IEC 60384-21:2011

IEC 60384-21 ®
Edition 2.0 2011-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fixed capacitors for use in electronic equipment –
Part 21: Sectional specification – Fixed surface mount multilayer capacitors of
ceramic dielectric, Class 1
Condensateurs fixes utilisés dans les équipements électroniques –
Partie 21: Spécification intermédiaire – Condensateurs multicouches fixes à
diélectriques en céramique pour montage en surface, de Classe 1

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IEC 60384-21 ®
Edition 2.0 2011-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fixed capacitors for use in electronic equipment –
Part 21: Sectional specification – Fixed surface mount multilayer capacitors of
ceramic dielectric, Class 1
Condensateurs fixes utilisés dans les équipements électroniques –
Partie 21: Spécification intermédiaire – Condensateurs multicouches fixes à
diélectriques en céramique pour montage en surface, de Classe 1

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX W
ICS 31.060.10 ISBN 978-2-88912-822-8

– 2 – 60384-21 © IEC:2011
CONTENTS
FOREWORD . 5

1 General . 7

1.1 Scope . 7

1.2 Object . 7

1.3 Normative references . 7

1.4 Information to be given in a detail specification . 7

1.4.1 Outline drawing and dimensions . 8

1.4.2 Mounting . 8
1.4.3 Rating and characteristics . 8
1.4.4 Marking . 9
1.5 Terms and definitions . 9
1.6 Marking . 10
1.6.1 Information for marking . 10
1.6.2 Marking on the body . 10
1.6.3 Requirements for marking . 10
1.6.4 Marking of the packaging . 10
1.6.5 Additional marking . 10
2 Preferred ratings and characteristics . 10
2.1 Preferred characteristics . 10
2.1.1 Preferred climatic categories . 10
2.2 Preferred values of ratings . 11
2.2.1 Rated temperature (T ) . 11
R
2.2.2 Rated voltage (U ) . 11
R
2.2.3 Category voltage (U ) . 11
C
2.2.4 Preferred values of nominal capacitance and associated tolerance
values . 11
2.2.5 Temperature coefficient (α) . 12
2.2.6 Dimensions . 14
3 Quality assessment procedures . 14
3.1 Primary stage of manufacture . 14
3.2 Structurally similar components . 14
3.3 Certified records of released lots . 14
3.4 Qualification approval . 14

3.4.1 Qualification approval on the basis of the fixed sample size
procedures . 14
3.4.2 Tests . 15
3.5 Quality conformance inspection . 19
3.5.1 Formation of inspection lots . 19
3.5.2 Schedule . 20
3.5.3 Delayed delivery . 20
3.5.4 Assessment levels . 20
4 Test and measurement procedures . 21
4.1 Preliminary drying . 21
4.2 Measuring conditions . 22
4.3 Mounting . 22
4.4 Visual examination and check of dimensions . 22
4.4.1 Visual examination . 22

60384-21 © IEC:2011 – 3 –
4.4.2 Requirements . 22

4.5 Electrical tests . 24

4.5.1 Capacitance . 24

4.5.2 Tangent of loss angle (tan δ) . 24

4.5.3 Insulation resistance . 24

4.5.4 Voltage proof . 25

4.6 Temperature coefficient (α) and temperature cycle drift . 26

4.6.1 Preliminary drying . 26

4.6.2 Measuring conditions . 26

4.6.3 Requirements . 26
4.7 Shear test . 26
4.8 Substrate bending test . 27
4.8.1 Initial measurement . 27
4.8.2 Final inspection . 27
4.9 Resistance to soldering heat . 27
4.9.1 Initial measurement . 27
4.9.2 Test conditions . 27
4.9.3 Recovery . 28
4.9.4 Final inspection, measurements and requirements . 28
4.10 Solderability . 29
4.10.1 Test conditions . 29
4.10.2 Recovery . 30
4.10.3 Final inspection, measurements and requirements . 30
4.11 Rapid change of temperature . 30
4.11.1 Initial measurement . 30
4.11.2 Number of cycles . 30
4.11.3 Recovery . 30
4.11.4 Final inspection, measurements and requirements . 30
4.12 Climatic sequence . 31
4.12.1 Initial measurement . 31
4.12.2 Dry heat . 31
4.12.3 Damp heat, cyclic, Test Db, first cycle . 31
4.12.4 Cold . 31
4.12.5 Damp heat, cyclic, Test Db, remaining cycles . 31
4.12.6 Final inspection, measurements and requirements . 31

4.13 Damp heat, steady state . 32
4.13.1 Initial measurement . 32
4.13.2 Conditions of test . 32
4.13.3 Recovery . 33
4.13.4 Final inspection, measurements and requirements . 33
4.14 Endurance . 33
4.14.1 Initial measurement . 33
4.14.2 Conditions of test . 33
4.14.3 Recovery . 34
4.14.4 Final inspection, measurements and requirements . 34
4.15 Robustness of terminations (only for capacitors with strip termination) . 34
4.15.1 Test conditions . 34
4.15.2 Final inspection and requirements . 34
4.16 Component solvent resistance (if required) . 35

– 4 – 60384-21 © IEC:2011
4.17 Solvent resistance of the marking (if required) . 35

4.18 Accelerated damp heat, steady state (if required) . 35

4.18.1 Initial measurement . 35

4.18.2 Conditioning . 35

4.18.3 Recovery . 36

4.18.4 Final measurements . 36

Annex A (normative) Guidance for the specification and coding of dimensions of fixed

surface mount multilayer capacitors of ceramic dielectric, Class 1 . 37

Annex B (informative) Combination of temperature coefficient and tolerance for the

reference temperature of 25 °C . 38

Bibliography . 39

Figure 1 – Fault: crack or fissure . 22
Figure 2 – Fault: crack or fissure . 22
Figure 3 – Separation or delamination . 23
Figure 4 – Exposed electrodes . 23
Figure 5 – Principal faces . 23
Figure 6 – Reflow temperature profile . 28
Figure A.1 – Dimensions . 37

Table 1 – Preferred tolerance on nominal capacitance . 11
Table 2 – Nominal temperature coefficient and tolerance . 12
Table 3 – Combination of temperature coefficient and tolerance . 13
Table 4 – Fixed sample size test plan for qualification approval – Assessment level EZ . 16
Table 5 – Tests schedule for qualification approval . 17
Table 6a – Lot-by-lot inspection . 21
Table 6b – Periodic tests . 21
Table 7 – Tangent of loss angle limits . 24
Table 8 – Test voltages. 26
Table 9 – Temperature cyclic drift limits . 26
Table 10 – Reflow temperature profiles for Sn-Ag-Cu alloy . 28
Table 11 – Maximum capacitance change . 29
Table 12 – Maximum capacitance change . 31

Table 13 – Number of damp heat cycles . 31
Table 14 – Final inspection measurements and requirements . 32
Table 15 – Test conditions for damp heat, steady state . 32
Table 16 – Final inspection measurements and requirements . 33
Table 17 – Endurance test conditions (U = U ) . 33
C R
Table 18 – Endurance test conditions (U ≠ U ) . 34
C R
Table 19 – Final inspection measurements and requirements . 34
Table 20 – Initial requirements . 35
Table 21 – Conditioning . 35
Table B.1 – Combination of temperature coefficient and tolerance for the reference
temperature of 25 °C . 38

60384-21 © IEC:2011 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION

____________
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 21: Sectional specification –

Fixed surface mount multilayer capacitors

of ceramic dielectric, Class 1

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
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agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
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3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
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4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
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between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of

patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60384-21 has been prepared by IEC technical committee 40:
Capacitors and resistors for electronic equipment.
This second edition cancels and replaces the first edition published in 2004 and contains the
following significant technical changes with respect to the previous edition:
• The test voltage of 1,2 U at U ≥ 1 000 V has been added in 4.5.4 Voltage proof.
R R
• Detail test conditions have been added in 4.7 Shear test and 4.8 Substrate bending test.
• Test conditions applying lead free solder alloy (Sn-Ag-Cu) have been included in 4.9
Resistance to soldering heat and 4.10 Solderability.
• A selection of the test conditions according to marketing needs have been stated in 4.13
Damp heat, steady state.
• The dimensions of 0402 M in Annex A have been added.

– 6 – 60384-21 © IEC:2011
• The code of the temperature coefficient and the tolerance of capacitance for the reference

temperature of 25 °C have been added, see Annex B.

The text of this standard is based on the following documents:

FDIS Report on voting
40/2127/FDIS 40/2140/RVD
Full information on the voting for the approval of this standard can be found in the report on

voting indicated in the above table.

This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
The list of all parts of the IEC 60384 series, under the general title Fixed capacitors for use in
electronic equipment, can be found on the IEC web site.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
60384-21 © IEC:2011 – 7 –
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 21: Sectional specification –

Fixed surface mount multilayer capacitors

of ceramic dielectric, Class 1

1 General
1.1 Scope
This part of IEC 60384 is applicable to fixed unencapsulated surface mount multilayer
capacitors of ceramic dielectric, Class 1, for use in electronic equipment. These capacitors
have metallized connecting pads or soldering strips and are intended to be mounted on
printed boards, or directly onto substrates for hybrid circuits.
Capacitors for electromagnetic interference suppression are not included, but are covered by
IEC 60384-14.
1.2 Object
The object of this standard is to prescribe preferred ratings and characteristics and to select
from IEC 60384-1 the appropriate quality assessment procedures, tests and measuring
methods and to give general performance requirements for this type of capacitor. Test
severities and requirements prescribed in detail specifications referring to this sectional
specification should be of equal or higher performance level, lower performance levels are not
permitted.
1.3 Normative references
The following reference documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60063:1963, Preferred number series for resistors and capacitors
Amendment 1 (1967)
Amendment 2 (1977)
IEC 60068-1:1988, Environmental testing – Part 1: General and guidance

IEC 60068-2-58:2004, Environmental testing – Part 2-58: Tests – Test Td – Test methods
for solderability, resistance to dissolution of metallization and to soldering heat of surface
mounting devices (SMD)
IEC 60384-1:2008, Fixed capacitors for use in electronic equipment – Part 1: Generic
specification
IEC 61193-2:2007, Quality assessment systems – Part 2: Selection and use of sampling
plans for inspection of electronic components and packages
ISO 3:1973, Preferred numbers – Series of preferred numbers
1.4 Information to be given in a detail specification
The detail specification shall be derived from the relevant blank detail specification.

– 8 – 60384-21 © IEC:2011
Detail specifications shall not specify requirements inferior to those of the generic, sectional

or blank detail specification. When more severe requirements are included, they shall be

listed in 1.9 of the detail specification and indicated in the test schedules, for example by an

asterisk.
NOTE The information given in 1.4.1 may, be presented in tabular form if more convenient.

The following information shall be given in each detail specification and the values quoted

shall preferably be selected from those given in the appropriate clause of this sectional

specification.
1.4.1 Outline drawing and dimensions

There shall be an illustration of the capacitors as an aid to easy recognition and for
comparison of the capacitors with others.
Dimensions and their associated tolerances, which affect interchangeability and mounting,
shall be given in the detail specification. All dimensions shall preferably be stated in
millimetres, however, when the original dimensions are given in inches, the converted metric
dimensions in millimetres shall be added.
Normally the numerical values shall be given for the length, width and height of the body.
When necessary, for example when a number of items (sizes and capacitance/voltage ranges)
are covered by a detail specification, the dimensions and their associated tolerances shall be
placed in a table below the drawing.
When the configuration is other than described above, the detail specification shall state such
dimensional information as will adequately describe the capacitors.
1.4.2 Mounting
The detail specification shall give guidance on methods of mounting for normal use. Mounting
for test and measurement purposes (when required) shall be in accordance with 4.3 of this
sectional specification.
1.4.3 Rating and characteristics
The ratings and characteristics shall be in accordance with the relevant clauses of this
specification, together with the following.
1.4.3.1 Nominal capacitance range
See 2.2.4.1.
NOTE When products approved to the detail specification have different ranges, the following statement should
be added: “The range of capacitance values available in each voltage range is given in the register of approvals,
available for example on the website www.iecq.org.
1.4.3.2 Particular characteristics
Additional characteristics may be listed, when they are considered necessary to specify
adequately the component for design and application purposes.
1.4.3.3 Soldering
The detail specification shall prescribe the test methods, severity and requirements applicable
for the solderability and the resistance to soldering heat tests.

60384-21 © IEC:2011 – 9 –
1.4.4 Marking
The detail specification shall specify the content of the marking on the capacitor and on the

package. Deviations from 1.6 of this sectional specification shall be specifically stated.

1.5 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60384-1, as well as
the following apply.
1.5.1
surface mount capacitor
capacitor whose small dimensions and nature or shape of terminations make it suitable for
surface mounting in hybrid circuits and on printed boards
1.5.2
fixed capacitors, ceramic dielectric, Class 1
capacitor specially designed and suited for resonant circuit application where low losses and
high stability of capacitance are essential or where a precisely defined temperature coefficient
is required, for example for compensating temperature effects in the circuit
NOTE The ceramic dielectric is defined by its rated temperature coefficient (α).
1.5.3
subclass
for a given nominal temperature coefficient, the subclass is defined by the tolerance on the
temperature coefficient (see Table 2)
NOTE The nominal temperature coefficient value and its tolerance refer to the temperature interval of +20 °C to
+85 °C, but because in practice TC curves are not strictly linear, it is necessary to define limiting capacitance
deviation (∆C/C) for other temperatures (see Table 3).
1.5.4
category temperature range
range of ambient temperatures for which the capacitor has been designed to operate
continuously; this is given by the lower and upper category temperature
1.5.5
rated temperature
T
R
maximum ambient temperature at which the rated voltage may be continuously applied

1.5.6
rated d.c. voltage
U
R
maximum d.c. voltage which may be applied continuously to a capacitor at any temperature
between the lower category temperature and the rated temperature
NOTE Maximum d.c. voltage is the sum of the d.c. voltage and peak a.c. voltage or peak pulse voltage applied to
the capacitor.
1.5.7
category voltage
U
C
maximum voltage which may be applied continuously to a capacitor at its upper category
temperature
– 10 – 60384-21 © IEC:2011
1.6 Marking
See IEC 60384-1, 2.4, with the following details.

1.6.1 Information for marking
The information given in the marking is normally selected from the following list; the relative
importance of each item is indicated by its position in the list:

– nominal capacitance;
– rated voltage (d.c. voltage may be indicated by the symbol   or    );

– tolerance on nominal capacitance;
– temperature coefficient and its tolerance as applicable (according to 2.2.5);
– year and month (or week) of manufacture;
– manufacturer’s name or trade mark;
– climatic category;
– manufacturer’s type designation;
– reference to the detail specification.
1.6.2 Marking on the body
These capacitors are generally not marked on the body. If some markings can be applied,
they shall be clearly marked with as many as possible of the above items as is considered
useful. Any duplication of information in the marking on the capacitor should be avoided.
1.6.3 Requirements for marking
Any marking shall be legible and not easily smeared or removed by rubbing with the finger.
1.6.4 Marking of the packaging
The packaging containing the capacitor(s) shall be clearly marked with all the information
listed in 1.6.1.
1.6.5 Additional marking
Any additional marking shall be so applied that no confusion can arise.
2 Preferred ratings and characteristics

2.1 Preferred characteristics
The values given in the detail specification shall preferably be selected from the following.
2.1.1 Preferred climatic categories
The capacitors covered by this sectional specification are classified into climatic categories
according to the general rules given in IEC 60068-1.
The lower and upper category temperatures and the duration of the damp heat, steady state
test shall be chosen from the following:
– lower category temperature: −55 °C, −40 °C, −25 °C, −10 °C and +10 °C;
– upper category temperature: +70 °C, +85 °C, +100 °C, +125 °C and +150 °C;
– duration of the damp heat, steady state test (40 °C, 93 % RH): 4, 10, 21 and 56 days.

60384-21 © IEC:2011 – 11 –
The severity for the cold and dry heat tests are the lower and upper category temperatures

respectively.
NOTE The resistance to humidity resulting from the above climatic category is for the capacitors in their

unmounted state. The climatic performance of the capacitors after mounting is greatly influenced by the mounting
substrate, the mounting method (see 4.3) and the final coating.

2.2 Preferred values of ratings

2.2.1 Rated temperature (T )
R
For capacitors covered by this sectional specification, the rated temperature is equal to the
upper category temperature, unless the upper category temperature exceeds 125 °C.
2.2.2 Rated voltage (U )
R
The preferred values of the rated voltage are the values of the R5 series of ISO 3. If other
values are needed they shall be chosen from the R10 series.
The sum of the d.c. voltage and the peak a.c. voltage or the peak-to-peak a.c. voltage,
whichever is the greater, applied to the capacitor shall not exceed the rated voltage. The
value of the peak a.c. voltage shall not exceed the value determined by the permissible
reactive power.
2.2.3 Category voltage (U )
C
When the rated temperature is defined as the upper category temperature, the category
voltage is equal to the rated voltage as defined in IEC 60384-1, 2.2.5. If the upper category
temperature exceeds 125 °C, or the rated voltages exceed 500 V, the category voltage shall
be given in the detail specification.
2.2.4 Preferred values of nominal capacitance and associated tolerance values
2.2.4.1 Preferred values of nominal capacitance
Nominal capacitance values shall be taken from the series of IEC 60063; the E6, E12 and E24
series are preferred.
2.2.4.2 Preferred tolerance on nominal capacitance
See Table 1.
Table 1 – Preferred tolerance on nominal capacitance

Tolerance
Preferred
series
C ≥ 10 pF Letter code C < 10 pF Letter code
N N
E6 M G
±20 % ±2 pF
E12 ±10 % K ±1 pF F
E24 J D
±5 % ±0,5 pF
G C
±2 % ±0,25 pF
F B
±1 % ±0,1 pF
– 12 – 60384-21 © IEC:2011
α)
2.2.5 Temperature coefficient (

2.2.5.1 Nominal temperature coefficient and tolerance

Table 2 shows the preferred nominal temperature coefficients and the associated tolerances,
–6
expressed in parts per million per degree Kelvin (10 /K), and the corresponding subclasses
and codes.
The detail specification shall specify for each temperature coefficient the minimum value of
capacitance for which the given tolerance of temperature coefficient may be varified,

considering the accuracy of the method of capacitance measurement specified.

For values of capacitance lower than this minimum value:
a) the detail specification shall specify a multiplying factor for the tolerance on α, as well as
the permissible changes of capacitance at the lower and upper category temperature;
b) special meathods of measurement may be necessary and if required shall be tested in the
detail specification.
Table 2 – Nominal temperature coefficient and tolerance
Letter code for
Nominal temperature Tolerance on temperature
Subclass
−6 −6
coefficient (10 /K) coefficient (10 /K)
Tolerance
α
+100 ±30 1B A G
0 ±30 1B C G
−33 ±30 1B H G
−75 ±30 1B L G
−150 ±30 1B P G
−220 ±30 1B R G
−330 ±60 1B S H
−470 ±60 1B T H
−750 ±120 1B U J
−1 000 ±250 1F Q K
−1 500 ±250 1F V K
a
+140 ≥ α ≥ −1 000 1C SL −
NOTE 1 Preferred temperature coefficient values (α) are underlined.
NOTE 2 The nominal temperature coefficients and their tolerances are defined using the capacitance
change between the temperatures 20 °C and 85 °C.

−6
NOTE 3 A capacitor with a temperature coefficient 0 × 10 /K and a tolerance on temperature
−6
coefficient of ±30 × 10 /K is designated as a CG capacitor (subclass 1B).
a
This temperature coefficient value is not subject to inspection, since no limits for relative

capacitance variation are specified in Table 3.

NOTE See Annex B for the reference temperature of 25 °C as informative guide.
2.2.5.2 Permissible relative variation of capacitance
Table 3 shows for each combination of temperature coefficient and tolerance the permissible
relative variation of capacitance expressed in parts per thousand at both the upper and lower
category temperatures. Temperature coefficients and tolerances are expressed in parts per
–6
million per degree Kelvin (10 /K).

60384-21 © IEC:2011 – 13 –
Table 3 – Combination of temperature coefficient and tolerance

Permissible relative variation in capacitance in parts per 1 000 between 20 °C

and given temperature
Lower category temperature Upper category temperature

Tolerance
α
−6
−6
10 /K
10 /K −55 °C −40 °C −25 °C −10 °C +70 °C +85 °C +100 °C +125 °C

+100 ±30(G) −9,75/  −7,80/  −5,85/  −3,90/  3,50/  4,55/  5,60/  7,35/

−3,71 −2,96 −2,22 −1,48 6,50 8,45 10,4 13,7

0 ±30(G) −2,25/  −1,80/  −1,35/  −0,90/  −1,50/  −1,95/  −2,40/  −3,15/

5,45 4,36 3,27 2,18 1,50 1,95 2,40 3,15
−33 0,225/
±30(G) 0,180/ 0,135/ 0,090/ −3,15/ −4,10/ −5,04/ −6,62/
8,47 6,77 5,08 3,39 −0,15 −0,195 −0,240 −0,32
−75 3,38/  2,70/  2,03/  1,35/  −5,25/  −6,83/  −8,40/  −11,0/
±30(G)
12,3 9,85 7,39 4,92 −2,25 −2,93 −3,60 −4,73
−150 9,00/  7,20/  5,40/  3,60/  −9,00/  −11,7/  −14,4/  −18,9/
±30(G)
19,2 15,3 11,5 7,67 −6,0 −7,80 −9,60 −12,6
−220 14,3/  11,4/  8,55/  5,70/  −12,5/  −16,2/  −20,0/  −26,3/
±30(G)
25,6 20,46 15,3 10,2 −9,50 −12,4 −15,2 −20,0
−330 20,3/  16,2/  12,2/  8,10/  −19,5/  −25,4/  −31,2/  −41,0/
±60(H)
38,4 30,7 23,0 15,4 −13,5 −17,6 −21,6 −28,4
−470 30,8/  24,6/  18,5/  12,3/  −26,5/  −34,5/  −42,4/  −55,7/
±60(H)
51,2 41,0 30,7 20,5 −20,5 −26,7 −32,8 −43,1
−750 ±120(J) 47,3/  37,8/  28,4/  18,9/  −43,5/  −56,6/  −69,6/  −91,4/
82,3 65,8 49,4 32,9 −31,5 −41,0 −50,4 −66,2
−1 000 ±250(K) 56,3/  45,0/  33,8/  22,5/  −62,5/  −81,3/  −100/  −131/
117 93,7 70,2 46,8 −37,5 −48,8 −60,0 −78,8
−1 500 ±250(K) 93,8/  75,0/  56,3/  37,5/  −87,5/  −114/   −140/   −184/
163 130 97,7 65,1 −62,5 −81,3 −100 −131
When the upper category temperature is above 125 °C, the limits shall be given in the detail specification.
NOTE 1 Preferred temperature coefficient values (α) are underlined.
NOTE 2 The temperature coefficient limits at the temperature range from 20 °C to the upper category
temperature are calculated by the nominal temperature coefficients and their tolerances (see formula a) of
NOTE 3).
The temperature coefficient limits at the temperature range from 20 °C to –55 °C are calculated by using the
formula b) and c) of NOTE 3.
NOTE 3 The capacitance deviations at the lower category temperature are obtained by using following
formulas:
a) upper and lower permissible relative variation in capacitance under upper category temperature:
−3
ΔC/C (10 ) = (nominal temperature coefficient ± tolerance on temperature coefficient*) × (upper
category temperature − 20)/1 000
b) lower permissible relative variation in capacitance under lower category temperature:
−3
ΔC/C (10 ) = (nominal temperature coefficient + tolerance on temperature coefficient*) × (lower
category temperature − 20)/1 000
c) upper permissible relative variation in capacitance under lower category temperature:
−3
ΔC/C (10 ) = [(−36) − (1,22 × tolerance o
...