IEC 60384-2:2011

IEC 60384-2 ®
Edition 4.0 2011-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fixed capacitors for use in electronic equipment –
Part 2: Sectional specification – Fixed metallized polyethylene terephthalate film
dielectric d.c. capacitors
Condensateurs fixes utilisés dans les équipements électroniques –
Partie 2: Spécification intermédiaire – Condensateurs fixes pour courant continu
à diélectrique en film de téréphtalate de polyéthylène métallisé

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IEC 60384-2 ®
Edition 4.0 2011-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fixed capacitors for use in electronic equipment –
Part 2: Sectional specification – Fixed metallized polyethylene terephthalate film
dielectric d.c. capacitors
Condensateurs fixes utilisés dans les équipements électroniques –
Partie 2: Spécification intermédiaire – Condensateurs fixes pour courant continu
à diélectrique en film de téréphtalate de polyéthylène métallisé

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX U
ICS 31.060.30 ISBN 978-2-88912-828-0

– 2 – 60384-2  IEC:2011
CONTENTS
FOREWORD . 4
1 General . 6
1.1 Scope . 6
1.2 Object . 6
1.3 Normative references . 6
1.4 Information to be given in a detail specification . 6
1.5 Terms and definitions . 7
1.6 Marking . 8
2 Preferred ratings and characteristics . 9
2.1 Preferred characteristics . 9
2.2 Preferred values of ratings . 9
3 Quality assessment procedures . 10
3.1 Primary stage of manufacture . 10
3.2 Structurally similar components . 10
3.3 Certified records of released lots . 10
3.4 Qualification approval . 10
3.5 Quality conformance inspection . 17
4 Test and measurement procedures . 19
4.1 Visual examination and check of dimensions . 19
4.2 Electrical tests . 19
4.3 Robustness of terminations . 22
4.4 Resistance to soldering heat . 22
4.5 Solderability . 22
4.6 Rapid change of the temperature . 23
4.7 Vibration. 23
4.8 Bump . 23
4.9 Shock . 24
4.10 Climatic sequence . 24
4.11 Damp heat, steady state . 25
4.12 Endurance . 26
4.13 Charge and discharge . 26
4.14 Component solvent resistance . 27
4.15 Solvent resistance of the marking . 27
Bibliography . 28

Table 1 – Sampling plan together with numbers of permissible non-conformance for
qualification approval test . 12
Table 2 – Test schedule for qualification approval. 13
Table 3 – Lot-by-lot inspection . 18
Table 4 – Periodic inspection . 19
Table 5 – Test points and voltages . 19
Table 6 – Tangent of loss angle requirements . 20
Table 7 – Insulation resistance requirements . 21
Table 8 – Correction factors . 22
Table 9 – Preferred severities . 24

60384-2  IEC:2011 – 3 –
Table 10 – Test conditions . 26
Table 11 – Lead spacing . 27

– 4 – 60384-2  IEC:2011
INTERNATIONAL ELECTROTECHNICAL COMMISSION
_____________
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 2: Sectional specification – Fixed metallized polyethylene
terephthalate film dielectric d.c. capacitors

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
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2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
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5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
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services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
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Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60384-2 has been prepared by IEC technical committee 40:
Capacitors and resistors for electronic equipment.
This fourth edition cancels and replaces the third edition published in 2005 and contains the
following significant technical changes with respect to the previous edition.
– Table 1, Sampling plan together with numbers of permissible non-conformance for
qualification approval test, has been adjusted.
– Table 3, Lot-by-lot inspection, has been changed, highlighting assessment level EZ only.
– Table 4, Periodic inspection, has been changed, highlighting assessment level EZ only.
– The preferred values of rated voltages have been updated in conformance with the basic
series of preferred values R5 and R10 given in ISO 3.

60384-2  IEC:2011 – 5 –
The text of this standard is based on the following documents:
FDIS Report on voting
40/2129/FDIS 40/2142/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC directives, Part 2.
A list of all the parts of the IEC 60384 series, under the general title Fixed capacitors for use
in electronic equipment, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
– 6 – 60384-2  IEC:2011
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 2: Sectional specification – Fixed metallized polyethylene
terephthalate film dielectric d.c. capacitors

1 General
1.1 Scope
This part of IEC 60384 applies to fixed capacitors for direct current, with metallized electrodes
and polyethylene-terephthalate dielectric for use in electronic equipment.
These capacitors may have “self-healing properties” depending on conditions of use. They are
primarily intended for applications where the a.c. component is small with respect to the rated
voltage. Two performance grades of capacitors are covered, Grade 1 for long-life application
and Grade 2 for general application.
Capacitors for electromagnetic interference suppression and surface mount fixed metallized
polyethylene-terephthalate film dielectric d.c. capacitors are not included, but are covered by
IEC 60384-14 and IEC 60384-19 respectively.
1.2 Object
The object of this standard is to prescribe preferred ratings and characteristics and to select
from IEC 60384-1 the appropriate quality assessment procedures, tests and measuring
methods, and to give general performance requirements for this type of capacitor. Test
severities and requirements prescribed in detail specifications referring to this sectional
specification should be of equal or higher performance level, because lower performance
levels are not permitted.
1.3 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60063:1963, Preferred number series for resistors and capacitors
Amendment 1 (1967)
Amendment 2 (1977)
IEC 60384-1:2008, Fixed capacitors for use in electronic equipment – Part 1: General
specification
IEC 61193-2:2007, Quality assessment systems – Part 2: Selection and use of sampling
plans for inspection of electronic components and packages
ISO 3:1973, Preferred numbers – Series of preferred numbers
1.4 Information to be given in a detail specification
Detail specifications shall be derived from the relevant blank detail specification.
Detail specifications shall not specify requirements inferior to those of the generic, sectional
or blank detail specification. When more severe requirements are included, they shall be

60384-2  IEC:2011 – 7 –
listed in 1.9 of the detail specification and indicated in the test schedules, for example by an
asterisk.
NOTE The information given in 1.4.1 may, for convenience, be presented in tabular form.
The following information shall be given in each detail specification and the values quoted
shall preferably be selected from those given in the appropriate clause of this sectional
specification.
1.4.1 Outline drawing and dimensions
These shall be an illustration of the capacitor as an aid to easy recognition and for
comparison of the capacitor with others. Dimensions and their associated tolerances, which
affect interchangeability and mounting, shall be given in the detail specification. All
dimensions shall preferably be stated in millimetres.
Normally, the numerical values shall be given for the length of the body, the width and height
of the body and the wire spacing, or for cylindrical types, the body diameter, and the length
and diameter of the terminations. When necessary, for example, when a number of items
(capacitance values/voltage ranges) are covered by a detail specification, the dimensions and
their associated tolerances shall be placed in a table below the drawing.
When the configuration is other than described above, the detail specification shall state such
dimensional information as will adequately describe the capacitor. When the capacitor is not
designed for use on printed boards, this shall be clearly stated in the detail specification.
1.4.2 Mounting
The detail specification shall specify the method of mounting to be applied for normal use and
for the application of the vibration and the bump or shock tests. The capacitors shall be
mounted by their normal means. The design of the capacitor may be such that special
mounting fixtures are required in its use. In this case, the detail specification shall describe
the mounting fixtures and they shall be used in the application of the vibration and bump or
shock tests.
1.4.3 Rating and characteristics
The ratings and characteristics shall be in accordance with the relevant clauses of this
specification, together with the following.
1.4.3.1 Particular characteristics
Additional characteristics may be listed, when they are considered necessary to specify
adequately the component for design and application purposes.
1.4.3.2 Soldering
The detail specification shall prescribe the test methods, severities and requirements
applicable for the solderability and the resistance to solder heat test.
1.4.4 Marking
The detail specification shall specify the content of the marking on the capacitor and on the
package. Deviations from 1.6 of this sectional specification shall be specifically stated.
1.5 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60384-1 and the
following apply.
– 8 – 60384-2  IEC:2011
1.5.1
performance grade 1 capacitors (long-life)
capacitors for long-life applications with stringent requirements for the electrical parameters
1.5.2
performance grade 2 capacitors (general purpose)
capacitors for general application where the stringent requirements for Grade 1 capacitors are
not necessary
1.5.3
rated voltage
U
R
maximum d.c. voltage which may be applied continuously to a capacitor at the rated
temperature
NOTE The sum of the d.c. voltage and the peak a.c. voltage applied to the capacitor must not exceed the rated
voltage. The value of the peak a.c. voltage must not exceed the following percentages of the rated voltage at the
frequencies stated and must be not greater than 280 V:
50 Hz: 20 %
100 Hz: 15 %
1 000 Hz: 3 %
10 000 Hz: 1 %
unless otherwise specified in the detail specification.
1.6 Marking
See IEC 60384-1, 2.4 with the following details.
1.6.1 General
The information given in the marking is normally selected from the following list; the relative
importance of each item is indicated by its position in the list:
– nominal capacitance;
– rated voltage (d.c. voltage may be indicated by the symbol      or     );
– tolerance on nominal capacitance;
– category voltage;
– year and month (or week) of manufacture;
– manufacturer’s name or trade mark;
– climatic category;
– manufacturer’s type designation;
– reference to the detail specification.
1.6.2 Marking of capacitors
The capacitor shall be clearly marked with a), b) and c) above and with as many as possible
of the remaining items as is considered necessary. Any duplication of information in the
marking on the capacitor should be avoided.
1.6.3 Marking of packaging
The package containing the capacitors shall be clearly marked with all the information listed
in 1.6.1.
60384-2  IEC:2011 – 9 –
1.6.4 Additional marking
Any additional marking shall be so applied that no confusion can arise.
2 Preferred ratings and characteristics
2.1 Preferred characteristics
The values given in detail specifications shall preferably be selected from the following:
2.1.1 Preferred climatic categories
The capacitors covered by this specification are classified into climatic categories according
to the general rules given in IEC 60384-1.
The lower and upper category temperatures and the duration of the damp heat, steady-state
test shall be chosen from the following.
Lower category temperature: –55 °C, –40 °C and –25 °C
Upper category temperature: +85 °C, +100 °C, 105 °C and +125 °C
Duration of the damp heat, steady-state test: 4, 10, 21 and 56 days.
NOTE With continuous operation at 125 °C in excess of the endurance test time, accelerated ageing has to be
considered (see detail specification).
The severities for the cold and dry heat tests are the lower and upper category temperatures
respectively.
2.2 Preferred values of ratings
2.2.1 Nominal capacitance (C )
N
Preferred values of nominal capacitance are: 1; 1,5; 2,2; 3,3; 4,7 and 6,8 and their decimal
multiples.
These values conform to the E6 series of preferred values given in IEC 60063.
2.2.2 Tolerance on nominal capacitance
The preferred tolerances on the nominal capacitance are ±5 %, ±10 % and ±20 %.
2.2.3 Rated voltage (U )
R
The preferred values of rated voltages are: 40 V – 50 V – 63 V – 100 V – 160 V – 200 V –
250 V – 400 V – 630 V – 1 000 V – 1 600 V. These values conform to the basic series of
preferred values R5 and R10 given in ISO 3.
2.2.4 Category voltage (U )
C
The category voltage is equal to the rated voltage for T ≤ 85 °C.
For upper category temperature of 100 °C, the voltage is 0,8 U .
R
For upper category temperature of 105 °C, the voltage is 0,75 U .
R
For upper category temperature of 125 °C, the voltage is 0,5 U .
R
– 10 – 60384-2  IEC:2011
2.2.5 Rated temperature
The standard value of rated temperature is 85 °C.
3 Quality assessment procedures
3.1 Primary stage of manufacture
The primary stage of manufacture is the winding of the capacitor element or the equivalent
operation.
3.2 Structurally similar components
Capacitors considered as being structurally similar are capacitors produced with similar
processes and materials, though they may be of different case sizes and values.
3.3 Certified records of released lots
The information required in Clause Q.9 of IEC 60384-1 shall be made available when
prescribed in the detail specification and when requested by a purchaser. After the endurance
test, the parameters for which information on variables is required are the capacitance change,
tan δ and insulation resistance.
3.4 Qualification approval
The procedure for qualification approval testing is given in Clause Q.5 of the generic
specification IEC 60384-1.
The schedule to be used for qualification approval testing on the basis of lot-by-lot and
periodic tests is given in Clause Q.5 of the same specification. The procedure using a fixed
sample size schedule is given in 3.4.1 and 3.4.2 below.
3.4.1 Qualification approval on the basis of the fixed sample size procedures
The fixed sample size procedure is described in item b) of Q.5.3 IEC 60384-1. The sample
shall be representative of the range of capacitors for which approval is sought. This may or
may not be the complete range covered by the detail specification.
The samples shall consist of specimens having the lowest and highest voltages, and for these
voltages the lowest and highest capacitances. When there are more than four rated voltages,
an intermediate voltage shall also be tested. Thus, for the approval of a range, testing is
required of either four or six values (capacitance/voltage combinations). When the range
consists of less than four values, the number of specimens to be tested shall be that required
for four values.
Spare specimens are permitted two or three per value which may be used as replacements for
specimens which are non-conforming because of incidents not attributable to the
manufacturer.
The numbers given in Group 0 assume that all groups are applicable. If this is not so, the
numbers may be reduced accordingly.
When additional groups are introduced into the qualification approval test schedule, the
number of specimens required for Group 0 shall be increased by a same number as that
required for the additional group.
Table 1 gives the number of samples to be tested in each group or subgroup together with the
permissible number of non-conforming items for qualification approval tests.

60384-2  IEC:2011 – 11 –
3.4.2 Tests
The complete series of tests specified in Table 1 and Table 2 are required for the approval of
capacitors covered by one detail specification. The tests of each group shall be carried out in
the order given.
The whole sample shall be subjected to the tests of Group 0 and then divided for the other
groups.
Specimens found non-conforming during the tests of Group 0 shall not be used for the other
groups.
“One non-conforming” is counted when a capacitor has not satisfied the whole or a part of the
tests of a group.
The approval is granted when the number of non-conforming does not exceed the specified
number of permissible non-conforming for each group or subgroup and the total number of
permissible non-conforming.
NOTE Table 1 and Table 2 together form the fixed sample size test schedule, for which Table 1 includes the
details for the sampling and permissible non-conforming for the different tests or groups of tests, whereas Table 2
together with the detail of test contained in Clause 4 gives a complete summary of test conditions and performance
requirements and indicates where for example for the test method or conditions of test, a choice has to be made in
the detail specification.
The conditions of the test and performance requirements for the fixed sample size test
schedule shall be identical to those prescribed in the detail specification for quality
conformance inspection.
– 12 – 60384-2  IEC:2011
Table 1 – Sampling plan together with numbers of permissible
non-conformance for qualification approval test
Number of
permissible
Subclause of
Group Number of
Test this non-
number specimens (n)
publication conformance
b
(c)
0 Visual examination 4.1
Dimensions 4.1
Capacitance 4.2.2
Tangent of loss angle 4.2.3 120 0
Voltage proof 4.2.1
Insulation resistance 4.2.4
Spare specimen 12 0
1A Robustness of terminations 4.3
Resistance to soldering heat 4.4
12 0
Component solvent resistance 4.14
1B Solderability 4.5
Solvent resistance of the marking 4.15
Rapid change of temperature 4.6 24 0
Vibration 4.7
a
Bump or shock 4.8 or 4.9
1 Climatic sequence 4.10 36 0
2 Damp heat, steady state 4.11 24 0
3 Endurance 4.12 36 0
4 Charge and discharge 4.13 24 0
a
As required in the detail specification.
b
Not more than one non-conformity is permitted from any one value.

60384-2  IEC:2011 – 13 –
Table 2 – Test schedule for qualification approval
Subclause number D Conditions of test Number of Performance
a
and test or specimens (n) requirements
ND and number
b
of
permissible
non-
conformances
(c)
Group 0 ND See Table 1
4.1 Visual examination  As in 4.1

Legible marking and as
specified in the detail
specification
4.1 Dimensions (detail)  See detail specification
4.2.2 Capacitance Frequency 1 kHz Within specified tolerance
4.2.3 Tangent of loss
angle (tan δ)
4.2.1 Voltage proof See detail specification for the As in 4.2.3.2
method
4.2.4 Insulation See detail specification for the As in 4.2.4.2
resistance method
Group 1A D See Table 1
4.3.1 Initial Capacitance
measurements
Tangent of loss angle:
For C > 1 µF: at 1 kHz
N
C ≤ 1 µF: at 10 kHz
N
4.3 Robustness of Visual examination No visual damage
terminations
4.4 Resistance to No pre-drying
soldering heat See detail specification for the
method (1A or 1B)
4.14 Component Solvent:… See detail specification
solvent resistance Solvent temperature:…
(if applicable) Method 2
Recovery time:…
4.4.2 Final Visual examination No visible damage
measurements Legible marking
Capacitance
|∆C/C| ≦2 % of value
measured in 4.3.1
Tangent of loss angle
Increase of tan δ
≤0,003 C ≤ 1 µF Grade 1
N
≤0,002 C > 1 µF Grade 1
N
≤0,005 C ≤ 1 µF Grade 2
N
≤0,003 C > 1 µF Grade 2
N
Compared to values
measured in 4.3.1
– 14 – 60384-2  IEC:2011
Table 2 (continued)
Subclause number D Conditions of test Number of Performance
a
and test or specimens (n) requirements
ND and number
b
of
permissible
non-
conformances
(c)
Group 1B D See Table 1
4.5 Solderability Without ageing Good tinning as evidenced
See detail specification for the by free flowing of the
method solder with wetting of the
terminations or solder
shall flow within…s, as
applicable
4.15 Solvent resistance Solvent:… See detail specification
of the marking Solvent temperature:…
(if applicable) Method 2
Recovery
4.6.1 Initial Capacitance
measurement
Tangent of loss angle:
For C > 1 µF: at 1 kHz
N
C ≤ 1 µF: at 10 kHz
N
T = Lower category temperature
4.6 Rapid change of
A
temperature
T = Upper category temperature
B
Five cycles
Duration t = 30 min
4.7 Vibration Visual examination No visible damage
For mounting method see detail
specification
Frequency range: from … Hz to
…Hz
Amplitude: 0,75 mm or
acceleration 100 m/s :
…(whichever is the less severe)
Total duration: 6 h
4.7.2 Final inspection Visual examination No visible damage
4.8 Bump (or shock, For mounting method see detail
see 4.9) specification
Number of bumps: …
Acceleration: … m/s
Duration of pulse: … ms
4.9 Shock (or bump, For mounting method see detail
see 4.8) specification
Number of bumps: …
Acceleration: … m/s
Duration of pulse: … ms
4.8.3 or 4.9.3  Visual examination No visible damage
Final
Capacitance |∆C/C| ≤ 5 % of value
measurements
measurement in 4.3.1
60384-2  IEC:2011 – 15 –
Table 2 (continued)
Subclause number D Conditions of test Number of Performance requirements
a
and test or specimens (n)
ND and number
b
of
permissible
non-
conformances
(c)
D Tangent of loss angle See Table 1
Increase of tan δ
≤0,003 C ≤ 1 µF Grade 1
N
≤0,002 C > 1 µF Grade 1
N
≤0,005 C ≤ 1 µF Grade 2
N
≤0,003 C > 1 µF Grade 2
N
Compared to values
measured in 4.6.1
Insulation resistance
≥50 % of values in 4.2.4.2
Group 1 D See Table 1
4.10 Climatic sequence
4.10.2 Dry heat Temperature: Upper category
temperature
Duration: 16 h
4.10.3 Damp heat,
cyclic, Test Db,
first cycle
4.10.4 Cold Temperature: lower category
temperature
Duration: 2 h
4.10.5 Low air pressure Air pressure: 8 kPa
(if required by
the detail
specification)
4.10.5.2 Final Visual examination No permanent breakdown
inspection flashover or harmful
deformation of the case
4.10.6 Damp heat,
cyclic, Test Db,
remaining
cycles
4.10.6.2 Final Visual examination No visible damage
measurement
Capacitance |∆C/C| ≤ 5 % of value
measured in 4.4.2, 4.8.3,
4.9.3 as applicable 2
Tangent of loss angle
Increase of tan δ
≤0,003 C ≤ 1 µF Grade 1
N
≤0,002 C > 1 µF Grade 1
N
≤0,005 C ≤ 1 µF Grade 2
N
≤0,003 C > 1 µF Grade
N
Compared to values
measured in 4.3.1 or 4.6.1
as applicable
Insulation resistance
≥50 % of values in 4.2.4.2
– 16 – 60384-2  IEC:2011
Table 2 (continued)
Subclause number D Conditions of test Number of Performance
a
and test or specimens (n) requirements
ND and number
b
of
permissible
non-
conformances
(c)
Group 2 D See Table 1
4.11 Damp heat,
steady state
4.11.1 Initial Capacitance
measurements
Tangent of loss angle at 1 kHz
4.10.6.2 Final Visual examination No visible damage
measurement Legible marking
Capacitance |∆C/C| ≤ 5 % of value
measurement in 4.11.1
Tangent of loss angle
Increase of tan δ
≤0,005 compared to values
measured in 4.11.1
Insulation resistance
≥50 % of values in 4.2.4.2
Group 3 D See Table 1
4.12 Endurance Duration:
Grade 1: 2 000 h
Grade 2: 1 000 h
4.12.1 Initial Capacitance
measurements
Tangent of loss angle:
For C > 1 µF: at 1 kHz
N
C ≤1 µF: at 10 kHz
N
4.12.3 Final Visual examination No visible damage
measurement Legible marking
|∆C/C| ≤ 5 % for Grade 1
Capacitance
≤8 % for Grade 2 of values
measured in 4.12.1
Tangent of loss angle
Increase of tan δ
≤0,003 C ≤1 µF Grade 1
N
≤0,002 C >1 µF Grade 1
N
≤0,005 C ≤1 µF Grade 2
N
≤0,003 C >1 µF Grade 2
N
Compared to values
measured in 4.12.1
Insulation resistance
≥50 % of values in 4.2.4.2
60384-2  IEC:2011 – 17 –
Table 2 (continued)
Subclause number D Conditions of test Number of Performance
a
and test or specimens (n) requirements
ND and number
b
of
permissible
non-
conformances
(c)
Group 4 D See Table 1
4.13 Charge and
discharge
4.13.1 Initial Capacitance
measurement
Tangent of loss angle
For C >1 µF: at 1 kHz
N
C ≤1 µF: at 10 kHz
N
Duration of charge: … s
Duration of discharge: … s
4.13.3 Final Capacitance
|∆C/C| ≤3 % for Grade 1
measurement
and ≤5 % for Grade 2 of
values measured in 4.13.1
Tangent of loss angle
Increase of tan δ
≤0,003 C ≤ 1 µF Grade 1
N
≤0,002 C > 1 µF Grade 1
N
≤0,005 C ≤ 1 µF Grade 2
N
≤0,003 C > 1 µF Grade 2
N
compared to values
measured in 4.13.1
Insulation resistance
≥50 % of values in 4.2.4.2
a
Subclause numbers of test and performance requirements refer to Clause 4 – Test and measurement
procedures.
b
In this table: D = destructive, ND = non-destructive.

3.5 Quality conformance inspection
3.5.1 Formation of inspection lots
a) Groups A and B inspection
These tests shall be carried out on a lot-by-lot basis.
A manufacturer may aggregate the current production into inspection lots subject to the
following safeguards.
1) The inspection lot shall consist of structurally similar capacitors (see 3.2).
2a) The sample tested shall be representative of the values and dimensions contained in
the inspection lot:
– in relation to their number;
– with a minimum of five of any one value.
2b) If there are less than five of any one value in the sample, the basis for the drawing of
samples shall be agreed between the manufacturer and the Certification Body (CB).
b) Group C inspection
These tests shall be carried out on a periodic basis.
Samples shall be representative of the current production of the specified periods and
shall be divided into high, medium and low voltage ratings. In order to cover the range of
approvals in any period, one case size shall be tested from each voltage group. In

– 18 – 60384-2  IEC:2011
subsequent periods other case sizes and/or voltage ratings in production shall be tested
with the aim of covering the whole range.
3.5.2 Test schedule
The schedule for the lot-by-lot and periodic tests for quality conformance inspection is given
in the blank detail specification.
3.5.3 Delayed delivery
When, according to the procedures in Clause Q.10 of IEC 60384-1, re-inspection has to be
made, solderability and capacitance shall be checked as specified in Groups A and B
inspection.
3.5.4 Assessment levels
The assessment level(s) given in the blank detail specification shall preferably be selected
from the following Tables 3 and 4:
Table 3 – Lot-by-lot inspection
c
Inspection subgroup EZ
n c
IL
a
A0
100 %
b
A1
S-3 0
b
A2
S-3 0
b
B1
S-3 0
IL = inspection level;
n = sample size;
c = permissible number of non-conforming items.
a
This inspection shall be performed after removal of nonconforming items by 100 % testing during the
manufacturing process. Whether the lot was accepted or not, all of samples for sampling inspection shall be
inspected in order to monitor outgoing quality level by nonconforming items per million (×10 ). The
sampling level shall be established by the manufacturer, preferably according to IEC 61193-2, Annex A.
In case one or more nonconforming items occur in a sample, this lot shall be rejected but all nonconforming
items shall be counted for the calculation of quality level values.
If applicable, outgoing quality level by nonconforming items per million (×10 ) values shall be calculated by
accumulating inspection data according to the method given in IEC 61193-2, 6.2.
b
Number to be tested: Sample size as directly allotted to the code letter for IL in IEC 60410 ,Table IIA, or
shall be determined according to IEC 61193-2, 4.3.2.
c
The content of the inspection subgroups is described in Clause 2 of the relevant blank detail specification.

60384-2  IEC:2011 – 19 –
Table 4 – Periodic inspection
a
Inspection subgroup EZ
p n c
C1A 6 5 0
C1B 6 5 0
C1 6 10 0
C2 6 10 0
C3 6 10 0
C4 6 10 0
p = periodicity in months;
n = sample size;
c = permissible number of non-conforming items.
a
The content of the inspection subgroups is described in Clause 2 of the relevant blank detail specification.

4 Test and measurement procedures
4.1 Visual examination and check of dimensions
See IEC 60384-1, 4.4.
4.2 Electrical tests
4.2.1 Voltage proof
See IEC 60384-1, 4.6 with the following details:
4.2.1.1 Test circuit
Delete the capacitor C .
The product of R and the nominal capacitance (C ) of capacitor C under test shall be smaller
1 N x
than or equal to 1 s and greater than 0,01 s.
R includes the internal resistance of the power supply.
R shall limit the discharge current to a value equal to or less than 1 A.
4.2.1.2 Test conditions
The following voltages (see Table 5) shall be applied between the measuring points of Table 3
in IEC 60384-1, 4.5.6 for a period of 1 min for qualification approval testing and for a period of
1 s for the lot-by-lot quality conformance testing.
Table 5 – Test points and voltages
Test point Test voltage
1 a) Grade 1: 1,6 U
R
Grade 2: 1,4 U
R
1 b), 1 c) 2 U with a minimum of 200 V
R
NOTE The occurrence of self-healing breakdowns during the application of the test voltages is allowed.

– 20 – 60384-2  IEC:2011
4.2.2 Capacitance
See IEC 60384-1, 4.7 with the following details.
4.2.2.1 Measuring conditions
The capacitance shall be measured at, or corrected to, a frequency of 1 000 Hz.
For nominal capacitance, values >10 µF, 50 Hz to 120 Hz may be used.
The applied peak voltage at 1 000 Hz shall not exceed 3 % of the rated voltage, and the
applied peak voltage at 50 Hz to 120 Hz shall not exceed 20 % of the rated voltage with a
maximum of 100 V (70 V r.m.s.).
4.2.2.2 Requirements
The capacitance shall be within the specified tolerance.
4.2.3 Tangent of loss angle (tan δ)
See IEC 60384-1, 4.8 with the following details:
4.2.3.1 Measuring conditions for measurements at 1 000 Hz
Tangent of loss angle shall be measured as follows:
– frequency: 1 000 Hz
– peak voltage: ≤3 % of the rated voltage
–4
– inaccuracy: ≤10 × 10 (absolute value)
4.2.3.2 Requirement for measurements at 1 000 Hz
Tangent of loss angle shall not exceed the applicable values shown in Table 6.
Table 6 – Tangent of loss angle requirements
Nominal capacitance
Tan δ (absolute value)
Grade 1 capacitors Grade 2 capacitors
≤1 µF 0,008 0,01
0,01 0,01
>1 µF
4.2.3.3 Measuring conditions for measurements at 10 kHz
For capacitors with C ≤ 1µF, tan δ shall be measured as follows:
N
– frequency: 10 kHz
– voltage: ≤1 V r.m.s.
–4
– inaccuracy: ≤10 × 10 (absolute value).
4.2.4 Insulation resistance
See IEC 60384-1, 4.5 with the following details:

60384-2  IEC:2011 – 21 –
4.2.4.1 Preconditioning
Before measurement, the capacitor shall be fully discharged. The product of the resistance of
the discharge cir
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