EN IEC 60749-5:2024

SLOVENSKI STANDARD
01-marec-2024
Polprevodniški elementi - Mehanske in klimatske preskusne metode - 5. del:
Preskus življenjske dobe v dinamičnem ravnotežju vlažnosti in pri ustaljeni
temperaturi (IEC 60749-5:2023)
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state
temperature humidity bias life test (IEC 60749-5:2023)
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 5:
Lebensdauerprüfung bei konstanter Temperatur und Feuchte unter elektrischer
Beanspruchung (IEC 60749-5:2023)
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 5:
Essai continu de durée de vie sous température et humidité avec polarisation (IEC
60749-5:2023)
Ta slovenski standard je istoveten z: EN IEC 60749-5:2024
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN IEC 60749-5

NORME EUROPÉENNE
EUROPÄISCHE NORM January 2024
ICS 31.080.01 Supersedes EN 60749-5:2017
English Version
Semiconductor devices - Mechanical and climatic test methods -
Part 5: Steady-state temperature humidity bias life test
(IEC 60749-5:2023)
Dispositifs à semiconducteurs - Méthodes d'essais Halbleiterbauelemente - Mechanische und klimatische
mécaniques et climatiques - Partie 5: Essai continu de Prüfverfahren - Teil 5: Lebensdauerprüfung bei konstanter
durée de vie sous température et humidité avec polarisation Temperatur und Feuchte unter elektrischer Beanspruchung
(IEC 60749-5:2023) (IEC 60749-5:2023)
This European Standard was approved by CENELEC on 2024-01-23. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the
Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Türkiye and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2024 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN IEC 60749-5:2024 E

European foreword
The text of document 47/2820/FDIS, future edition 3 of IEC 60749-5, prepared by IEC/TC 47
"Semiconductor devices" was submitted to the IEC-CENELEC parallel vote and approved by
CENELEC as EN IEC 60749-5:2024.
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2024-10-23
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2027-01-23
document have to be withdrawn
This document supersedes EN 60749-5:2017 and all of its amendments and corrigenda (if any).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
Any feedback and questions on this document should be directed to the users’ national committee. A
complete listing of these bodies can be found on the CENELEC website.
Endorsement notice
The text of the International Standard IEC 60749-5:2023 was approved by CENELEC as a European
Standard without any modification.
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
NOTE 1 Where an International Publication has been modified by common modifications, indicated by (mod), the
relevant EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available
here: www.cencenelec.eu.
Publication Year Title EN/HD Year
IEC 60749-4 - Semiconductor devices - Mechanical and EN 60749-4 -
climatic test methods - Part 4: Damp heat,
steady state, highly accelerated stress test
(HAST)
IEC 60749-5 ®
Edition 3.0 2023-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Semiconductor devices – Mechanical and climatic test methods –

Part 5: Steady-state temperature humidity bias life test

Dispositifs à semiconducteurs – Méthodes d'essais mécaniques et climatiques –

Partie 5: Essai continu de durée de vie sous température et humidité avec

polarisation
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.080.01  ISBN 978-2-8322-8033-1

– 2 – IEC 60749-5:2023 © IEC 2023
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms and definitions . 5
4 General . 5
5 Equipment . 5
5.1 Equipment summary . 5
5.2 Temperature and relative humidity . 6
5.3 Devices under stress . 6
5.4 Minimizing release of contamination . 6
5.5 Ionic contamination . 6
5.6 Deionized water . 6
6 Test conditions . 6
6.1 Test conditions summary . 6
6.2 Temperature, relative humidity and duration . 6
6.3 Biasing guidelines . 7
6.4 Biasing choice and reporting . 7
7 Procedures . 8
7.1 Mounting . 8
7.2 Ramp-up . 8
7.3 Ramp-down . 8
7.4 Test clock . 8
7.5 Bias . 8
7.6 Read-out . 8
7.7 Handling . 8
8 Failure criteria . 9
9 Safety . 9
10 Summary . 9

Table 1 – Temperature, relative humidity and duration . 6
Table 2 – Criteria for choosing continuous or cyclical bias . 7

IEC 60749-5:2023 © IEC 2023 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES –
MECHANICAL AND CLIMATIC TEST METHODS –

Part 5: Steady-state temperature humidity bias life test

FOREWORD
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IEC 60749-5 has been prepared by IEC technical committee 47: Semiconductor devices. It is
an International Standard.
This third edition, based on JEDEC document JESD22-A101D.01, cancels and replaces the
second edit
...