SIST EN 55017:2011

SLOVENSKI STANDARD
SIST EN 55017:2011
01-november-2011
Postopki za merjenje dušenja pasivnih EMC filtrskih naprav (CISPR 17:2011)
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Verfahren zur Messung der Entstöreigenschaften von passiven EMV-Filtern (CISPR
17:2011)
Méthodes de mesure des caractéristiques d'antiparasitage des dispositifs de filtrage
CEM passifs (CISPR 17:2011)
Ta slovenski standard je istoveten z: EN 55017:2011
ICS:
33.100.99 Drugi vidiki v zvezi z EMC Other aspects related to
EMC
SIST EN 55017:2011 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN 55017:2011

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SIST EN 55017:2011

EUROPEAN STANDARD
EN 55017
NORME EUROPÉENNE
September 2011
EUROPÄISCHE NORM

ICS 33.100.01


English version


Methods of measurement of the suppression characteristics of passive
EMC filtering devices
(CISPR 17:2011)


Méthodes de mesure des caractéristiques Verfahren zur Messung der
d'antiparasitage des dispositifs de filtrage Entstöreigenschaften von passiven EMV-
CEM passifs Filtern
(CISPR 17:2011) (CISPR 17:2011)





This European Standard was approved by CENELEC on 2011-07-15. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the CEN-CENELEC Management Centre or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the CEN-CENELEC Management Centre has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus,
the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy,
Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia,
Spain, Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Management Centre: Avenue Marnix 17, B - 1000 Brussels


© 2011 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.

Ref. No. EN 55017:2011 E

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SIST EN 55017:2011
EN 55017:2011 - 2 -

Foreword
The text of document CISPR/A/941/FDIS, future edition 2 of CISPR 17, prepared by CISPR SC A,
"Radio-interference measurements and statistical methods", was submitted to the IEC-CENELEC parallel
vote and was approved by CENELEC as EN 55017 on 2011-07-15.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CEN and CENELEC shall not be held responsible for identifying any or all such patent
rights.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2012-04-15
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2014-07-15
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard CISPR 17:2011 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following note has to be added for the standard indicated:
CISPR 12:2007 NOTE  Harmonized as EN 55012:2007 (not modified).
__________

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SIST EN 55017:2011
- 3 - EN 55017:2011
Annex ZA
(normative)

Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.

Publication Year Title EN/HD Year

IEC 60050-161 - International Electrotechnical Vocabulary - -
(IEV) -
Chapter 161: Electromagnetic compatibility

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SIST EN 55017:2011

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SIST EN 55017:2011

CISPR 17
®

Edition 2.0 2011-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
INTERNATIONAL SPECIAL COMMITTEE ON RADIO INTERFERENCE
COMITÉ INTERNATIONAL SPÉCIAL DES PERTURBATIONS RADIOÉLECTRIQUES

Methods of measurement of the suppression characteristics of passive EMC
filtering devices

Méthodes de mesure des caractéristiques d’antiparasitage des dispositifs de
filtrage CEM passifs


INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX XB
ICS 33.100.01 ISBN 978-2-88912-526-5

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale

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SIST EN 55017:2011
– 2 – CISPR 17  IEC:2011
CONTENTS
FOREWORD . 6
INTRODUCTION . 8
1 Scope . 9
2 Normative references . 9
3 Terms, definitions and abbreviations . 9
3.1 Terms and definitions . 9
3.2 Abbreviations . 12
4 Classification of EMC filtering devices . 12
4.1 Insertion loss . 14
4.1.1 Insertion loss calculation . 14
4.1.2 Asymmetrical (common) mode . 14
4.1.3 Symmetrical (differential) mode . 14
4.1.4 Unsymmetrical mode . 14
4.2 Impedance . 14
4.3 S-parameters . 15
4.3.1 General . 15
4.3.2 Two-port S-parameters . 15
4.3.3 Four-port S-parameters . 16
5 Insertion loss measurement . 17
5.1 General . 17
5.2 Measurement set-up . 18
5.2.1 General . 18
5.2.2 Test equipment . 18
5.2.3 Asymmetrical (common mode) test circuit . 19
5.2.4 Symmetrical (differential mode) test circuit . 19
5.2.5 Unsymmetrical test circuit . 20
5.3 Measurement methods (procedure) . 21
5.3.1 General . 21
5.3.2 Measurement without bias . 22
5.3.3 Measurement with bias . 22
5.4 Calibration and verification . 23
5.4.1 General . 23
5.4.2 Validation of test set-up without bias . 23
5.4.3 Validation of test set-up with bias . 24
5.5 Uncertainty . 26
6 Impedance measurement . 26
6.1 General . 26
6.2 Direct method . 26
6.2.1 Measurement set-up and procedure . 26
6.2.2 Calibrations of the test set-up . 27
6.2.3 Measurement uncertainty . 27
6.3 Indirect method . 27
6.3.1 Measurement set-up and procedure . 27
6.3.2 Calibration of the test set-up . 29
6.3.3 Measurement uncertainty . 29
7 S-parameter measurement . 30

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SIST EN 55017:2011
CISPR 17  IEC:2011 – 3 –
7.1 Measurement set-up and procedure . 30
7.1.1 General . 30
7.1.2 Test fixture . 31
7.2 Calibration of test set-up . 36
7.3 Measurement uncertainties . 36
8 Presentation of results . 36
8.1 General . 36
8.2 Insertion loss . 37
8.3 Impedance . 37
8.4 S-parameters . 37
Annex A (normative) Uncertainty estimation for the measurement of the suppression
characteristics of EMC filtering devices . 38
Annex B (informative) Examples of test boxes for insertion loss measurement . 43
Annex C (informative) Insertion loss test methods with non-50 Ω systems . 47
Annex D (informative) Realization of the buffer-network for insertion loss
measurement . 49
Annex E (informative) Insertion loss measurement – General discussion . 51
Annex F (informative) Set-up for impedance measurement . 54
Annex G (informative) S-parameter measurement of common-mode choke coils . 59
Annex H (informative) Measurement set-up for S-parameters of a DUT without wire
leads . 64
Bibliography . 66

Figure 1 – Measurement arrangement for S-parameters of a two-terminal device . 15
Figure 2 – Measurement arrangement for S-parameters of a three-terminal device . 15
Figure 3 – Measurement arrangement for four-port S-parameters . 16
Figure 4 – Test circuit for insertion loss measurement (example: 4-line-filter) . 18
Figure 5 – Test circuit for asymmetrical insertion loss measurement (example:
4-line-filter) . 19
Figure 6 – Test circuit for symmetrical insertion loss measurement (example: 4-line-
filter) . 20
Figure 7 – Test circuit for unsymmetrical insertion loss measurement (example:
4-line filter) . 21
Figure 8 – Test circuit for insertion loss measurement without bias . 22
Figure 9 – Test circuit for insertion loss measurement with bias . 22
Figure 10 – Test circuit for verification of measurement circuit without bias . 23
Figure 11 – Test circuit for verification of measurement circuit with bias . 25
Figure 12 – One-port measurement of a two-terminal device . 28
Figure 13 – S-parameter measurements for evaluating the impedance of a device in a
series connection . 28
Figure 14 – S-parameter measurements for evaluating the impedance of a device in a
shunt connection. 28
Figure 15 – Two-port S-parameter measurement set-up . 30
Figure 16 – An alternative measurement system specifically for the insertion loss of a
DUT (using a combination of tracking generator and measuring receiver) . 31
Figure 17 – Symbolic expressions . 32
Figure 18 – Test fixture for a two-terminal device (series connection) . 32

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SIST EN 55017:2011
– 4 – CISPR 17  IEC:2011
Figure 19 – Test fixture for a two-terminal device (shunt connection) . 33
Figure 20 – Test fixture for a three-terminal filter . 33
Figure 21 – Test fixture for a two-terminal device with leads . 34
Figure 22 – Test fixture for a three-terminal filter with leads . 35
Figure 23 – Test fixture for a core device . 35
Figure 24 – Example of the standards for TRL calibration . 36
Figure B.1 – Design of typical test box for general-purpose filters . 43
Figure B.2 – 3D view of typical test box for general purpose filters . 44
Figure B.3 – Design of typical test box for feedthrough components . 45
Figure B.4 – 3D view of typical test box for feedthrough components . 45
Figure C.1 – Test circuit . 47
Figure D.1 – Example of connecting buffer-networks for test with bias . 49
Figure E.1 – Test circuit for insertion loss measurement, reference measurement
(filter replaced by a short circuit) . 51
Figure E.2 – Test circuit for insertion loss measurement, measurement of filter under test . 52
Figure F.1 – Measurement set-up for a leaded device (DUT) . 54
Figure F.2 – Four-terminal test fixture for a leaded device (DUT) . 55
Figure F.3 – Measurement set-up for an SMD . 55
Figure F.4 – Clamp-type test fixture . 56
Figure F.5 – Coaxial test fixture for an SMD . 56
Figure F.6 – Press-type test fixture for an SMD. 57
Figure F.7 – Connection for CMCC measurement . 57
Figure F.8 – Test fixture and measurement set-up for an SMD common-mode choke coil . 58
Figure G.1 – Common-mode choke coil . 59
Figure G.2 – Set-up for measurements of common-mode characteristics . 59
Figure G.3 – Test fixture for an SMD. 60
Figure G.4 – Test fixture for a leaded device . 60
Figure G.5 – Set-up for measurements of differential-mode characteristics . 61
Figure G.6 – Test fixture for an SMD. 61
Figure G.7 – Test fixture for a leaded device . 61
Figure G.8 – Set-up for measurement of four-port S-parameters . 62
Figure G.9 – Test fixture for the four-port S-parameters of an SMD . 62
Figure G.10 – Test fixture for the four-port S-parameters of a leaded device . 63
Figure H.1 – S-parameters measurement of a DUT without leads . 64
Figure H.2 – Procedure for TRL calibration . 65

Table 1 – Examples of EMC filtering devices . 13
Table 2 – Conditions and target values for validation of test set-up without bias . 24
Table 3 – Conditions and target values for validation of test set-up with bias . 25
Table A.1 – Measurement uncertainty of insertion loss (example) . 40
Table A.2 – Measurement uncertainty of impedance (example) . 41
Table A.3 – Measurement uncertainties of |S | and |S | (example) . 41
21 12
Table A.4 – Measurement uncertainties of |S | and |S | (example) . 41
11 22

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SIST EN 55017:2011
CISPR 17  IEC:2011 – 5 –
Table D.1 – Specifications of the elements of buffer-networks . 50

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SIST EN 55017:2011
– 6 – CISPR 17  IEC:2011
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________

METHODS OF MEASUREMENT OF THE SUPPRESSION
CHARACTERISTICS OF PASSIVE EMC FILTERING DEVICES


FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard CISPR 17 has been prepared by CISPR subcommittee A: Radio
interference measurements and statistical methods.
This second edition cancels and replaces the first edition published in 1981. It is a technical
revision.
This edition includes the following significant technical change with respect to the previous
edition: new measurement methods are added to characterize the more technologically
sophisticated EMC filtering devices currently available.
The text of this standard is based on the following documents:
FDIS Report on voting
CISPR/A/941/FDIS CISPR/A/951/RVD

Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.

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SIST EN 55017:2011
CISPR 17  IEC:2011 – 7 –
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.

IMPORTANT – The “colour inside” logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct understanding
of its contents. Users should therefore print this publication using a colour printer.

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SIST EN 55017:2011
– 8 – CISPR 17  IEC:2011
INTRODUCTION
The suppression characteristics of EMC filters and components used for the suppression of
EM disturbances, referred to in this standard as EMC filtering devices, are a function of
numerous variables such as impedance of the circuits to which they connect, operating
voltage and current, and ambient temperature. This standard specifies uniform test methods
that will enable comparison of filtering and suppression characteristics determined by test
laboratories or specified by manufacturers.
The first edition of CISPR 17 (1981) prescribed the measurement methods of insertion loss
mainly for power-line filters. Today, however, many types of sophisticated EMC filters and
suppression components can be found in various electronic devices. Those filters need to be
characterized using standardized measurement methods. New methods for measurement of
impedance and S-parameters for such EMI devices are included in this second edition.
In addition, the following insertion loss measurement methods from the first edition have been
deleted because they are no longer in use in the industry:
• measurement method with a bias voltage for insertion loss measurement,
• in situ method, and
• worst-case methods.

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SIST EN 55017:2011
CISPR 17  IEC:2011 – 9 –
METHODS OF MEASUREMENT OF THE SUPPRESSION
CHARACTERISTICS OF PASSIVE EMC FILTERING DEVICES



1 Scope
This International standard specifies methods to measure the radio interference suppression
characteristics of passive EMC filtering devices used in power and signal lines, and in other
circuits.
The defined methods may also be applied to combinations of over-voltage protection devices
and EMC filtering devices.
The measurement method covers the frequency range from 9 kHz to several GHz depending
on the device and test circuit.
NOTE Measurement methods in this standard may be applied up to 40 GHz.
The standard describes procedures for laboratory tests (type tests) as well as factory tests.
Test methods with and without bias conditions are defined.
Measurement procedures are provided for unbiased and bias conditions. Measurements
under bias conditions are performed to determine potential non-linear behaviour of the EMC
filtering devices such as saturation effects in inductors with magnetic cores. This testing
serves to show the usability in a specific application (such as frequency converters that
produce high amplitudes of common mode pulse current and thus may drive inductors into
saturation). Measurement under bias conditions may be omitted if the non-linear behaviour
can be determined by other methods (e.g. separate saturation measurement of the inductors
used).
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:
Electromagnetic compatibility
3 Terms, definitions and a
...