IEC 60384-22:2004

INTERNATIONAL IEC
STANDARD 60384-22
First edition
2004-06
Fixed capacitors for use in electronic equipment –
Part 22:
Sectional specification:
Fixed surface mount multilayer capacitors
of ceramic dielectric, Class 2

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INTERNATIONAL IEC
STANDARD 60384-22
First edition
2004-06
Fixed capacitors for use in electronic equipment –
Part 22:
Sectional specification:
Fixed surface mount multilayer capacitors
of ceramic dielectric, Class 2
 IEC 2004  Copyright - all rights reserved
No part of this publication may be reproduced or utilized in any form or by any means, electronic or
mechanical, including photocopying and microfilm, without permission in writing from the publisher.
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmail@iec.ch Web: www.iec.ch
PRICE CODE
Commission Electrotechnique Internationale W
International Electrotechnical Commission
МеждународнаяЭлектротехническаяКомиссия
For price, see current catalogue

– 2 – 60384-22  IEC:2004(E)
CONTENTS
FOREWORD.4

1 General.6
1.1 Scope.6
1.2 Object.6
1.3 Normative references.6
1.4 Information to be given in a detail specification .7
1.5 Terminology.8
1.6 Marking.9
2 Preferred rating and characteristics .9
2.1 Preferred characteristics.9
2.2 Preferred values of ratings .10
3 Quality assessment procedures.11
3.1 Primary stage of manufacture.11
3.2 Structurally similar components.11
3.3 Certified records of released lots.11
3.4 Qualification Approval.12
3.5 Quality Conformance Inspection.18
4 Test and measurement procedures.20
4.1 Special preconditioning .20
4.2 Measuring conditions.20
4.3 Mounting.20
4.4 Visual examination and check of dimensions .20
4.5 Electrical tests.22
4.6 Temperature characteristic of capacitance .25
4.7 Shear test.26
4.8 Substrate bending test.26
4.9 Resistance to soldering heat .27
4.10 Solderability.28
4.11 Rapid change of temperature .29
4.12 Climatic sequence.30
4.13 Damp heat, steady state.31
4.14 Endurance.32
4.15 Robustness of terminations (only for capacitors with strip termination) .33
4.16 Component solvent resistance (if required).33
4.17 Solvent resistance of the marking (if required).33
4.18 Accelerated damp heat, steady state (if required).34

Annex A (normative) Guide for the specification and coding of dimensions of fixed
surface mount multilayer capacitors of ceramic dielectric, Class 2 .36
Annex B (informative) Capacitance ageing of fixed capacitors of ceramic dielectric,
Class 2 .37

60384-22  IEC:2004(E) – 3 –
Figure 1 – Fault: crack or fissure .21
Figure 2 – Fault: crack or fissure .21
Figure 3 – Separation or delamination .21
Figure 4 – Exposed electrodes.21
Figure 5 – Principal faces .22

Table 1 – Preferred values of category voltages .10
Table 2 – Preferred tolerances.10
Table 3 – Temperature characteristic of capacitance .11
Table 4 – Fixed sample size test plan for qualification approval, assessment level EZ .14
Table 5 – Tests schedule for qualification approval.15
Table 6a – Lot-by-lot inspection .19
Table 6b – Periodic test .19
Table 7 – Measuring conditions .22
Table 8 – Tangent of loss angle limits.23
Table 9 – Test voltages.24
Table 10 – Details of measuring conditions.26
Table 11 – Maximum capacitance change.28
Table 12 – Maximum capacitance change.29
Table 13 – Number of damp heat cycles .30
Table 14 – Final inspection, measurements and requirements .31
Table 15 – Final inspection, measurements and requirements .32
Table 16 – Endurance test conditions (U = U ) .32
C R
Table 17 – Endurance test conditions (U ≠ U ) .32
C R
Table 18 – Final inspection, measurements and requirements of endurance test .33
Table 19 – Initial requirements.34
Table 20 – Conditioning .34
Table A.1 – Dimensions .36

– 4 – 60384-22  IEC:2004(E)
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 22: Sectional specification:
Fixed surface mount multilayer capacitors
of ceramic dielectric, Class 2

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
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between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
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5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60384-22 has been prepared by IEC technical committee 40:
Capacitors and resistors for electronic equipment.
This standard and its related publications (CEI 60384-21, IEC 60384-21-1 and IEC 60384-22-1)
cancel and replace IEC 60384-10 (1989) and its Amendments 1 (1993) and 2 (2000) as well
as IEC 60384-10-1 (1989) and its Amendment 1 (1993).
The text of this standard is based on the following documents:
FDIS Report on voting
40/1422/FDIS 40/1453/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.

60384-22  IEC:2004(E) – 5 –
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.
A bilingual version of this standard may be issued at a later date.

The contents of the corrigendum of September 2004 have been included in this copy.

– 6 – 60384-22  IEC:2004(E)
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 22: Sectional specification:
Fixed surface mount multilayer capacitors
of ceramic dielectric, Class 2

1 General
1.1 Scope
This sectional specification is applicable to fixed unencapsulated surface mount multilayer
capacitors of ceramic dielectric, Class 2, for use in electronic equipment. These capacitors
have metallized connecting pads or soldering strips and are intended to be mounted on
printed boards, or directly onto substrates for hybrid circuits.
Capacitors for electromagnetic interference suppression are not included, but are covered by
IEC 60384-14.
1.2 Object
The object of this standard is to prescribe preferred ratings and characteristics and to select
from IEC 60384-1:1999 the appropriate quality assessment procedures, tests and measuring
methods and to give general performance requirements for this type of capacitor. Test
severities and requirements prescribed in detail specifications referring to this sectional
specification shall be of equal or higher performance level, lower performance levels are not
permitted.
1.3 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60063:1963, Preferred number series for resistors and capacitors
Amendment 1 (1967)
Amendment 2 (1977)
IEC 60068-1:1988, Environmental testing – Part 1: General and guidance
IEC 60068-2-58:1999, Environmental testing – Part 2-58: Tests – Test Td – Test methods for
solderability, resistance to dissolution of metallization and to soldering heat of surface
mounting devices (SMD)
IEC 60384-1:1999, Fixed capacitors for use in electronic equipment – Part 1: Generic
specification
IEC 60410:1973, Sampling plans and procedures for inspection by attributes
IEC QC 001005: Register of firms, products and services approved under the IECQ system,
including ISO 9000
ISO 3:1973, Preferred numbers – Series of preferred numbers

60384-22  IEC:2004(E) – 7 –
1.4 Information to be given in a detail specification
Detail specifications shall be derived from the relevant blank detail specification.
Detail specifications shall not specify requirements inferior to those of the generic, sectional
or blank detail specification. When more severe requirements are included, they shall be
listed in 1.9 of the detail specification and indicated in the test schedules, for example by an
asterisk.
NOTE The information given in 1.4.1 may for convenience, be presented in tabular form.
The following information shall be given in each detail specification and the values quoted
shall preferably be selected from those given in the appropriate Clause of this sectional
specification.
1.4.1 Outline drawing and dimensions
There shall be an illustration of the capacitors as an aid to easy recognition and for
comparison of the capacitors with others.
Dimensions and their associated tolerances, which affect interchangeability and mounting,
shall be given in the detail specification. All dimensions shall preferably be stated in
millimetres, however, when the original dimensions are given in inches, the converted metric
dimensions in millimetres shall be added.
Normally the numerical values shall be given for the length, width and height of the body.
When necessary, for example when a number of items (sizes and capacitance/voltage ranges)
are covered by a detail specification, the dimensions and their associated tolerances shall be
placed in a table below the drawing.
When the configuration is other than described above, the detail specification shall state such
dimensional information as will adequately describe the capacitors.
1.4.2 Mounting
The detail specification shall give guidance on methods of mounting for normal use. Mounting
for test and measurement purposes (when required) shall be in accordance with 4.3 of this
sectional specification.
1.4.3 Rating and characteristics
The ratings and characteristics shall be in accordance with the relevant Clauses of this

specification, together with the following:
1.4.3.1 Rated capacitance range
See 2.2.4.1.
NOTE When products approved to the detail specification have different ranges, the following statement should
be added: “The range of capacitance values available in each voltage range is given in IECQ 001005”.
1.4.3.2 Particular characteristics
Additional characteristics may be listed, when they are considered necessary to specify
adequately the component for design and application purposes.
1.4.3.3 Soldering
The detail specification shall prescribe the test methods, severities and requirements
applicable for the solderability and the resistance to soldering heat tests.

– 8 – 60384-22  IEC:2004(E)
1.4.4 Marking
The detail specification shall specify the content of the marking on the capacitor and on the
package. Deviations from 1.6 of this sectional specification shall be specifically stated.
1.5 Terms and definitions
For the purposes of this sectional specification, the terms and definitions given in
IEC 60384-1, as well as the following apply.
1.5.1
surface mount capacitor
a capacitor whose small dimensions and nature or shape of terminations make it suitable for
surface mounting in hybrid circuits and on printed boards
1.5.2
fixed capacitors, ceramic dielectric, Class 2
capacitor which has a dielectric with a high permittivity and is suitable for by-pass and
coupling applications or for frequency discriminating circuits where low losses and high
stability of capacitance are not of major importance.
The ceramic dielectric is characterized by a non linear change of capacitance over the
category temperature range (see Table 3).
1.5.3
subclass
maximum percentage change of capacitance within the category temperature range with
respect to the capacitance at 20 °C.
The subclass may be expressed in code form (see Table 3)
1.5.4
category temperature range
range of ambient temperatures for which the capacitor has been designed to operate
continuously; this is given by the lower and upper category temperature
1.5.5
rated temperature
maximum ambient temperature at which the rated voltage may be continuously applied
1.5.6
rated voltage (d.c.)
U
R
maximum direct voltage or peak value of pulse voltage which may be applied continuously to
a capacitor at any temperature between the lower category temperature and the rated
temperature
NOTE The sum of the d.c. voltage and the peak a.c. voltage or the peak to peak a.c. voltage, whichever is the
greater, applied to the capacitor shall not exceed the rated voltage. The value of the peak a.c. voltage shall not
exceed the value determined by the permissible reactive power.
1.5.7
category voltage
U
C
maximum voltage which may be applied continuously to a capacitor at its upper category
temperature
60384-22  IEC:2004(E) – 9 –
1.6 Marking
See 2.4 of IEC 60384-1with the following details:
1.6.1 The information given in the marking is normally selected from the following list; the
relative importance of each item is indicated by its position in the list:
a) rated capacitance;
b) rated voltage (d.c. voltage may be indicated by the symbol (     or     );
c) tolerance on rated capacitance;
d) dielectric subclass as applicable (according to 2.2.5);
e) year and month (or week) of manufacture;
f) manufacturer’s name or trade mark;
g) climatic category;
h) manufacturer’s type designation;
i) reference to the detail specification.
1.6.2 These capacitors are generally not marked on the body. If some marking can be
applied, they shall be clearly marked with as many as possible of the above items as is
considered useful. Any duplication of information in the marking on the capacitor should be
avoided.
1.6.3 Any marking shall be legible and not easily smeared or removed by rubbing with the
finger.
1.6.4 The package containing the capacitor(s) shall be clearly marked with all the
information listed in 1.6.1.
1.6.5 Any additional marking shall be so applied that no confusion can arise.
2 Preferred rating and characteristics
2.1 Preferred characteristics
The values given in the detail specification shall preferably be selected from the following:
2.1.1 Preferred climatic categories
The capacitors covered by this sectional specification are classified into climatic categories
according to the general rules given in IEC 60068-1.
The lower and upper category temperatures and the duration of the damp heat, steady state
test shall be chosen from the following:
Lower category temperature: –55 °C, –40 °C, –25 °C, –10 °C and +10 °C
Upper category temperature: +70 °C, +85 °C, +100 °C, +125 °C and +150 °C
Duration of the damp heat, steady state test: 4, 10, 21 and 56 days.
The severities for the cold and dry heat tests are the lower and upper category temperatures
respectively.
NOTE The resistance to humidity resulting from the above climatic category is for the capacitors in their
unmounted state. The climatic performance of the capacitors after mounting is greatly influenced by the mounting
substrate, the mounting method (see 4.3) and the final coating.

– 10 – 60384-22  IEC:2004(E)
2.2 Preferred values of ratings
2.2.1 Rated temperature
The rated temperature is equal to the upper category temperature for capacitors with the
upper category temperature not exceeding 125 °C, unless otherwise stated in the detail
specification.
2.2.2 Rated voltage (U )
R
The preferred values of the rated voltage are the values of the R5 series of ISO 3. If other
values are needed they shall be chosen from the R10 series.
2.2.3 Category voltage (U )
C
The category voltage is equal to the rated voltage for capacitors with the upper category
temperature not exceeding 125 °C. Any category voltages which are different from the rated
voltage, for capacitors with the upper category temperature exceeding 125 °C or for high
voltage capacitors with rated voltages above 500 V, shall be given by the detail specification.
The preferred values of the category voltage at 125 °C upper category temperature for high
volumetric capacitors with a rated voltage of 16 V and less and a rated temperature of 85 °C
are given in Table 1.
Table 1 – Preferred values of category voltages
U V 2,5 4 6,3 10 16
R
U V 1,6 2,5 4 6,3 10
C
NOTE The numeric values of U are calculated by the following:
C
U = 0,63 × U
C R
2.2.4 Preferred values of rated capacitance and associated tolerance values
2.2.4.1 Preferred values of rated capacitance
Rated capacitance values shall be taken from the series of IEC 60063; the E3, E6 and E12
series are preferred.
2.2.4.2 Preferred tolerances on rated capacitance
See Table 2.
Table 2 – Preferred tolerances
Tolerance
Preferred series Letter code
%
E3 and E6 –20/+80 Z
–20/+50 S
E6 ±20 M
E6 and E12 ±10 K
2.2.5 Temperature characteristic of capacitance
Table 3 denotes with a cross the preferred values of the temperature characteristic with and
without a d.c. voltage applied. The method of coding the subclass is also given; for example a
dielectric with a percentage change of ±20 % without d.c. voltage applied over the
temperature range from –55 °C to +125 °C will be defined as a dielectric of subclass 2C1.

60384-22  IEC:2004(E) – 11 –
The temperature range for which the temperature characteristic of the dielectric is defined is
the same as the category temperature range.

Table 3 – Temperature characteristic of capacitance
Category temperature range and corresponding
Maximum capacitance number code
change within the category
temperature range with
respect to the capacitance
Sub-
–55/+150 –55/+125 –55/+85 –40/+85 –25/+85 +10/+85
at 20 °°°°C measured with and
class
without a
°C °C °C °C °C °C
letter
d.c. voltage applied
code
%
Without With 0 1 2 3 4 6
d.c. voltage d.c. voltage
applied applied
2B ±10  × × ×
2C ±20 × × ×
Requirements
2D +20/–30 ×  ×
specified in
2E +22/–56 the detail × × × ×
specification
2F +30/–80 × × × ×
2R ±15 × × × ×
d.c. voltage applied is either rated voltage or the voltage specified in the detail specification.
"×" indicates preferred.
When the upper category temperature is above 125 °C, the limits of capacitance change, both with and without d.c.
voltage applied shall be given in the detail specification.

2.2.6 Dimensions
Suggested rules for the specification and coding of dimensions are given in Annex A.
Specific dimensions shall be given in the detail specification.
3 Quality assessment procedures
3.1 Primary stage of manufacture
The primary stage of manufacture is the first common firing of the dielectric-electrode
assembly.
3.2 Structurally similar components
Capacitors considered as being structurally similar are capacitors produced with similar
processes and materials, through they may be of different case sizes and values.
3.3 Certified records of released lots
The information required in IEC 60384-1, 3.9 shall be made available when prescribed in the
detail specification and when requested by a purchaser. After the endurance test, the
parameters for which variables information is required are the capacitance change, tan δ and
the insulation resistance.
– 12 – 60384-22  IEC:2004(E)
3.4 Qualification approval
The procedures for qualification approval testing are given in IEC 60384-1, 3.5.
The schedule to be used for qualification approval testing on the basis of lot-by-lot and
periodic tests is given in 3.5 of this sectional specification. The procedure using a fixed
sample size schedule is given in 3.4.1 and 3.4.2.
3.4.1 Qualification Approval on the basis of the fixed sample size procedures
The fixed sample size procedure is described in item b) of 3.5.3 of IEC 60384-1. The sample
shall be representative of the range of capacitors for which approval is sought. This may or
may not be the complete range covered by the detail specification.
For each temperature characteristic, the sample shall consist of specimens of capacitors of
maximum and minimum size and for each of these sizes, the maximum capacitance value for
the highest rated voltage and minimum rated voltage of the voltage ranges for which approval
is sought. When there are more than four rated voltages, an intermediate voltage shall also be
tested. Thus for the approval of a range, testing is required of either four or six values
(capacitance/voltage combinations) for each temperature characteristic. Where the total range
consists of less than four values, the number of specimens to be tested shall be that required
for four values.
In case assessment level EZ is used, spare specimens are permitted as follows:
Two (for six values) or three (for four values) per value which may be used as replacements
for specimens, which are non-conforming because of incidents not attributable to the
manufacturer.
The numbers given in Group 0 assume that all groups are applicable. If this is not so, the
numbers may be reduced accordingly.
When additional groups are introduced into the qualification approval test schedule, the
number of specimens required for Group 0 shall be increased by the same number as that
required for the additional groups.
Table 4 gives the number of samples to be tested in each group or subgroup together with the
number of the number of permissible non-conformances for the qualification approval test.
3.4.2 Tests
The complete series of tests specified in Tables 4 and 5 are required for the approval of
capacitors covered by one detail specification. The tests of each group shall be carried out in
the order given.
The whole sample shall be subjected to the tests of Group 0 and then divided for the other
groups.
Non-conforming specimens found during the tests of Group 0 (according to Table 4) shall not
be used for the other groups.
“One non-conforming item” is counted when a capacitor has not satisfied the whole or a part
of the tests of a group.
The approval is granted when the number or non-conforming items do not exceed the
specified number of permissible non-conforming items for each group or subgroup and the
total number of permissible non-conformances.

60384-22  IEC:2004(E) – 13 –
NOTE Tables 4 and 5 together form the fixed sample size test schedule. Table 4 includes the details for the
sampling and permissible non-conforming items for the different tests or groups of tests. Table 5 together with the
details of the test contained in Clause 4 gives a complete summary of test conditions and performance
requirements and indicates where, for example for the test method or conditions of test, a choice has to be made in
detail specification.
The conditions of test and performance requirements for the fixed sample size test schedule shall be identical to
those prescribed in the detail specification for quality conformance inspection.

– 14 – 60384-22  IEC:2004(E)
Table 4 – Fixed sample size test plan for qualification approval, assessment level EZ
Permissible
number of
Number of
Group Subclause of this
non-conforming
specimens
Test
No. publication
e
items
n
c
0 Visual examination 4.4
f
Dimensions 4.4 0
132 + 24
Capacitance 4.5.1
Tangent of loss angle 4.5.2
Insulation resistance 4.5.3
Voltage proof 4.5.4
Spare specimens
g
1A 4.15 12 0
Robustness of termination
4.9
Resistance to soldering heat
b
4.16
Component solvent resistance
b
1B 4.5.5 12 0
Impedance
b
4.5.6
Equivalent series resistance [ESR]
4.10
Solderability
b
4.17
Solvent resistance of marking
d
4.8 12 0
Substrate bending test
a
Mounting 4.3
f c
Visual examination 4.4
84 + 24   0
Capacitance 4.5.1
Tangent of loss angle 4.5.2
Insulation resistance 4.5.3
Voltage proof 4.5.4
h
3.1 4.7 24 0
Shear test
4.11
Rapid change of temperature
4.12
Climatic sequence
3.2 Damp heat, steady state 4.13 24 0
3.3 Endurance 4.14 36 0
b f
3.4 4.18 0
Accelerated damp heat, steady state  24
4 Temperature characteristic of capacitance 4.6 12 0
a
The values of these measurements serve as initial measurements for the tests of Group 3.
b
If required in the detail specification.
c
The capacitors found to be non-conforming after mounting shall not be taken into account when calculating the
permissible non-conforming for the following tests. They shall be replaced by spare capacitors.
d
Not applicable to capacitors, which according to their detail specification shall only be mounted on alumina
substrates.
e
Capacitance/voltage combinations, see 3.4.1.
f
Additional capacitors if group 3.4 is tested.
g
Applicable to capacitors with strip terminations.
h
Not applicable to capacitors with strip terminations.

60384-22  IEC:2004(E) – 15 –
Table 5 – Tests schedule for qualification approval
Subclause number and test D Conditions of test Number of Performance
or specimens requirements
(see NOTE 1) (see NOTE 1)
ND (n) and
(see NOTE 1)
number of
non-
conforming
items (c)
GROUP 0 ND  See Table 4
4.4 Visual examination As in 4.4.2

Legible marking and as
specified in the detail
specification
4.4 Dimension (detail) See the detail specification

4.5.1 Capacitance Frequency: … Hz Within specified tolerance
Measuring voltage: …V r.m.s
4.5.2 Tangent of loss angle Frequency and measuring As in 4.5.2
voltage same as in 4.5.1
(tan δ)
4.5.3 Insulation resistance See detail specification for the As in 4.5.3.3
method
4.5.4 Voltage proof See detail specification for the No breakdown or flashover
method
GROUP 1A
D See Table 4
4.15 Robustness of Test Ua1, force: 2,5 N
termination
Test Ub, method 1, force: 2,5 N
(if applicable)
Number of bends: 1
Visual examination No visible damage
4.9.2 Initial measurement Capacitance
4.9 Resistance to Special preconditioning as in 4.1
soldering heat
See detail specification for the
method
Recovery: (24 ± 2) h
4.9.5 Final measurement Visual examination As in 4.9.5
Capacitance As in 4.9.5
4.16 Component solvent Solvent: …
resistance
Solvent temperature: … See detail specification
(if applicable)
Method 2
Recovery: …
GROUP 1B D See Table 4
4.5.5 Impedance  Frequency: 100 kHz See detail specification
(if required)
4.5.6 ESR Frequency: 100 kHz See detail specification
(if required)
4.10 Solderability See detail specification for the
method
4.10.3 Final Visual examination As in 4.10.3
measurements
– 16 – 60384-22  IEC:2004(E)
Subclause number and test D Conditions of test Number of Performance
specimens requirements
(see NOTE 1) or (see NOTE 1)
(n) and
(see NOTE 1)
number of
ND
non-
conforming
items (c)
4.17 Solvent resistance of D Solvent: … Legible marking

a
the marking
Solvent temperature: …
(if required)
Method 1
Rubbing material: cotton wool
Recovery: …
GROUP 2 D See Table 4
4.8 Substrate bending Deflection: … See detail specification
test Number of bends: …
4.8.1 Initial measurement Capacitance
4.8.2 Final inspection Capacitance (with printed board
ΔC/C ≤ 10 %
in bent position)
Visual examination
No visible damage
GROUP 3 D  See Table 4
b
4.3 Mounting
Substrate material: …
Visual examination As in 4.4.2
Capacitance Within specified tolerance
Tangent of loss angle As in 4.5.2
Insulation resistance As in 4.5.3.3
Voltage proof No breakdown or flashover
GROUP 3.1 D See Table 4
4.7 Shear test Visual examination No visible damage
4.11.2 Initial measurement Capacitance
4.11 Rapid change of Special preconditioning as in
temperature 4.1
T = Lower category
A
temperature
T = Upper category
B
temperature
Five cycles
Duration t = 30 min
Recovery: (24 ± 2) h
4.11.5 Final measurements Visual examination No visible damage

Capacitance
ΔC/C: as in 4.11.5
4.12 Climatic sequence Special preconditioning as in

4.1
4.12.2 Initial measurement Capacitance
4.12.3 Dry heat Temperature: upper category
temperature
Duration: 16 h
4.12.4 Damp heat, cyclic,
test Db, first cycle
60384-22  IEC:2004(E) – 17 –
Subclause number and test D Conditions of test Number of Performance
specimens requirements
(see NOTE 1) or (see NOTE 1)
(n) and
(see NOTE 1)
ND
number of
non-
conforming
items (c)
4.12.5 Cold D Temperature: lower category See Table 4
temperature
Duration: 2 h
Visual examination No visible damage
Recovery: (24 ± 2) h
4.12.6 Damp heat, cyclic,
test Db, remaining
cycles
4.12.7 Final measurements Visual examination No visible damage
Legible marking
Capacitance
ΔC/C: as in 4.12.7
Tangent of loss angle As in 4.12.7
Insulation resistance As in 4.12.7
GROUP 3.2 D  See Table 4
4.13 Damp heat, steady Special preconditioning as in 4.1
state
4.13.2 Initial measurement Capacitance

Recovery: (24 ± 2) h
4.13.5 Final measurements Visual examination No visible damage
Legible marking
Capacitance
ΔC/C: as in 4.13.5
Tangent of loss angle
As in 4.13.5
Insulation resistance
As in 4.13.5
GROUP 3.3 D  See Table 4
4.14 Endurance Special preconditioning as in 4.1
Duration: … h
Temperature: … °C
Voltage: … V
4.14.2 Initial measurement Capacitance

Recovery: (24 ± 2) h
4.14.5 Final measurements Visual examination No visible damage
Legible marking
Capacitance ΔC/C: as in 4.14.5
Tangent of loss angle
As in 4.14.5
Insulation resistance
As in 4.14.5
GROUP 3.4 D See Table 4
Duration: … h
4.18 Accelerated damp
heat, steady state
Temperature: (85 ± 2) °C
(if required)
Humidity: (85 ± 3) %
4.18.1 Initial measurement Insulation resistance As in 4.18.1

Recovery: (24 ± 2) h
4.18.4 Final measurements Insulation resistance As in 4.18.4
GROUP 4 ND See Table 4
4.6 Temperature Special preconditioning as in 4.1
ΔC/C: as in 4.6.3
characteristic of
capacitance
NOTE 1 Subclause numbers of test and performance requirements refer to Clause 4.
NOTE 2 In this table: D = destructive, ND= non-destructive.

– 18 – 60384-22  IEC:2004(E)
a
This test may be carried out on capacitors mounted on a substrate.
b
When different substrate materials are used for the individual subgroup, the detail specification shall indicate which

substrate material is used in each subgroup.

3.5 Quality conformance inspection
3.5.1 Formation of inspection lots
3.5.1.1 Group A and B inspection
These tests shall be carried out on a lot-by-lot basis.
A manufacturer may aggregate the current production into inspection lots subject to the
following safeguards:
1) The inspection lot shall consist of structurally similar capacitors (See 3.2).
2a) The sample tested shall be representative of the values and the dimensions contained
in the inspection lot:
– in relation to their number;
– with a minimum of five of any one value.
2b) If there are less than five of any one value in the sample the basis for the drawing of
samples shall be agreed between the manufacturer and the National Supervising
I n s p e c to r a te .
3.5.1.2 Group C inspection
These tests shall be carried out on a periodic basis.
Samples shall be representative of the current production of the specified periods and shall
be divided into small, medium and large sizes. In order to cover the range of approvals in any
period, one voltage shall be tested from each group of sizes. In subsequent periods, other
sizes and/or voltage ratings in production shall be tested with the aim of covering the whole
range.
3.5.2 The schedule
The schedule for the lot-by-lot and periodic tests for Quality Conformance Inspection is given
in Clause 2, Table 4 of the blank detail specification, for example in IEC 60384-22-1.
3.5.3 Delayed delivery
When, according to the procedures of 3.10 of IEC 60384-1, re-inspection has to be made,
solderability and capacitance shall be checked as specified in Group A and B inspection.
3.5.4 Assessment levels
The assessment level(s) given in the blank detail specification shall preferably be selected
from Tables 6a and 6b.
60384-22  IEC:2004(E) – 19 –
Table 6a – Lot-by-lot inspection
EZ
Inspection
d
subgroup
a
a a
IL
n c
b
A0
100 %
c
A1
S-4 0
c
A2
S-3 0
c
B1
S-3 0
c
B2
S-2 0
a
IL = inspection level
n = sample size
c = permissible number of non-conforming items
b
100 % testing shall be followed by re-inspection by sampling in order to monitor outgoing quality level by non-
conforming items per million (ppm).The sampling level shall be established by the manufacturer. For the
calculation of ppm values, any parametric failure shall be counted as a non-conforming item. In case one or more
non-conforming items occur in a sample, this lot shall be rejected.
c
Number to be tested: sample size as directly allotted to the code letter for IL in Table IIA of IEC 60410.
d
The content of the inspection subgroup is described in Clause 2 of the relevant blank detail specification.

Table 6b – Periodic test
Inspection  EZ
c
subgroup
a a a
p n c
C1  3 12 0
b
C2 3 12 0
C3.1 6 27 0
C3.2 6 15 0
C3.3 3 15 0
b
C3.4 6 15 0
C4 6 9 0
a
p = periodicity in months
n = sample size
c = permissible number of non-conforming items
b
Additional capacitors if Subgroup C3.4 is tested
c
The content of the inspection subgroup is described in Clause 2 of the relevant blank detail specification.

– 20 – 60384-22  IEC:2004(E)
4 Test and measurement procedures
This Clause supplements the information given in Clause 4 of IEC 60384-1.
4.1 Special preconditioning
Unless otherwise specified in the detail specification, the special pre-conditioning, when
specified
...