IEC 60060-2:2025

IEC 60060-2 ®
Edition 4.0 2025-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
High-voltage test techniques –
Part 2: Measuring systems
Techniques des essais à haute tension –
Partie 2: Systèmes de mesure
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IEC 60060-2 ®
Edition 4.0 2025-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
High-voltage test techniques –

Part 2: Measuring systems
Techniques des essais à haute tension –

Partie 2: Systèmes de mesure
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 17.220.20, 19.080 ISBN 978-2-8322-4701-3

– 2 – IEC 60060-2:2025 © IEC 2025
CONTENTS
FOREWORD . 7
1 Scope . 9
2 Normative references . 9
3 Terms and definitions . 10
3.1 Measuring systems . 10
3.2 Components of a measuring system . 10
3.3 Scale factors . 11
3.4 Rated values . 12
3.5 Terms related to dynamic behaviour . 13
3.6 Terms related to uncertainty . 17
3.7 Terms related to tests on measuring systems . 20
4 Procedures for qualification and use of measuring systems . 21
4.1 General principles . 21
4.2 Schedule of performance tests . 21
4.3 Schedule of performance checks . 21
4.4 Requirements for the record of performance . 22
4.4.1 Contents of the record of performance . 22
4.4.2 Exceptions . 22
4.5 Operating conditions . 22
4.6 Uncertainty . 23
5 Tests and test requirements for an approved measuring system and its
components . 23
5.1 General requirements . 23
5.2 Calibration – Determination of the scale factor . 24
5.2.1 Calibration of measuring systems by comparison with a reference
measuring system (preferred method). 24
5.2.2 Determination of the scale factor of a measuring system from the scale
factors of its components (alternative method) . 27
5.3 Linearity test in addition to comparison over the limited voltage range . 28
5.3.1 Application . 28
5.3.2 Alternative methods in order of suitability . 29
5.4 Dynamic behaviour . 30
5.4.1 General . 30
5.4.2 Determination of the amplitude-frequency response of
AC measuring systems . 30
5.4.3 Reference method for impulse voltage measuring systems . 31
5.5 Short-term stability . 31
5.6 Long-term stability . 32
5.7 Ambient temperature effect . 32
5.8 Proximity effect . 33
5.9 Software effect . 33
5.10 Uncertainty calculation of the scale factor . 34
5.10.1 General . 34
5.10.2 Uncertainty of the calibration . 34
5.10.3 Uncertainty of measurement using an approved measuring system . 35
5.11 Uncertainty calculation of time parameter measurement (impulse voltages
only) . 36
5.11.1 General . 36

5.11.2 Uncertainty of the time parameter calibration . 36
5.11.3 Uncertainty of time parameter measurement using an approved
measuring system . 38
5.12 Interference test (transmission system and instrument for impulse voltage
measurements) . 38
5.13 Withstand tests for converting device . 39
6 Measurement of direct voltage . 39
6.1 Requirements for an approved measuring system . 39
6.1.1 General . 39
6.1.2 Uncertainty contributions . 40
6.1.3 Requirements for converting device . 40
6.1.4 Dynamic behaviour for measuring voltage changes . 40
6.2 Tests on an approved measuring system . 40
6.3 Performance check . 41
6.3.1 General . 41
6.3.2 Comparison with an approved measuring system. 41
6.3.3 Check of the scale factors of the components . 42
6.4 Measurement of ripple amplitude . 42
6.4.1 Requirements . 42
6.4.2 Uncertainty contributions . 42
6.4.3 Calibrations and tests on an approved ripple voltage measuring system . 42
6.4.4 Measurement of the scale factor at the ripple frequency . 42
6.4.5 Dynamic behaviour by amplitude-frequency response . 43
6.4.6 Performance check for ripple measuring system . 43
7 Measurement of alternating voltage . 43
7.1 Requirements for an approved measuring system . 43
7.1.1 General . 43
7.1.2 Uncertainty contributions . 43
7.1.3 Dynamic behaviour . 43
7.2 Tests on an approved measuring system . 46
7.3 Dynamic behaviour test . 46
7.4 Performance check . 46
7.4.1 General . 46
7.4.2 Comparison with an approved measuring system. 47
7.4.3 Check of the scale factors of the components . 47
8 Measurement of lightning impulse voltage . 48
8.1 Requirements for an approved measuring system . 48
8.1.1 General . 48
8.1.2 Uncertainty contributions . 48
8.1.3 Requirements for measuring instrument . 48
8.1.4 Dynamic behaviour . 48
8.1.5 Connection to the test object . 49
8.2 Tests on an approved measuring system . 49
8.3 Performance test on measuring systems . 50
8.3.1 Reference method (preferred) . 50
8.3.2 Alternative method supplemented by a measurement of the step
response in accordance with Annex C . 50
8.4 Dynamic behaviour test . 51
8.4.1 Comparison with a reference measuring system (preferred). 51

– 4 – IEC 60060-2:2025 © IEC 2025
8.4.2 Alternative method based on step response parameters (Annex C) and
convolution (Annex D) . 51
8.5 Performance check . 51
8.5.1 Comparison with an approved measuring system. 51
8.5.2 Check of the scale factors of the components . 51
8.5.3 Dynamic behaviour check by reference record at low voltage . 52
8.5.4 Dynamic behaviour check by reference record of an impulse voltage . 52
9 Measurement of switching impulse voltage . 52
9.1 Requirements for an approved measuring system . 52
9.1.1 General . 52
9.1.2 Uncertainty contribution . 52
9.1.3 Requirements for the measuring instrument . 52
9.1.4 Dynamic behaviour . 53
9.1.5 Connection to the test object . 53
9.2 Tests on an approved measuring system . 53
9.3 Performance test on measuring systems . 53
9.3.1 Reference method (preferred) . 53
9.3.2 Alternative methods supplemented by a step-response measurement . 53
9.4 Dynamic behaviour test by comparison . 54
9.5 Performance check . 54
9.5.1 Scale factor check by comparison with an approved measuring system . 54
9.5.2 Check of the scale factors of the components . 54
9.5.3 Dynamic behaviour check by reference record . 54
10 Measurement of combined voltages . 55
10.1 Requirements for an approved measuring system . 55
10.1.1 General . 55
10.1.2 Uncertainty contributions . 56
10.1.3 Requirements for measuring systems . 56
10.1.4 Connection to the test object . 58
10.1.5 Requirements for an approved measuring system . 58
10.2 Performance checks and tests on measuring systems. 58
11 Measurement of composite voltages . 58
11.1 Requirements for an approved measuring system . 58
11.1.1 General . 58
11.1.2 Uncertainty contributions . 59
11.1.3 Requirements for measuring systems . 59
11.1.4 Connection to the test object . 60
11.1.5 Combining requirements for an approved measuring system . 60
11.2 Performance checks and tests on measuring systems. 60
12 Reference measuring systems . 61
12.1 Requirements for reference measuring systems . 61
12.1.1 Direct voltage . 61
12.1.2 Alternating voltage . 61
12.1.3 Full and chopped lightning and switching impulse voltages . 61
12.2 Calibration of a reference measuring system. 61
12.2.1 General . 61
12.2.2 Reference method: Comparative measurement . 61
12.2.3 Alternative method for impulse voltages: Measurement of scale factor
and evaluation of step response parameters . 61

12.3 Interval between successive calibrations of reference measuring systems . 62
12.4 Use of reference measuring systems . 62
Annex A (informative) Uncertainty of measurement . 63
A.1 General . 63
A.2 Model function . 63
A.3 Type A evaluation of standard uncertainty . 64
A.4 Type B evaluation of standard uncertainty . 65
A.5 Combined standard uncertainty . 66
A.6 Expanded uncertainty . 67
A.7 Effective degrees of freedom . 68
A.8 Uncertainty budget . 68
A.9 Statement of the measurement result . 69
Annex B (informative) Examples for the calculation of measuring uncertainties in high-
voltage measurements . 71
B.1 Example 1: Calibration of scale factor of an AC measuring system
(comparison method) . 71
B.1.1 Description . 71
B.1.2 Determination of scale factor and uncertainty contributions . 71
B.1.3 Uncertainty budget and expression of result . 75
B.2 Example 2: Calibration of scale factor of an impulse voltage measuring
system (component method) . 75
B.3 Example 3: Calibration of front time of lightning impulse voltages . 77
Annex C (normative) Step-response measurements . 81
C.1 General . 81
C.2 Circuit for step- response measurements . 81
C.3 Recommendations for the step response of a component. 81
Annex D (normative) Convolution method for the determination of dynamic behaviour
from step-response measurements . 84
D.1 General . 84
D.2 Convolution method . 84
D.3 Procedure for performing the convolution calculation . 85
D.4 Uncertainty contributions . 86
D.5 Discussion of the calculated errors of impulse parameters . 86
D.5.1 Error in the peak amplitude . 86
D.5.2 Error in the front time . 86
D.5.3 Error in the time to half-value. 87
Bibliography . 88

Figure 1 – Amplitude-frequency response with examples for limit frequencies (f ; f ) . 13
1 2
Figure 2 – Parameters for the unit step response g(t) . 15
Figure 3 – Parameters for the step-response integral T(t) . 16
Figure 4 – Calibration by comparison over the full voltage range, h=5 . 26
Figure 5 – Uncertainty contributions for calibration over five voltage levels . 26
Figure 6 – Combining calibration and linearity test . 27
Figure 7 – Linearity test in the extended voltage range . 29
Figure 8 – Short-circuiting arrangement for the interference test . 39
Figure 9 – Normalized amplitude-frequency response of a measuring system intended
for a single fundamental frequency . 45

– 6 – IEC 60060-2:2025 © IEC 2025
Figure 10 – Normalized amplitude-frequency response of measuring system intended
for a range of fundamental frequencies . 46
Figure 11 – Circuit for a combined voltage test . 56
Figure 12 – Circuit for a composite voltage test . 59
Figure A.1 – Normal probability distribution p(x) . 69
Figure A.2 – Rectangular probability distribution p(x) . 70
Figure B.1 – Comparison of measuring systems . 71
Figure B.2 – Front time deviation of system X, related to the reference system N . 79
Figure C.1 –Unit step response g(t) showing an initial distortion . 82
Figure C.2 – Suitable circuits for step response measurement . 83

Table 1 – Tests required for an approved direct voltage measuring system . 41
Table 2 – Tests required for estimation of uncertainty contributions in ripple
measurement . 43
Table 3 – Tests required for an approved alternating voltage measuring system . 47
Table 4 – Tests required for an approved lightning impulse voltage measuring system . 49
Table 5 – Tests required for a switching impulse voltage measuring system . 55
Table 6 – Requirements for measuring systems for combined voltage tests . 58
Table 7 – Requirements for measuring systems for composite tests . 60
Table 8 – Recommended response parameter values for impulse voltage reference
measuring systems . 62
Table A.1 – Coverage factor k for effective degrees of freedom ν (p = 95 %) . 68
eff
Table A.2 – Schematic of an uncertainty budget . 69
Table B.1 – Result of the comparison measurement at a single voltage level g . 73
Table B.2 – Summary of results for h = 5 voltage levels (V = 500 kV) . 73
Xmax
Table B.3 – Uncertainty budget of the assigned scale factor F . 75
X
Table B.4 – Uncertainty budget of the assigned scale factor F . 77
Table B.5 – Calibration result for front time T and deviations. 78
Table B.6 – Uncertainty budget of the front time deviation ∆T . 80
1cal
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
HIGH-VOLTAGE TEST TECHNIQUES –

Part 2: Measuring systems
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
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2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
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3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
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Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
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4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
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any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) IEC draws attention to the possibility that the implementation of this document may involve the use of (a)
patent(s). IEC takes no position concerning the evidence, validity or applicability of any claimed patent rights in
respect thereof. As of the date of publication of this document, IEC had not received notice of (a) patent(s), which
may be required to implement this document. However, implementers are cautioned that this may not represent
the latest information, which may be obtained from the patent database available at https://patents.iec.ch. IEC
shall not be held responsible for identifying any or all such patent rights
IEC 60060-2 has been prepared by IEC technical committee 42: High-voltage and high current
test techniques. It is an International Standard.
This fourth edition cancels and replaces the third edition published in 2010. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) The general layout and text has been updated and improved to make the standard easier to
use.
b) This document has been revised to align it with the fourth edition of IEC 60060-1.
c) The treatment of measurement uncertainty estimation has been expanded.

– 8 – IEC 60060-2:2025 © IEC 2025
d) This document is now applicable to measuring systems used in testing at all standard
insulation levels specified in IEC 60071-1.
e) The measurement uncertainty requirement for the front time of the standard lighting impulse
voltage has been changed from 10 % to 15 %, for testing at all standard insulation levels
specified in IEC 60071-1.
f) The parameter "time-to-peak" of the switching impulse defined in the third edition of
IEC 60060-1:2010 has been replaced by "front time" in the fourth edition of IEC 60060-1.
Necessary changes have been made in this document to accommodate this change in
IEC 60060-1.
g) Clause 10, Measurement of combined voltages and Clause 11, Measurement of composite
voltages have been added.
h) Clause B.1 has been significantly revised to align more closely with the provisions of
Clause 5, including using the same nomenclature.
The text of this International Standard is based on the following documents:
Draft Report on voting
42/443/FDIS 42/447/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this International Standard is English.
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications.
A list of all parts in the IEC 60060 series, published under the general title High-voltage test
techniques, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn, or
• revised.
HIGH-VOLTAGE TEST TECHNIQUES –

Part 2: Measuring systems
1 Scope
This part of IEC 60060 is applicable to complete measuring systems and to their components,
used for the measurement of high voltages during laboratory and factory tests with direct
voltage, alternating voltage and lightning and switching impulse voltages and combined and
composite voltages as specified in IEC 60060-1. For measurements during on-site tests, see
IEC 60060-3.
The limits on uncertainties of measurements stated in this document apply to test levels stated
in IEC 60071-1. The principles of this document apply also to higher levels but the uncertainty
can be greater.
This document:
• defines the terms used;
• describes methods to estimate the uncertainties of high-voltage measurements;
• states the requirements that apply to measuring systems;
• describes the methods for approving a measuring system and checking its components;
• describes the procedures by which the user demonstrates that a measuring system meets
the requirements of this document, including the limits set for the uncertainty of
measurement.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60052, Voltage measurement by means of standard air gaps
IEC 60060-1, High-voltage test techniques – Part 1: General terminology and test requirements
IEC 61083 (all parts), Instruments and software used for measurements in high-voltage and
high-current tests
IEC 61083-1, Instruments and software used for measurements in high-voltage and high-
current tests – Part 1: Requirements for instruments for impulse tests
IEC 61083-2, Instruments and software used for measurement in high-voltage and high-current
tests – Part 2: Requirements for software for tests with impulse voltages and currents
ISO/IEC Guide 98-3:2008, Uncertainty of measurement – Part 3: Guide to the expression of
uncertainty in measurement (GUM: 1995)

– 10 – IEC 60060-2:2025 © IEC 2025
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
ISO and IEC maintain terminology databases for use in standardization at the following
addresses:
• IEC Electropedia: available at https://www.electropedia.org/
• ISO Online browsing platform: available at https://www.iso.org/obp
3.1 Measuring systems
3.1.1
measuring system
complete set of devices suitable for performing a high-voltage measurement
Note 1 to entry: A measuring system usually comprises the following components:
– a converting device with the leads required for connecting this device to the test object or into the circuit and the
connections to earth;
– a transmission system connecting the output terminals of the converting device to the measuring instruments with
its attenuating, terminating and adapting impedances or networks;
– a measuring instrument together with any connection to the power supply. Measuring systems which comprise
only some of the above components or which are based on non-conventional principles are acceptable if they
meet the uncertainty requirements specified in this document;
– and in some cases the measuring system can include software to calculate the measurand.
Note 2 to entry: The environment in which a measuring system functions, its clearances to live and earthed
structures and the presence of electric or magnetic fields can significantly affect the measurement result and its
uncertainty.
3.1.2
record of performance
detailed record, established and maintained by the user, describing the measuring system and
containing evidence that the requirements given in this document have been met
Note 1 to entry: This evidence includes the results of the initial performance test and the schedule and results of
each subsequent performance test and performance check.
3.1.3
approved measuring system
measuring system that is shown to comply with one or more of the sets of requirements set out
in IEC 60060-2
3.1.4
reference measuring system
measuring system with its calibration conducted in conformity with relevant national or
international standards of measurement, and having sufficient accuracy and stability for use in
the approval of other systems by making simultaneous comparative measurements with specific
types of waveform and ranges of voltage
Note 1 to entry: A reference measuring system (maintained in accordance with the requirements of this document)
can be used as an approved measuring system but the converse is not true.
3.2 Components of a measuring system
3.2.1
converting device
device for converting the quantity to be measured (measurand) into a quantity compatible with
the measuring instrument
3.2.2
voltage divider
device comprising resistors, inductors, capacitors, transformer(s) or a combination of these
components such that, between two points of the device, a desired fraction of the voltage
applied to the device as a whole can be obtained
[SOURCE: IEC 60050-312:2001, 312-02-32]
3.2.3
voltage transformer
instrument transformer in which the secondary voltage, in normal conditions of use, is
substantially proportional to the primary voltage and differs in phase from it by an angle which
is approximately zero for an appropriate direction of the connections
[SOURCE: IEC 60050-321:1986, 321-03-01]
3.2.4
voltage converting impedance
converting device which carries a current proportional to the applied voltage to be measured
with a current measuring instrument
3.2.5
electric-field probe
converting device for the measurement of the amplitude and waveform of an electric field
Note 1 to entry: An electric-field probe can be used to measure the waveform of the voltage producing the field
provided that the measurement is not affected by corona or space charges.
3.2.6
transmission system
set of devices that transfers the output signal of a converting device to a measuring instrument
Note 1 to entry: A transmission system usually consists of a coaxial cable with its terminating impedance, but it can
include attenuators, amplifiers, or other devices connected between the converting device and the measuring
instrument. For example, an optical link includes a transmitter, an optical cable and a receiver as well as related
amplifiers.
Note 2 to entry: A transmission system can be partially or completely included in the converting device or in the
measuring instrument.
3.2.7
measuring instrument
device intended to be used to make measurements, alone or in conjunction with supplementary
devices
[SOURCE: IEC 60050-311:2001, 311-03-01]
3.3 Scale factors
3.3.1
scale factor
factor by which the value of the measuring-instrument reading is
multiplied to obtain the value of the input quantity of the complete measuring system
Note 1 to entry: A measuring system can have multiple scale factors for different assigned measurement ranges,
frequency ranges or waveforms.
Note 2 to entry: For measuring systems that display the value of the input quantity directly, the nominal scale factor
...