MT 61000-4-36 - TC 77/SC 77C/MT 61000-4-36
TC 77/SC 77C/MT 61000-4-36
General Information
Frequently Asked Questions
MT 61000-4-36 is a Technical Committee within the International Electrotechnical Commission (IEC). It is named "TC 77/SC 77C/MT 61000-4-36". This committee has published 1 standards.
MT 61000-4-36 develops IEC standards in the area of Information technology. Currently, there are 1 published standards from this technical committee.
The International Electrotechnical Commission (IEC) is the world's leading organization for the preparation and publication of international standards for electrical, electronic, and related technologies. Founded in 1906, the IEC provides a global platform for companies, industries, and governments to meet, discuss, and develop the international standards they require.
A Technical Committee (TC) in IEC is a group of experts responsible for developing international standards in a specific technical area. TCs are composed of national member body delegates and work through consensus to create standards that meet global industry needs. Each TC may have subcommittees (SCs) and working groups (WGs) for specialized topics.
IEC 61000-4-36:2020 provides methods to determine test levels for the assessment of the immunity of equipment and systems to intentional electromagnetic interference (IEMI) sources. It introduces the general IEMI problem, IEMI source parameters, derivation of test limits and summarises practical test methods. This second edition cancels and replaces the first edition published in 2014. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
- addition of a hyperband and mesoband radiated transients immunity test method in
- Annex H;
- addition of a calibration method of sensors for radiated hyperband and mesoband transient fields and measurement uncertainty in Annex I.
- Standard108 pagesEnglish languagesale 15% off
- Standard218 pagesEnglish languagesale 15% off