IEC 61010-031:2015/AMD1:2018

IEC 61010-031 ®
Edition 2.0 2018-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
G ROUP SAFETY PUBLICATION
PU BLICATION GROUPÉE DE SÉCURITÉ

AMENDMENT 1
AMENDEMENT 1
Safety requirements for electrical equipment for measurement, control and
laboratory use –
Part 031: Safety requirements for hand-held and hand-manipulated probe
assemblies for electrical test and measurement

Règles de sécurité pour appareils électriques de mesurage, de régulation et de
laboratoire –
Partie 031: Exigences de sécurité pour sondes équipées portatives et
manipulées à la main pour mesurage et essais électriques

IEC 61010-031:2015-05/AMD1:2018-05(en-fr)

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IEC 61010-031 ®
Edition 2.0 2018-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
G ROUP SAFETY PUBLICATION
PU BLICATION GROUPÉE DE SÉCURITÉ

AMENDMENT 1
AMENDEMENT 1
Safety requirements for electrical equipment for measurement, control and

laboratory use –
Part 031: Safety requirements for hand-held and hand-manipulated probe

assemblies for electrical test and measurement

Règles de sécurité pour appareils électriques de mesurage, de régulation et de

laboratoire –
Partie 031: Exigences de sécurité pour sondes équipées portatives et

manipulées à la main pour mesurage et essais électriques

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 19.080 ISBN 978-2-8322-6159-0

– 2 – IEC 61010-031:2015/AMD1:2018
© IEC 2018
FOREWORD
This amendment has been prepared by IEC technical committee 66: Safety of measuring,
control and laboratory equipment.
This bilingual version (2018-10) corresponds to the monolingual English version, published in
2018-05.
The text of this standard is based on the following documents:
FDIS Report on voting
66/664/FDIS 66/670/RVD
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The French version of this amendment has not been voted upon.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the stability date indicated on the IEC website under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
_____________
Title
Replace the part title as follows:
Part 031: Safety requirements for hand-held and hand-manipulated
probe assemblies for electrical test and measurement

1 Scope and object
1.1.1 Probe assemblies included in scope
Figure 4 – Examples of Type D probe assemblies
Delete, in key 3, the words “or clamp”.

© IEC 2018
3 Terms and definitions
3.1.1
TERMINAL
Note 1 to entry:
Delete the word “connectors,”.
3.1.5
CONNECTOR
Delete, in the definition, the words “a CONNECTOR of” so that the end of the sentence will read:
“…to connect to a TERMINAL of the equipment or to another probe assembly”.
3.4.11
MEASUREMENT CATEGORY
Replace the existing text of the definition with the following:
classification of testing and measuring circuits according to the types of mains to which they
are intended to be connected
4 Tests
4.3.9 Duty cycle
Replace the existing title of 4.3.9 with the following:
4.3.9 Short-term or intermittent operation

4.4.4.2 Temperature
Replace the existing second paragraph with the following:
This temperature is determined by measuring the temperature rise of the surface or part and
adding it to the ambient temperature of 40 °C, or to the maximum RATED ambient temperature
if higher.
4.5.2 Fuses
Replace, in the fourth sentence of the second paragraph, the word “MAINS” (in SMALL CAPS)
with “mains” (in regular font).

5 Marking and documentation
5.1.5 RATING
Replace, in list item a) of the first paragraph, the words “(see also 5.4.3 f) and g))” with “(see
also 5.4.3 k))”.
– 4 – IEC 61010-031:2015/AMD1:2018
© IEC 2018
6 Protection against electric shock
6.2.2 Examination
Figure 6 – Methods for determination of ACCESSIBLE parts (see 6.2) and for voltage tests
(see 6.4.2)
Replace the existing subfigures 6c and 6d with the following new subfigures:

Connecting parts are partially mated so as just to make electrical contact while allowing maximum access to the
test finger.
Note the two possible positions of the test finger.
Figure 6c – Partially mated probe assemblies (see 6.2 and 6.4.2 b))

Key
F rigid test finger (see Figure B.1)
H potentially HAZARDOUS LIVE part
Note the two possible positions of the test finger.
Figure 6d – Unmated parts of a probe assembly (see 6.2 and 6.4.2 c))

6.3.4.1 General
Replace, in the first paragraph, the existing list with the following:
a) the probe body;
b) hand-held or hand-manipulated parts of each CONNECTOR;
c) 150 mm ± 20 mm of the PROBE WIRE or the maximum length of the cable whichever is
shorter;
d) other hand-held or hand-manipulated parts.

© IEC 2018
Figure 8 – Voltage and touch current measurement
Delete, in the text of key item 2c, the words “(see 12.3.2)”.

6.3.4.2 Probe assemblies with floating outer conductors
Figure 10 – Voltage and touch current measurement with shielded test probe
Delete, in the text of key item 2c, the words “(see 12.3.2)”.

6.3.4.3 High frequency test probes
Replace, in the fourth paragraph, “the circuit from A.3” with “the circuit from Figure A.3”.

6.4.1 General
Replace, in the third paragraph, the existing list with the following list:
a) DOUBLE INSULATION, consisting of BASIC INSULATION plus SUPPLEMENTARY INSULATION (see
6.4.6)
b) BASIC INSULATION plus impedance (see 6.4.4);
c) REINFORCED INSULATION (see 6.4.6);
d) PROTECTIVE IMPEDANCE (see 6.4.5).

6.4.2 CONNECTORS
Add, at the end of the sentence of 6.4.2 c) 2), “(see Figure 5)”.

6.4.3.2 Protection by a PROTECTIVE FINGERGUARD
Replace the existing third paragraph with the following:
The height of the PROTECTIVE FINGERGUARD from the side where the fingers are intended to be
applied shall be at least 2 mm.

6.4.3.4 Protection by tactile indicator
Replace the existing first paragraph with the following:
SPRING-LOADED CLIPS RATED for MEASUREMENT CATEGORY II or without MEASUREMENT CATEGORY
for maximum 300 V which require finger pressure at about 90° to the axis of the clip are
acceptable without a PROTECTIVE FINGERGUARD, provided that there is a tactile indicator to
indicate the limit of safe access for the OPERATOR.

– 6 – IEC 61010-031:2015/AMD1:2018
© IEC 2018
6.4.3.5 PROBE TIPS used as CONNECTORS
Replace the text with the following text:
PROBE TIPS which can be used as CONNECTORS and are intended to be connected to specified
accessories (for example to a SPRING-LOADED CLIP) shall, in combination with those
accessories, also meet the requirements for CONNECTORS in fully-mated position and partially-
mated position (see 6.4.2 a) and b)).

OLID INSULATION
6.5.1.2.4 S
Delete the entire subclause including Table 4, Table 5, Figure 15, Figure 16 and Figure 17.

Add the following new subclause:
6.5.1.3 Solid insulation
The term “solid insulation” is used to describe many different types of construction, including
monolithic blocks of insulating material and insulation subsystems composed of multiple
insulating materials, organized in layers or otherwise.
The electric strength of a thickness of solid insulation is considerably greater than that of the
same thickness of air. The insulating distances through solid insulation are therefore typically
smaller than the distances through air. As a result, electric fields in solid insulation are
typically higher, and often are less homogeneous.
Solid insulation material may contain gaps or voids. When a solid insulation system is
constructed from layers of solid materials, there are also likely to be gaps or voids between
layers. These voids will perturb the electric field so that a disproportionately large part of the
electric field is located in the void, potentially causing ionization within the void, resulting in
partial discharge. These partial discharges will influence the adjacent solid insulation and may
reduce its service life.
Solid insulation is not a renewable medium: damage is cumulative over the life of the
equipment. Solid insulation is also subject to ageing and to degradation from repeated high
voltage testing.
Conformity is checked as specified in 6.5.2.5 and 6.5.2.6.

6.5.2.2 CLEARANCES for probe assemblies of MEASUREMENT CATEGORIES II, III and IV
Replace the existing Table 6 with the following:

IEC 61010-031:2015
...