CISPR 16-1-6:2014/AMD1:2017

CISPR 16-1-6 ®
Edition 1.0 2017-01
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
INTERNATIONAL SPECIAL COMMITTEE ON RADIO INTERFERENCE

COMITÉ INTERNATIONAL SPÉCIAL DES PERTURBATIONS RADIOÉLECTRIQUES

BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
AMENDMENT 1
AMENDEMENT 1
Specification for radio disturbance and immunity measuring apparatus and
methods –
Part 1-6: Radio disturbance and immunity measuring apparatus – EMC antenna
calibration
Spécifications des méthodes et des appareils de mesure des perturbations
radioélectriques et de l'immunité aux perturbations radioélectriques –
Partie 1-6: Appareils de mesure des perturbations radioélectriques et de
l'immunité aux perturbations radioélectriques – Étalonnage des antennes CEM

CISPR 16-1-6:2014-12/AMD1:2017-01(en-fr)

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CISPR 16-1-6 ®
Edition 1.0 2017-01
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
INTERNATIONAL SPECIAL COMMITTEE ON RADIO INTERFERENCE

COMITÉ INTERNATIONAL SPÉCIAL DES PERTURBATIONS RADIOÉLECTRIQUES

BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM

AMENDMENT 1
AMENDEMENT 1
Specification for radio disturbance and immunity measuring apparatus and

methods –
Part 1-6: Radio disturbance and immunity measuring apparatus – EMC antenna

calibration
Spécifications des méthodes et des appareils de mesure des perturbations

radioélectriques et de l'immunité aux perturbations radioélectriques –

Partie 1-6: Appareils de mesure des perturbations radioélectriques et de

l'immunité aux perturbations radioélectriques – Étalonnage des antennes CEM

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.100.10; 33.100.20 ISBN 978-2-8322-3786-1

– 2 – CISPR 16-1-6:2014/AMD1:2017
© IEC 2017
FOREWORD
This amendment has been prepared by CISPR subcommittee A: Radio-interference
measurements and statistical methods, of IEC technical committee CISPR: International
special committee on radio interference.
The text of this amendment is based on the following documents:
FDIS Report on voting
CISPR/A/1195/FDIS CISPR/A/1204/RVD

Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the stability date indicated on the IEC website under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
_____________
6.3.4 Radiation patterns of an antenna
Add, after the last paragraph of this subclause, the following new paragraph:
Annex I introduces a method for antenna pattern measurement in the frequency range above
1 GHz.
Add, after the existing Annex H, the following new Annex I:

© IEC 2017
Annex I
(normative)
Antenna pattern measurement method in the frequency
range above 1 GHz, with measurement uncertainty budget
I.1 General
All measurement methods in the CISPR 16 series need an estimation of the measurement
uncertainty. A common approach is to list all contributions and to determine the influence of
each one. This works very well if the uncertainty contributions are independent from the EUT
itself. In case of antenna pattern measurements above 1 GHz uncertainty contributions are
NOT independent from the EUT.
The major uncertainty contributions are:
a) reflections inside the antenna chamber;
b) reflections from the transmit antenna mast and the receive antenna mast;
c) positioning uncertainty of the turntable leading to azimuth drift;
d) alignment of the antennas;
e) reflections between antennas.
All of these contributions are dependent on the antenna pattern to be measured as follows:
1) The nature of the pattern of omnidirectional antennas will lead to stronger reflections from
objects around the antenna and from all surfaces of the anechoic chamber.
2) Coupling with the antenna mast is more significant if omnidirectional antennas or
directional antennas with a strong back lobe are measured.
3) Uncertainty of the turntable positioning can be seen if directional antennas with a high-
gradient antenna pattern are measured.
4) Alignment is more critical if directive antennas are measured.
5) Unwanted coupling between measurement antennas exists if the dimensions of the
antennas are electrically large.
To account for these effects on uncertainty this measurement method includes a statistical
estimation of the measurement uncertainty. The following subclauses describe the set-up and
test method. Because a combined method is used, the problem of separately performing site
validation and antenna mast validation is solved. It is easy for calibration labs to implement,
and the effort is reasonable because the procedure is applied for the following cases:
a) for a new and/or modified chamber and/or turntable;
b) if the receive antenna model is changed;
c) for each manufacturer and model of AUC.
This method is similar to the method given in 5.3.3 of CISPR 16-1-5:2014.
I.2 Test set-up
In a typical test set-up, the receive or transmit antenna under test is mounted in front of a
vertical mast placed on a turntable. A change between the E-plane and the H-plane is easily
done by rotating the antenna by 90°.

– 4 – CISPR 16-1-6:2014/AMD1:2017
© IEC 2017
For the purposes of these tests, two principal categories of positioning systems are defined
based on known methods of performing spherical antenna pattern tests. These are the
distributed-axis system and the combined-axis system.
Combined-axis systems mount the Φ-axis positioner on the θ-axis, as shown in Figure I.1 a),
to rotate the AUC around two axes, while the distributed axis systems move the measurement
antenna about the AUC on the Φ-axis positioner, as shown in Figure I.1 b). With the combined
axis system the height is not critical but half the chamber height is recommended. With the
distributed axis system the radius of the ring is determined by using the maximum size of the
AUC and calculating the far-field criteria.
Measurement
AUC
antenna Measurement
antenna
Φ
rotational axis    θ
AUC rotational axis
Antenna
Φ
mast
rotational axis
Turntable
IEC
IEC
a) Combined axis system b) Distributed axis system
Figure I.1 – Typical set-up for antenna pattern measurement
Two distances are defined as follows:

d is the distance between the centre of the turntable and the reference point of the
measurement antenna; a distance of 3 m or longer is recommended (see Figure
I.2);
Measurement
AUC
antenna
d
Measurement
antenna
Antenna
AUC
mast
Turntable
IEC
IEC
a) Combined axis system b) Distributed axis system
Figure I.2 − Definition of d
θ
rotational axis
d
© IEC 2017
d is the distance between the antenna mast and the reference point of the AUC (see
Figure I.3); because only the antenna can be moved, and not the positioner.
Adjustment of d is possible using for example different length adaptors.
d
Measurement
antenna
Measurement
AUC
antenna
AUC
Adjustable
Adjustable
length
height
Antenna
mast
Turntable
IEC IEC
a) Combined axis system b) Distributed axis system
Figure I.3 − Definition of d
The AUC is the antenna mounted on the rotational positioner of the combined axis system
and on the rotating pedestal for the distributed axis system. Only one of either system needs
to be used.
For an element type antenna, see 7.5.2.1.
I.3 Test method
The test method is based on changing the phase condition of direct and reflected waves,
similar to S (see CISPR 16-1-4).
VSWR
The antenna pattern is measured a total of 12 times while the distances d and d are varied
1 2
as follows.
a) Influence of the antenna mast – with d held constant, d is increased in the following
1 2
steps (see Figure I.4):
1) d + 0,0 cm,
2) d + 0,3 cm,
3) d + 3,0 cm,
4) d + 6,0 cm,
5) d + 7,5 cm,
+ 9,0 cm.
6) d
The spacing between d positions above is unequal, i.e. similar to S . The physical
2 VSWR
lower limit is defined by the lowest frequency used, at least λ/4.
NOTE The reference point and phase centre in this case mean the same thing. The phase centre can change
as a function of frequency and has to be known for the applica
...