EN 60749:1999/A1:2000
(Amendment)Semiconductor devices - Mechanical and climatic test methods
Semiconductor devices - Mechanical and climatic test methods
EN following parallel vote * Superseded by EN 60749 series
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren
Dispositifs à semiconducteurs - Essais mécaniques et climatiques
Semiconductor devices - Mechanical and climatic test methods (IEC 60749:1996)
General Information
- Status
- Withdrawn
- Publication Date
- 16-Nov-2000
- Withdrawal Date
- 31-Aug-2003
- Technical Committee
- CLC/SR 47 - Semiconductor devices
- Drafting Committee
- IEC/TC 47 - IEC_TC_47
- Parallel Committee
- IEC/TC 47 - IEC_TC_47
- Current Stage
- 9960 - Withdrawal effective - Withdrawal
- Start Date
- 01-Jan-2008
- Completion Date
- 20-Feb-2026
Relations
- Effective Date
- 29-Jan-2023
- Effective Date
- 29-Jan-2023
- Effective Date
- 29-Jan-2023
- Effective Date
- 29-Jan-2023
- Effective Date
- 29-Jan-2023
- Effective Date
- 29-Jan-2023
- Effective Date
- 29-Jan-2023
- Effective Date
- 29-Jan-2023
- Effective Date
- 29-Jan-2023
- Effective Date
- 28-Jan-2023
- Effective Date
- 28-Jan-2023
- Replaced By
EN 60749-1:2003 - Semiconductor devices - Mechanical and climatic test methods - Part 1: General - Effective Date
- 28-Jan-2023
- Effective Date
- 28-Jan-2023
- Effective Date
- 28-Jan-2023
Frequently Asked Questions
EN 60749:1999/A1:2000 is a standard published by CLC. Its full title is "Semiconductor devices - Mechanical and climatic test methods". This standard covers: EN following parallel vote * Superseded by EN 60749 series
EN following parallel vote * Superseded by EN 60749 series
EN 60749:1999/A1:2000 is classified under the following ICS (International Classification for Standards) categories: 31.080.01 - Semiconductor devices in general. The ICS classification helps identify the subject area and facilitates finding related standards.
EN 60749:1999/A1:2000 has the following relationships with other standards: It is inter standard links to EN 60749-11:2002, EN 60749-6:2002, EN 60749-3:2002, EN 60749-13:2002, EN 60749-7:2002, EN 60749-14:2003, EN 60749-2:2002, EN 60749-4:2002, EN 60749-12:2002, EN 60749-31:2003, EN 60749-10:2002, EN 60749-1:2003, EN 60749-9:2002, EN 60749-15:2003. Understanding these relationships helps ensure you are using the most current and applicable version of the standard.
EN 60749:1999/A1:2000 is available in PDF format for immediate download after purchase. The document can be added to your cart and obtained through the secure checkout process. Digital delivery ensures instant access to the complete standard document.
Standards Content (Sample)
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Semiconductor devices - Mechanical and climatic test methods (IEC 60749:1996)Halbleiterbauelemente - Mechanische und klimatische PrüfverfahrenDispositifs à semiconducteurs - Essais mécaniques et climatiquesSemiconductor devices - Mechanical and climatic test methods31.080.01Polprevodniški elementi (naprave) na splošnoSemiconductor devices in generalICS:Ta slovenski standard je istoveten z:EN 60749:1999/A1:2000SIST EN 60749:2002 + A1:2002en01-september-2002SIST EN 60749:2002 + A1:2002SLOVENSKI
STANDARD
SIST EN 60749:2002 + A1:2
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