ISO 17470:2014
(Main)Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
ISO 17470:2014 gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.
Analyse par microfaisceaux — Analyse par microsonde électronique (Microsonde de Castaing) — Lignes directrices pour l'analyse qualitative ponctuelle par spectrométrie de rayons X à dispersion de longueur d'onde (WDX)
General Information
Relations
Standards Content (Sample)
INTERNATIONAL ISO
STANDARD 17470
Second edition
2014-01-15
Microbeam analysis — Electron
probe microanalysis — Guidelines
for qualitative point analysis
by wavelength dispersive X-ray
spectrometry
Analyse par microfaisceaux — Analyse par microsonde électronique
(Microsonde de Castaing) — Lignes directrices pour l’analyse
qualitative ponctuelle par spectrométrie de rayons X à dispersion de
longueur d’onde (WDX)
Reference number
ISO 17470:2014(E)
©
ISO 2014
---------------------- Page: 1 ----------------------
ISO 17470:2014(E)
COPYRIGHT PROTECTED DOCUMENT
© ISO 2014
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form
or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior
written permission. Permission can be requested from either ISO at the address below or ISO’s member body in the country of
the requester.
ISO copyright office
Case postale 56 • CH-1211 Geneva 20
Tel. + 41 22 749 01 11
Fax + 41 22 749 09 47
E-mail copyright@iso.org
Web www.iso.org
Published in Switzerland
ii © ISO 2014 – All rights reserved
---------------------- Page: 2 ----------------------
ISO 17470:2014(E)
Contents Page
Foreword .iv
Introduction .v
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Abbreviated terms . 2
5 Apparatus . 2
6 Procedure for identification . 2
6.1 General . 2
6.2 Setting of analysis conditions . 2
6.3 Method for analysing an X-ray spectrum. 4
6.4 Detection limit . 5
7 Test report . 6
Annex A (informative) Example of the test report on qualitative analysis of a stainless steel
sample by EPMA . 7
Bibliography .10
© ISO 2014 – All rights reserved iii
---------------------- Page: 3 ----------------------
ISO 17470:2014(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body intere
...
Questions, Comments and Discussion
Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.