SIST EN 61580-9:1998
(Main)Methods of measurement for waveguides -- Part 9: Reflection coefficient at rectangular waveguide interfaces
Methods of measurement for waveguides -- Part 9: Reflection coefficient at rectangular waveguide interfaces
Gives the means for determining the reflection coefficient at the junction of two similar rectanglular waveguides due to: differences in the wavguide internal dimensions, lateral displacement between the waveguide axes in either the H or E plane and angular misalignment between the waveguide axes.
Meßverfahren für Hohlleiter -- Teil 9: Dämpfungskoeffizient rechteckiger Hohlleiter-Adapter
Méthodes de mesure appliquées aux guides d'ondes -- Partie 9: Coefficient de réflexion aux interfaces de guides d'ondes rectangulaires
Indique les moyens de déterminer le coefficient de réflexion à la jonction de deux guides d'ondes rectangulaires similaires dû aux: différences dans les dimensions internes du guide, déplacement latéral entre les axes du guide dans le plan H ou le plan E et excentrage angulaire entre les axes du guide.
Methods of measurement for waveguides - Part 9: Reflection coefficient at rectangular waveguide interfaces (IEC 61580-9:1996)
General Information
- Status
- Published
- Publication Date
- 31-Mar-1998
- Technical Committee
- iTEL - Communication cables
- Current Stage
- 6060 - National Implementation/Publication (Adopted Project)
- Start Date
- 01-Apr-1998
- Due Date
- 01-Apr-1998
- Completion Date
- 01-Apr-1998
Overview
SIST EN 61580-9:1998, issued by the CLC (European Committee for Electrotechnical Standardization), specifies methods for measuring the reflection coefficient at rectangular waveguide interfaces. This standard is part 9 of the IEC 61580 series and focuses on evaluating the effect of imperfections at junctions between two similar rectangular waveguides. The reflection coefficient quantifies signal reflections caused by mismatches, which impact the performance of microwave and RF communication systems.
The standard addresses crucial parameters that influence reflections, such as differences in internal waveguide dimensions, lateral displacement of waveguide axes in H or E planes, and angular misalignment between the waveguide axes. EN 61580-9 provides both theoretical formulas and practical measurement guidance to assess return losses and ensure reliable waveguide connections.
Key Topics
Reflection Coefficient Determination
The reflection coefficient (often represented by ( P )) is evaluated considering:- Variations in waveguide internal width (( a )) and height (( b ))
- Lateral displacements in the H-plane (( P_H )) and E-plane (( P_E ))
- Angular misalignment between flanges
Dimensional Tolerances Impact
Dimensional differences in internal waveguide cross-sections cause mismatches, leading to additional reflections and return loss degradation. Equations given in the standard help quantify the effect for small changes, incorporating waveguide wavelength and cutoff frequency parameters.Axial and Angular Misalignment Effects
The standard provides mathematical models for the reflection caused by lateral and angular displacements. A key formula estimates the reflection coefficient increase due to a rotation ( \theta ) (in degrees) between flanges:
[ p_t = 0.5 \sin(\theta) ]
This approximation applies for flange rotations up to 45°, primarily for waveguides with 2:1 aspect ratio.Graphical Tools and Calculation Methods
EN 61580-9 includes graphs for quickly determining reflection coefficients as percentages based on measured deviations and displacement values, facilitating practical assessment during installation and maintenance.Integration with IEC 154 Flange Standards
The reflection coefficient results and criteria from EN 61580-9 feed into IEC 154 standards for waveguide flanges, which define acceptable mechanical tolerances to maintain signal integrity with minimal return loss increase.
Applications
Microwave and RF System Design
Engineers use EN 61580-9 parameters to design and specify waveguide components ensuring minimal reflection losses at junctions, which is critical for radar, satellite communications, and wireless infrastructure.Quality Control in Manufacturing
Manufacturers of rectangular waveguides apply measurement methods to verify dimensional accuracy and flange alignment, guaranteeing compliance with electromagnetic performance standards.Installation and Maintenance of Waveguides
Technicians assess and correct axial and angular misalignment during installation of waveguide assemblies, preventing performance degradation due to reflection mismatches.Performance Optimization in Communication Networks
The standard supports systematic evaluation of waveguide discontinuities, improving matching and minimizing signal reflections, which enhances network efficiency and reduces power loss.
Related Standards
IEC 154 Series – Flanges for Waveguides
Focuses on mechanical and electromagnetic specifications for waveguide flange interfaces, including dimensional tolerances and permissible misalignment limits influencing reflection loss.IEC 61580 Series – Methods of Measurement for Waveguides
Covers various measurement techniques and parameters relevant to waveguide components and accessories across multiple parts.ISO/IEC Coordination
EN 61580-9 aligns with International Electrotechnical Commission (IEC) principles and cooperates with ISO for harmonized global standards.
Keywords: EN 61580-9, reflection coefficient, rectangular waveguide interfaces, waveguide measurement methods, return loss, waveguide flange misalignment, axial displacement, angular misalignment, RF waveguides, IEC waveguide standards.
Frequently Asked Questions
SIST EN 61580-9:1998 is a standard published by the Slovenian Institute for Standardization (SIST). Its full title is "Methods of measurement for waveguides -- Part 9: Reflection coefficient at rectangular waveguide interfaces". This standard covers: Gives the means for determining the reflection coefficient at the junction of two similar rectanglular waveguides due to: differences in the wavguide internal dimensions, lateral displacement between the waveguide axes in either the H or E plane and angular misalignment between the waveguide axes.
Gives the means for determining the reflection coefficient at the junction of two similar rectanglular waveguides due to: differences in the wavguide internal dimensions, lateral displacement between the waveguide axes in either the H or E plane and angular misalignment between the waveguide axes.
SIST EN 61580-9:1998 is classified under the following ICS (International Classification for Standards) categories: 33.120.10 - Coaxial cables. Waveguides. The ICS classification helps identify the subject area and facilitates finding related standards.
SIST EN 61580-9:1998 is available in PDF format for immediate download after purchase. The document can be added to your cart and obtained through the secure checkout process. Digital delivery ensures instant access to the complete standard document.
Standards Content (Sample)
SLOVENSKI STANDARD
01-april-1998
Methods of measurement for waveguides - Part 9: Reflection coefficient at
rectangular waveguide interfaces (IEC 61580-9:1996)
Methods of measurement for waveguides -- Part 9: Reflection coefficient at rectangular
waveguide interfaces
Meßverfahren für Hohlleiter -- Teil 9: Dämpfungskoeffizient rechteckiger Hohlleiter-
Adapter
Méthodes de mesure appliquées aux guides d'ondes -- Partie 9: Coefficient de réflexion
aux interfaces de guides d'ondes rectangulaires
Ta slovenski standard je istoveten z: EN 61580-9:1996
ICS:
33.120.10 Koaksialni kabli. Valovodi Coaxial cables. Waveguides
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
NORME CEI
INTERNATIONALE IEC
1580-9
INTERNATIONAL
Première édition
STANDARD
First edition
1996-06
Méthodes de mesure appliquées
aux guides d'ondes —
Partie 9:
Coefficient de réflexion aux interfaces
de guides d'ondes rectangulaires
Methods of measurement for waveguides —
Part 9:
Reflection coefficient at rectangular
waveguide interfaces
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1580-9 © CEI:1996 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
METHODS OF MEASUREMENT FOR WAVEGUIDES -
Part 9: Reflection coefficient at rectangular waveguide interfaces
FOREWORD
The IEC (International Electrotechnical Commission) is a worldwide organization for standardization
1)
comprising all national electrotechnical committees (IEC National Committees). The object of the IEC is to
promote international co-operation on all questions concerning standardization in the electrical and electronic
fields. To this end and in addition to other activities, the IEC publishes International Standards. Their
preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt
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International Organization for Standardization (ISO) in accordance with conditions determined by agreement
between the two organizations.
The formal decisions or agreements of the IEC on technical matters, express as nearly as possible, an
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international consensus of opinion on the relevant subjects since each technical committee has
representation from all interested National Committees.
The documents produced have the form of recommendations for international use and are published in the
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form of standards, technical reports or guides and they are accepted by the National Committees in that
sense.
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Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
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equipment declared to be in conformity with one of its standards.
Attention is drawn to the possibility that some of the elements of this International Standard may be the subject
6)
of patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 1580-9 has been prepared by subcommittee 46B: Waveguides
and their accessories, of IEC technical committee 46: Cables, wires, waveguides, r.f.
connectors, and accessories for communication and signalling.
The text of this standard is based on the following documents:
FDIS Report on voting
46B/210/FDIS 46B/217/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
5 –
1580-9 © CEI:1996 –
INTRODUCTION
Due to tolerances in waveguide dimensions, flange alignment holes and bolt diameters, the
junction between two similar waveguides can give rise to reflections of an input signal. This
part of IEC 1580 examines the effects on reflection coefficient due to the various
tolerances.
1580-9 © CE 1:1996 – 7 -
METHODS OF MEASUREMENT FOR WAVEGUIDES -
Part 9: Reflection coefficient at rectangular waveguide interfaces
1 Scope
This part of IEC 1580 gives the means for determining the reflection coefficient at the
junction of two similar rectangular waveguides due to the following imperfections:
a) differences in the waveguide internal dimensions;
b) lateral displacem
...
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