ISO/TR 23276:2020

TECHNICAL ISO/TR
REPORT 23276
First edition
2020-08
Geometrical product specifications
(GPS) — Surface texture: Profile
method — Flowchart for PSm, RSm,
WSm and Pc, Rc, Wc
Reference number
©
ISO 2020
© ISO 2020
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ii © ISO 2020 – All rights reserved

Contents Page
Foreword .iv
Introduction .v
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
3.1 General terms . 1
3.2 Surface profile parameters . 3
4 Flowchart for parameters PSm, RSm, WSm and Pc, Rc, Wc . 6
4.1 General . 6
4.2 Part one — Calculation of peaks and valleys within the evaluation length . 7
4.3 Part two — Peak height discrimination and valley depth discrimination . 8
4.4 Part three — Merging of remaining peaks and valleys . 9
4.5 Part four — Calculation of roughness parameters XSm and Xc .10
Bibliography .11
Foreword
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iv © ISO 2020 – All rights reserved

Introduction
Feature characterization of rough surfaces is of growing interest in terms of a function-oriented
description of technical surfaces. A well-known set of feature parameters is the mean width and mean
height of profile elements defined in ISO 4287. Unfortunately, the definition given in ISO 4287 is
insufficient for an unambiguous implementation in a high-level programming language. Due to the lack
of a flowchart, results given by different software packages are not comparable. The main intention of
this document is to provide an unambiguous algorithm for feature parameters PSm , RSm , WSm and
Pc , Rc , Wc according to ISO 4287.
[5]
The flowchart defined in this document was developed by Seewig and Scott and represents an
[4]
extension of crossing the line segmentation proposed by Scott . The flowchart is based on new
knowledge gathered over the past 10 years.
TECHNICAL REPORT ISO/TR 23276:2020(E)
Geometrical product specifications (GPS) — Surface
texture: Profile method — Flowchart for PSm, RSm, WSm
and Pc, Rc, Wc
1 Scope
This document provides an unambiguous calculation of parameters PSm, RSm, WSm and Pc, Rc, Wc, as
defined in ISO 4287, by means of a flowchart.
2 Normative references
There are no normative references in this document.
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
ISO and IEC maintain terminological databases for use in standardization at the following addresses:
— ISO Online browsing platform: available at https:// www .iso .org/ obp
— IEC Electropedia: available at http:// www .electropedia .org/
3.1 General terms
3.1.1
profile
set of ordered pairs xz, which describe the intersection of a surface with a specified plane
()
Note 1 to entry: For every point x on the X-axis, there is exactly one ordinate z. The relation between x and z is
given by a formula zf= ()x .
Note 2 to entry: Usually profiles have value pairs xz, above and below the X-axis.
()
Note 3 to entry: In surface metrology three profiles are defined. The primary profile, the roughness profile and
the waviness profile. Each profile corresponds to a specific lateral scale.
3.1.2
evaluation length
lm
length in the direction of the X-axis used for assessing the profile under evaluation
[SOURCE: ISO 4287:1997, 3.1.10, modified — symbol changed from ln and notes to entry removed.]
3.1.3
profile peak
outwardly directed (from material to surrounding medium) portion of the assessed profile connecting
two adjacent intersection points of the profile and the X-axis
3.1.4
profile peak height
normal distance between the X-axis and the highest ordinate of the profile peak
3.1.5
profile valley
inwardly directed (from surrounding medium to material) portion of the assessed profile connecting
two adjacent intersection points of the assessed profile and the X-axis
3.1.6
profile valley depth
normal distance between the X-axis and the lowest ordinate of the profile valley
3.1.7
profile element
profile peak/valley and the adjacent profile valley/peak within the evaluation length
Note 1 to entry: Profile elements are calculated from the beginning to the end of the evaluation length and
vice versa.
3.1.8
profile element height
sum of the profile peak height and the profile valley depth of a profile element
3.1.9
profile element spacing
distance on the X-axis between the beginning of two adjacent profile elements
Note 1 to entry: The positive or negative portion of the assessed profile at the beginning or end of the evaluation
length is considered as an imperfect profile element and is used for the determination of the profile element
spacing.
3.1.10
profile peak height discrimination
minimum height of profile peaks of the assessed profile which is taken into account
Note 1 to entry: The minimum height of profile peaks is 10 % of Pp for primary profile parameters, 10 % of Rp for
roughness profile parameters and 10 % of Wp for waviness
...