IEC 60384-23:2023

IEC 60384-23 ®
Edition 3.0 2023-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fixed capacitors for use in electronic equipment –
Part 23: Sectional specification – Fixed metallized polyethylene naphthalate film
dielectric surface mount DC capacitors

Condensateurs fixes utilisés dans les équipements électroniques –
Partie 23: Spécification intermédiaire – Condensateurs fixes pour montage en
surface pour courant continu à diélectrique en film de polynaphtalate d’éthylène
métallisé
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IEC 60384-23 ®
Edition 3.0 2023-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fixed capacitors for use in electronic equipment –

Part 23: Sectional specification – Fixed metallized polyethylene naphthalate film

dielectric surface mount DC capacitors

Condensateurs fixes utilisés dans les équipements électroniques –

Partie 23: Spécification intermédiaire – Condensateurs fixes pour montage en

surface pour courant continu à diélectrique en film de polynaphtalate d’éthylène

métallisé
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.060.10 ISBN 978-2-8322-6341-9

– 2 – IEC 60384-23:2023 © IEC 2023
CONTENTS
FOREWORD . 5
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 8
4 Preferred ratings and characteristics . 8
4.1 Preferred climatic categories . 8
4.2 Preferred values of ratings . 8
4.2.1 Nominal capacitance (C ) . 8
N
4.2.2 Tolerance on nominal capacitance . 9
4.2.3 Rated voltage (U ) . 9
R
4.2.4 Category voltage (U ) . 9
C
4.2.5 Rated temperature . 9
5 Test and measurement procedures . 10
5.1 General . 10
5.2 Mounting . 10
5.2.1 Initial inspections . 10
5.2.2 Mounting method . 10
5.2.3 Final inspections after mounting . 10
5.3 Visual examination and check of dimensions . 10
5.3.1 General . 10
5.3.2 Visual examination and check of dimensions . 10
5.3.3 Requirements . 10
5.4 Electrical tests . 10
5.4.1 Voltage proof . 10
5.4.2 Capacitance . 11
5.4.3 Tangent of loss angle (tan δ) . 11
5.4.4 Insulation resistance . 12
5.5 Shear test . 13
5.5.1 General . 13
5.5.2 Final inspections . 13
5.6 Substrate bending test . 14
5.6.1 General . 14
5.6.2 Initial inspections . 14
5.6.3 Final inspections and requirements . 14
5.7 Resistance to soldering heat . 14
5.7.1 General . 14
5.7.2 Initial inspections . 14
5.7.3 Test conditions . 14
5.7.4 Recovery . 14
5.7.5 Final inspections and requirements . 14
5.8 Solderability . 14
5.8.1 General . 14
5.8.2 Test conditions . 15
5.8.3 Final inspections and requirements . 15
5.9 Rapid change of temperature . 15
5.9.1 General . 15

5.9.2 Initial inspections . 15
5.9.3 Test conditions . 15
5.9.4 Final inspections and requirements . 15
5.10 Climatic sequence. 15
5.10.1 General . 15
5.10.2 Initial inspections . 15
5.10.3 Dry heat . 15
5.10.4 Damp heat, cyclic, test Db, first cycle . 16
5.10.5 Cold. 16
5.10.6 Damp heat, cyclic, test Db, remaining cycles . 16
5.10.7 Recovery . 16
5.10.8 Final inspections and requirements . 16
5.11 Damp heat, steady state . 16
5.11.1 General . 16
5.11.2 Initial inspections . 16
5.11.3 Test conditions . 16
5.11.4 Recovery . 16
5.11.5 Final inspections and requirements . 16
5.12 Endurance . 17
5.12.1 General . 17
5.12.2 Initial inspections . 17
5.12.3 Test conditions . 17
5.12.4 Final inspections and requirements . 17
5.13 Charge and discharge . 17
5.13.1 General . 17
5.13.2 Initial inspections . 18
5.13.3 Test conditions . 18
5.13.4 Recovery . 18
5.13.5 Final inspections and requirements . 18
5.14 Component solvent resistance (if required) . 18
5.14.1 General . 18
5.14.2 Final inspections and requirements . 18
5.15 Solvent resistance of marking (if applicable) . 18
5.15.1 General . 18
5.15.2 Final inspections and requirements . 18
6 Marking . 18
6.1 General . 18
6.2 Information for marking . 19
6.3 Marking on capacitors . 19
6.4 Marking on packaging . 19
7 Information to be given in a detail specification . 19
7.1 General . 19
7.2 Outline drawing and dimensions . 19
7.3 Mounting . 20
7.4 Ratings and characteristics . 20
7.4.1 General . 20
7.4.2 Nominal capacitance range . 20
7.4.3 Particular characteristics . 20
7.4.4 Soldering . 20

– 4 – IEC 60384-23:2023 © IEC 2023
7.5 Marking . 20
8 Quality assessment procedures . 20
8.1 Primary stage of manufacture . 20
8.2 Structurally similar components . 20
8.3 Certified test records of released lots . 21
8.4 Qualification approval procedures . 21
8.4.1 General . 21
8.4.2 Qualification approval on the basis of the fixed sample size procedure . 21
Annex A (normative) Quality conformance inspection . 29
A.1 Formation of inspection lots . 29
A.1.1 Groups A and B inspection . 29
A.1.2 Group C inspection . 29
A.2 Test schedule . 29
A.3 Delayed delivery . 29
A.4 Assessment levels . 29
Annex X (informative) Cross-references to the previous edition of this document . 36
Bibliography . 37

Table 1 – Percentage limit of the rated voltage at AC voltage frequency . 9
Table 2 – Test voltages . 11
Table 3 – Tangent of loss angle limits . 12
Table 4 – Requirements regarding insulation resistance . 13
Table 5 – Correction factor dependent on temperature. 13
Table 6 – Endurance test conditions for Grade 1 and Grade 2 capacitors . 17
Table 7 – Endurance test conditions for Grade 3 capacitors . 17
Table 8 – Test and sampling plan for qualification approval Assessment level EZ . 22
Table 9 – Test schedule for qualification approval . 23
Table A.1 – Lot-by-lot inspection . 30
Table A.2 – Periodic inspection . 31
Table X.1 – Cross-reference . 36

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 23: Sectional specification –
Fixed metallized polyethylene naphthalate film
dielectric surface mount DC capacitors

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
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9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent
rights. IEC shall not be held responsible for identifying any or all such patent rights.
IEC 60384-23 has been prepared by IEC technical committee 40: Capacitors and resistors for
electronic equipment. It is an International Standard.
This third edition cancels and replaces the second edition published in 2015. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) this edition includes the following significant technical changes with respect to the previous
edition: revision of all parts of the document based on the ISO/IEC Directives, Part 2:2021,
and harmonization with other similar kinds of documents;
b) the document structure has been organized to follow new sectional specification structure
decided in TC 40;
c) revised tables and Clause 5 so as to prevent duplications and contradictions;

– 6 – IEC 60384-23:2023 © IEC 2023
d) in Subclause 5.2 (Mounting), the Subclauses 5.2.1, 5.2.2 and 5.2.3 have been added;
e) in Subclause 5.5 (Shear test), the Subclauses 5.5.1 and 5.5.2 have been added;
f) in Subclause 5.14 (Component solvent resistance), the Subclauses 5.14.1 and 5.14.2 have
been added. In Table 8 and Table A.2, test 5.14 has been moved before 5.7.5 (Final
inspections and requirements) in Group 1A and in Subgroup C1;
g) In Subclause 5.15 (Solvent resistance of marking), the Subclauses 5.15.1 and 5.15.2 have
been added;
h) tangent of loss angle measurement has been added to the resistance to soldering heat test;
i) lot-by-lot and periodical inspection tables including requirements have been moved to
Annex A;
j) revised Inspection Level (IL) of A1 subgroup.
The text of this International Standard is based on the following documents:
Draft Report on voting
40/2983/FDIS 40/3019/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this International Standard is English.
The list of all parts of the IEC 60384 series, under the general title Fixed capacitors for use in
electronic equipment, can be found on the IEC web site.
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 23: Sectional specification –
Fixed metallized polyethylene naphthalate film
dielectric surface mount DC capacitors

1 Scope
This part of IEC 60384 is applicable to fixed surface mount capacitors for direct current, with
metallized electrodes and polyethylene naphthalate dielectric for use in electronic equipment.
These capacitors have metallized connecting pads or soldering strips and are intended to be
mounted directly onto printed boards or onto substrates for hybrid circuits. These capacitors
can have "self-healing properties" depending on conditions of use. They are primarily intended
for applications where the AC component is small with respect to the rated voltage.
This part of IEC 60384 specifies preferred ratings and characteristics, selects from
IEC 60384‑1:2021 the appropriate quality assessment procedures, tests and measuring
methods and gives general performance requirements for this type of capacitor. Test severities
and requirements specified in detail specifications referring to this sectional specification are
of an equal or higher performance level. Lower performance levels are not permitted.
Capacitors for electromagnetic interference suppression are not included, but are covered by
IEC 60384‑14.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60062, Marking codes for resistors and capacitors
IEC 60063, Preferred number series for resistors and capacitors
IEC 60068-1:2013, Environmental testing – Part 1: General and guidance
IEC 60384-1:2021, Fixed capacitors for use in electronic equipment – Part 1: Generic
specification
IEC 61193-2:2007, Quality assessment systems – Part 2: Selection and use of sampling plans
for inspection of electronic components and packages
ISO 3, Preferred numbers – Series of preferred numbers

– 8 – IEC 60384-23:2023 © IEC 2023
3 Terms and definitions
For the purposes of this document, the terms and definitions of IEC 60384-1:2021,and the
following apply.
ISO and IEC maintain terminology databases for use in standardization at the following
addresses:
• IEC Electropedia: available at https://www.electropedia.org/
• ISO Online browsing platform: available at https://www.iso.org/obp
3.1
grade 1 capacitors
capacitors for long-life applications with stringent requirements for the electrical
parameters
3.2
grade 2 capacitors
capacitors for general applications for which the stringent requirements for
grade 1 capacitors are not necessary
3.3
grade 3 capacitors
miniature type capacitors having a rated temperature of 85°C
and for which less stringent requirements than for grade 2 capacitors are acceptable
4 Preferred ratings and characteristics
4.1 Preferred climatic categories
The values given in detail specifications should be selected from the following.
The surface mount capacitors covered by this document are classified into climatic categories
according to the general rules given in IEC 60068-1:2013, Annex A.
The lower and upper category temperature and the duration of the damp heat, steady-state test
shall be chosen from the following:
Lower category temperature: −55 °C, −40 °C and −25 °C.
Upper category temperature: +85 °C (only grade 3), +100 °C, +125 °C and +155 °C.
Duration of the damp heat, steady state test: 21 days and 56 days.
At continuous operation at 155 °C beyond the endurance test time, accelerated ageing shall be
carried out (see detail specification).
The severities for the cold and dry heat tests are the lower and upper category temperatures,
respectively.
4.2 Preferred values of ratings
4.2.1 Nominal capacitance (C )
N
Preferred values of nominal capacitance shall be taken from the E6 series of IEC 60063:
n
1,0 − 1,5 − 2,2 − 3,3 − 4,7 and 6,8 and their decimal multiples (× 10 , n = integer).

If other values are required, they should be chosen from the E12 series.
4.2.2 Tolerance on nominal capacitance
The preferred tolerances on the nominal capacitance are ±5 %, ±10 % and ±20 %.
4.2.3 Rated voltage (U )
R
The preferred values of rated voltage shall be taken from R10 series of ISO 3 are:
n
1,0 − 1,6 − 2,5 − 4,0 − 5,0 − 6,3 and their decimal multiples (× 10 , n: integer).
The sum of the DC voltage and the peak AC voltage applied to the capacitor shall not exceed
the rated voltage.
The value of the peak AC voltage shall not exceed the percentages of the rated voltage at the
frequencies stated in Table 1 and should not be greater than 280 V, unless otherwise specified
in the detail specification.
Table 1 – Percentage limit of the rated voltage at AC voltage frequency
AC voltage frequency Percentage limit of the rated voltage
Hz %
50 20
100 15
1 000 3
10 000 1
4.2.4 Category voltage (U )
C
The category voltage for Grade 1 and Grade 2 capacitors is:
– for upper category temperature 125 °C: 0,8 U ;
R
– for upper category temperature 155 °C: 0,5 U .
R
The category voltage for Grade 3 capacitors is:
– for upper category temperature 100 °C: 0,8 U ;
R
– for upper category temperature 125 °C: 0,5 U .
R
4.2.5 Rated temperature
Grade 1 and Grade 2 capacitors
The standard value of rated temperature is 100 °C.
Grade 3 capacitors
The standard value of rated temperature is 85 °C.

– 10 – IEC 60384-23:2023 © IEC 2023
5 Test and measurement procedures
5.1 General
This Clause 5 supplements the information given in the relevant clauses of IEC 60384-1:2021.
5.2 Mounting
5.2.1 Initial inspections
The capacitance shall be measured in accordance with 5.4.2.
The tangent of loss angle shall be measured in accordance with 5.4.3.
5.2.2 Mounting method
See IEC 60384-1:2021, 5.5.
5.2.3 Final inspections after mounting
After recovery, the capacitors shall be visually examined and measured and shall meet the
requirements given in Table 9.
The measurement values are used as initial inspection values in subgroups 3.1, 3.2, 3.3 and
3.4 in Table 8 and in subgroups C3.1, C3.2, C3.3 and C3.4 in Table A.2.
5.3 Visual examination and check of dimensions
5.3.1 General
See IEC 60384-1:2021, 7.1 with the details of 5.3.2 and 5.3.3.
5.3.2 Visual examination and check of dimensions
Visual examination shall be carried out with equipment with approximately 10× magnification
and lighting appropriate to the specimen under test and the quality level required.
The operator should have available facilities for incident or transmitted illumination as well as
an appropriate measuring facility.
5.3.3 Requirements
The capacitors shall be examined to verify that the materials, design, construction, physical
dimensions and workmanship are in accordance with the applicable requirements given in the
detail specification.
5.4 Electrical tests
5.4.1 Voltage proof
5.4.1.1 General
See IEC 60384-1:2021, 6.2 with the details of 5.4.1.2, 5.4.1.3 and 5.4.1.4.
5.4.1.2 Test circuit
Delete the capacitor C .
The product of R and the nominal capacitance of the capacitor under test (C ) shall be smaller
1 X
than or equal to 1 s and greater than 0,01 s.
R includes the internal resistance of the power supply.
R shall limit the discharge current to a value equal to or less than 1 A.
5.4.1.3 Test conditions
The voltages given in Table 2 shall be applied between terminals, the measuring points 1a) of
IEC 60384-1:2021, Table 3, for a duration of 1 min for qualification approval testing and for a
duration of 1 s for the lot-by-lot quality conformance testing.
Table 2 – Test voltages
Measuring point Test voltage
Grade 1: 1,6 U
R
Grade 2: 1,4 U
1a)
R
Grade 3: 1,4 U
R
5.4.1.4 Requirements
There shall be no breakdown or flashover during the test.
NOTE The occurrence of self-healing breakdowns during the application of the test voltages is allowed.
5.4.2 Capacitance
5.4.2.1 General
See IEC 60384-1:2021, 6.3 with the details of 5.4.2.2 and 5.4.2.3.
5.4.2.2 Measuring conditions
The capacitance shall be measured at, or corrected to, a frequency of 1 kHz. For nominal
capacitance values > 10 µF, 50 Hz to 120 Hz may be used.
The applied peak voltage at 1 kHz shall not exceed 3 % of the rated voltage, and the applied
peak voltage at 50 Hz to 120 Hz shall not exceed 20 % of the rated voltage with a maximum of
100 V (70 V RMS).
5.4.2.3 Requirements
The capacitance shall be within the specified tolerance.
5.4.3 Tangent of loss angle (tan δ)
5.4.3.1 General
See IEC 60384-1:2021, 6.4 with the details of 5.4.3.2, 5.4.3.3, 5.4.3.4 and 5.4.3.5.

– 12 – IEC 60384-23:2023 © IEC 2023
5.4.3.2 Measuring conditions for measurements at 1 kHz
The test conditions are as follows:
– Frequency: 1 kHz;
– Peak voltage: ≤ 3 % of the rated voltage;
−4
– Inaccuracy: ≤ 10 × 10 (absolute value).
5.4.3.3 Requirement for measurements at 1 kHz
Tan δ shall not exceed the applicable values shown in Table 3.
Table 3 – Tangent of loss angle limits
Nominal capacitance Tan δ (absolute value)
µF Grade 1 capacitors Grade 2 capacitors Grade 3 capacitors
≤ 1 0,006 0,010 0,010
> 1 0,007 0,010 0,010
5.4.3.4 Measuring conditions for measurements at 10 kHz
For capacitors with C ≤ 1 µF, tan δ shall be in addition measured when required in Table 9 for
N
certain tests.
– Frequency: 10 kHz;
– Voltage: 1 V RMS;
−4
– Inaccuracy: ≤ 10 × 10 (absolute value).
5.4.3.5 Requirement for measurements at 10 kHz
Tangent of loss angle shall be as stated in the detail specification.
5.4.4 Insulation resistance
5.4.4.1 General
See IEC 60384-1:2021, 6.1 with the details of 5.4.4.2 and 5.4.4.3.
5.4.4.2 Measuring conditions
Prior to the test, capacitors shall be carefully cleaned to remove any contamination. Cleanliness
shall be maintained in the test chambers and during post-test measurements.
Before the measurement, the capacitors shall be fully discharged. The product of the resistance
of the discharge circuit and the nominal capacitance of the capacitor under test shall be ≥ 0,01 s
or any other value stated in the detail specification.
The measuring conditions shall be in accordance with IEC 60384-1:2021, 6.1.2. The measuring
points shall be in accordance with IEC 60384-1:2021, Table 3.
The voltage shall be applied immediately at the correct value through the internal resistance of
the voltage source.
The product of the internal resistance and the nominal capacitance of the capacitor shall be
smaller than 1 s or any other value stated in the detail specification.

5.4.4.3 Requirements
The insulation resistance shall meet the requirements of Table 4. However, in lot-by-lot quality
conformance testing, the measurement may be interrupted at the time when the limits of Table 4
have been reached, which can be within 60 s.
Table 4 – Requirements regarding insulation resistance
Minimal RC product Minimum insulation resistance between the
(R = insulation resistance between the terminations
terminations)
(C = nominal capacitance C )
N
s MΩ
C > 0,33 µF C ≤ 0,33 µF
N N
Rated voltage
> 100 V ≤ 100 V > 100 V ≤ 100 V
Grade:
1 2,3 1 2,3 1 2,3 1 2,3
10 000 400 5 000 400 30 000 1 000 15 000 1 000
NOTE MΩ is used instead of the correct unit GΩ for the convenience of the user to calculate the time constant
correctly, and from historical reasons.

When the test is carried out at a temperature other than 20 °C, the result shall, when necessary,
be corrected to 20 °C by multiplying the result of the measurement by the appropriate correction
factor. In case of doubt, the measurement at 20 °C is decisive. The correction factors given in
Table 5 can be considered as average values for metallized polyethylene naphthalate film
capacitors.
Table 5 – Correction factor dependent on temperature
Temperature Correction factor
°C
15 0,75
20 1,00
23 1,15
27 1,35
30 1,50
35 1,75
5.5 Shear test
5.5.1 General
See IEC 60384-1:2021, 7.7.
5.5.2 Final inspections
The capacitors shall be visually examined and shall meet the requirements given in Table 9 or
Table A.2.
– 14 – IEC 60384-23:2023 © IEC 2023
5.6 Substrate bending test
5.6.1 General
See IEC 60384-1:2021, 7.8.
5.6.2 Initial inspections
Capacitance shall be measured in accordance with 5.4.2.
5.6.3 Final inspections and requirements
The capacitance shall be measured in the board bending position.
The capacitance value and visual examination shall meet the requirements shown in Table 9 or
Table A.2.
5.7 Resistance to soldering heat
5.7.1 General
See IEC 60384-1:2021, 9.1 with the details of 5.7.2 to 5.7.5.
5.7.2 Initial inspections
The capacitance shall be measured in accordance with 5.4.2.
The tangent of loss angle shall be measured in accordance with 5.4.3.
5.7.3 Test conditions
Test conditions are as follows:
– Method: Method 1 (solder bath), or Method 2 (reflow), unless otherwise specified in
detail specification;
– Duration: 5 s ± 0,5 s or 10 s ± 1 s, unless otherwise specified in detail specification.
If Method 1 is applied, immersion and withdrawal speed shall be 20 mm/s to 25 mm/s.
5.7.4 Recovery
The recovery period shall be 24 h ± 2 h.
5.7.5 Final inspections and requirements
After recovery the capacitors shall be visually examined and measured and shall meet the
following requirements:
Under normal lighting and approximately 10× magnification, there shall be no signs of damage
such as cracks.
The capacitance and tangent of loss angle shall meet the requirements given in Table 9 or
Table A.2.
5.8 Solderability
5.8.1 General
See IEC 60384-1:2021, 9.2 with the details of 5.8.2 and 5.8.3.

5.8.2 Test conditions
The test conditions shall be specified in the detail specification. Preconditioning or ageing is
not required unless otherwise specified in the detail specification.
5.8.3 Final inspections and requirements
The capacitor shall be visually examined under normal lighting and approximately 10×
magnification. There shall be no signs of damage.
The areas to be soldered shall be covered with a smooth and bright solder coating with no more
than a small number of scattered imperfections, such as pinholes or un-wetted or de-wetted
areas. These imperfections shall not be concentrated in one area.
5.9 Rapid change of temperature
5.9.1 General
See IEC 60384-1:2021, 8.1 with the details of 5.9.2, 5.9.3 and 5.9.4.
The capacitors shall be mounted in accordance with 5.2.
5.9.2 Initial inspections
The capacitance shall be measured in accordance with 5.4.2.
The tangent of loss angle shall be measured in accordance with 5.4.3.
5.9.3 Test conditions
The test conditions are as follows:
The capacitors shall be tested for 5 cycles.
The duration of exposure at each temperature limit shall be 30 min.
5.9.4 Final inspections and requirements
The capacitors shall be visually examined and shall meet the requirements given in Table 9 or
Table A.2.
5.10 Climatic sequence
5.10.1 General
See IEC 60384-1:2021, 8.2 with the details of 5.10.2 to 5.10.8.
The capacitors shall be mounted in accordance with 5.2.
5.10.2 Initial inspections
The capacitance shall be measured in accordance with 5.4.2.
The tangent of loss angle shall be measured in accordance with 5.4.3.
5.10.3 Dry heat
See IEC 60384-1:2021, 8.2.3.
– 16 – IEC 60384-23:2023 © IEC 2023
5.10.4 Damp heat, cyclic, test Db, first cycle
See IEC 60384-1:2021, 8.2.4.
5.10.5 Cold
See IEC 60384-1:2021, 8.2.5.
5.10.6 Damp heat, cyclic, test Db, remaining cycles
See IEC 60384-1:2021, 8.2.7 with the following detail:
Within 15 min after removal from the damp heat test, the rated voltage shall be applied for 1 min
at measuring point 1a) using the test circuit conditions given in 5.4.1.2.
5.10.7 Recovery
The recovery period shall be 1 h to 2 h, unless otherwise specified in the detail specification.
5.10.8 Final inspections and requirements
After recovery, the surface mount capacitors shall be visually examined
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