IEC 60512-9-5:2020

IEC 60512-9-5 ®
Edition 2.0 2020-06
REDLINE VERSION
INTERNATIONAL
STANDARD
colour
inside
Connectors for electrical and electronic equipment – Tests and measurements –
Part 9-5: Endurance tests – Test 9e: Current loading, cyclic

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IEC 60512-9-5 ®
Edition 2.0 2020-06
REDLINE VERSION
INTERNATIONAL
STANDARD
colour
inside
Connectors for electrical and electronic equipment – Tests and measurements –

Part 9-5: Endurance tests – Test 9e: Current loading, cyclic

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.220.01 ISBN 978-2-8322-8517-6

– 2 – IEC 60512-9-5:2020 RLV © IEC 2020
CONTENTS
FOREWORD . 3
INTRODUCTION . 5
1 Scope and object . 6
2 Normative references . 6
3 Terms and definitions . 6
4 Preparations . 7
4.1 Test equipment . 7
4.2 Preparation of specimens . 7
4.3 Mounting of specimens . 7
5 Test/measuring methods . 7
5.1 Pre-conditioning . 7
5.2 Initial measurements . 7
5.3 Test . 8
5.3.1 General . 8
5.3.2 Method A . 8
5.3.3 Method B . 8
5.4 Recovery . 9
5.5 Final measurements . 9
6 Details to be specified . 10
Bibliography . 11

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
CONNECTORS FOR ELECTRICAL AND ELECTRONIC EQUIPMENT –
TESTS AND MEASUREMENTS –
Part 9-5: Endurance tests – Test 9e: Current loading, cyclic

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
This redline version of the official IEC Standard allows the user to identify the changes
made to the previous edition. A vertical bar appears in the margin wherever a change
has been made. Additions are in green text, deletions are in strikethrough red text.

– 4 – IEC 60512-9-5:2020 RLV © IEC 2020
International Standard IEC 60512-9-5 has been prepared by subcommittee 48B: Electrical
connectors, of IEC technical committee 48: Electrical connectors and mechanical structures
for electrical and electronic equipment.
This second edition cancels and replaces the first edition published in 2010. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
• added method B and renamed the former test method as method A, to provide an
alternative with more adjustable time “ON” and “OFF” for products with larger thermal
mass;
• added introduction to provide background of this revision;
The text of this International Standard is based on the following documents:
FDIS Report on voting
48B/2803/FDIS 48B/2819/RVD
Full information on the voting for the approval of this International Standard can be found in
the report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 60512 series, published under the general title Connectors for
electrical and electronic equipment – Tests and measurements, can be found on the IEC
website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to
the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
INTRODUCTION
The object of this document is to detail a standard method for subjecting solderless
connections to a thermal stress conditioning by cyclic current loading, in order to verify the
right combination of conductor material, termination material and tool application – if any is
required, in view of any possible creep phenomena that might lead to a reduction of
performance of the solderless connection.
Although requiring electric power to apply the specified current loading, this test is an
endurance test by thermal conditioning, whose aim is to submit specimens of connectors
using solderless connections or of solderless connections to a repeated cycling between
ambient temperature (normal laboratory conditions) and the upper limiting temperature (ULT)
specified for the connector or solderless connection, either by the detail product specification
or the manufacturer specification, or by the default values provided in the relevant part of
IEC 60352 series.
The way the solderless connection under test acts is affected both by the solderless
termination design and material and the attached conductor size and material, as well as by
any tool applied to produce the connection, with all relevant settings and accessories as
specified for the particular combination of termination and conductor.
Time “ON” represents the “heating” interval necessary to reach the ULT from ambient
temperature, time “OFF” represents the “cooling” interval, necessary to cool down the
specimen to ambient temperature. The sum of these intervals represents a cycle. Due to the
various nature of a solderless connection in terms of size and thermal inertia of the
termination and of the attached conductor, the traditional method with fixed duty cycle
duration it is not always suitable.
For this reason, two methods are now provided to perform this test:
– method A is the traditional one, with time “ON” of 45 min and time “OFF” of 15 min, that
has proven suitable for small-sized solderless connections, e.g. connections employing
conductors with cross-sectional area less than or equal to 10 mm . However, even in such
cases, depending on the thermal mass of the termination or the conductor (e.g. for a
crimped connection), method B may be preferable;
– method B is with time “ON” or time “OFF” to be determined experimentally by the first test
cycle. Moreover, heating time by current load may be even abbreviated by increasing and
controlling the current load, whereas cooling may be accelerated too, by forced air cooling.
Because the number of repeated cycles is the primary factor affecting the severity of this
test, long duration times at ULT (highest temperature) and ambient temperature (lowest
temperature) may not be necessary for the purpose of this test. This method is suitable for
large-sized solderless connections, e.g. connections employing conductors with cross-
sectional area larger than 10 mm .

– 6 – IEC 60512-9-5:2020 RLV © IEC 2020
CONNECTORS FOR ELECTRICAL AND ELECTRONIC EQUIPMENT –
TESTS AND MEASUREMENTS –
Part 9-5: Endurance tests – Test 9e: Current loading, cyclic

1 Scope and object
This part of IEC 60512, when required by the detail product specification, is used for testing
connectors or solderless connections within the scope of technical committee 48. It may also be
used for similar devices when specified in a detail product specification.
The object of this document is to detail a standard method for subjecting solderless
connections to thermal stress conditioning by cyclic current loading.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their
content constitutes requirements of this document. For dated references, only the edition
cited applies. For undated references, the latest edition of the referenced document (including
any amendments) applies.
IEC 60352 (all parts), Solderless connections
IEC 60512-1:2018, Connectors for electrical and electronic equipment – Tests and
measurements – Part 1: General Generic specification
IEC 60512-1-1, Connectors for electronic equipment – Tests and measurements – Part 1-1:
General examination – Test 1a: Visual examination
IEC 60512-2-1, Connectors for electronic equipment – Tests and measurements – Part 2-1:
Electrical continuity and contact resistance tests – Test 2a: Contact resistance – Millivolt level
method
IEC 60512-2-2, Connectors for electronic equipment – Tests and measurements – Part 2-2:
Electrical continuity and contact resistance tests – Test 2b: Contact resistance – Specified
test current method
IEC 60512-2-6, Connectors for electronic equipment – Tests and measurements – Part 2-6:
Electrical continuity and contact resistance tests – Test 2f: Housing (shell) electrical continuity
IEC 60512-3-1, Connectors for electronic equipment – Tests and measurements – Part 3-1:
Insulation tests – Test 3a: Insulation resistance
IEC 60512-4-1, Connectors for electronic equipment – Tests and measurements – Part 4-1:
Voltage stress tests – Test 4a: Voltage proof
3 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60512-1 apply.
ISO and IEC maintain terminological databases for use in standardization at the following
addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
4 Preparations
4.1 Test equipment
For the performance of this thermal conditioning, a suitable current source generator is
required. Test may be performed either in AC or DC current. The output voltage of the power
source shall be suitable to cover the voltage drop all along the test circuit, which may foresee
daisy chained specimens (see 4.2 and 4.3).
Other instruments required are a voltmeter to measure voltage drop and a micro-ohm meter to
measure resistance across the solderless connection under test.
Further test instruments are those specified in the relevant test methods called up in the
following clauses.
4.2 Preparation of specimens
A specimen shall consist of a solderless connection made with the relevant termination and
the appropriate conductor as specified in the detail product specification.
Type and number of specimens shall be specified in the detail product specification. In case
of multiple specimens, these may be wired in series, provided that each specimen does not
thermally influence the subsequent one. Therefore, the length of the connecting conductors
shall be chosen long enough to avoid mutual influence (the temperature at the opposite end of
a heated specimen should be ambient temperature).
4.3 Mounting of specimens
Mounting and electrical connections in the test circuit shall be as specified in the detail
product specification, e.g. connection of several specimens in series.
For solderless connections used in connectors, in case of multiple specimens specified, the
specimens shall be mounted inside one or more relevant connector mating pairs.
5 Test/measuring methods
5.1 Pre-conditioning
Before starting the initial measurements, the specimens shall be pre-conditioned under
standard atmospheric conditions for testing as specified in IEC 60512-1 for a period of 24 h,
unless otherwise specified in the detail product specification.
5.2 Initial measurements
Before test is started, initial measurements (e.g. initial contact resistance or initial voltage
drop) as specified in the detail product specification shall be done in accordance with the
relevant part of IEC 60512.
– 8 – IEC 60512-9-5:2020 RLV © IEC 2020
5.3 Test
5.3.1 General
Two methods are available:
– method A is the traditional one, fixing the time “ON” and time “OFF” of the cyclic current
loading;
– method B is a variant of method A that identifies experimentally the time “ON” and “OFF”
of the cyclic current loading during the first cycle of test, and allows forced heating and
cooling, in order to reduce time, when a high number of cycles is specified, e.g. by
increasing the applied current and then regulating it, and by using forced air cooling.
Method A is suitable for small-sized solderless connections, e.g. connections employing
conductors with cross-sectional area lower than or equal to 10 mm . However, even in such
cases, depending on the thermal mass of the termination (e.g. crimp contact), method B may
be preferable.
Method B is suitable for large-sized solderless connections, e.g. connections employing
conductors with cross-sectional area larger than 10 mm .
5.3.2 Method A
This method is particularly suitable for relatively small solderless connections. When the
involved dimensions of both the solderless termination and the attached conductor, their mass,
and the implied thermal mass are likely to determine longer heating and cooling periods,
method B is preferable.
The test shall be carried out in still air.
The ambient temperature shall be recorded during the test. Care shall be taken to minimize
radiant heat effects.
The specimen shall be loaded with current as specified in the detail product specification. The
purpose of this current load is to increase the temperature of the specimens up to the ULT
specified in the detail product specification or, in lack of it, the default ULT specified in the
relevant part of IEC 60352.
Current loading shall be "ON" for 45 min and "OFF" for 15 min. This shall be considered to be
one cycle. The number of cycles shall be as specified in the detail specification. Preferred
numbers of cycles are 20, 100 and 500, unless otherwise specified in the detail product
specification.
Material combinations which have proven their reliable performance in many years of
application in multiple application-specific working conditions, do not require a high number of
cycles specified. Material combinations that are new or different from those referred to as
preferred choice in the relevant part of IEC 60352 shall require a high number of cycles to
gain validation.
5.3.3 Method B
This method is particularly suitable for large-sized solderless connections, i.e. employing
cross-sectional area conductors larger than 10 mm . This method can however be used also
for smaller sized solderless connections.
The heating period and cooling period are not of specified duration. Their duration shall be
established experimentally at the first cycle.

The current to apply for heating shall be such that the solderless connection reaches at
regime (steady-state) the upper limiting temperature (ULT) specified by the detail product
specification or by the relevant part of IEC 60352 (e.g. by default for crimped connection
ULT = 125 °C).
The ambient temperature shall be recorded during the test.
When this test is applied on solderless connections to be used in connectors, this current is
provided by the derating diagram of the connector, for the specified conductor cross-sectional
area, where the solderless connection under test is used.
In such cases the specimens shall be arranged in the relevant connector mated pair(s) in a
condition representative of their actual use.
All points of a derating curve represent combinations of current (derated by a factor 0,8
unless otherwise specified on the derating curve) and ambient temperature for which the
connection’s hot spot reaches the ULT.
It is allowed to shorten the heating and cooling periods of a cycle, in order to minimize overall
test duration, e.g. by applying a current higher than that identified above and then regulating it
during the heating period, and by using forced air cooling during the cooling period.
The regime (steady state) condition, both at the end of the heating and of the cooling periods,
is reached when thermal stability is achieved. This is defined as when the temperature
variation does not exceed 2 °C in 10 min (due to the amplitude of the temperature cycling, a
more stringent accuracy in defining the steady state condition is not required).
The preferred numbers of cycles are 20, 100 and 500 unless otherwise specified in the detail
product specification.
Material combinations that have proven their reliable performance in many years of
application in multiple application-specific working conditions do not require a high number of
cycles specified. Material combinations that are new or different from those referred to as
preferred choice in the relevant part of the IEC 60352 series shall require a high number of
cycles to gain validation.
5.4 Recovery
After this cyclic test and before carrying out any subsequent measurement, the specimen
shall be allowed to recover at standard conditions for testing as specified in 6.1 of IEC 60512-
1:2018 for a period of 1 h minimum.
5.5 Final measurements
a) Contact resistance (IEC 60512-2-1, test 2a). This test may be replaced by a voltage drop
measurement (IEC 60512-2-2, test 2b), particularly suitable for large sized solderless
connections. This is the first and most important failure criterion to fix in the detail product
specification (or in the relevant part of IEC 60352).
b) Housing (shell) electrical continuity (IEC 60512-2-6, test 2f), where applicable.
c) Insulation resistance (IEC 60512-3-1, test 3a) , if applicable (solderless connections that
do not have pre-insulated cover and that are tested outside of the connector body, do not
require this test).
d) Voltage proof (IEC 60512-4-1, test 4a) , if applicable (solderless connections that do not
have pre-insulated cover and that are tested outside of the connector body, do not require
this test).
e) Visual examination (IEC 60512-1-1, test 1a).

– 10 – IEC 60512-9-5:2020 RLV © IEC 2020
f) Operational tests (if applicable, the detail product specification may e.g. require a sealing
test from the IEC 60512-14 series, or an ingress protection test according IEC 60529).
NOTE If applicable, the detail specification may require a sealing test from the IEC 60512-14 series or an ingress
protection test according IEC 60529.
6 Details to be specified
When this test is required by the detail product specification, the following details shall be
specified:
a) type and number of specimens;
b) wire/conductor size, type and length;
c) mounting and electrical connections in the test circuit;
d) test method (method A or B);
e) initial measurements as applicable,and requirements after initial measurements (e.g.
contact resistance or voltage drop, temperature rise, etc.);
f) test current to be applied;
g) upper limiting temperature for the solderless connection to reach at the end of the “heating”
period;
h) number of cycles to be carried out;
i) final measurements as applicable, and requirements after final measurements (e.g. contact
resistance or voltage drop, temperature rise, insulation resistance, etc., and operational
tests);
j) any deviation from the standard test method.

Bibliography
IEC 60352-1:1997, Solderless connections – Part 1: Wrapped connections − General
requirements, test methods and practical guidance
IEC 60352-2:2006, Solderless connections – Part 2: Crimped connections – General
requirements, test methods and practical guidance
IEC 60352-2:2006/AMD1:2013
IEC 60352-3:1993, Solderless connections – Part 3: Solderless accessible insulation
displacement connections − General requirements, test methods and practical guidance
IEC 60352-4:1994, Solderless connections – Part 4: Solderless non-accessible insulation
displacement connections − General requirements, test methods and practical guidance
IEC 60352-5:2012, Solderless connections – Part 5: Press-in connections − General
requirements, test methods and practical guidance
IEC 60352-6:1997, Solderless connections – Part 6: Insulation piercing connections − General
requirements, test methods and practical guidance
IEC 60352-7:2002, Solderless connections – Part 7: Spring clamp connections − General
requirements, test methods and practical guidance
IEC 60352-8:2011, Solderless connections – Part 8: Compression mount connections –
General requirements, test methods and practical guidance
IEC 60512-14-2:2006, Connectors for electronic equipment – Tests and measurements –
Part 14-2: Sealing tests – Test 14b: Sealing – Fine air leakage
IEC 60512-14-4:2006, Connectors for electronic equipment – Tests and measurements –
Part 14-4: Sealing tests – Test 14d: Immersion – Waterproof
IEC 60512-14-5:2006, Connectors for electronic equipment – Tests and measurements –
Part 14-5: Sealing tests – Test 14e: Immersion at low air pressure
IEC 60512-14-6:2006, Connectors for electronic equipment – Tests and measurements –
Part 14-6: Sealing tests – Test 14f: Interfacial sealing
IEC 60512-14-7:1997, Electromechanical components for electronic equipment – Basic testing
procedures and measuring methods – Part 14: Sealing tests – Section 7: Test 14g: Impacting
water
IEC 60529:1989, Degrees of protection provided by enclosures (IP Code)
IEC 60529:1989/AMD1:1999
IEC 60529:1989/AMD2:2013
___________
IEC 60512-9-5 ®
Edition 2.0 2020-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Connectors for electrical and electronic equipment – Tests and measurements –
Part 9-5: Endurance tests – Test 9e: Current loading, cyclic

Connecteurs pour équipements électriques et électroniques –
Essais et mesures –
Partie 9-5: Essais d'endurance – Essai 9e: Charge en courant, essai cyclique

– 2 – IEC 60512-9-5:2020 © IEC 2020
CONTENTS
FOREWORD . 3
INTRODUCTION . 5
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 6
4 Preparations . 7
4.1 Test equipment . 7
4.2 Preparation of specimens . 7
4.3 Mounting of specimens . 7
5 Test / measuring methods . 7
5.1 Pre-conditioning . 7
5.2 Initial measurements . 7
5.3 Test . 8
5.3.1 General . 8
5.3.2 Method A . 8
5.3.3 Method B . 8
5.4 Recovery . 9
5.5 Final measurements . 9
6 Details to be specified . 10
Bibliography . 11

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
CONNECTORS FOR ELECTRICAL AND ELECTRONIC EQUIPMENT –
TESTS AND MEASUREMENTS –
Part 9-5: Endurance tests – Test 9e: Current loading, cyclic

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60512-9-5 has been prepared by subcommittee 48B: Electrical
connectors, of IEC technical committee 48: Electrical connectors and mechanical structures
for electrical and electronic equipment.
This second edition cancels and replaces the first edition published in 2010. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
• added method B and renamed the former test method as method A, to provide an
alternative with more adjustable time “ON” and “OFF” for products with larger thermal
mass;
• added introduction to provide background of this revision;

– 4 – IEC 60512-9-5:2020 © IEC 2020
The text of this International Standard is based on the following documents:
FDIS Report on voting
48B/2803/FDIS 48B/2819/RVD
Full information on the voting for the approval of this International Standard can be found in
the report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 60512 series, published under the general title Connectors for
electrical and electronic equipment – Tests and measurements, can be found on the IEC
website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to
the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
INTRODUCTION
The object of this document is to detail a standard method for subjecting solderless
connections to a thermal stress conditioning by cyclic current loading, in order to verify the
right combination of conductor material, termination material and tool application – if any is
required, in view of any possible creep phenomena that might lead to a reduction of
performance of the solderless connection.
Although requiring electric power to apply the specified current loading, this test is an
endurance test by thermal conditioning, whose aim is to submit specimens of connectors
using solderless connections or of solderless connections to a repeated cycling between
ambient temperature (normal laboratory conditions) and the upper limiting temperature (ULT)
specified for the connector or solderless connection, either by the detail product specification
or the manufacturer specification, or by the default values provided in the relevant part of
IEC 60352 series.
The way the solderless connection under test acts is affected both by the solderless
termination design and material and the attached conductor size and material, as well as by
any tool applied to produce the connection, with all relevant settings and accessories as
specified for the particular combination of termination and conductor.
Time “ON” represents the “heating” interval necessary to reach the ULT from ambient
temperature, time “OFF” represents the “cooling” interval, necessary to cool down the
specimen to ambient temperature. The sum of these intervals represents a cycle. Due to the
various nature of a solderless connection in terms of size and thermal inertia of the
termination and of the attached conductor, the traditional method with fixed duty cycle
duration it is not always suitable.
For this reason, two methods are now provided to perform this test:
– method A is the traditional one, with time “ON” of 45 min and time “OFF” of 15 min, that
has proven suitable for small-sized solderless connections, e.g. connections employing
conductors with cross-sectional area less than or equal to 10 mm . However, even in such
cases, depending on the thermal mass of the termination or the conductor (e.g. for a
crimped connection), method B may be preferable;
– method B is with time “ON” or time “OFF” to be determined experimentally by the first test
cycle. Moreover, heating time by current load may be even abbreviated by increasing and
controlling the current load, whereas cooling may be accelerated too, by forced air cooling.
Because the number of repeated cycles is the primary factor affecting the severity of this
test, long duration times at ULT (highest temperature) and ambient temperature (lowest
temperature) may not be necessary for the purpose of this test. This method is suitable for
large-sized solderless connections, e.g. connections employing conductors with cross-
sectional area larger than 10 mm .

– 6 – IEC 60512-9-5:2020 © IEC 2020
CONNECTORS FOR ELECTRICAL AND ELECTRONIC EQUIPMENT –
TESTS AND MEASUREMENTS –
Part 9-5: Endurance tests – Test 9e: Current loading, cyclic

1 Scope
This part of IEC 60512, when required by the detail product specification, is used for testing
connectors or solderless connections within the scope of technical committee 48. It may also be
used for similar devices when specified in a detail product specification.
The object of this document is to detail a standard method for subjecting solderless
connections to thermal stress conditioning by cyclic current loading.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their
content constitutes requirements of this document. For dated references, only the edition
cited applies. For undated references, the latest edition of the referenced document (including
any amendments) applies.
IEC 60352 (all parts), Solderless connections
IEC 60512-1:2018, Connectors for electrical and electronic equipment – Tests and
measurements – Part 1: Generic specification
IEC 60512-1-1, Connectors for electronic equipment – Tests and measurements – Part 1-1:
General examination – Test 1a: Visual examination
IEC 60512-2-1, Connectors for electronic equipment – Tests and measurements – Part 2-1:
Electrical continuity and contact resistance tests – Test 2a: Contact resistance – Millivolt level
method
IEC 60512-2-2, Connectors for electronic equipment – Tests and measurements – Part 2-2:
Electrical continuity and contact resistance tests – Test 2b: Contact resistance – Specified
test current method
IEC 60512-2-6, Connectors for electronic equipment – Tests and measurements – Part 2-6:
Electrical continuity and contact resistance tests – Test 2f: Housing (shell) electrical continuity
IEC 60512-3-1, Connectors for electronic equipment – Tests and measurements – Part 3-1:
Insulation tests – Test 3a: Insulation resistance
IEC 60512-4-1, Connectors for electronic equipment – Tests and measurements – Part 4-1:
Voltage stress tests – Test 4a: Voltage proof
3 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60512-1 apply.
ISO and IEC maintain terminological databases for use in standardization at the following
addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
4 Preparations
4.1 Test equipment
For the performance of this thermal conditioning, a suitable current source generator is
required. Test may be performed either in AC or DC current. The output voltage of the power
source shall be suitable to cover the voltage drop all along the test circuit, which may foresee
daisy chained specimens (see 4.2 and 4.3).
Other instruments required are a voltmeter to measure voltage drop and a micro-ohm meter to
measure resistance across the solderless connection under test.
Further test instruments are those specified in the relevant test methods called up in the
following clauses.
4.2 Preparation of specimens
A specimen shall consist of a solderless connection made with the relevant termination and
the appropriate conductor as specified in the detail product specification.
Type and number of specimens shall be specified in the detail product specification. In case
of multiple specimens, these may be wired in series, provided that each specimen does not
thermally influence the subsequent one. Therefore, the length of the connecting conductors
shall be chosen long enough to avoid mutual influence (the temperature at the opposite end of
a heated specimen should be ambient temperature).
4.3 Mounting of specimens
Mounting and electrical connections in the test circuit shall be as specified in the detail
product specif
...