EN 61580-9:1996

SLOVENSKI STANDARD
01-april-1998
Methods of measurement for waveguides - Part 9: Reflection coefficient at
rectangular waveguide interfaces (IEC 61580-9:1996)
Methods of measurement for waveguides -- Part 9: Reflection coefficient at rectangular
waveguide interfaces
Meßverfahren für Hohlleiter -- Teil 9: Dämpfungskoeffizient rechteckiger Hohlleiter-
Adapter
Méthodes de mesure appliquées aux guides d'ondes -- Partie 9: Coefficient de réflexion
aux interfaces de guides d'ondes rectangulaires
Ta slovenski standard je istoveten z: EN 61580-9:1996
ICS:
33.120.10 Koaksialni kabli. Valovodi Coaxial cables. Waveguides
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

NORME CEI
INTERNATIONALE IEC
1580-9
INTERNATIONAL
Première édition
STANDARD
First edition
1996-06
Méthodes de mesure appliquées
aux guides d'ondes —
Partie 9:
Coefficient de réflexion aux interfaces
de guides d'ondes rectangulaires
Methods of measurement for waveguides —
Part 9:
Reflection coefficient at rectangular
waveguide interfaces
© CEI 1996 Droits de reproduction réservés —Copyright - all rights reserved
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1580-9 © CEI:1996 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
METHODS OF MEASUREMENT FOR WAVEGUIDES -
Part 9: Reflection coefficient at rectangular waveguide interfaces
FOREWORD
The IEC (International Electrotechnical Commission) is a worldwide organization for standardization
1)
comprising all national electrotechnical committees (IEC National Committees). The object of the IEC is to
promote international co-operation on all questions concerning standardization in the electrical and electronic
fields. To this end and in addition to other activities, the IEC publishes International Standards. Their
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with may participate in this preparatory work. International, governmental and non-governmental
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International Organization for Standardization (ISO) in accordance with conditions determined by agreement
between the two organizations.
The formal decisions or agreements of the IEC on technical matters, express as nearly as possible, an
2)
international consensus of opinion on the relevant subjects since each technical committee has
representation from all interested National Committees.
The documents produced have the form of recommendations for international use and are published in the
3)
form of standards, technical reports or guides and they are accepted by the National Committees in that
sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
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5)
equipment declared to be in conformity with one of its standards.
Attention is drawn to the possibility that some of the elements of this International Standard may be the subject
6)
of patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 1580-9 has been prepared by subcommittee 46B: Waveguides
and their accessories, of IEC technical committee 46: Cables, wires, waveguides, r.f.
connectors, and accessories for communication and signalling.
The text of this standard is based on the following documents:
FDIS Report on voting
46B/210/FDIS 46B/217/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.

5 –
1580-9 © CEI:1996 –
INTRODUCTION
Due to tolerances in waveguide dimensions, flange alignment holes and bolt diameters, the
junction between two similar waveguides can give rise to reflections of an input signal. This
part of IEC 1580 examines the effects on reflection coefficient due to the various
tolerances.
1580-9 © CE 1:1996 – 7 -
METHODS OF MEASUREMENT FOR WAVEGUIDES -
Part 9: Reflection coefficient at rectangular waveguide interfaces
1 Scope
This part of IEC 1580 gives the means for determining the reflection coefficient at the
junction of two similar rectangular waveguides due to the following imperfections:
a) differences in the waveguide internal dimensions;
b) lateral displacem
...