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ISO

ISO 20720:2018

(Main)

Microbeam analysis — Methods of specimen preparation for analysis of general powders using WDS and EDS

Microbeam analysis — Methods of specimen preparation for analysis of general powders using WDS and EDS

This document specifies specimen preparation methods for the analysis of particles in powders using energy-dispersive spectrometers (EDS) or wavelength-dispersive spectrometers (WDS) installed on an EPMA or SEM. The preparation methods for powder particle analysis are classified by the analytical purpose and the particle size. This document applies to inorganic particles larger than 100 nm and smaller than 100 µm in diameter. It applies only to analysis of "general" powders, which means that it excludes procedures for special applications such as forensic or trace analysis.

Analyse par microfaisceaux — Méthodes de préparation des échantillons pour l’analyse des particules

General Information

Status
Published
Publication Date
17-Oct-2018
ICS
71.040.99 - Other standards related to analytical chemistry
Technical Committee
ISO/TC 202 - Microbeam analysis
Drafting Committee
ISO/TC 202 - Microbeam analysis
Current Stage
9093 - International Standard confirmed
Completion Date
30-Apr-2024
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ISO 20720:2018 - Microbeam analysis -- Methods of specimen preparation for analysis of general powders using WDS and EDSISO 20720:2018 - Microbeam analysis -- Methods of specimen preparation for analysis of general powders using WDS and EDS
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ISO 20720:2018 - Microbeam analysis -- Methods of specimen preparation for analysis of general powders using WDS and EDS
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INTERNATIONAL ISO
STANDARD 20720
First edition
2018-10
Microbeam analysis — Methods of
specimen preparation for analysis of
general powders using WDS and EDS
Analyse par microfaisceaux — Méthodes de préparation des
échantillons pour l’analyse des particules
Reference number
ISO 20720:2018(E)
©
ISO 2018

---------------------- Page: 1 ----------------------
ISO 20720:2018(E)

COPYRIGHT PROTECTED DOCUMENT
© ISO 2018
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting
on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address
below or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: +41 22 749 01 11
Fax: +41 22 749 09 47
Email: copyright@iso.org
Website: www.iso.org
Published in Switzerland
ii © ISO 2018 – All rights reserved

---------------------- Page: 2 ----------------------
ISO 20720:2018(E)

Contents Page
Foreword .iv
Introduction .v
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Abbreviated terms . 1
[1]
5 Analytical purposes and methods of specimen preparation for particle analysis .1
5.1 Methods of specimen preparation for particle analysis . 1
5.2 Description of preparation methods . 2
5.2.1 Analysis of whole particles or surface of particles . 2
5.2.2 Analysis of cross-section of particles . 4
5.3 Choosing preparation methods . 5
6 Electric conductivity processing . 6
Annex A (informative) Examples of X-ray strength dependency on tablet-forming pressure .7
Annex B (informative) Example of X-ray strength dependency on tablet-forming particle size .8
Bibliography . 9
© ISO 2018 – All rights reserved iii

---------------------- Page: 3 ----------------------
ISO 20720:2018(E)

Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.
ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In partic
...

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