such as cadmium and zinc have high
vapour pressures and deposit metallic films can
occur on adjacent surfaces.
Table 5-1: Outgassing criteria for materials in the vicinity of
sensitive items around RT
Mass of material concerned
CVCM (%) RML (%)
(g)
>100 < 0,01 < 1
10 - 100 < 0,05 < 1
< 10 < 0,1 < 1
Table 5-2: Outgassing criteria for materials in the vicinity of
sensitive items at temperature below RT
Mass of material concerned
CVCM (%) RML (%)
(g)
>100 < 0,01 < 0,1
10 - 100 < 0,05 < 1
< 10 < 0,1 < 1
Table 5-3: Outgassing criteria for materials in the vicinity of
cryogenic surfaces
Mass of material concerned
CVCM (%) TML (%)
(g)
>100 < 0,01 < 0,1
10 - 100 < 0,05 < 1
< 10 < 0,1 < 1
5.2.2 MAIT
5.2.2.1 Manufacturing
a. Personnel involved in the manufacturing of sensitive items shall be
trained with respect to the cleanliness control policy.
b. All elements manufactured in non-controlled areas or under non-clean
conditions shall be the object of a cleaning process until the cleanliness
requirements are met, before they are packaged for delivery.
c. Cleaning and packaging operations for all elements shall be processed
according to procedures approved by the customer for the specific
application/product.
d. Elements that can be cleaned after manufacturing shall be cleaned till the
cleanliness requirements are met.
e. For elements that cannot be cleaned after manufacturing, then
manufacturing and assembling areas shall meet the cleanliness level
requirements specification.
f. The conformity of the manufacturing facilities shall be verified during
MRR or TRR.
g. An audit of the manufacturing facilities shall be performed according to
ECSS-Q-ST-10 clause 5.2.3 criteria.
h. An audits shall be held after problems have already occurred or as part
of a plan to establish if facilities and personnel are adequate.
5.2.2.2 Assembly and Integration
a. Involved personnel shall be trained with respect to the cleanliness policy.
b. Critical and sensitive elements shall only be exposed when necessary.
NOTE Exposition of sensitive and critical elements during
optical calibration or alignment cannot be avoided.
c. When an exposure of sensitive and critical elements cannot be avoided,
the exposure time and conditions shall be recorded.
d. A set of assembly tools and equipment for assembly and integration shall
be used and maintained in clean conditions.
e. Procedures for assembly and integration shall be established for critical
item assembly.
f. For the selection of the cleanroom, the allocated contamination budget
and the duration of the integration shall be known.
NOTE The correlation between the airborne contamination
and the particle fallout for normal cleanrooms is
basically known (see clause 5.3.1), and so a rough
estimate can be made of the type of cleanroom
required. A practical contamination level for the
cleanroom can be measured with representative
activities and a representative number of operators.
The expected contamination levels depend on the
type of protection applied to critical hardware (e.g.
covers, shields and purging).
g. The conformity of the facilities shall be verified during MRR or TRR.
h. An audit of the integration facilities shall be performed according to
ECSS-Q-ST-10 clause 5.2.3 criteria.
i. An audit shall be held after problems have already occurred or as part of
a plan to establish if facilities and personnel are adequate.
5.2.2.3 Testing
a. Involved personnel shall be trained with respect to the cleanliness policy.
b. For test centres, ECSS-Q-ST-20-07 shall apply.
c. The conformity of the facilities shall be verified during MRR or TRR.
d. An audit of the test facilities shall be performed according to ECSS-Q-ST-10
clause 5.2.3 criteria.
e. An audit shall be held after problems have already occurred or as part of
a plan to establish if facilities and personnel are adequate.
5.2.3 pre-launch and launch
5.2.3.1 General
a. Personnel involved in pre-launch activities shall be trained with respect
to the cleanliness policy.
b. The space system shall be shipped to the launch base under clean
conditions as defined in the CRS and controlled by the C&CCP.
c. The potential contamination during launch preparation shall be also
controlled.
NOTE This can be done through the C&CCP or through
specific launch base procedures approved by the
project.
d. Contamination during launch shall be controlled through preventive
actions and specific design provisions.
NOTE Preventive actions can consist of cleaning and
purging of the fairing. Specific design provisions
can consist of shields controlling the
depressurization.
5.2.3.2 Specific design provisions
a. Launcher parts, shall be clean in order to avoid contamination of the
clean items of the space system.
NOTE Launcher parts can be fairings and mechanical
systems for double or multiple launches.
b. The materials of the hardware in the vicinity of the space system shall
meet the same outgassing and surface-cleanliness requirements as the
space system itself.
c. The building environment in which the spacecraft is put inside the
fairing shall be compatible with the spacecraft characteristics.
NOTE 1 Specific spacecraft design provisions can be
protection mechanisms used to limit the launch
contaminants, especially the “unknown” figure of
particle transfer during launch.
NOTE 2 A second design aspect is the location of the
contamination-sensitive items with respect to the
position of thrusters and of pyrotechnics or other
contamination sources.
NOTE 3 The reflection by atmospheric molecules (i.e.
atmospheric scattering) or by outgassing
molecules (i.e. self-scattering) can take place and
some form of modelling is of interest.
5.2.4 Mission
a. External contamination control during mission shall be done through
preventive actions, specific design provisions and operations.
NOTE 1 Preventive actions include materials selection (see
clause 5.5.3 in ECSS-Q-ST-70-02), bakeout (see
clause 5.4.3.2) and purging (see clause 5.4.3.3).
NOTE 2 Specific design provisions include the
implementation of heaters for decontamination of
sensitive surfaces, of shutters and baffles.
NOTE 3 Operations include shielding during dumping,
thrusters firing or venting,, decontamination of
sensitive surfaces through exposure to the Sun.
b. Fluids that can emerge to the exterior by leakage or intentional use of
valves shall be considered in the design and operational requirements of
system and equipment hardware.
c. A specific analysis shall be performed to ensure an optimum level of
detection, location and isolation techniques.
NOTE These fluids are originating from thermal,
environmental or life support systems or
subsystems or released due to crew activities
(nutrients, wastes), during maintenance and r
...