IEC 60749-11:2002/COR2:2003
(Corrigendum)Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
Modification of the validity date: now put at 2007.
Corrigendum 2 - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 11: Variations rapides de température - Méthode des deux bains
Modification de la date de validité : fixée maintenant à 2007.
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Standards Content (Sample)
CEI 60749-11 IEC 60749-11
(Première édition – 2002) (First edition – 2002)
DISPOSITIFS À SEMICONDUCTEURS – SEMICONDUCTOR DEVICES –
MÉTHODES D'ESSAIS MÉCANIQUES MECHANICAL AND CLIMATIC TEST METHODS –
ET CLIMATIQUES –
Partie 11: Variations rapides de température – Part 11: Rapid change of temperature –
Méthode des deux bains Two-fluid-bath method
CORRIGENDUM 2
Page 2 Page 3
Au lieu de: Instead of:
Le comité a décidé que le cont
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