Electromagnetic compatibility (EMC) - Part 4-36: Testing and measurement techniques - IEMI immunity test methods for equipment and systems

IEC 61000-4-36:2020 is available as IEC 61000-4-36:2020 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 61000-4-36:2020 provides methods to determine test levels for the assessment of the immunity of equipment and systems to intentional electromagnetic interference (IEMI) sources. It introduces the general IEMI problem, IEMI source parameters, derivation of test limits and summarises practical test methods. This second edition cancels and replaces the first edition published in 2014. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
- addition of a hyperband and mesoband radiated transients immunity test method in
- Annex H;
- addition of a calibration method of sensors for radiated hyperband and mesoband transient fields and measurement uncertainty in Annex I.

General Information

Status
Published
Publication Date
22-Mar-2020
Current Stage
PPUB - Publication issued
Start Date
06-Mar-2020
Completion Date
23-Mar-2020
Ref Project

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IEC 61000-4-36:2020 - Electromagnetic compatibility (EMC) - Part 4-36: Testing and measurement techniques - IEMI immunity test methods for equipment and systems
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IEC 61000-4-36:2020 RLV - Electromagnetic compatibility (EMC) - Part 4-36: Testing and measurement techniques - IEMI immunity test methods for equipment and systems Released:3/23/2020 Isbn:9782832280454
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Standards Content (Sample)


IEC 61000-4-36 ®
Edition 2.0 2020-03
INTERNATIONAL
STANDARD
colour
inside
BASIC EMC PUBLICATION
Electromagnetic compatibility (EMC) –
Part 4-36: Testing and measurement techniques – IEMI immunity test methods
for equipment and systems
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.

IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé info@iec.ch
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigendum or an amendment might have been published.

IEC publications search - webstore.iec.ch/advsearchform Electropedia - www.electropedia.org
The advanced search enables to find IEC publications by a The world's leading online dictionary on electrotechnology,
variety of criteria (reference number, text, technical containing more than 22 000 terminological entries in English
committee,…). It also gives information on projects, replaced and French, with equivalent terms in 16 additional languages.
and withdrawn publications. Also known as the International Electrotechnical Vocabulary

(IEV) online.
IEC Just Published - webstore.iec.ch/justpublished
Stay up to date on all new IEC publications. Just Published IEC Glossary - std.iec.ch/glossary
details all new publications released. Available online and 67 000 electrotechnical terminology entries in English and
once a month by email. French extracted from the Terms and definitions clause of
IEC publications issued between 2002 and 2015. Some
IEC Customer Service Centre - webstore.iec.ch/csc entries have been collected from earlier publications of IEC
If you wish to give us your feedback on this publication or TC 37, 77, 86 and CISPR.

need further assistance, please contact the Customer Service

Centre: sales@iec.ch.
IEC 61000-4-36 ®
Edition 2.0 2020-03
INTERNATIONAL
STANDARD
colour
inside
BASIC EMC PUBLICATION
Electromagnetic compatibility (EMC) –

Part 4-36: Testing and measurement techniques – IEMI immunity test methods

for equipment and systems
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 33.100.20 ISBN 978-2-8322-7942-7

– 2 – IEC 61000-4-36:2020 © IEC 2020
CONTENTS
FOREWORD . 7
INTRODUCTION . 9
1 Scope . 10
2 Normative references . 10
3 Terms, definitions and abbreviated terms . 10
3.1 Terms and definitions . 10
3.2 Abbreviated terms . 14
4 General . 15
5 IEMI environments and interaction . 16
5.1 General . 16
5.2 IEMI environments . 17
5.2.1 Technical capability groups . 17
5.2.2 IEMI deployment scenarios . 17
5.2.3 Radiated IEMI environment summary . 17
5.2.4 Published conducted IEMI environments. 18
5.3 Interaction with victim equipment, systems and installations . 18
5.3.1 General . 18
5.3.2 Protection level . 19
6 Test methods . 20
6.1 Derivation of applicable test methods . 20
6.2 Derivation of transfer functions . 21
6.3 Radiated tests using IEMI simulator . 22
6.4 Radiated tests using a reverberation chamber . 22
6.5 Complex waveform injection (CWI) . 22
6.6 Damped sinusoidal injection (DSI) . 22
6.7 Electrostatic discharge (ESD) . 22
6.8 Electrically fast transient (EFT) . 22
6.9 Antenna port injection . 23
7 Test parameters . 23
7.1 Derivation of immunity test parameters . 23
7.2 Radiated test parameters . 23
7.2.1 Generic hyperband test parameters (skilled capability group) . 23
7.2.2 Generic mesoband test parameters (skilled capability group). 25
7.2.3 Generic hypoband test parameters (skilled capability group) . 27
7.3 Generic conducted IEMI test parameters. 28
7.3.1 General . 28
7.3.2 Characteristics and performance of the fast damped oscillatory wave
generator . 29
7.4 Tailored test level derivation . 30
7.5 Relevance of EMC immunity data . 30
Annex A (informative) Failure mechanisms and performance criteria . 31
A.1 General . 31
A.2 Failure mechanisms . 31
A.2.1 General . 31
A.2.2 Noise . 32

A.2.3 Parameter offset and drifts . 32
A.2.4 System upset or breakdown . 33
A.2.5 Component destruction . 33
A.3 Effect of pulse width. 34
A.4 Performance criteria . 34
A.5 References . 35
Annex B (informative) Developments in IEMI source environments . 37
B.1 General . 37
B.2 IEMI environment . 38
B.3 IEMI sources . 39
B.4 Published radiated IEMI environments . 43
B.4.1 IEC 61000-2-13 [B.14] . 43
B.4.2 Mil-Std-464C . 43
B.4.3 Selection of parameters for mesoband immunity test . 45
B.4.4 International Telecommunication Union (ITU) . 47
B.5 Summary . 47
B.6 References . 48
Annex C (informative) Interaction with buildings . 50
C.1 Building attenuation . 50
C.2 Coupling to cables . 51
C.3 Low voltage cable attenuation . 52
C.4 References . 53
Annex D (informative) Relation between plane wave immunity testing and immunity
testing in a reverberation chamber . 55
D.1 General . 55
D.2 Relation between measurements of shielding effectiveness in the two
environments . 56
D.3 Relation between immunity testing in the two environments . 59
D.4 Additional aspects . 61
D.5 References . 61
Annex E (informative) Complex waveform injection – Test method . 64
E.1 General . 64
E.2 Prediction . 64
E.2.1 General . 64
E.2.2 Example . 68
E.3 Construction . 70
E.4 Injection . 74
E.5 Summary . 76
E.6 References . 76
Annex F (informative) Significance of test methodology margins . 78
F.1 General . 78
F.2 Examples . 78
F.2.1 General . 78
F.2.2 Negative contributions . 79
F.2.3 Positive contributions. 81
F.2.4 Summary . 83
F.3 References . 83
Annex G (informative) Intentional EMI – The issue of jammers . 84
G.1 General . 84

– 4 – IEC 61000-4-36:2020 © IEC 2020
G.2 Effects .
...


IEC 61000-4-36 ®
Edition 2.0 2020-03
REDLINE VERSION
INTERNATIONAL
STANDARD
colour
inside
BASIC EMC PUBLICATION
Electromagnetic compatibility (EMC) –
Part 4-36: Testing and measurement techniques – IEMI immunity test methods
for equipment and systems
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.

IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé info@iec.ch
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigendum or an amendment might have been published.

IEC publications search - webstore.iec.ch/advsearchform Electropedia - www.electropedia.org
The advanced search enables to find IEC publications by a The world's leading online dictionary on electrotechnology,
variety of criteria (reference number, text, technical containing more than 22 000 terminological entries in English
committee,…). It also gives information on projects, replaced and French, with equivalent terms in 16 additional languages.
and withdrawn publications. Also known as the International Electrotechnical Vocabulary

(IEV) online.
IEC Just Published - webstore.iec.ch/justpublished
Stay up to date on all new IEC publications. Just Published IEC Glossary - std.iec.ch/glossary
details all new publications released. Available online and 67 000 electrotechnical terminology entries in English and
once a month by email. French extracted from the Terms and Definitions clause of
IEC publications issued since 2002. Some entries have been
IEC Customer Service Centre - webstore.iec.ch/csc collected from earlier publications of IEC TC 37, 77, 86 and
If you wish to give us your feedback on this publication or CISPR.

need further assistance, please contact the Customer Service

Centre: sales@iec.ch.
IEC 61000-4-36 ®
Edition 2.0 2020-03
REDLINE VERSION
INTERNATIONAL
STANDARD
colour
inside
BASIC EMC PUBLICATION
Electromagnetic compatibility (EMC) –

Part 4-36: Testing and measurement techniques – IEMI immunity test methods

for equipment and systems
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 33.100.20 ISBN 978-2-8322-8045-4

– 2 – IEC 61000-4-36:2020 RLV © IEC 2020
CONTENTS
FOREWORD . 7
INTRODUCTION . 2
1 Scope . 10
2 Normative references . 10
3 Terms, definitions and abbreviated terms . 10
3.1 Terms and definitions . 10
3.2 Abbreviated terms . 14
4 General . 16
5 IEMI environments and interaction . 16
5.1 General . 16
5.2 IEMI environments . 17
5.2.1 Technical capability groups . 17
5.2.2 IEMI deployment scenarios . 17
5.2.3 Radiated IEMI environment summary . 18
5.2.4 Published conducted IEMI environments. 18
5.3 Interaction with victim equipment, systems and fixed installations . 19
5.3.1 General . 19
5.3.2 Protection level . 20
6 Test methods . 20
6.1 Derivation of applicable test methods . 20
6.2 Derivation of transfer functions . 21
6.3 Radiated tests using IEMI simulator . 22
6.4 Radiated tests using a reverberation chamber . 22
6.5 Complex waveform injection (CWI) . 22
6.6 Damped sinusoidal injection (DSI) . 22
6.7 Electrostatic discharge (ESD) . 22
6.8 Electrically fast transient (EFT) . 23
6.9 Antenna port injection . 23
7 Test parameters . 23
7.1 Derivation of immunity test parameters . 23
7.2 Radiated test parameters . 24
7.2.1 Generic hyperband test parameters (skilled capability group) . 24
7.2.2 Generic mesoband test parameters (skilled capability group). 25
7.2.3 Generic hypoband/narrowband test parameters (skilled capability
group) . 27
7.3 Generic conducted IEMI test parameters. 29
7.3.1 General . 29
7.3.2 Characteristics and performance of the fast damped oscillatory wave
generator . 29
7.4 Tailored test level derivation . 30
7.5 Relevance of EMC immunity data . 31
Annex A (informative) Failure mechanisms and performance criteria . 32
A.1 General . 32
A.2 Failure mechanisms . 32
A.2.1 General . 32
A.2.2 Noise . 33

A.2.3 Parameter offset and drifts . 33
A.2.4 System upset or breakdown . 34
A.2.5 Component destruction . 34
A.3 Effect of pulse width. 35
A.4 Performance criteria . 35
A.5 References . 36
Annex B (informative) Developments in IEMI source environments . 38
B.1 General . 38
B.2 IEMI environment . 39
B.3 IEMI sources . 40
B.4 Published radiated IEMI environments . 44
B.4.1 IEC 61000-2-13 [B.14] . 44
B.4.2 Mil-Std-464C . 44
B.4.3 Selection of parameters for mesoband immunity test . 46
Practical determination of a tailored test level – An example.
B.4.4 International Telecommunication Union (ITU) . 46
B.5 Summary . 49
B.6 References . 50
Annex C (informative) Interaction with buildings . 52
C.1 Building attenuation . 52
C.2 Coupling to cables . 53
C.3 Low voltage cable attenuation . 54
C.4 References . 55
Annex D (informative) Relation between plane wave immunity testing and immunity
testing in a reverberation chamber . 57
D.1 General . 57
D.2 Relation between measurements of shielding effectiveness in the two
environments . 58
D.3 Relation between immunity testing in the two environments . 61
D.4 Additional aspects . 63
D.5 References . 63
Annex E (informative) Complex waveform injection – Test method . 66
E.1 General . 66
E.2 Prediction . 66
E.2.1 General . 66
E.2.2 Example . 70
E.3 Construction . 72
E.4 Injection . 76
E.5 Summary . 78
E.6 References . 78
Annex F (informative) Significance of test methodology margins . 80
F.1 General . 80
F.2 Examples . 80
F.2.1 General . 80
F.2.2 Negative contributions . 81
F.2.3 Positive contributions. 83
F.2.4 Summary . 85
F.3 References . 85
Annex G (informative) Intentional EMI – The issue of jammers . 86

– 4 – IEC 61000
...

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