IEC 60384-21:2004

INTERNATIONAL IEC
STANDARD 60384-21
First edition
2004-06
Fixed capacitors for use in electronic equipment –
Part 21:
Sectional specification:
Fixed surface mount multilayer capacitors
of ceramic dielectric, Class 1

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INTERNATIONAL IEC
STANDARD 60384-21
First edition
2004-06
Fixed capacitors for use in electronic equipment –
Part 21:
Sectional specification:
Fixed surface mount multilayer capacitors
of ceramic dielectric, Class 1
 IEC 2004  Copyright - all rights reserved
No part of this publication may be reproduced or utilized in any form or by any means, electronic or
mechanical, including photocopying and microfilm, without permission in writing from the publisher.
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmail@iec.ch Web: www.iec.ch
PRICE CODE
Commission Electrotechnique Internationale W
International Electrotechnical Commission
МеждународнаяЭлектротехническаяКомиссия
For price, see current catalogue

– 2 – 60384-21  IEC:2004(E)
CONTENTS
FOREWORD.4
1 General.6
1.1 Scope.6
1.2 Object.6
1.3 Normative references.6
1.4 Information to be given in a detail specification .7
1.5 Terms and definitions .8
1.6 Marking.9
2 Preferred rating and characteristics .9
2.1 Preferred characteristics.9
2.2 Preferred values of ratings .10
3 Quality assessment procedures.12
3.1 Primary stage of manufacture.12
3.2 Structurally similar components.12
3.3 Certified records of released lots.13
3.4 Qualification approval.13
3.5 Quality conformance inspection.19
4 Test and measurement procedures.21
4.1 Preliminary drying.21
4.2 Measuring conditions.21
4.3 Visual examination and check of dimensions .21
4.4 Mounting.21
4.5 Electrical tests.23
4.6 Temperature coefficient (α) and temperature cycle drift.25
4.7 Shear test.26
4.8 Substrate bending test.26
4.9 Resistance to soldering heat .26
4.10 Solderability.27
4.11 Rapid change of temperature .28
4.12 Climatic sequence.29
4.13 Damp heat, steady state.30
4.14 Endurance.31
4.15 Robustness of terminations (Only for capacitors with strip termination) .33
4.16 Component solvent resistance (if required).33
4.17 Solvent resistance of the marking (if required).33
4.18 Accelerated damp heat, steady state (if required).33

Annex A (normative) Guide for the specification and coding of dimensions of fixed
surface mount multilayer capacitors of ceramic dielectric, Class 1 .35

Figure 1 – Fault: crack or fissure .21
Figure 2 – Fault: crack or fissure .22
Figure 3 – Separation or delamination .22
Figure 4 – Exposed electrodes.22
Figure 5 – Principal faces .23

60384-21  IEC:2004(E) – 3 –
Table 1 – Preferred tolerance on rated capacitance .10
Table 2 – Rated temperature coefficient and tolerance .11
Table 3 – Combination of temperature coefficient and tolerance .12
Table 4 – Fixed sample size test plan for qualification approval – Assessment level EZ.15
Table 5 – Tests schedule for Qualification Approval.16
Table 6a – Lot-by-lot inspection .20
Table 6b – Periodic tests .20
Table 7 – Tangent of loss angle limits.24
Table 8 – Test voltages.25
Table 9 – Temperature cyclic drift limits.26
Table 10 – Maximum capacitance change.27
Table 11 – Maximum capacitance change.29
Table 12 – Number of damp heat cycles .30
Table 13 – Final inspection measurements and requirements .30
Table 14 – Final inspection measurements and requirements .31
Table 15 – Endurance test conditions (U = U ).32
C R
Table 16 – Endurance test conditions (U ≠ U ).32
C R
Table 17 – Final inspection measurements and requirements .32
Table 18 – Initial requirements.33
Table 19 – Conditioning .34
Table A.1 – Dimensions .36

– 4 – 60384-21  IEC:2004(E)
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 21: Sectional specification:
Fixed surface mount multilayer capacitors
of ceramic dielectric, Class 1

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
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agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
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3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
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Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
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expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60384-21 has been prepared by IEC technical committee 40:
Capacitors and resistors for electronic equipment.
This standard and its related publications (CEI 60384-21-1, IEC 60384-22 and IEC 60384-22-
1) cancel and replace IEC 60384-10 (1989) and its Amendments 1 (1993) and 2 (2000) as
well as IEC 60384-10-1 (1989) and its Amendment 1 (1993).
The text of this standard is based on the following documents:
FDIS Report on voting
40/1420/FDIS 40/1451/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.

60384-21  IEC:2004(E) – 5 –
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.
A bilingual version of this standard may be issued at a later date.

The contents of the corrigendum of September 2004 have been included in this copy.

– 6 – 60384-21  IEC:2004(E)
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 21: Sectional specification:
Fixed surface mount multilayer capacitors
of ceramic dielectric, Class 1

1 General
1.1 Scope
This sectional specification is applicable to fixed unencapsulated surface mount multilayer
capacitors of ceramic dielectric, Class 1, for use in electronic equipment. These capacitors
have metallized connecting pads or soldering strips and are intended to be mounted on
printed boards, or directly onto substrates for hybrid circuits.
Capacitors for electromagnetic interference suppression are not included, but are covered by
IEC 60384-14.
1.2 Object
The object of this standard is to prescribe preferred ratings and characteristics and to select
from IEC 60384-1:1999 the appropriate quality assessment procedures, tests and measuring
methods and to give general performance requirements for this type of capacitor. Test
severities and requirements prescribed in detail specifications referring to this sectional
specification shall be of equal or higher performance level, lower performance levels are not
permitted.
1.3 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60063:1963, Preferred number series for resistors and capacitors
Amendment 1 (1967)
Amendment 2 (1977))
IEC 60068-1:1988, Environmental testing – Part 1: General and guidance
IEC 60068-2-58:1999, Environmental testing – Part 2-58: Tests – Test Td – Test methods for
solderability, resistance to dissolution of metallization and to soldering heat of surface
mounting devices (SMD)
IEC 60384-1:1999, Fixed capacitors for use in electronic equipment – Part 1: Generic
specification
IEC 60410:1973, Sampling plans and procedures for inspection by attributes
ISO 3 :1973, Preferred numbers – Series of preferred numbers

60384-21  IEC:2004(E) – 7 –
1.4 Information to be given in a detail specification
Detail specification shall be derived from the relevant blank detail specification.
Detail specifications shall not specify requirements inferior to those of the generic, sectional
or blank detail specification. When more severe requirements are included, they shall be
listed in 1.9 of the detail specification and indicated in the test schedules, for example by an
asterisk.
NOTE The information given in 1.4.1 may, for convenience, be presented in tabular form.
The following information shall be given in each detail specification and the values quoted
shall preferably be selected from those given in the appropriate Clause of this sectional
specification.
1.4.1 Outline drawing and dimensions
There shall be an illustration of the capacitors as an aid to easy recognition and for
comparison of the capacitors with others.
Dimensions and their associated tolerances, which affect interchangeability and mounting,
shall be given in the detail specification. All dimensions shall preferably be stated in
millimetres, however, when the original dimensions are given in inches, the converted metric
dimensions in millimetres shall be added.
Normally the numerical values shall be given for the length, width and height of the body.
When necessary, for example when a number of items (sizes and capacitance/voltage ranges)
are covered by a detail specification, the dimensions and their associated tolerances shall be
placed in a table below the drawing.
When the configuration is other than described above, the detail specification shall state such
dimensional information as will adequately describe the capacitors.
1.4.2 Mounting
The detail specification shall give guidance on methods of mounting for normal use. Mounting
for test and measurement purposes (when required) shall be in accordance with 4.3 of this
sectional specification.
1.4.3 Rating and characteristics
The ratings and characteristics shall be in accordance with the relevant Clauses of this
specification, together with the following:
1.4.3.1 Rated capacitance range
See 2.2.4.1
NOTE When products approved to the detail specification have different ranges, the following statement should
be added: “The range of capacitance values available in each voltage range is given in IECQ 001005”.
1.4.3.2 Particular characteristics
Additional characteristics may be listed, when they are considered necessary to specify
adequately the component for design and application purposes.
1.4.3.3 Soldering
The detail specification shall prescribe the test methods, severities and requirements
applicable for the solderability and the resistance to soldering heat tests.

– 8 – 60384-21  IEC:2004(E)
1.4.4 Marking
The detail specification shall specify the content of the marking on the capacitor and on the
package. Deviations from 1.6 of this sectional specification shall be specifically stated.
1.5 Terms and definitions
For the purposes of this sectional specification, the terms and definitions given in
IEC 60384-1, as well as the following apply.
1.5.1
surface mount capacitor
a capacitor whose small dimensions and nature or shape of terminations make it suitable for
surface mounting in hybrid circuits and on printed boards
1.5.2
fixed capacitors, ceramic dielectric, Class 1
a capacitor specially designed and suited for resonant circuit application where low losses
and high stability of capacitance are essential or where a precisely defined temperature
coefficient is required, for example for compensating temperature effects in the circuit.
The ceramic dielectric is defined by its rated temperature coefficient (α)
1.5.3
subclass
for a given rated temperature coefficient, the subclass is defined by the rated tolerance on the
temperature coefficient (see Table 2)
NOTE The rated temperature coefficient value and its tolerance refer to the temperature interval of +20 °C to
+85 °C, but because in practice TC curves are not strictly linear, it is necessary to define limiting capacitance
deviation (ΔC/C) for other temperatures (see Table 3)
1.5.4
category temperature range
range of ambient temperatures for which the capacitor has been designed to operate
continuously; this is given by the lower and upper category temperature
1.5.5
rated temperature
maximum ambient temperature at which the rated voltage may be continuously applied
1.5.6
rated voltage (d.c.)
U
R
maximum direct voltage or peak value of pulse voltage which may be applied continuously to
a capacitor at any temperature between the lower category temperature and the rated
temperature
NOTE The sum of the d.c. voltage and the peak a.c. voltage or the peak to peak a.c. voltage, whichever is the
greater, applied to the capacitor shall not exceed the rated voltage. The value of the peak a.c. voltage shall not
exceed the value determined by the permissible reactive power.
1.5.7
category voltage
U
C
maximum voltage which may be applied continuously to a capacitor at its upper category
temperature
60384-21  IEC:2004(E) – 9 –
1.6 Marking
See 2.4 of IEC 60384-1with the following details:
1.6.1 The information given in the marking is normally selected from the following list; the
relative importance of each item is indicated by its position in the list:
a) rated capacitance;
b) rated voltage (d.c. voltage may be indicated by the symbol     or     );
c) tolerance on rated capacitance;
d) temperature coefficient and its tolerance as applicable ( according to 2.2.5);
e) year and month (or week) of manufacture;
f) manufacturer’s name or trade mark;
g) climatic category;
h) manufacturer’s type designation;
i) reference to the detail specification.
1.6.2 These capacitors are generally not marked on the body. If some marking can be
applied, they shall be clearly marked with as many as possible of the above items as is
considered useful. Any duplication of information in the marking on the capacitor should be
avoided.
1.6.3 Any marking shall be legible and not easily smeared or removed by rubbing with the
finger.
1.6.4 The package containing the capacitor(s) shall be clearly marked with all the
information listed in 1.6.1.
1.6.5 Any additional marking shall be so applied that no confusion can arise.
2 Preferred rating and characteristics
2.1 Preferred characteristics
The values given in the detail specification shall preferably be selected from the following:
2.1.1 Preferred climatic categories
The capacitors covered by this sectional specification are classified into climatic categories
according to the general rules given in IEC 60068-1.
The lower and upper category temperatures and the duration of the damp heat, steady state
test shall be chosen from the following:
Lower category temperature: –55 °C, –40 °C, –25 °C, –10 °C and +10 °C
Upper category temperature: +70 °C, +85 °C, +100 °C, +125 °C and +150 °C
Duration of the damp heat, steady state test: 4, 10, 21 and 56 days.
The severities for the cold and dry heat tests are the lower and upper category temperatures
respectively.
NOTE The resistance to humidity resulting from the above climatic category is for the capacitors in their
unmounted state. The climatic performance of the capacitors after mounting is greatly influenced by the mounting
substrate, the mounting method (see 4.3) and the final coating.

– 10 – 60384-21  IEC:2004(E)
2.2 Preferred values of ratings
2.2.1 Rated temperature
For capacitors covered by this sectional specification, the rated temperature is equal to the
upper category temperature, unless the upper category temperature exceeds 125 °C.
2.2.2 Rated voltage (U )
R
The preferred values of the rated voltage are the values of the R5 series of ISO 3. If other
values are needed they shall be chosen from the R10 series.
2.2.3 Category voltage (U )
C
When the rated temperature is defined as the upper category temperature, the category
voltage is equal to the rated voltage as defined in IEC 60384-1, 2.2.17. If the upper category
temperature exceeds 125 °C, or the rated voltages exceed 500 V, the category voltage shall
be given in the detail specification.
2.2.4 Preferred values of rated capacitance and associated tolerance values
2.2.4.1 Preferred values of rated capacitance
Rated capacitance values shall be taken from the series of IEC 60063; the E6, E12 and E24
series are preferred.
2.2.4.2 Preferred tolerance on rated capacitance
See Table 1.
Table 1 – Preferred tolerance on rated capacitance
Preferred Tolerance
series
C ≥≥ 10 pF Letter code C << 10 pF Letter code
R ≥≥ R <<
E 6
± 20 % M ± 2 pF G
E 12 K F
± 10 % ± 1 pF
E 24 ± 5 % J ± 0.5 pF D
G C
± 2 % ± 0.25 pF
F B
± 1 % ± 0.1 pF
2.2.5 Temperature coefficient (αααα)
2.2.5.1 Table 2 shows the preferred rated temperature coefficients and the associated
–6
tolerances, expressed in parts per million per degree Kelvin (10 /K), and the corresponding
subclasses and codes.
The detail specification shall specify for each temperature coefficient the minimum value of
capacitance for which the given tolerance of temperature coefficient may be verified,
considering the accuracy of the method of capacitance measurement specified.
For values of capacitance lower than this minimum value:
a) The detail specification shall specify a multiplying factor for the tolerance on α, as well as
the permissible changes of capacitance at the lower and upper category temperature.

60384-21  IEC:2004(E) – 11 –
b) Special methods of measurement may be necessary and if required shall be tested in the
detail specification.
Table 2 – Rated temperature coefficient and tolerance
Rated temperature coefficient Tolerance on temperature Subclass Letter code for
-6 -6
(10 /K ) coefficient (10 /K )
Tolerance
αααα
± 30
+100 1B A G
± 30
0 1B C G
± 30
–33 1B H G
± 30
–75 1B L G
± 30
–150 1B P G
± 30
–220 1B R G
± 60
–330 1B S H
± 60
–470 1B T H
± 120
–750 1B U J
± 250
–1 000 1F Q K
± 250
–1 500 1F V K
a)
+140 ≥ α ≥ –1 000 1C SL -
a)
This temperature coefficient value is not subject to inspection, since no limits for relative
capacitance variation are specified in Table 3.
NOTE 1 Preferred temperature coefficients values (α) are underlined.
NOTE 2 The rated temperature coefficients and their tolerances are defined using the capacitance
change between the temperatures 20 °C and 85 °C.
-6
NOTE 3 A capacitor with a temperature coefficient 0 x 10 /K and a tolerance on temperature
-6
coefficient of ±30 x 10 /K is designated as a CG capacitor (subclass 1B).

2.2.5.2 Table 3 shows for each combination of temperature coefficient and tolerance, the
permissible relative variation of capacitance expressed in parts per thousand at both the
upper and lower category temperatures. Temperature coefficients and tolerances are
–6
expressed in parts per million per degree Kelvin (10 /K).

– 12 – 60384-21  IEC:2004(E)
Table 3 – Combination of temperature coefficient and tolerance

Permissible relative variation in capacitance in parts per 1 000
between 20 °°°°C and given temperature
Lower category temperature Upper category temperature
Tolerance
αααα
–55 °°°°C –40 °°°°C –25 °°°°C –10 °°°°C +70 °°°°C +85 °°°°C +100 °°°°C +125 °°°°C
–6
-6
10 /K
10 /K
+100 ±30(G) –9,75 / –7,80 / –5,85 / –3,90 / 3,50 / 4,55 / 5,60 / 7,35 /
–3,71 –2,96 –2,22 –1,48 6,50 8,45 10,4 13,7
0 ±30(G) –2,25 / –1,80 / –1,35 / –0,90 / –1,50 / –1,95 / –2,40 / –3,15 /
5,45 4,36 3,27 2,18 1,50 1,95 2,40 3,15
-33 0,225 / 0,180 / 0,135 / 0,090 / –3,15 / –4,10 / –5,04 / –6,62 /
±30(G)
8,47 6,77 5,08 3,39 –0,15 –0,195 –0,240 –0,32
-75 3,38 / 2,70 / 2,03 / 1,35 / –5,25 / –6,83 / –8,40 / –11,0 /
±30(G)
12,3 9,85 7,39 4,92 –2,25 –2,93 –3,60 –4,73
-150 9,00 / 7,20 / 5,40 / 3,60 / –9,00 / –11,7 / –14,4 / –18,9 /
±30(G)
19,2 15,3 11,5 7,67 –6,0 –7,80 –9,60 –12,6
-220 14,3 / 11,4 / 8,55 / 5,70 / –12,5 / –16,2 / –20,0 / –26,3 /
±30(G)
25,6 20,46 15,3 10,2 –9,50 –12,4 –15,2 –20,0
-330 20,3 / 16,2 / 12,2 / 8,10 / –19,5 / – –25,4 / –31,2 / –41,0 /
±60(H)
38,4 30,7 23,0 15,4 13,5 –17,6 –21,6 –28,4
-470 30,8 / 24,6 / 18,5 / 12,3 / –26,5 / –34,5 / –42,4 / –55,7 /
±60(H)
51,2 41,0 30,7 20,5 –20,5 –26,7 –32,8 –43,1
-750 ±120(J) 47,3 / 37,8 / 28,4 / 18,9 / –43,5 / –56,6 / –69,6 / –91,4 /
82,3 65,8 49,4 32,9 –31,5 –41,0 –50,4 –66,2
-1000 ±250(K) 56,3 / 45,0 / 33,8 / 22,5 / –62,5 / –81,3 / –100 / –131 /
117 93,7 70,2 46,8 –37,5 –48,8 –60,0 –78,8
-1500 ±250(K) 93,8 / 75,0 / 56,3 / 37,5 / –87,5 / –114 / –140 / –184 /
163 130 97,7 65,1 –62,5 –81,3 –100 –131
NOTE Preferred temperature coefficient values (α) are underlined.
When the upper category temperature is above 125 °C, the limits shall be given in the detail specification.

2.2.6 Dimensions
Suggested rules for the specification and coding of dimensions are given in Annex A.
Specific dimensions shall be given in the detail specification.
3 Quality assessment procedures
3.1 Primary stage of manufacture
The primary stage of manufacture is the first common firing of the dielectric-electrode
assembly.
3.2 Structurally similar components
Capacitors considered as being structurally similar are capacitors produced with similar
processes and materials, through they may be of different case sizes and values.

60384-21  IEC:2004(E) – 13 –
3.3 Certified records of released lots
The information required in IEC 60384-1, 3.9 shall be made available when prescribed in the
detail specification and when requested by a purchaser. After the endurance test, the
parameters for which variables information is required are the capacitance change, tan δ and
the insulation resistance.
3.4 Qualification approval
The procedures for qualification approval testing are given in IEC 60384-1, 3.5.
The schedule to be used for qualification approval testing on the basis of lot-by-lot and
periodic tests is given in 3.5 of this specification. The procedure using a fixed sample size
schedule is given in 3.4.1 and 3.4.2.
3.4.1 Qualification approval on the basis of the fixed sample size procedures
The fixed sample size procedure is described in item b) of 3.5.3 of IEC 60384-1. The sample
shall be representative of the range of capacitors for which approval is sought. This may or
may not be the complete range covered by the detail specification.
For each temperature coefficient the sample shall consist of specimens of capacitors of
maximum and minimum size and for each of these sizes, the maximum capacitance value for
the highest rated voltage and minimum rated voltage of the voltage ranges for which approval
is sought. When there are more than four rated voltages, an intermediate voltage shall also be
tested. Thus for the approval of a range, testing is required of either four or six values
(capacitance/voltage combinations) for each temperature coefficient. Where the total range
consists of less than four values, the number of specimens to be tested shall be that required
for four values. When approval is sought for more than one temperature coefficient, see 3.4.2.
In case assessment level EZ is used, spare specimens are permitted as follows:
Two (for six values) or three (for four values) per value which may be used as replacements
for specimens, which are non-conforming because of incidents not attributable to the
manufacturer.
The numbers given in Group 0 assume that all groups are applicable. If this is not so, the
numbers may be reduced accordingly.
When additional groups are introduced into the qualification approval test schedule, the
number of specimens required for Group 0 shall be increased by the same number as that
required for the additional groups.
Table 4 gives the number of samples to be tested in each group or subgroup together with the
number of permissible non-conformances for the qualification approval test.
3.4.2 Tests
The complete series of tests specified in Table 4 and 5 are required for the approval of
capacitors covered by one detail specification. The tests of each group shall be carried out in
the order given.
The whole sample shall be subjected to the tests of Group 0 and then divided for the other
groups.
Non-conforming specimens found during the tests of Group 0 shall not be used for the other
groups.
– 14 – 60384-21  IEC:2004(E)
“One non-conforming item” is counted when a capacitor has not satisfied the whole or a part
of the tests of a group.
When approval is sought for more than one temperature coefficient at the same time, the test
schedule and sample size required for the smallest temperature coefficient are those of
Group 1, 2 and 3. For each additional temperature coefficient, the testing is limited to the
tests and sample sizes as specified for Subgroup 3.3 and Group 4.
The approval is decided on an individual temperature coefficient basis in accordance with the
permissible number of non-conforming items indicated in Table 4. In order to calculate the
total actual non-conforming items for temperature coefficients other than the smallest, the
non-conforming items in Group 1, 2 and 3 for the smallest temperature coefficient are added
to the non-conforming items in Subgroup 3.3 and Group 4 for that particular temperature
coefficient.
The approval is granted when the number of non-conforming items do not exceed the
specified number of permissible non-conforming items for each group or subgroup and the
total number of permissible non-conformances.
NOTE Tables 4 and 5 together form the fixed sample size test schedule. Table 4 includes the details for the
sampling and permissible non-conforming items for the different tests or groups of tests. Table 5 together with the
details of the test contained in Clause 4 gives a complete summary of test conditions and performance
requirements and indicates where, for example for the test method or conditions of test, a choice has to be made in
detail specification.
The conditions of test and performance requirements for the fixed sample size test schedule shall be identical to
those prescribed in the detail specification for quality conformance inspection.

60384-21  IEC:2004(E) – 15 –
Table 4 – Fixed sample size test plan for qualification approval – Assessment level EZ
Group Test Subclause of this Number of Permissible
publication specimens number of
No.
non conforming
e
n
items
c
0 Visual examination 4.4
f
Dimensions 4.4 132 + 24 0
Capacitance 4.5.1
Tangent of loss angle 4.5.2
Insulation resistance 4.5.3
Voltage proof 4.5.4
Spare specimens 12
g
1A 4.15 12 0
Robustness of termination
Resistance to soldering heat 4.9
b
Component solvent resistance 4.16
1B Solderability 4.10 12 0
b
Solvent resistance of marking  4.17
d
2 Substrate bending test 4.8 12 0
a
Mounting 4.3
f c
Visual examination 4.4 84 + 24 0
Capacitance 4.5.1
Tangent of loss angle 4.5.2
Insulation resistance 4.5.3
Voltage proof 4.5.4
h
3.1 4.7 24 0
Shear test
Rapid change of temperature 4.11
Climatic sequence 4.12
3.2 Damp heat, steady state 4.13 24 0
3.3 Endurance 4.14 36 0
f
3.4 Accelerated damp heat, steady 4.18 24 0
b
state
4 Temperature coefficient and 4.6 12 0
temperature cycle drift
a
The values of these measurements serve as initial measurements for the tests of Group 3.
b
If required in the detail specification.
c
The capacitors found non-conforming items after mounting shall not be taken into account when calculating
the permissible non-conforming for the following tests. They shall be replaced by spare capacitors.
d
Not applicable to capacitors, which according to their detail specification shall only be mounted on alumina
substrates.
e
Capacitance/voltage combinations, see 3.4.1.
f
Additional capacitors, if Group 3.4 is tested.
g
Applicable to capacitors with strip terminations.
h
Not applicable to capacitors with strip terminations.

– 16 – 60384-21  IEC:2004(E)
Table 5 – Tests schedule for qualification approval
Subclause number and test D Conditions of test Number of Performance
specimens requirements
(see NOTE 1) or (see NOTE 1)
(n)
(see NOTE 1)
and
ND
number of
non-
conforming
items (c)
GROUP 0 ND  See Table 4
4.4 Visual examination As in 4.4.2
Legible marking and as
specified in the detail
specification
4.4 Dimension (detail) See the detail specification
4.5.1 Capacitance Frequency: … Hz Within specified tolerance
Measuring voltage: … V r.m.s.
4.5.2 Tangent of loss angle Frequency and measuring As in 4.5.2
voltage same as in 4.5.1
(tanδ)
4.5.3 Insulation resistance See detail specification for the As in 4.5.3.3
method
4.5.4 Voltage proof See detail specification for the No breakdown or flashover
method
GROUP 1A D See Table 4
4.15 Robustness of ter- Test Ua1, Force: 2.5 N No visible damage
minations
Test Ub, Method 1, Force: 2,5 N
(if applicable)
Number of bends: 1
Visual examination
4.9.1 Initial measurement Capacitance
4.9 Resistance to sol- See detail specification for the
dering heat method
Recovery: 6 h to 24 h
4.9.4 Final measurement Visual examination As in 4.9.4

Capacitance As in 4.9.4
4.16 Component solvent Solvent: … See detail specification
resistance
Solvent temperature: …
(if applicable)
Method 2
Recovery: …
D
GROUP 1B  See Table 4
4.10 Solderability See detail specification for the

method
4.10.3 Final measurements Visual examination As in 4.10.3
4.17 Solvent resistance Solvent: … Legible marking
a
of the marking
Solvent temperature: …
(if applicable)
Method 1
Rubbing material: cotton wool
Recovery: …
60384-21  IEC:2004(E) – 17 –
Subclause number and test D Conditions of test Number of Performance
specimens requirements
(see NOTE 1) or (see NOTE 1)
(n)
(see NOTE 1)
and
ND
number of
non-
conforming
items (c)
GROUP 2 D  See Table 4
4.8 Substrate bending Deflection: … See detail specification
test
Number of bends: …
4.8.1 Initial measurement Capacitance
4.8.2 Final inspection Capacitance (with printed ΔC/C ≤ 5 %
board in bent position)
No visible damage
Visual examination
GROUP 3 D  See Table 4
b
4.3 Mounting Substrate material: …
Visual examination As in 4.4.2
Capacitance Within specified tolerance
Tangent of loss angle As in 4.5.2
Insulation resistance As in 4.5.3.3
Voltage proof No breakdown or flashover

GROUP 3.1
D  See Table 4
4.7 Shear test Visual examination No visible damage
4.11.1 Initial measurement Capacitance
4.11 Rapid change of T = Lower category
A
temperature temperature
T = Upper category
B
temperature
Five cycles
Duration t = 30 min
Recovery: 6 h to 24 h
4.11.4 Final measurements Visual examination No visible damage
Capacitance ΔC/C as in 4.11.4
4.12 Climatic sequence
4.12.1 Initial Measurement Capacitance
4.12.2 Dry heat Temperature: upper category
temperature
Duration: 16 h
4.12.3 Damp heat, cyclic,
test Db, first cycle
4.12.4 Cold Temperature: lower category
temperature
Duration: 2 h
Visual examination No visible damage

– 18 – 60384-21  IEC:2004(E)
Subclause number and test D Conditions of test Number of Performance
specimens requirements
(see NOTE 1) or (see NOTE 1)
(n)
(see NOTE 1)
ND
and
number of
non-
conforming
items (c)
4.12.5 Damp heat, cyclic, Recovery: 6 h to 24 h
test Db, remaining
cycles
4.12.6 Final measurements Visual examination No visible damage
Legible marking
Capacitance
ΔC/C: As in 4.12.6
Tangent of loss angle
As in 4.12.6
Insulation resistance
As in 4.12.6
GROUP 3.2
D  See Table 4
4.13 Damp heat, steady
state
4.13.1 Initial measurement Capacitance
Recovery: 6 h to 24 h
4.13.4 Final measurements Visual examination No visible damage
Legible marking
Capacitance
Δ C/C: As in 4.13.4
Tangent of loss angle
As in 4.13.4
Insulation resistance
As in 4.13.4
GROUP 3.3 D  See Table 4
4.14 Endurance Duration: … h
Temperature: …°C
Voltage: …V
4.14.1 Initial measurement Capacitance
Recovery: 6 h to 24 h
4.14.4 Final measurements Visual examination No visible damage
Legible marking
Capacitance
Δ C/C: As in 4.14.4
Tangent of loss angle
As in 4.14.4
Insulation resistance
As in 4.14.4
GROUP 3.4
D See Table 4
4.18 Accelerated damp Duration: … h
heat, steady state
Temperature: (85 ± 2) °C
(if required)
Humidity: (85 ± 3) %
4.18.1 Initial measurement Insulation resistance As in 4.18.1
Recovery: 6 h to 24 h
4.18.4 Final measurements Insulation resistance As in 4.18.4
Group 4
ND See Table 4
4.6 Temperature Preliminary drying: 16 h to 24 h Δ C/C: As in 4.6.3
coefficient and cyclic
drift
NOTE 1 Subclause numbers of test and performance requirements refer to Clause 4.
NOTE 2 In this table: D = destructive, ND = non- destructive.
a
This test may be carried out on capacitors mounted on a substrate.
b
When different substrate materials are used for the individual subgroup, the detail specification shall indicate which
substrate material is used in each subgroup.

60384-21  IEC:2004(E) – 19 –
3.5 Quality conformance inspection
3.5.1 Formation of inspection lots
3.5.1.1 Group A and B inspection
These tests shall be carried out on a lot-by-lot basis.
A manufacturer may aggregate the current production into inspection lots subject to the
following safeguards:
1) The inspection lot shall consist of structurally similar capacitors (see 3.2).
2a) The sample tested shall be representative of the values and the dimensions
contained in the inspection lot:
– in relation to their number;
– with a minimum of five of any one value.
2b) If there are less than five of any one value in the sample the basis for the drawing of
samples shall be agreed between the manufacturer and the National Supervising
Inspectorate.
3.5.1.2 Group C inspection
These tests shall be carried out on a periodic basis.
Samples shall be representative of the current production of the specified periods and shall
be divided into small, medium and large sizes. In order to cover the range of approvals in any
period, one voltage shall be tested from each group of sizes. In subsequent periods, other
sizes and/or voltage ratings in production
...