IEC 60444-8:2003

INTERNATIONAL IEC
STANDARD
60444-8
First edition
2003-07
Measurement of quartz crystal
unit parameters –
Part 8:
Test fixture for surface mounted
quartz crystal units
Mesure des paramètres des résonateurs à quartz –
Partie 8:
Dispositif d'essai pour les résonateurs à quartz
montés en surface
Reference number
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INTERNATIONAL IEC
STANDARD
60444-8
First edition
2003-07
Measurement of quartz crystal
unit parameters –
Part 8:
Test fixture for surface mounted
quartz crystal units
Mesure des paramètres des résonateurs à quartz –
Partie 8:
Dispositif d'essai pour les résonateurs à quartz
montés en surface
 IEC 2003  Copyright - all rights reserved
No part of this publication may be reproduced or utilized in any form or by any means, electronic or
mechanical, including photocopying and microfilm, without permission in writing from the publisher.
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmail@iec.ch  Web: www.iec.ch
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Commission Electrotechnique Internationale
L
International Electrotechnical Commission
Международная Электротехническая Комиссия
For price, see current catalogue

– 2 – 60444-8  IEC:2003(E)
CONTENTS
FOREWORD . 3
INTRODUCTION .5
1 Scope . 6
2 Normative references. 6
3 General issue. 6
4 Leadless surface mounted quartz crystal units. 7
4.1 Enclosure . 7
4.2 Overtone and frequency range . 7
5 Specifications of measurement method, test fixture . 7
5.1 Specifications of measurement method . 7
5.2 Specifications of test fixture . 7
6 Calibration of measurement system and C adapter board.10
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6.1 Calibration of measurement system.10
6.2 Calibration of C adapter board .10
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Bibliography .11
Figure 1 – Equivalent circuit of the test fixture. 8
Figure 2 – Equivalent circuit of the test fixture with load capacitance. 8
Figure 3 – Three-dimensional projection for the test fixture . 8
Figure 4 – Design of the test fixture . 9
Figure 5 – Structure of the test fixture.10

60444-8  IEC:2003(E) – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS –
Part 8: Test fixture for surface mounted quartz crystal units
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
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technical committees; any IEC National Committee interested in the subject dealt with may participate in this
preparatory work. International, governmental and non-governmental organizations liaising with the IEC also
participate in this preparation. IEC collaborates closely with the International Organization for Standardization
(ISO) in accordance with conditions determined by agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
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3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
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4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
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between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
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5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60444-8 has been prepared by IEC technical committee 49:
Piezoelectric and dielectric devices for frequency control and selection.
This International Standard cancels and replaces IEC/PAS 62277 published in 2001, of which it
constitutes a technical revision.
The text of this standard is based on the following documents:
FDIS Report on voting
49/599/FDIS 49/611/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

– 4 – 60444-8  IEC:2003(E)
This standard forms Part 8 of a series of publications dealing with measurements of quartz
crystal unit parameters.
IEC 60444 consists of the following parts under the general title Measurement of quartz crystal
unit parameters:
Part 1: Basic method for the measurement of resonance frequency and resonance resistance
of quartz crystal units by zero phase technique in a π-network
Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
Part 4: Method for the measurement of the load resonance frequency f , load resonance
L
resistance, R and the calculation of other derived values of quartz crystal units, up to
L
30 MHz
Part 5: Methods for the determination of equivalent electrical parameters using automatic
network analyzer techniques and error correction
Part 6: Measurement of drive level dependence (DLD)
Part 7: Measurement of activity and frequency dips of quartz crystal units
The committee has decided that the contents of this publication will remain unchanged until 2007.
At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.
A bilingual version of this standard may be issued at a later date.
___________
Under consideration.
60444-8  IEC:2003(E) – 5 –
INTRODUCTION
This document is only for the test fixture applied to leadless surface mounted quartz crystal
units. The document is the specification for the test fixture [1] that allows the accurate
measurement of resonance frequency, resonance resistance, and equivalent electrical circuit
parameters of leadless surface mounted quartz crystal units. The measurement method using
an automatic network analyzer is based on IEC 60444-5.
The measuring frequency range is from 1 MHz to 150 MHz when the load capacitance is not
used, and is from 1 MHz to 30 MHz when the load capacitance is used. The use of the test
−
fixture with the measurement method yields measurement accuracy of about 10 over of the
frequency range, and the accuracy of the resonance resistance is ±2 Ω or ±10 %.
___________
Numbers in square brackets refer to the bibliography.

– 6 – 60444-8  IEC:2003(E)
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS –
Part 8: Test fixture for surface mounted quartz crystal units
1 Scope
This part of IEC 60444 explains the test fixture that allows the accurate measurement of
resonance frequency, resonance resistance, and equivalent electrical circuit parameters of a
leadless surface mounted quartz crystal units using zero phase technique as specified in IEC
60444-4 and IEC 60444-5.
An equivalent circuit constant and the application frequency range obtained by using the test
fixture are then shown.
In addition, this is applied to the enclosure shown in IEC 61240 as a crystal unit without lead
wires. An equivalent circuit of the test fixture and an electric values are based on IEC 60444-1
and IEC 60444-4. The range of load capacitance is 10 pF or more. Calibration of the
measurement system and C adapter board is explained hereafter.
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This document applies to the test fixture that allows the accurate measurement of resonance
frequency, resonance resistance, parallel capacitance C , motional capacitance C , and
0 1
motional inductance L of the crystal unit over the frequency range from 1 MHz to 150 MHz
using an automatic network analyzer, based on IEC 60444-5.
2 Normative references
The following referenced documents are indispensable for the application of this document. For
dated references, only the edition cited applies. For undated references, the latest edition of
the referenced document (including any amendments) applies.
IEC 60444-1:1986, Measurement of quartz crystal unit parameters by zero phase technique in
a pi-network. Part 1: Basic method for the measurement of resonance frequency and
resonance resistance of quartz crystal units by zero phase technique in a pi-network
IEC 60444-2:1980, Measurement of quartz crystal unit parameters by zero phase technique in
a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz
crystal units
IEC 60444-5:1995, Measurement of quartz crystal units parameters – Part 5: Methods for the
determination of equivalent electrical parameters using automatic network analyzer techniques
and error correction
IEC 61240:1994, Piezoelectric devices – Preparation of outline drawings of surface-mounted
devices (SMD) for frequency control and selection – General rules
3 General issue
The test fixture and the method for measuring the resonance frequency, resonance resistance,
and equivalent electrical circuit parameters must be specified in the contract between the
crystal unit supplier and the user. The crystal unit requires special consideration as it has no
lead wires.
60444-8  IEC:2003(E) – 7 –
4 Leadless surface mounted quartz crystal units
4.1 Enclosure
No particular specification shall be made regarding the enclosure type. However, it is
recommended that enclosures such as those shown in IEC 61240, be used.
4.2 Overtone and frequency rang
...