IEC 60384-22:2024

IEC 60384-22 ®
Edition 4.0 2024-06
COMMENTED VERSION
INTERNATIONAL
STANDARD
colour
inside
Fixed capacitors for use in electronic equipment –
Part 22: Sectional specification – Fixed surface mount multilayer capacitors of
ceramic dielectric, Class 2
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IEC 60384-22 ®
Edition 4.0 2024-06
COMMENTED VERSION
INTERNATIONAL
STANDARD
colour
inside
Fixed capacitors for use in electronic equipment –
Part 22: Sectional specification – Fixed surface mount multilayer capacitors of
ceramic dielectric, Class 2
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.060.10 ISBN 978-2-8322-9281-5
– 2 – IEC 60384-22:2024 CMV © IEC 2024
CONTENTS
FOREWORD .6
1 Scope .9
2 Normative references .9
3 Terms and definitions . 10
4 Preferred ratings and characteristics. 11
4.1 Preferred characteristics . 11
4.2 Preferred values of ratings . 11
4.2.1 Rated temperature (T ) . 11
R
4.2.2 Rated voltage (U ) . 11
R
4.2.3 Category voltage (U ) . 11
C
4.2.4 Preferred values of nominal capacitance and associated tolerance
values . 12
4.2.5 Temperature characteristic of capacitance . 12
4.2.6 Dimensions . 13
5 Test and measurement procedures . 13
5.1 General . 13
5.2 Special preconditioning . 13
5.3 Measuring conditions . 14
5.4 Mounting . 14
5.5 Visual examination and check of dimensions . 14
5.5.1 General . 14
5.5.2 Visual examination . 14
5.5.3 Requirements . 14
5.6 Electrical tests . 16
5.6.1 Capacitance . 16
5.6.2 Tangent of loss angle (tan δ) . 16
5.6.3 Insulation resistance . 17
5.6.4 Voltage proof . 18
5.6.5 Impedance (if required by the detail specification) . 18
5.6.6 Equivalent series resistance [ESR] (if required by the detail
specification) . 19
5.7 Temperature characteristic of capacitance (reference temperature 20 °C) . 19
5.7.1 Special preconditioning . 19
5.7.2 Measuring conditions . 19
5.7.3 Requirements . 20
5.8 Shear test . 20
5.9 Substrate bending test . 20
5.9.1 General . 20
5.9.2 Initial measurement . 21
5.9.3 Final inspection . 21
5.10 Resistance to soldering heat . 21
5.10.1 General . 21
5.10.2 Special preconditioning . 21
5.10.3 Initial measurement . 21
5.10.4 Test conditions . 21
5.10.5 Recovery . 22

5.10.6 Final inspection, measurements and requirements . 22
5.11 Solderability . 23
5.11.1 General . 23
5.11.2 Test conditions . 23
5.11.3 Recovery . 24
5.11.4 Final inspection, measurements and requirements . 24
5.12 Rapid change of temperature . 24
5.12.1 General . 24
5.12.2 Special preconditioning . 24
5.12.3 Initial measurement . 24
5.12.4 Number of cycles . 24
5.12.5 Recovery . 24
5.12.6 Final inspection, measurements and requirements . 25
5.13 Climatic sequence . 25
5.13.1 General . 25
5.13.2 Special preconditioning . 25
5.13.3 Initial measurement . 25
5.13.4 Dry heat . 25
5.13.5 Damp heat, cyclic, Test Db, first cycle . 25
5.13.6 Cold . 25
5.13.7 Damp heat, cyclic, Test Db, remaining cycles . 26
5.13.8 Final inspection, measurements and requirements . 26
5.14 Damp heat, steady state . 27
5.14.1 General . 27
5.14.2 Special preconditioning . 27
5.14.3 Initial measurement . 27
5.14.4 Test conditions . 27
5.14.5 Recovery . 28
5.14.6 Final inspection, measurements and requirements . 28
5.15 Endurance . 29
5.15.1 General . 29
5.15.2 Special preconditioning . 29
5.15.3 Initial measurement . 29
5.15.4 Test conditions . 29
5.15.5 Recovery . 30
5.15.6 Final inspection, measurements and requirements . 30
5.16 Robustness of terminations (only for capacitors with strip termination) . 30
5.16.1 General . 30
5.16.2 Test conditions . 31
5.16.3 Final inspection and requirements . 31
5.17 Component solvent resistance (if required) . 31
5.18 Solvent resistance of the marking (if required) . 31
5.19 Accelerated damp heat, steady state (if required) . 31
5.19.1 General . 31
5.19.2 Initial measurement . 31
5.19.3 Conditioning . 31
5.19.4 Recovery . 32
5.19.5 Final measurements . 32
6 Marking . 32

– 4 – IEC 60384-22:2024 CMV © IEC 2024
6.1 General . 32
6.2 Information for marking . 32
6.3 Marking on the body . 32
6.4 Requirements for marking . 33
6.5 Marking of the packaging . 33
6.6 Additional marking . 33
7 Information to be given in a detail specification . 33
7.1 General . 33
7.2 Outline drawing and dimensions . 33
7.3 Mounting . 33
7.4 Rating and characteristics . 33
7.4.1 General . 33
7.4.2 Nominal capacitance range . 34
7.4.3 Particular characteristics . 34
7.4.4 Soldering . 34
7.5 Marking . 34
8 Quality assessment procedures . 34
8.1 Primary stage of manufacture . 34
8.2 Structurally similar components . 34
8.3 Certified records of released lots . 34
8.4 Qualification approval . 34
8.4.1 General . 34
8.4.2 Qualification approval on the basis of the fixed sample size procedures . 35
8.4.3 Tests. 35
Annex A (normative) Guidance for the specification and coding of dimensions of fixed
surface mount multilayer capacitors of ceramic dielectric, Class 2 . 43
Annex B (informativenormative) Capacitance ageing of fixed capacitors of ceramic
dielectric, Class 2. 44
B.1 General . 44
B.2 Law of capacitance ageing . 44
B.3 Capacitance measurements and capacitance tolerance . 45
B.4 Special preconditioning (see 5.2) . 45
Annex C (informativenormative) Temperature characteristics of capacitance for the
reference temperature of 25 °C. 47
Annex D (normative) Quality conformance inspection . 50
D.1 Formation of inspection lots . 50
D.1.1 Groups A and B inspection . 50
D.1.2 Group C inspection . 50
D.2 Test schedule . 50
D.3 Delayed delivery . 50
D.4 Assessment levels . 50
D.5 test schedule for quality conformance inspection . 51
Annex X (informative) Cross-reference for reference to IEC 60384-22:20112019 . 57
Bibliography . 59
List of comments . 60

Figure 1 – Fault: crack or fissure . 14
Figure 2 – Fault: crack or fissure . 14

Figure 3 – Separation or delamination . 15
Figure 4 – Exposed electrodes . 15
Figure 5 – Principal faces . 15
Figure 6 – Reflow temperature profile . 22
Figure A.1 – Dimensions . 43

Table 1 – Preferred values of category voltages . 12
Table 2 – Preferred tolerances . 12
Table 3 – Temperature characteristic of capacitance . 13
Table 4 – Measuring conditions . 16
Table 5 – Tangent of loss angle limits . 17
Table 6 – Test voltages . 18
Table 7 – Details of measuring conditions . 20
Table 8 – Reflow temperature profiles for Sn-Ag-Cu alloy . 22
Table 9 – Maximum capacitance change . 23
Table 10 – Maximum capacitance change . 25
Table 11 – Number of damp heat cycles . 26
Table 12 – Final inspection, measurements and requirements . 27
Table 13 – Test conditions for damp heat, steady state . 28
Table 14 – Final inspection, measurements and requirements . 29
Table 15 – Endurance test conditions (U = U ). 29
C R
Table 16 – Endurance test conditions (U ≠ U ) . 30
C R
Table 17 – Final inspection, measurements and requirements of endurance test . 30
Table 18 – Initial requirements . 31
Table 19 – Conditioning. 32
Table 20 – Fixed sample size test plan for qualification approval Assessment level EZ . 36
Table 21 – Test schedule for qualification approval . 37
Table A.1 – Dimensions . 43
Table C.1 – Temperature characteristics of capacitance for the reference temperature
of 25 °C .
Table C.2 – Measuring conditions of temperature characteristic of capacitance for the
reference temperature of 25 °C.
Table C.1 – Temperature characteristics of capacitance . 48
Table C.2 – Preferred values of the temperature characteristic of capacitance with and
without a DC voltage applied . 49
Table C.3 – Measuring conditions of temperature characteristic of capacitance for the
reference temperature 25 °C . 49
Table D.1 – Lot-by-lot inspection . 51
Table D.2 – Periodic test . 51
Table D.3 – Test schedule for quality conformance inspection (lot by lot) . 52
Table D.4 – Test schedule for quality conformance inspection (Periodic test) . 53
Table X.1 – Reference to IEC 60384-22 for clause/subclause . 57
Table X.2 – Reference to IEC 60384-22 for figure/table . 58

– 6 – IEC 60384-22:2024 CMV © IEC 2024
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 22: Sectional specification –
Fixed surface mount multilayer capacitors of ceramic dielectric, Class 2

FOREWORD
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
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shall not be held responsible for identifying any or all such patent rights.
This commented version (CMV) of the official standard IEC 60384-22:2024 edition 4.0
allows the user to identify the changes made to the previous IEC 60384-22:2019
edition 3.0. Furthermore, comments from IEC TC 40 experts are provided to explain the
reasons of the most relevant changes, or to clarify any part of the content.
A vertical bar appears in the margin wherever a change has been made. Additions are in
green text, deletions are in strikethrough red text. Experts' comments are identified by a
blue-background number. Mouse over a number to display a pop-up note with the
comment.
This publication contains the CMV and the official standard. The full list of comments is
available at the end of the CMV.

IEC 60384-22 has been prepared by IEC technical committee 40: Capacitors and resistors for
electronic equipment. It is an International Standard.
This fourth edition cancels and replaces the third edition published in 2019. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) the document has been completely restructured to comply with the ISO/IEC Directives,
Part 2 and to make it more useable; tables, figures and references have been revised
accordingly; Annex X contains all cross-references of changes in clause/subclause
numbers;
b) the requirements of reference temperature 25 °C has been added in Table 5, Table 9,
Table 10, Table 12, Table 14 and Table 17;
c) the table of temperature characteristics of capacitance for the reference temperature 25 °C
have been added in Table C.1, Table C.2 and Table C.3;
d) the requirement in 5.5.2 (visual examination) has been repeated in 5.9.3, 5.10.6, 5.11.4,
5.12.6, 5.13.8, 5.14.6 and 5.15.6;
e) the deflection D in the very robust designs has been added in 5.9.1;
f) Annex C has been changed informative into normative;
g) Clause D.5 (Test schedule for quality conformance inspection) has been newly added to
withdraw the blank detail specification: IEC 60384-22-1.
The text of this International Standard is based on the following documents:
Draft Report on voting
40/3120/FDIS 40/3139/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this International Standard is English.
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications.
A list of all parts in the IEC 60384 series, published under the general title Fixed capacitors for
use in electronic equipment, can be found on the IEC website.

– 8 – IEC 60384-22:2024 CMV © IEC 2024
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn, or
• revised.
IMPORTANT – The "colour inside" logo on the cover page of this document indicates
that it contains colours which are considered to be useful for the correct understanding
of its contents. Users should therefore print this document using a colour printer.

FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 22: Sectional specification –
Fixed surface mount multilayer capacitors of ceramic dielectric, Class 2

1 Scope
This part of IEC 60384 is applicable to fixed unencapsulated surface mount multilayer
capacitors of ceramic dielectric, Class 2, for use in electronic equipment. These capacitors have
metallized connecting pads or soldering strips and are intended to be mounted on printed
boards, or directly onto substrates for hybrid circuits.
Capacitors for electromagnetic interference suppression are not included but are covered by
IEC 60384-14.
The object of this document is to prescribe specify preferred ratings and characteristics and to
select from IEC 60384-1:2021 the appropriate quality assessment procedures, tests and
measuring methods and to give general performance requirements for this type of capacitor.
Test severities and requirements prescribed in detail specifications referring to this sectional
specification are of equal or higher performance levels; lower performance levels are not
permitted. Test severities and requirements specified in detail specifications referring to this
document provide specific test severities and requirements of an equal or higher performance
level. Further information on the conception of generic, sectional and detail specifications can
be found in the Introduction of IEC 60384-1:2021. 1
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60063, Preferred number series for resistors and capacitors
IEC 60068-1:2013, Environmental testing – Part 1: General and guidance
IEC 60068-2-58:2015, Environmental testing – Part 2-58: Tests – Test Td – Test methods for
solderability, resistance to dissolution of metallization and to soldering heat of surface mounting
devices (SMD)
IEC 60068-2-58:2015/AMD1:2017
IEC 60384-1:20162021, Fixed capacitors for use in electronic equipment – Part 1: Generic
specification
IEC 61193-2:2007, Quality assessment system – Part 2: Selection and use of sampling plans
for inspection of electronic components and packages
ISO 3:1973, Preferred numbers – Series of preferred numbers

– 10 – IEC 60384-22:2024 CMV © IEC 2024
3 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60384-1 and the
following apply.
ISO and IEC maintain terminology databases for use in standardization at the following
addresses:
• IEC Electropedia: available at https://www.electropedia.org/
• ISO Online browsing platform: available at https://www.iso.org/obp
3.1
surface mount multilayer capacitor
multilayer capacitor whose small dimensions and nature or shape of terminations make it
suitable for surface mounting in hybrid circuits and on printed boards
3.2
capacitor of ceramic dielectric, Class 2
capacitor that has a dielectric with a high permittivity and is suitable for by-pass and coupling
applications or for frequency-discriminating circuits where low losses and high stability of
capacitance are not of major importance
Note 1 to entry: The ceramic dielectric is characterized by a non-linear change of capacitance over the category
temperature range (see Table 3).
3.3
subclass
maximum percentage change of capacitance within the category temperature range
with respect to the capacitance at the reference temperature 20 °C or 25 °C
Note 1 to entry: The subclass may be expressed in code form (see Table 3 and Annex C).
3.4
category temperature range
ambient temperature range for which the capacitor has been designed to operate continuously
Note 1 to entry: This is given by the lower and upper category temperature (see Table 3 and Annex C).
3.5
rated temperature
T
R
maximum ambient temperature at which the rated voltage may can be continuously applied
3.6
rated voltage
U
R
maximum DC voltage that may can be applied continuously to a capacitor at any temperature
between the lower category temperature and the rated temperature
Note 1 to entry: The maximum DC voltage is the sum of the DC voltage and peak AC voltage or peak pulse voltage
applied to the capacitor.
3.7
category voltage
U
C
maximum voltage that can be applied continuously to a capacitor at its upper category
temperature
4 Preferred ratings and characteristics
4.1 Preferred characteristics
Preferred climatic categories only shall be given in the preferred characteristics.
The capacitors covered by this document are classified into climatic categories in accordance
with the general rules given in IEC 60068-1:2013, Annex A.
For reference temperature 20 °C, the lower and upper category temperatures and the duration
of the damp heat, steady state test shall be chosen from the following:
• lower category temperature: −55 °C, −40 °C, −25 °C, −10 °C and +10 °C;
• upper category temperature: +70 °C, +85 °C, +100 °C, +125 °C and +150 °C;
• duration of the damp heat,
steady state test (40 °C, 93 % RH): 4, 10, 21 and 56 days.
For reference temperature 25 °C, the lower and upper category temperatures shall be chosen
from Table C.1 in Annex C. 2
The severities of the cold and dry heat tests are the lower and upper category temperatures
respectively.
NOTE The resistance to humidity resulting from the above climatic category is for the capacitors in their unmounted
state. The climatic performance of the capacitors after mounting is greatly influenced by the mounting substrate, the
mounting method (see 5.4) and the final coating.
4.2 Preferred values of ratings
4.2.1 Rated temperature (T )
R
The rated temperature is equal to the upper category temperature for capacitors with the upper
category temperature not exceeding 125 °C, unless otherwise stated in the detail specification.
4.2.2 Rated voltage (U )
R
The preferred values of the rated voltage are the values of the R5 series of ISO 3. If other
values are needed, they shall be chosen from the R10 series.
The sum of the DC voltage and the peak AC voltage or the peak-to-peak AC voltage, whichever
is the greater, applied to the capacitor shall not exceed the rated voltage.
4.2.3 Category voltage (U )
C
The category voltage is equal to the rated voltage for capacitors with the upper category
temperature not exceeding 125 °C. Any category voltages which are different from the rated
voltage, for capacitors with the upper category temperature exceeding 125 °C or for high-
voltage capacitors with rated voltages about 500 V, shall be given in the detail specification.
The preferred values of the category voltage at 125 °C upper category temperature for high
volumetric capacitors with a rated voltage of 16 V and less and a rated temperature of 85 °C
are given in Table 1.
– 12 – IEC 60384-22:2024 CMV © IEC 2024
Table 1 – Preferred values of category voltages
U    V
2,5 4 6,3 10 16
R
U    V
1,6 2,5 4 6,3 10
C
NOTE The numeric values of U are calculated by the following:
C
UU= 0,63×
CR
4.2.4 Preferred values of nominal capacitance and associated tolerance values
4.2.4.1 Preferred values of nominal capacitance
Nominal capacitance values shall should be taken from the number series of IEC 60063; the
E3, E6 and E12 series are preferred given in IEC 60063.
4.2.4.2 Preferred tolerances on nominal capacitance
See Table 2.
Table 2 – Preferred tolerances
Preferred series Tolerance Letter code
%
E3 and E6 −20/+80 Z
−20/+50 S
E6 ± 20 M
E6 and E12 ± 10 K
4.2.5 Temperature characteristic of capacitance
Table 3 denotes with a cross the preferred values of shows the temperature characteristic with
and without DC voltage applied for the reference temperature 20 °C. The method of coding the
subclass is also given; for example a dielectric with a percentage change of ±20 % without DC
voltage applied over the temperature range from −55 °C to +125 °C will be defined as a
dielectric of subclass 2C1.The temperature characteristics, category temperatures and
corresponding codes for the reference temperature 25 °C are given in Annex C. The
temperature range for which the temperature characteristic of the dielectric is defined is the
same as the category temperature range.

Table 3 – Temperature characteristic of capacitance
Maximum capacitance change Category temperature range and corresponding number
within the category temperature
code
range with respect to the
−55/+150 −55/+125 −55/+85 −40/+85 −25/+85 +10/+85
capacitance at 20 °C measured
with and without a DC voltage
Sub-class
applied
letter code
% °C °C °C °C °C °C
without DC with DC
voltage applied voltage 0 1 2 3 4 6
a
applied
× × ×
2B ±10
2C ±20 × × ×
Requirements
2D +20/−30 ×  ×
specified in the
detail
× × × ×
2E +22/−56
specification
2F +30/−80  × × × ×
×
2R ±15 × × ×
When the upper category temperature is above 125 °C, the limits of capacitance change, both with and without DC
voltage applied, should be given in the detail specification.
NOTE Annex C can be referred to for preferred values of the temperature characteristic for the reference
temperature of 25 °C.
a
DC voltage applied is either rated voltage or the voltage specified in the detail specification.
NOTE 2 "×" indicates preferred.

NOTE See Annex C for the reference temperature of 25 °C as an informative guidance.
4.2.6 Dimensions
Suggested rules for the specification and coding of dimensions are given in Annex A.
Specific dimensions shall be given in the detail specification.
5 Test and measurement procedures
5.1 General
This Clause 5 supplements the information given in IEC 60384-1:20162021, Clause 5 to Clause
10.
5.2 Special preconditioning
Unless otherwise specified in the detail specification, the special preconditioning, when
specified in this document before a test or a sequence of test, shall be carried out under the
following conditions.
Exposure at upper category temperature or at such higher temperature as may be specified in
the detail specification during 1 h, followed by recovery during (24 ± 1) h under standard
atmospheric conditions for testing.
NOTE Capacitors lose capacitance continuously with time in accordance with a logarithmic law (this is called
ageing). However, if the capacitor is heated to a temperature above the Curie point of its dielectric, then "de-ageing"
takes place, i.e. the capacitance lost through "ageing" is regained, and "ageing" recommences from the time when
the capacitor recools. The purpose of special preconditioning is to bring the capacitor to a defined state regardless
of its previous history (see Clause B.4 for further information).

– 14 – IEC 60384-22:2024 CMV © IEC 2024
5.3 Measuring conditions
See IEC 60384-1:20162021, 5.2.1.
5.4 Mounting
See IEC 60384-1:20162021, 5.5.
5.5 Visual examination and check of dimensions
5.5.1 General
See IEC 60384-1:20162021, 7.1, with the details of 5.5.2 and 5.5.3.
5.5.2 Visual examination
A visual examination shall be carried out with suitable equipment with approximately 10×
magnification and lighting appropriate to the specimen under test and the quality level required.
In case the specimen are very small components, the visual examination may be carried out
with higher magnification.
The operator should have available facilities for incident or transmitted illumination as well as
an appropriate measuring facility.
5.5.3 Requirements
5.5.3.1 General
Quantitative values for the r
...