High-level test description table for development of production test programs

Hochrangige Testbeschreibungstabelle für die Entwicklung von Produktionstestprogrammen

Tableau de description d’essais de haut niveau pour l’élaboration des programmes d’essai de production

Tabela visokonivojskega opisa preizkusov za razvoj proizvodnih preizkusnih programov

General Information

Status
Not Published
Public Enquiry End Date
30-Sep-2025
Current Stage
4020 - Public enquire (PE) (Adopted Project)
Start Date
17-Jul-2025
Due Date
04-Dec-2025
Completion Date
23-Oct-2025

Overview

The oSIST prEN IEC 63569:2025 standard, titled High-level test description table for development of production test programs, is developed by the International Electrotechnical Commission (IEC) under Technical Committee 91 (Electronics Assembly Technology). This international standard focuses on standardizing the upstream design process in test program development, specifically through the use of a High-Level Test Description Table (HTD Table).

The HTD Table method addresses the challenge of creating structured, clear, and efficient test programs for automated test systems (ATS) in industrial automation and electronics assembly. It ensures a comprehensive approach by integrating customer requirements, hardware specifications, basic test specifications, and quality information, thereby improving test program quality and accelerating time to market.

Key Topics

  • High-Level Test Description Table (HTD Table):
    A formal, hierarchical table organizing test requirements and related data. It visually represents test flows and details across multiple layers for clarity and manageability.

  • Upstream Design Process:
    Standardizes the initial, crucial phase of test program development by providing a clear and reproducible methodology. This step is vital in ensuring the final program's effectiveness and efficiency.

  • Frames and Structure:
    The HTD Table comprises six main frames arranged left to right, which are consistent for all tests:

    1. Test process description (test flow)
    2. Power supply configuration
    3. Signal source configuration of Unit Under Test (UUT)
    4. Measurement equipment setup and methods
    5. Test result processing
    6. Notes and additional information
  • Inputs for Test Program Development:
    Four primary inputs feed into the test program:

    • Customer requirements (e.g., product features, environment constraints)
    • Hardware specifications of the UUT (interfaces, power supply, etc.)
    • Basic test specifications (targeted UUT functions)
    • Quality information (historical faults and preventive measures)
  • Flexibility and Extensibility:
    The HTD Table allows additional frames or columns to be added depending on specific test requirements and complexity.

Applications

The oSIST prEN IEC 63569:2025 standard is highly valuable for:

  • Manufacturers of electronic products and automated test systems:
    Standardized test program design reduces development costs, enhances test reliability, and improves product quality.

  • Test program developers and engineers:
    Provides a clear, structured template for specifying test flows, configurations, and measurements, fostering consistent program development and communication.

  • Quality assurance teams:
    Facilitates traceability and documentation, ensuring thorough coverage of test cases and efficient detection of potential failures.

  • Large enterprises and SMEs alike:
    By applying a common framework, companies regardless of size can enhance their test development efficiency and reduce redundancy.

Related Standards

  • IEC 61671 (IEEE Std 1671):
    Provides relevant terminology used within the test program development context and complements oSIST prEN IEC 63569:2025 in definitions and descriptions.

  • Standards on automated test systems and electronics assembly technology under IEC TC 91:
    Support broader aspects of product manufacturing and testing, addressing automation, equipment, and quality protocols.

  • ISO and IEC Electropedia Terminology Resources:
    Offer comprehensive technical glossaries that enhance understanding of terms used in oSIST prEN IEC 63569:2025 and related documentation.


Keywords: High-Level Test Description Table, HTD Table, production test programs, upstream design process, automated test systems, electronics assembly, test program standardization, IEC 63569, industrial automation testing, test development workflow, electronics quality assurance.

Draft

oSIST prEN IEC 63569:2025

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Frequently Asked Questions

oSIST prEN IEC 63569:2025 is a draft published by the Slovenian Institute for Standardization (SIST). Its full title is "High-level test description table for development of production test programs". This standard covers: High-level test description table for development of production test programs

High-level test description table for development of production test programs

oSIST prEN IEC 63569:2025 is classified under the following ICS (International Classification for Standards) categories: 25.040.01 - Industrial automation systems in general; 35.240.50 - IT applications in industry. The ICS classification helps identify the subject area and facilitates finding related standards.

You can purchase oSIST prEN IEC 63569:2025 directly from iTeh Standards. The document is available in PDF format and is delivered instantly after payment. Add the standard to your cart and complete the secure checkout process. iTeh Standards is an authorized distributor of SIST standards.

Standards Content (Sample)


SLOVENSKI STANDARD
01-september-2025
Tabela visokonivojskega opisa preizkusov za razvoj proizvodnih preizkusnih
programov
High-level test description table for development of production test programs
Ta slovenski standard je istoveten z: prEN IEC 63569:2025
ICS:
25.040.01 Sistemi za avtomatizacijo v Industrial automation
industriji na splošno systems in general
35.240.50 Uporabniške rešitve IT v IT applications in industry
industriji
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

91/2040/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 63569 ED1
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2025-07-04 2025-09-26
SUPERSEDES DOCUMENTS:
91/1993/CD, 91/2031/CC
IEC TC 91 : ELECTRONICS ASSEMBLY TECHNOLOGY
SECRETARIAT: SECRETARY:
Japan Mr Osamu IKEDA
OF INTEREST TO THE FOLLOWING COMMITTEES: HORIZONTAL FUNCTION(S):

ASPECTS CONCERNED:
SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING
Attention IEC-CENELEC parallel voting
The attention of IEC National Committees, members of
CENELEC, is drawn to the fact that this Committee Draft for
Vote (CDV) is submitted for parallel voting.
The CENELEC members are invited to vote through the
CENELEC online voting system.
This document is still under study and subject to change. It should not be used for reference purposes.
Recipients of this document are invited to submit, with their comments, notification of any relevant patent rights of which they
are aware and to provide supporting documentation.
Recipients of this document are invited to submit, with their comments, notification of any relevant “In Some Countries”
clauses to be included should this proposal proceed. Recipients are reminded that the CDV stage is the final stage for
submitting ISC clauses. (SEE AC/22/2007 OR NEW GUIDANCE DOC).

TITLE:
High-level test description table for development of production test programs

PROPOSED STABILITY DATE: 2031
NOTE FROM TC/SC OFFICERS:
electronic file, to make a copy and to print out the content for the sole purpose of preparing National Committee positions.
You may not copy or "mirror" the file or printed version of the document, or any part of it, for any other purpose without
permission in writing from IEC.

IEC CDV 63569 © IEC 2025 2 91/2040/CDV

2 CONTENTS
4 FOREWORD . 3
5 INTRODUCTION . 5
6 1 Scope . 6
7 2 Normative references . 6
8 3 Terms and definitions . 6
9 4 High-Level Test Description Table (HTD Table) . 6
10 4.1 Frame (Including Columns) . 8
11 4.1.1 First Frame . 9
12 4.1.2 Second Frame . 9
13 4.1.3 Third Frame . 10
14 4.1.4 Fourth Frame . 11
15 4.1.5 Fifth Frame . 11
16 4.1.6 Sixth Frame (Note) . 12
17 4.2 Row . 13
18 4.3 Cell . 13
19 Annex A Visualization of Test Hierarchy . 14
21 Figure 1 – Test Program Development Flow Using HTD Table . 7
22 Figure 2 – Sample of HTD Table . 8
24 Table A.1 – Example of a Summary Table of Individual Function Test Flow . 14
IEC CDV 63569 © IEC 2025 3 91/2040/CDV

27 INTERNATIONAL ELECTROTECHNICAL COMMISSION
28 ____________
30 HIGH-LEVEL TEST DESCRIPTION TABLE FOR DEVELOPMENT OF PRODUCTION
31 TEST PROGRAMS
33 FOREWORD
34 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national
35 electrotechnical committees (IEC National Committees). The object of IEC is to promote international co -operation on all
36 questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities ,
37 IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS)
38 and Guides (hereafter referred to as "IEC Publication(s)"). Their preparation is entrusted to technical committees; any IEC
39 National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental
40 and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with
41 the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between
42 the two organizations.
43 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus
44 of opinion on the relevant subjects since each technical committee has representation from all interested IEC National
45 Committees.
46 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in
47 that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC
48 cannot be held responsible for the way in which they are used or for any misinterpretation by any end user.
49 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to
50 the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and
51 the corresponding national or regional publication shall be clearly indicated in the latter.
52 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment
53 services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by
54 independent certification bodies.
55 6) All users should ensure that they have the latest edition of this publication.
56 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of
57 its technical committees and IEC National Committees for any personal injury, property damage or other damage of any
58 nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publicatio n,
59 use of, or reliance upon, this IEC Publication or any other IEC Publications.
60 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable
61 for the correct application of this publication.
62 9) IEC and ISO draw attention to the possibility that the implementation of this document may involve the use of (a) patent(s).
63 IEC and ISO take no position concerning the evidence, validity or applicability of any claimed patent rights in respect thereof.
64 As of the date of publication of this document, IEC and ISO had not received notice of (a) patent(s), which may be required
65 to implement this document. However, implementers are cautioned that this may not represent the latest information, which
66 may be obtained from the patent database available at https://patents.iec.ch and/or www.iso.org/patents. EC and ISO sh all
67 not be held responsible for identifying any or all such patent rights.
68 IEC 63569 has been prepared by subcommittee WG15: Design Automation, of IEC technical committee
69 TC19. Electronics assembly technology. It is an International Standard.
70 The text of this International Standard is based on the following documents:
Draft Report on voting
XX/XX/FDIS XX/XX/RVD
72 Full information on the voting for its approval can be found in the report on voting indicated in the above
73 table.
74 The language used for the development of this International Standard is English.
75 This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in accordance
76 with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available at

IEC CDV 63569 © IEC 2025 4 91/2040/CDV

77 www.iec.ch/members_experts/refdocs. The main document types developed by IEC are described in
78 greater detail at www.iec.ch/publications.
79 The committee has decided that the contents of this document will remain unchanged until the stability
80 date indicated on the IEC website under webstore.iec.ch in the data related to the specific document.
81 At this date, the document will be
82 • reconfirmed,
83 • withdrawn,
84 • replaced by a revised edition, or
85 • amended.
IEC CDV 63569 © IEC 2025 5 91/2040/CDV

87 INTRODUCTION
88 The test program development process is divided into two stages, an upstream design process to clarify
89 the flow of program development, and a detailed design process to embody and execute the program
90 development flow using a programming language. The detailed design process is generally a program
91 description process using the Program Development Environment.
92 The upstream design process is not explicitly described in the relevant standards in general, and it is
93 left to the test program developer to decide how to execute the upstream design process. As a result,
94 the upstream design process is rarely standardized. In addition, the tools used to execute the upstream
95 design process are not standardized. These two factors create an "invisible process" in the upstream
96 design process.
97 Large companies are aware that the degree of completion of the upstream design process greatly affects
98 the quality of the final program, and therefore, they invest significant resources and costs in the
99 upstream design process of test program development. However, the upstream design process of large
100 companies is unique, and large companies do not share upstream design techniques as standard design
101 techniques. Therefore, large companies also incur extra costs by redeveloping from scratch each time
102 they develop a test program. On the other hand, companies with inferior financial and technological
103 capabilities are often unable to devote sufficient resources to upstream design.
104 It would be very beneficial for any manufacturer, regardless of the size of the company, to be able to
105 use standardized mechanisms and tools to easily perform upstream design with a high degree of
106 completeness, because this standardization will contribute to improving the market quality of final
107 products and accelerating the time to market, To achieve international standardization in this area
IEC CDV 63569 © IEC 2025 6 91/2040/CDV

109 HIGH-LEVEL TEST DESCRIPTION TABLE FOR DEVELOPMENT OF PRODUCTION
110 TEST PROGRAMS
112 Scope
113 This standard specifies the method for High-Level Test Description Table (HTD Table) for development
114 of production test program. High-level test description technology is a test verification technology that
115 takes into account the various operating environments of electronic equipment and systems. It is a
116 technology to effectively deploy the process of test program design and development, which was
117 developed to accurately and efficiently conduct electronic equipment and system tests.
118 The upstream design of a test program for an automated test system (ATS) is a complex process that
119 involves Test Requirement Data, Unit Under Test (UUT) Data, Diagnostics Data, Prognostics Data, and
120 Program Development Environment. It is the most important process in the verification of system test
121 products. Standardization of the upstream design of test programs is in line with the efficiency
122 requirements of the testing field.
123 Normative references
124 There are no normative references in this document.
125 Terms and definitions
126 For the purposes of this document, the terms and definitions given in IEC61671(IEEE Std 1671) apply.
127 ISO and IEC maintain terminology databases for use in standardization at the following addresses:
128 • IEC Electropedia: available at https://www.electropedia.org/
129 • ISO Online browsing platform: available at https://www.iso.org/obp
130 High-Level Test Description Table (HTD Table)
131 The following four documents are necessary to prepare for developing test program as inputs.
132 1) Customer requirements
133 2) UUT Hardware specifications
134 3) Basic test specifications
135 4) Quality information
136 The test program for the development of the High-Level Test Program is described by a description
137 containing the rules to which the above four files relate, and HTD Table, a table of test requirements
138 described in a formal format.
139 The Test Requirement Description Standard for High-Level Test Program Development assumes that
140 the specification of test verification is described by means of HTD Table. HTD Table is a visual means
141 of organizing and displaying test information/data and describes the basic elements of the test. Because
142 detailed tests can be difficult to decipher if described on a single Test Requirements Table for all tests,
143 the test program developer should describe HTD Table in a hierarchical manner. Figure 1 shows the
144 test program development flow using HTD Table with four inputs.
145 1) Customer requirements
146 These are what customer ask the product to meet. From the customer requirements, we identify
147 what features are necessary to realize on the product, such as communication, sensor and actuator
148 controls, security functions, operation temperature range and the others.

IEC CDV 63569 © IEC 2025 7 91/2040/CDV

149 2) UUT Hardware specifications
150 These include specifications for interfaces (Ethernet, USB, LED, etc.), power supply, and so on.
151 3) Basic test specifications
152 This specifies which UUT function of the product should be tested.
153 4) Quality information
154 This information is about faults and failures that have occurred in the past for similar products and
155 the test countermeasures to prevent reoccurrence. Most manufactures have their own knowledge
156 database on the past faults/failure experiences and countermeasures. Test-related issues and
157 countermeasures among them should be included in this document.
160 Figure 1 – Test Program Development Flow Using HTD Table
161 HTD Table consists of 6 frames. Each frame can be extended and additional Frames added. The frame
162 consists of the row with a column. Column is included in each fram
...

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