EN 62433-2:2017

SLOVENSKI STANDARD
01-julij-2017
1DGRPHãþD
SIST EN 62433-2:2010
Modeliranje integriranih vezij (IC) za elektromagnetno združljivost (EMC) - 2. del:
Modeli integriranih vezij za vedenjsko simulacijo pri EMI - Vodeni model oddajanja
(ICEM-CE) (IEC 62433-2:2017)
EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation -
Conducted emissions modelling (ICEM-CE) (IEC 62433-2:2017)
EMV-IC-Modellierung - Teil 2: Modelle integrierter Schaltungen für die Simulation des
Verhaltens bei elektromagnetischer Beeinflussung - Modellierung leitungsgeführter
Aussendungen (ICEM-CE) (IEC 62433-2:2017)
Modèles de circuits intégrés pour la CEM - Partie 2: Modèles de circuits intégrés pour la
simulation du comportement lors de perturbations électromagnétiques – Modélisation
des émissions conduites (ICEM-CE) (IEC 62433-2:2017)
Ta slovenski standard je istoveten z: EN 62433-2:2017
ICS:
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
33.100.10 Emisija Emission
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN 62433-2
NORME EUROPÉENNE
EUROPÄISCHE NORM
May 2017
ICS 31.200; 33.100.10 Supersedes EN 62433-2:2010
English Version
EMC IC modelling -
Part 2: Models of integrated circuits for EMI behavioural
simulation - Conducted emissions modelling (ICEM-CE)
(IEC 62433-2:2017)
Modèles de circuits intégrés pour la CEM - Partie 2: EMV-IC-Modellierung - Teil 2: Modelle integrierter
Modèles de circuits intégrés pour la simulation du Schaltungen für die Simulation des Verhaltens bei
comportement lors de perturbations électromagnétiques - elektromagnetischer Beeinflussung - Modellierung
Modélisation des émissions conduites (ICEM-CE) leitungsgeführter Aussendungen (ICEM-CE)
(IEC 62433-2:2017) (IEC 62433-2:2017)
This European Standard was approved by CENELEC on 2017-03-03. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden,
Switzerland, Turkey and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN 62433-2:2017 E
European foreword
The text of document 47A/999/FDIS, future edition 2 of IEC 62433-2, prepared by SC 47A "Integrated
circuits", of IEC/TC 47 "Semiconductor devices" was submitted to the IEC-CENELEC parallel vote and
approved by CENELEC as EN 62433-2:2017.
The following dates are fixed:
(dop) 2017-12-03
• latest date by which the document has to be implemented at
national level by publication of an identical national
standard or by endorsement
(dow) 2020-03-03
• latest date by which the national standards conflicting with
the document have to be withdrawn

This document supersedes EN 62433-2:2010.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such
patent rights.
Endorsement notice
The text of the International Standard IEC 62433-2:2017 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards indicated:
IEC 61967 NOTE Harmonized in EN 61967 series.
IEC 61967-4 NOTE Harmonized as EN 61967-4.
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.
NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod),
the relevant EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is
available here: www.cenelec.eu.

Publication Year Title EN/HD Year
IEC/TS 62433-1 2011 EMC IC modelling - Part 1: General - -
modelling framework
CISPR 17 -  Methods of measurement of the EN 55017 -
suppression characteristics of passive
EMC filtering devices
IEC 62433-2 ®
Edition 2.0 2017-01
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
EMC IC modelling –
Part 2: Models of integrated circuits for EMI behavioural simulation – Conducted

emissions modelling (ICEM-CE)
Modèles de circuits intégrés pour la CEM –

Partie 2: Modèles de circuits intégrés pour la simulation du comportement lors

de perturbations électromagnétiques – Modélisation des émissions conduites

(ICEM-CE)
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
31.200; 33.100.10 ISBN 978-2-8322-3876-9

– 2 – IEC 62433-2:2017 © IEC 2017
CONTENTS
FOREWORD . 7
1 Scope . 9
2 Normative references . 9
3 Terms, definitions, abbreviations and conventions . 9
3.1 Terms and definitions . 9
3.2 Abbreviations . 11
3.3 Conventions . 11
4 Philosophy . 11
4.1 General . 11
4.2 Conducted emission from core activity (digital culprit) . 12
4.3 Conducted emission from I/O activity . 12
4.4 Data exchange format . 12
5 ICEM-CE basic components . 13
5.1 General . 13
5.2 Internal Activity (IA) . 13
5.2.1 General . 13
5.2.2 Examples of IA . 14
5.3 Passive Distribution Network (PDN) . 14
5.3.1 General . 14
5.3.2 Examples of PDN . 15
6 IC macro-models . 16
6.1 Types of IC macro-models . 16
6.2 General IC macro-model . 16
6.3 Block-based IC macro-model . 17
6.3.1 Block component . 17
6.3.2 Inter-Block Coupling component (IBC) . 18
6.3.3 Block-based IC macro-model structure . 19
6.4 Sub-model-based IC macro-model . 21
6.4.1 Sub-model component . 21
6.4.2 Sub-model-based IC macro-model structure . 22
7 CEML format . 23
7.1 General . 23
7.2 CEML structure . 24
7.3 Global keywords . 24
7.4 Header section . 24
7.5 Lead definitions . 25
7.6 SPICE macro-models . 26
7.7 Validity section . 28
7.7.1 General . 28
7.7.2 Attribute definitions . 29
7.8 PDN . 31
7.8.1 General . 31
7.8.2 Attribute definitions . 32
7.8.3 Description . 36
7.9 IBC . 40
7.9.1 General . 40

IEC 62433-2:2017 © IEC 2017 – 3 –
7.9.2 Attribute definitions . 40
7.10 IA . 42
7.10.1 General . 42
7.10.2 Attribute definitions . 42
7.10.3 Description . 46
8 Requirements for parameter extraction . 47
8.1 General . 47
8.2 Environmental extraction constraints . 47
8.3 IA parameter extraction . 47
8.4 PDN parameter extraction . 47
8.5 IBC parameter extraction . 48
Annex A (normative) Preliminary definitions for XML representation . 49
A.1 XML basics . 49
A.1.1 XML declaration . 49
A.1.2 Basic elements . 49
A.1.3 Root element . 49
A.1.4 Comments . 50
A.1.5 Line terminations . 50
A.1.6 Element hierarchy . 50
A.1.7 Element attributes . 50
A.2 Keyword requirements . 50
A.2.1 General . 50
A.2.2 Keyword characters . 51
A.2.3 Keyword syntax . 51
A.2.4 File structure . 51
A.2.5 Values . 53
Annex B (normative) CEML valid keywords and usage . 56
B.1 Root element keywords . 56
B.2 File header keywords . 57
B.3 Validity section keywords . 58
B.4 Global keywords . 59
B.5 Lead Keyword . 59
B.6 Lead_definitions section attributes . 60
B.7 Macromodels section attributes . 60
B.8 Pdn section keywords . 61
B.8.1 Lead element keywords . 61
B.8.2 Netlist section keywords . 63
B.9 Ibc section keywords . 63
B.9.1 Lead element keywords . 63
B.9.2 Netlist section keywords . 65
B.10 Ia section keywords . 65
B.10.1 Lead element keywords . 65
B.10.2 Voltage section keywords . 66
B.10.3 Current section keywords . 68
Annex C (informative) Example of ICEM-CE macro-model in CEML format . 70
C.1 General . 70
C.2 PDN and IBC sub-model . 70
C.3 IA sub-model . 71

– 4 – IEC 62433-2:2017 © IEC 2017
C.4 Frequency domain ICEM-CE in CEML . 73
C.5 Time domain ICEM-CE in CEML . 75
Annex D (informative) Conversions between parameter types . 77
D.1 General . 77
D.2 Conversion for one-port PDN . 77
D.3 Conversion for two-port PDN . 77
Annex E (informative) Model parameter generation . 79
E.1 General . 79
E.2 Default structure and values . 79
E.2.1 General . 79
E.2.2 IA parameters . 79
E.2.3 PDN parameters . 80
E.3 Model parameter generation from design information . 81
E.3.1 General . 81
E.3.2 IA parameters . 81
E.3.3 PDN parameters . 85
E.4 Model parameter generation from measurements . 87
E.4.1 IA parameters . 87
E.4.2 PDN parameters . 90
Annex F (informative) Decoupling capacitors optimization . 100
Annex G (informative) Conducted emission prediction . 102
Annex H (informative) Conducted emission prediction at PCB level . 103
Bibliography . 105

Figure 1 – Decomposition example of a digital IC for conducted emissions analysis . 12
Figure 2 – IA component in the case of a current source . 13
Figure 3 – Example of IA characteristics in the time domain. 14
Figure 4 – Example of IA characteristics in the frequency domain . 14
Figure 5 – Example of a four-terminal PDN using lumped elements . 15
Figure 6 – Example of a seven-terminal PDN using distributed elements . 16
Figure 7 – Example of a twelve-terminal PDN using matrix representation . 16
Figure 8 – General IC macro-model . 17
Figure 9 – Example of block component with a single IA . 18
Figure 10 – Example of block components for I/Os . 18
Figure 11 – Example of IBC with four internal terminals . 19
Figure 12 – Relationship between blocks and IBC . 19
Figure 13 – Block-based IC macro-model . 20
Figure 14 – Example of block-based IC macro-model . 21
Figure 15 – Example of simple sub-model . 21
Figure 16 – Sub-model-based IC macro-model . 22
Figure 17 – CEML inheritance hierarchy . 23
Figure 18 – Example of a netlist file defining a sub-circuit . 28
Figure 19 – PDN represented as S-parameters in Touchstone format . 38
Figure 20 – Simulated IA waveform with corresponding parameters . 45
Figure A.1 – Multiple XML (CEML) files . 52

IEC 62433-2:2017 © IEC 2017 – 5 –
Figure A.2 – XML files with data files (*.dat) . 52
Figure A.3 – XML files with additional files . 53
Figure C.1 – Example pin-out of a microcontroller and the modelled pins . 70
Figure C.2 – PDN sub-model topology . 71
Figure C.3 – IA sub-model topology . 72
Figure C.4 – IA of digital block in frequency domain . 72
Figure C.5 – IA of digital block in time domain . 73
Figure E.1 – Typical characterization current gate schematic . 82
Figure E.2 – Current peak during switching transition . 82
Figure E.3 – Example of IA extraction procedure from design . 83
Figure E.4 – Technology Influence . 83
Figure E.5 – Final current waveform for a program period . 84
Figure E.6 – Comparison between measurement and simulation . 84
Figure E.7 – Example lumped element model of a package. 85
Figure E.8 – Circuit structure of the netlist . 87
Figure E.9 – Principle of the IA computation in the frequency domain . 88
Figure E.10 – Process involved to model i (t) . 89
A
Figure E.11 – i (t) measured using IEC 61967-4 . 89
Ext
Figure E.12 – i (t)and i (t) profiles . 90
A Ext
Figure E.13 – Conventional one-port S-parameter measurement . 90
Figure E.14 – Two-port method for low impedance measurement. 91
Figure E.15 – Two-port method for high impedance measurement . 91
Figure E.16 – Example of a hardware set-up used to extract the PDN parameters . 92
Figure E.17 – Miniature 50 Ω coaxial connectors . 93
Figure E.18 – Impedance probe using two miniature coaxial connectors . 93
Figure E.19 – Open and short terminations . 93
Figure E.20 – Measurement probe model . 94
Figure E.21 – De-embedding principle . 94
Figure E.22 – Example of a predefined PDN structure . 95
Figure E.23 – RL configuration. 96
Figure E.24 – RLC configuration . 97
Figure E.25 – RLC with magnetic coupling configuration . 97
Figure E.26 – Impedance seen from Vcc and Gnd. 97
Figure E.27 – Complete PDN component . 98
Figure E.28 – Set-up for correlation (left), measurement and prediction model (right) . 99
Figure E.29 – Set-up used to measure the internal decoupling capacitor . 99
Figure F.1 – Equivalent schematic of the complete electronic system . 100
Figure F.2 – Impedance prediction and measurements . 101
Figure G.1 – IEC 61967-4 test set-up standard . 102
Figure G.2 – Comparison between prediction and measurement . 102
Figure H.1 – Prediction of ETVddc noise level at PCB level . 103
Figure H.2 – Good agreements on the noise envelope . 104

– 6 – IEC 62433-2:2017 © IEC 2017
Table 1 – Attributes of Lead keyword in the Lead_definitions section . 25
Table 2 – Compatibility between the Mode and Type fields for correct CEML
annotation . 26
Table 3 – Subckt definition . 26
Table 4 – Definition of the Validity section . 28
Table 5 – Definition of the Lead keyword for Pdn section . 32
Table 6 – Valid data formats and their default units in the Pdn section . 35
Table 7 – Valid file extensions in the Pdn section . 35
Table 8 – Valid fields of the Lead keyword in the Pdn section . 36
Table 9 – Netlist definition . 39
Table 10 – Differences between the Pdn and Ibc section fields . 41
Table 11 – Valid fields of the Lead keyword for IBC definition . 41
Table 12 – Definition of the Lead keyword in the Ia section . 42
Table 13 – Voltage and Current definition . 43
Table 14 – Valid file extensions in the Ia section . 43
Table 15 – Definition of the Pulse keyword in the Voltage or Current section . 44
Table 16 – Base units of the Pulse section’s fields . 44
Table 17 – Valid data formats and their default units for the Voltage and Current
elements . 46
Table A.1 – Valid logarithmic units . 54
Table D.1 – One-port conversion . 77
Table D.2 – Two-port conversion . 78
Table E.1 – Typical parameters for CMOS logic technologies . 80
Table E.2 – Typical number of logic gates vs. CPU technology . 80
Table E.3 – R, L and C parameters for various package types . 81
Table E.4 – Measurement configurations and extracted RLC parameters . 95

IEC 62433-2:2017 © IEC 2017 – 7 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
EMC IC MODELLING –
Part 2: Models of integrated circuits for EMI behavioural
simulation – Conducted emissions modelling (ICEM-CE)

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
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with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
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misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
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services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
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members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 62433-2 has been prepared by subcommittee 47A: Integrated
Circuits, of IEC technical committee 47: Semiconductor devices.
This second edition cancels and replaces the first edition published in 2008. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
Incorporation of an XML based exchange format for model representation.
The text of this standard is based on the following documents:
FDIS Report on voting
47A/999/FDIS 47A/1007/RVD
– 8 – IEC 62433-2:2017 © IEC 2017

Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 62433 series, published under the general title EMC IC modelling,
can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC website under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
IEC 62433-2:2017 © IEC 2017 – 9 –
EMC IC MODELLING –
Part 2: Models of integrated circuits for EMI behavioural
simulation – Conducted emissions modelling (ICEM-CE)

1 Scope
This part of IEC 62433 specifies macro-models for an Integrated Circuit (IC) to simulate
conducted electromagnetic emissions on a printed circuit board. The model is commonly
called Integrated Circuit Emission Model – Conducted Emission (ICEM-CE).
The ICEM-CE macro-model can also be used for modelling an IC-die, a functional block and
an Intellectual Property (IP) block.
The ICEM-CE macro-model can be used to model both digital and analogue ICs.
Basically, conducted emissions have two origins:
• conducted emissions through power supply terminals and ground reference structures;
• conducted emissions through input/output (I/O) terminals.
The ICEM-CE macro-model addresses those two types of origins in a single approach.
This standard defines structures and components of the macro-model for EMI simulation
taking into account the IC’s internal activities.
This part of IEC 62433 has two main parts:
• the first is the electrical description of ICEM-CE macro-model elements along with the
specific requirements for information.
• the second part proposes a universal data exchange format called CEML based on XML.
This format allows encoding the ICEM-CE in a more useable and generic form for
simulating the conducted emissions.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their
content constitutes requirements of this document. For dated references, only the edition
cited applies. For undated references, the latest edition of the referenced document (including
any amendments) applies.
IEC TS 62433-1:2011, EMC IC modelling – Part 1: General modelling framework
CISPR 17, Methods of measurement of the suppression characteristics of passive EMC
filtering devices
3 Terms, definitions, abbreviations and conventions
3.1 Terms and definitions
For the purposes of this document, the following terms and definitions apply.

– 10 – IEC 62433-2:2017 © IEC 2017
3.1.1
external terminal
terminal of an integrated circuit (IC) macro-model which interfaces the model to the external
environment of the IC
EXAMPLE Power supply pins and input/output pins.
Note 1 to entry: In this part of IEC 62433, the name of each external terminal starts with "ET".
3.1.2
internal terminal
terminal of an integrated circuit (IC) macro-model's component which interfaces the
component to other components of the IC macro-model
Note 1 to entry: In this part of IEC 62433, the name of each internal terminal starts with "IT".
3.1.3
section
XML element placed one level below the root element or within another section and that
contains one or more XML elements, but no value
3.1.4
parent
keyword which is one level above another keyword
3.1.5
child
keyword which is one level below another keyword
3.1.6
parser
tool for syntactic analysis of data that is encoded in a specified format
3.1.7
S-parameter
scattering parameter
S
ij
element of the S-matrix expressing the transmission and reflection coefficients of a device
Note 1 to entry: The most commonly used, each S-parameter relates the complex electric field strength of a
reflected or transmitted wave to that of an incident wave; the subscripts of a typical S-parameter S refer to the
ij
output and input ports related by the S-parameter, which may vary with frequency.
[SOURCE: CISPR 17:2011, 3.1.13]
3.1.8
CEML
Conducted Emissions Markup Language
data exchange format for ICEM-CE macro-model
Note 1 to entry: This note applies to the French language only.
3.1.9
CEMLBase
Conducted Emissions Markup Language Base
abstract type from which all CEML model components are directly or indirectly derived in the
ICEM-CE macro-model definition

IEC 62433-2:2017 © IEC 2017 – 11 –
3.1.10
PDN
Passive Distribution Network
component of an IC model that represents the characteristics of propagation path of
electromagnetic noises such as power distribution network
[SOURCE: IEC TS 62433-1:2011, 3.4]
3.1.11
IA
Internal Activity
component of an IC model represented by a current or voltage source, which originates in
activity of active devices in an IC or in a portion of the IC
[SOURCE: IEC TS 62433-1:2011, 3.3]
3.1.12
IBC
Inter-Block Coupling
network of passive elements that presents a coupling effect between circuit blocks within an
IC
[SOURCE: IEC TS 62433-1:2011, 3.5]
3.1.13
VNA
Vector Network Analyzer
network analyzer capable of measuring complex values of the S-parameters
[SOURCE: CISPR 16-1-4:2010, 3.1.21, modified — for VNA with two or more ports]
3.2 Abbreviations
CEM Conducted Emission Model
XML eXtensible Markup Language
SPICE Simulation Program with Integrated Circuit Emphasis
3.3 Conventions
For the sake of clarity, but with some exceptions, the writing conventions of XML have been
used in text and tables.
The symbol “µ” is used in the text part to define micro = 1e-6. The symbol “u” is used in the
XML parts to define the micro = 1e-6.
4 Philosophy
4.1 General
Integrated circuits will have more and more gates on silicon and technical progress will
develop faster. To predict the electromagnetic behaviour of equipment, it is required to model
the switching of the input and output interface and the internal activities of an IC effectively.
Figure 1 depicts an example of decomposition of an IC to enable conducted emissions
analysis. The internal digital activity (culprit) is a source of electromagnetic noise that
originates in switching of active devices. The coupling path propagates the emissions to the

– 12 – IEC 62433-2:2017 © IEC 2017
IC’s external terminals: pins/pads. The coupling path is the power distribution network or I/O
lines inside the IC.
Power Distribution
Network
Vss
Vdd Vss Vdd
Digital Culprit
Digital Coupling I/Os' Coupling I/Os' Culprit
(Emission
path path (Emission Source)
Source)
IC
Inter Block Coupling Path
I/O
IEC
Figure 1 – Decomposition example of a digital IC for conducted emissions analysis
4.2 Conducted emission from core activity (digital culprit)
The current transients are created in the core area on the IC-die. Due to the characteristics of
the digital coupling paths, the passive distribution network on printed circuit board (PCB) and
the availability of on-chip decoupling, a portion of these current transients will occur at the
power supply pins of the IC.
NOTE These off-chip power supply currents can be measured according to the IEC 61967 series [1] .
4.3 Conducted emission from I/O activity
I/Os activities may create voltage fluctuations of power and ground levels, and conducted
emissions appear at power and ground pins through the I/Os' coupling path. And the output
signals at output pins themselves are sources of conducted emissions to the printed circuit
boards.
NOTE The measurement set-up is done according to the IEC 61967 series [1].
4.4 Data exchange format
ICEM-CE macro-model data is arranged in a decipherable nested manner using XML format.
The objective of this exchange format, called Conducted Emissions Markup Language (CEML),
i
...