IEC 60512-23-3:2018

IEC 60512-23-3 ®
Edition 2.0 2018-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Connectors for electrical and electronic equipment – Tests and measurements –
Part 23-3: Screening and filtering tests – Test 23c: Shielding effectiveness of
connectors and accessories – Line injection method

Connecteurs pour équipements électriques et électroniques – Essais et
mesures –
Partie 23-3: Essais d’écrantage et de filtrage – Essai 23c: Efficacité de blindage
des connecteurs et des accessoires – Méthode de la ligne d’injection

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IEC 60512-23-3 ®
Edition 2.0 2018-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Connectors for electrical and electronic equipment – Tests and measurements –

Part 23-3: Screening and filtering tests – Test 23c: Shielding effectiveness of

connectors and accessories – Line injection method

Connecteurs pour équipements électriques et électroniques – Essais et

mesures –
Partie 23-3: Essais d’écrantage et de filtrage – Essai 23c: Efficacité de blindage

des connecteurs et des accessoires – Méthode de la ligne d’injection

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.220.01 ISBN 978-2-8322-6319-8

– 2 – IEC 60512-23-3:2018 © IEC 2018
CONTENTS
FOREWORD . 3
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 8
3 Terms and definitions . 8
4 Test method . 9
4.1 Test requirements . 9
4.2 Applicable frequency range . 9
5 Test equipment . 9
6 Preparation of the test specimen . 10
6.1 General . 10
6.2 Circular connectors . 10
6.3 Rectangular connectors . 11
6.4 Connectors for printed boards . 11
6.5 Impedance matching of primary and secondary circuits . 12
6.5.1 General. 12
6.5.2 Preparation of the secondary circuit . 12
6.5.3 Adaptation of the primary circuit . 12
6.6 Calibration of test set-up . 12
7 Measurement of shielding effectiveness . 13
7.1 Measurement . 13
7.2 Method of calculating shielding effectiveness SE (attenuation) from surface
transfer impedance Z . 13
T
8 Requirements . 14
9 Details to be specified . 14
Bibliography . 15

Figure 1 – Principle of line injection method . 8
Figure 2 – Installation of test set-up . 10
Figure 3 – Example of test set-up for shielded circular connectors . 11
Figure 4 – Example of test set-up for shielded rectangular connectors . 11
Figure 5 – Example of test set-up for shielded printed board connectors . 12
Figure 6 – Calibration test set-up . 13
Figure 7 – Example of a shielding attenuation (shielding effectiveness) plot . 14

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
CONNECTORS FOR ELECTRICAL AND ELECTRONIC
EQUIPMENT – TESTS AND MEASUREMENTS –

Part 23-3: Screening and filtering tests – Test 23c: Shielding effectiveness
of connectors and accessories – Line injection method

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
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6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
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expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60512-23-3 has been prepared by subcommittee 48B: Electrical
connectors, of IEC technical committee 48: Electrical connectors and mechanical structures
for electrical and electronic equipment.
This second edition cancels and replaces the first edition, published in 2000. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) an introduction has been added to provide some guidance to this document in view of
concurrent test method 23g in the same family;

– 4 – IEC 60512-23-3:2018 © IEC 2018
b) the frequency range for which this test method is considered reliable moved from 1 GHz
to 3 GHz, to be consistent with Figure 7 (unchanged) and current industry practice and
need;
c) update to IEC 62153-4-6:2017 of former normative reference IEC 60096-4-1:1990,
withdrawn and incorrect (should have been IEC 61196-1:1995, also withdrawn);
d) update to current subclause numbers of IEC 62153-4-6:2017 what were the previous
subclause numbers referenced in IEC 61196-1:1995 (wrongly attributed to IEC 60096-4-
1:1990). For immediate understanding the title of these subclauses has been added;
e) alignment of title to the current scope of SC 48B (connectors) and inclusion of electrical
equipment as target application of said connectors (per current scope of TC 48) and
explicit reference to the method – line injection – for the measurement of transfer
impedance;
f) symbols SE for shielding effectiveness and Z for surface transfer impedance added
T
throughout the document;
g) list of connectors to which the test method is applicable – previously in 3.1 – moved in
scope;
h) former name of AECMA organization changed to the current ASD-STAN;
i) “specimen” used instead of “sample” throughout the document;
j) clarification in the title of what transfer impedance is described in Table 3 and editorial
improvement of the same;
k) “dielectric constant” changed into the updated term “relative permittivity”;
l) added a note to warn about the fact that this test method requires in 6.6 a TDR with more
stringent rise time of less than 100 ps than the value of less than 350 ps specified both in
IEC 62153-4-6 and in EN 50289-1-6 for the similar line injection method applied to
screened cables, whereas test 23g of IEC 60512-23-7 specifies for the same purpose a
TDR with a rise time of less than 200 ps;
m) adoption of term “connector housing” [IEV 581-27-10] instead of “shell” to address the
connector accessory providing the shielding;
n) title “Transfer impedance Z [Ω]” added to the ordinate axis on the left side of double log
T
diagram of Figure 7;
o) explanatory note to clarify the conversion formula for SE from Z added.
T
The text of this International Standard is based on the following documents:
FDIS Report on voting
48B/2631/CDV 48B/2670/RVC
Full information on the voting for the approval of this International Standard can be found in
the report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.
Future standards in this series will carry the new general title as cited above. Titles of existing
standards in this series will be updated at the time of the next edition.
A list of all parts in the IEC 60512 series, published under the general title Connectors for
electrical and electronic equipment – Tests and measurements, can be found on the IEC
website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to
the specific document. At this date, the document will be

• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
– 6 – IEC 60512-23-3:2018 © IEC 2018
INTRODUCTION
This document is part of the IEC 60512 series within the group of standards identified as
Part 23: Screening and filtering tests.
It covers a method to measure the shielding (screening) effectiveness of shielded connectors
or of shielding accessories for connectors that are non-inherently shielded, e.g. connector
shielded housings and/or connector EMC cable glands, by measurement of the surface
transfer impedance Z (Ω) as a function of the frequency. By using a formula, Z is then
T T
converted in shielding effectiveness SE (dB).
In Part 23 there is another document, IEC 60512-23-7, Connectors for electronic equipment –
Tests and measurements – Part 23-7 – Screening and filtering tests – Test 23g: Effective
transfer impedance of connectors, that provides test 23g.
The first difference between the method described in this document and test 23g is that here
in test 23c, in the measurement of the transfer impedance Z the capacitive coupling
T
phenomena covered by the capacity coupling impedance Z are considered negligible, while
F
test 23g includes these effects to measure the effective surface transfer impedance Z .
TE
This test 23c is applicable to a wide range of applications: it covers circular connectors,
rectangular connectors and connectors for PCBs, as well as connector shielding accessories,
i.e. those accessories such as connector shielded housings and/or metal shielding plates,
providing shielding properties to a non-inherently shielded connector.
Test 23g is a variant of the triaxial test method for screened cables of IEC 62153-4-7, it
addresses more specifically non-circular screened (shielded) connectors, it requires as DUT a
complete cable assembly, i.e. a short piece of screened cable terminated by two connectors
to be tested, and it requires also two adaptors plus a specific test jig.
More differences will be clear by a comparative read of the two test methods (this test 23c
and test 23g) for the choice of the most suitable test to be indicated by the connector (or
accessory) product detail specification or the manufacturer specification.
For further guidance regarding EMC testing of connectors and cable assemblies with
screened cables and connectors, see also IEC TS 62513-4-1.

CONNECTORS FOR ELECTRICAL AND ELECTRONIC
EQUIPMENT – TESTS AND MEASUREMENTS –

Part 23-3: Screening and filtering tests – Test 23c: Shielding effectiveness
of connectors and accessories – Line injection method

1 Scope
This part of IEC 60512 defines a standard test method for measuring the shielding
effectiveness SE of a shielded connector, or of a connector not provided with integral shield
once fitted with a shielding accessory and terminated with a screened cable.
The complete assembly has a continuous 360° shielding capability throughout its length.
NOTE 1 Practically, continuous 360° shielding is not always achievable based on the geometry of the connector.
NOTE 2 Shielding” is used in this document with the same meaning as “screening”.
This test method can be applied to shielded connectors and to connector accessories with
shielding capability. The following different connector designs can be tested:
– circular connectors;
– rectangular connectors;
– connectors for printed boards;
– connector shielding accessories.
NOTE 3 For the definition of “accessory” see IEV 581-24-10. A shielding accessory i.e. an accessory that confers
shielding to a non-inherently shielded connector, may be a suitable set of shielded housings providing electrical
continuity, along the mated connector set, between the screen of the (screened) cable at the cable outlet of the
free cable connector housing and the metallic mounting surface for the fixed connector housing. The free connector
housing is provided with a cable screen clamp.
This test method utilizes the principle that the intrinsic shielding property of the connector/
accessory/cable assembly is its surface transfer impedance Z which can be expressed as the
T
longitudinal voltage inside the shield, relative to the current flow on the outside shell.
This test method is based on two impedance-matched circuits. See Figure 1 for the
measurement principle. The connector specimen under test is integrated into the secondary
circuit 02. The impedance-matched injection line of the primary circuit 01, which activates
the electromagnetic field, runs parallel to the surface of the specimen under test.
This test is also suitable for measuring the shielding effectiveness of a connector fitted with
triaxial contacts terminated with shielded, twisted pair cables, as used in data bus systems.
NOTE 4 This standard has been adopted by ASD-STAN (formerly known as AECMA) as EN 2591-212 .

– 8 – IEC 60512-23-3:2018 © IEC 2018

Key
Z characteristic impedance, primary circuit
Z characteristic impedance, secondary circuit
L length of coupling section
P power, primary circuit
P power, far end, secondary circuit
2f
P power, near end, secondary circuit
2n
Figure 1 – Principle of line injection method
2 Normative references
The following documents are referred to in the text in such a way that some or all of their
content constitutes requirements of this document. For dated references, only the edition
cited applies. For undated references, the latest edition of the referenced document (including
any amendments) applies.
IEC 60050-581, International Electrotechnical Vocabulary - Part 581: Electromechanical
components for electronic equipment
IEC 60512-1, Connectors for electrical and electronic equipment – Tests and measurements –
Part 1: Generic specification
IEC 62153-4-6:2017, Metallic cables and other passive components test methods – Part 4-6:
Electromagnetic compatibility (EMC) – Surface transfer impedance – Line injection method
3 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60050-581 and in
IEC 60512-1 apply.
ISO and IEC maintain terminological databases for use in standardization at the following
addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp

4 Test method
4.1 Test requirements
This method is based on IEC 62153-4-6:2017 and the specimen under test shall be tested
with the cables installed. However, reference to 7.2.1 (reduced primary current) and 7.2.3
(inhomogeneities of cable screens around the circumference) of IEC 62153-4-6:2017 shall be
made to ensure that an electrically short length is maintained and that a minimum of four
points around the circumference of the specimen under test are measured.
The line injection method provides a means of obtaining two impedance-matched
transmission lines. This is achieved by selecting as the first transmission line an inner pick-up
line through the specimen under test, said line being adjusted to provide an impedance match
as close as possible to 50 Ω relative to the specimen under test. The second outer
transmission line is achieved by laying an injection wire along the length of the specimen
under test, this line also being adjusted to provide an impedance match as close as possible
to 50 Ω relative to the specimen under test.
It shall be ensured that there is no earth loop between the signal source and the measuring
equipment.
4.2 Applicable frequency range
The applicable frequency range is 10 kHz up to 3 GHz. The maximum applicable frequency is
dependent on the test set-up and the dimensions of the specimen under test.
The maximum applicable frequency can be calculated as:
c
f= (1)
π× L × ε − ε
r2 r1
where
c = 3 × 10 m/s (speed of light in vacuum);
L is the length of the coupling section of the specimen under test in m (see Figure 1);
ε is the relative permittivity of the primary circuit;
r1
ε is the relative permittivity of the secondary circuit.
r2
5 Test equipment
The test and measuring equipment shall consist of (see Figure 2):
– a vector network analyser or alternatively a signal generator with the same characteristic
impedance as the line injection circuit and with a power amplifier if necessary for very low
transfer impedance and a receiver with a calibrated step attenuator and complemented
with a low noise amplifier for very low transfer impedance;
– a power splitter (as required);
– attenuators (as required);
– termination loads matching the impedance of the vector network analyzer ports;
– test adapter;
– a time domain reflectometer (TDR) with rise time of less than 100 ps or a vector network
analyser (at least 3 GHz) performing a return loss measurement transformed into the time
domain (see 6.6);
– 10 – IEC 60512-23-3:2018 © IEC 2018
– an insulated copper foil or a multi-conductor ribbon cable for the injection line
construction.
NOTE This test method specifies the use of a TDR with rise time of less than 100 ps (see 6.5.3), whereas test
23g of IEC 60512-23-7 specifies for the same test equipment a rise time of less than 200 ps and the standards
covering line injection method for screened cables IEC 62153-4-6 and EN 50289-1-6 specify for the TDR a rise
time of less than 350 ps.
Key
A1 Coupling box
A2 Termination box
D Launchers for injection line
F Feeding cables for primary circuit
Figure 2 – Installation of test set-up
6 Preparation of the test specimen
6.1 General
In all applications when testing accessories, the shielding tube is replaced with the accessory
to be tested.
NOTE The term “accessories” means here e.g. “EMC cable glands”. The connector shielded housings (which are
also “accessories” in this document) do not replace the shielding tube.
6.2 Circular connectors
The r.f. proof shielding tubes are mounted on the connector housings.
The total length L of the specimen under test acts as the coupling section.
Figure 3 shows an example of a test set-up for shielded circular connectors. The coupling of
the injection line is carried out by semi-rigid coaxial cables with appropriate termination load
for the feeding cable of the signal generator. The outer conductor of the semi-rigid cable and
the shielding tube are connected by soldering.
The injection line shall be isolated from the conductive surfaces of the connector housings.
Therefore, for impedance matching, a suitable dielectric has to be chosen.

Figure 3 – Example of test set-up for shielded circular connectors
6.3 Rectangular connectors
For rectangular connectors in shielded housings, the shielding tubes or equivalent shielded
cables are coupled to the cable retention (cable screen clamp) of the connector shielded
housings which is r.f. proof.
The coupling section extends over the total length L of both housings in the direction of the
signal path.
If the connector interface is mounted to a shielded housing only on one side, the adaptor shall
have a separate outer shielding.
In Figure 4, an example of a test set-up for shielded rectangular connectors is shown. Semi-
rigid coaxial cables are used for coupling of the injection line, which is isolated from the
specimen under test by a suitable dielectric, if necessary.

Figure 4 – Example of test set-up for shielded rectangular connectors
6.4 Connectors for printed boards
Connectors for printed boards can only be tested with the aid of the line injection method, if
there are additional outer shielding structures for the PCBs. These can be achieved by a
suitable shielded box, printed boards with shielding on both sides or equivalent constructions.
Figure 5 shows a test set-up for shielded printed board connectors. The injection line with
suitable dielectric for insulation and impedance-matching is coupled to the semi-rigid coaxial

– 12 – IEC 60512-23-3:2018 © IEC 2018
cable. For termination, a 50 Ω SMD resistor is used, which is mounted on the printed board
beyond the coupling section.
Instead of the shielding tube, a multilayer printed board is used with shielding on both sides
and impedance-matched stripline technology.

Figure 5 – Example of test set-up for shielded printed board connectors
6.5 Impedance matching of primary and secondary circuits
6.5.1 General
The contact(s) or contact group(s) under test (secondary circuit) and the injection line (primary
circuit) shall be chosen and arranged, so that the impedance value is in the range of
50 Ω ± 10 Ω.
For frequencies below 1 MHz, higher tolerance values are permissible (50 Ω ± 20 Ω).
6.5.2 Preparation of the secondary circuit
The contact(s) under test are given by the detail specification. The other contacts are not
connected. For the measurement of the impedance of the inner pick-up line through the
specimen (secondary circuit), the TDR is used.
6.5.3 Adaptation of the primary circuit
The required impedance for the specified frequency range of the injection line (primary circuit)
can be realized by suitable design of a copper foil or the right conductor number of a ribbon
cable. Simultaneously, the impedance matching is measured with a TDR (rise time less than
100 ps). The injection line shall run parallel to the selected contact(s) of the connector.
The distance between the connector contact(s) and the injection line shall be as short as
possible. The coupling section shall be restricted to the length L of the test specimen.
6.6 Calibration of test set-up
For the calibration procedure, see the test set-up according to Figure 6. For the short-circuit
calibration procedure, the output signal of the network analyser is connected to the input
channel via the test specimen.

Key
A1 Coupling box
A2 Coupling box
D Launchers for injection line
Figure 6 – Calibration test set-up
7 Measurement of shielding effectiveness
7.1 Measurement
For the measurement, a test set-up according to Figures 2 to 5 and in accordance with 7.2.3
(inhomogeneities of cable screen around the circumference) of IEC 62153-4-6:2017 shall be
used.
7.2 Method of calculating shielding effectiveness SE (attenuation) from surface
transfer impedance Z
T
The surface transfer impedance Z and the shielding effectiveness SE can be calculated from
T
the following relationships:
Surface transfer impedance:
V
receiver
Z =100× Ω/m (2)
T
V
generator
NOTE 1 The value 100 Ω is the sum of the two 50 Ω termination loads. The injected current is V /100.
generator
For the specimen under test (a shielded connector or a connector shielding accessory) Z
T
shall be an absolute value. As the test specimen is not of unit length (1 m), it shall be
necessary to correct the Z result of formula (2) multiplying it by the coupling length L of the
T
test specimen expressed in m.
Shielding effectiveness:
dB (3)
SE= 40− 20log Z
10 T
NOTE 2 The first term, 40 dB, derives from 20 log (100) = 20 • 2 (dB), where 100 is the value in Ω of the circuit
impedance, sum of the two 50 Ω termination loads. The shielding effectiveness SE is the ratio of the power induced

– 14 – IEC 60512-23-3:2018 © IEC 2018
without shield to the power induced with shield, i.e. their logarithmic difference. Expressed in decibel SE becomes
20 log (V / V ) = 20 log V – 20 log V , hence the correlation between SE
10 without shield with shield 10 without shield 10 with shield
and Z .
T
The measurement results are visualized in Figure 7 as a linear curve in a double logarithmic
scale. In the axis of ordinate on the left the relative shielding effectiveness SE (attenuation) is
shown, on the right the transfer impedance Z is shown, and in the abscissa the frequency is
T
shown.
Figure 7 – Example of a shielding attenuation (shielding effectiveness) plot
8 Requirements
The surface transfer impedance Z of the connector (see formula (2) above) expressed in
T
milliohms (mΩ), or converted to shielding effectiveness SE expressed in decibels (dB) (see
formula (3) above), shall not exceed (in the case of Z ), or be lower than (in the case of SE),
T
the value(s) specified in the product detail specification.
9 Details to be specified
a) Contact(s) or contact group(s) to be tested.
b) Minimum value of the shielding effectiveness (SE) in dB or maximum value of the transfer
impedance (Z ).
T
c) Frequency or frequency range.
d) Any deviation from the standard test method.

Bibliography
IEC TS 62153-4-1:2014, Metallic communication cable test methods – Part 4-1:
Electromagnetic compatibility (EMC) – Introduction to electromagnetic screening
measurements
___________
– 16 – IEC 60512-23-3:2018 © IEC 2018
SOMMAIRE
AVANT-PROPOS . 17
INTRODUCTION . 20
1 Domaine d’application . 21
2 Références normatives . 22
3 Termes et définitions . 22
4 Méthode d’essai . 23
4.1 Exigences d’essai . 23
4.2 Plage de fréquences applicable . 23
5 Matériel d’essai . 23
6 Préparation de l’éprouvette . 24
6.1 Généralités . 24
6.2 Connecteurs circulaires . 24
6.3 Connecteurs rectangulaires . 25
6.4 Connecteurs pour cartes de circuit imprimé . 25
6.5 Adaptation d’impédance des circuits primaire et secondaire . 26
6.5.1 Généralités . 26
6.5.2 Préparation du circuit secondaire . 26
6.5.3 Adaptation du circuit primaire . 26
6.6 Etalonnage du montage d’essai . 27
7 Mesure de l’efficacité de blindage . 27
7.1 Mesure . 27
7.2 Méthode de calcul de l’efficacité (l’affaiblissement) de blindage SE à partir
de l’impédance de transfert de surface Z . 27
T
8 Exigences . 28
9 Détails à spécifier . 28
Bibliographie . 30

Figure 1 – Principe de la méthode de la ligne d’injection . 22
Figure 2 – Installation du montage d’essai . 24
Figure 3 – Exemple de montage d’essai pour connecteurs circulaires blindés . 25
Figure 4 – Exemple de montage d’essai pour connecteurs rectangulaires blindés . 25
Figure 5 – Exemple de montage d’essai pour connecteurs blindés pour cartes de
circuit imprimé . 26
Figure 6 – Montage d’essai d’étalonnage . 27
Figure 7 – Exemple de tracé d’affaiblissement (d’efficacité) de blindage . 28

COMMISSION ÉLECTROTECHNIQUE INTERNATIONALE
____________
CONNECTEURS POUR ÉQUIPEMENTS ÉLECTRIQUES ET
ÉLECTRONIQUES – ESSAIS ET MESURES –

Partie 23-3: Essais d’écrantage et de filtrage – Essai 23c: Efficacité de
blindage des connecteurs et des accessoires –
Méthode de la ligne d’injection

AVANT-PROPOS
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La Norme internationale IEC 60512-23-3 a été établie par le sous-comité 48B: Connecteurs
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Cette deuxième édition annule et remplace la première édition, parue en 2000. Cette édition
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Cette édition inclu
...