Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages

IEC 60191-6:2009 gives general rules for the preparation of outline drawings of surface-mounted semiconductor devices. It supplements IEC 60191-1 and IEC 60191-3. It covers all surface-mounted devices discrete semiconductors with lead count of greater or equal to 8, as well as integrated circuits classified as form E in Clause 3 of IEC 60191-4. This third edition of IEC 60191-6 cancels and replaces the second edition, published in 2004 and constitutes a technical revision. This edition includes the following significant changes with respect to the previous edition: a) scope is modified to cover all surface-mounted devices discrete semiconductors with lead count of greater or equal to 8; b) editorial modifications on several pages; and c) technical revision to ball grid array package (BGA) especially its geometrical drawing format. (two types of BGA would unify as one type as a result of revising drawing format.

Mechanische Normung von Halbleiterbauelementen - Teil 6: Allgemeine Regeln für die Erstellung von Gehäusezeichnungen von SMD-Halbleitergehäusen

Normalisation mécanique des dispositifs à semi-conducteurs - Partie 6: Règles générales pour la préparation des dessins d'encombrement des boîtiers pour dispositifs à semi-conducteurs pour montage en surface

La CEI 60191-6:2009 donne les règles générales pour la préparation des dessins d'encombrement des dispositifs à semi-conducteurs pour montage en surface. Elle complète la CEI 60191-1 et la CEI 60191-3. Elle couvre tous les dispositifs pour montage en surface à semi-conducteurs discrets dotés d'au moins 8 sorties, ainsi que les circuits intégrés classés 'de forme E' dans l'Article 3 de la CEI 60191-4. Cette troisième édition de la CEI 60191-6 annule et remplace la deuxième édition parue en 2004 dont elle constitue une révision technique. La présente édition contient les modifications majeures suivantes par rapport à l'édition précédente: a) le domaine d'application est modifié pour couvrir tous les dispositifs pour montage en surface à semi-conducteurs discrets dotés d'au moins 8 sorties; b) des modifications éditoriales sur plusieurs pages; et c) une révision technique du boîtier matriciel à billes (BGA) particulièrement son format de dessin géométrique. (la révision du format de dessin permettrait d'unifier deux types de boîtier BGA pour n'avoir qu'un seul type.)

Standardizacija mehanskih lastnosti polprevodniških elementov - 6. del: Splošna pravila za pripravo tehničnih risb okrovov površinsko nameščenih polprevodniških elementov (IEC 60191-6:2009)

Ta del IEC 60191 podaja splošna pravila za pripravo tehničnih risb površinsko nameščenih polprevodniških elementov. Dopolnjuje IEC 60191-1 in IEC 60191-3. Zajema vse površinsko nameščene ločene polprevodniške elemente s stopnjo svinca vsaj 8 in integrirana vezja, opredeljena kot oblika E v Klavzuli 3 IEC 60191-4.

General Information

Status
Published
Publication Date
22-Dec-2009
Withdrawal Date
30-Nov-2012
Current Stage
6060 - Document made available - Publishing
Start Date
23-Dec-2009
Completion Date
23-Dec-2009

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SLOVENSKI STANDARD
01-marec-2010
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SIST EN 60191-6:2005
6WDQGDUGL]DFLMDPHKDQVNLKODVWQRVWLSROSUHYRGQLãNLKHOHPHQWRYGHO6SORãQD
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Mechanical standardization of semiconductor devices -- Part 6: General rules for the
preparation of outline drawings of surface mounted semiconductor device packages (IEC
60191-6:2009)
Mechanische Normung von Halbleiterbauelementen - Teil 6: Allgemeine Regeln für die
Erstellung von Gehäusezeichnungen von SMD-Halbleitergehäusen (IEC 60191-6:2009)
Normalisation mécanique des dispositifs à semi-conducteurs - Partie 6: Règles
générales pour la préparation des dessins d'encombrement des boîtiers pour dispositifs
à semi-conducteurs pour montage en surface (CEI 60191-6:2009)
Ta slovenski standard je istoveten z: EN 60191-6:2009
ICS:
01.100.25 5LVEHVSRGURþMD Electrical and electronics
HOHNWURWHKQLNHLQHOHNWURQLNH engineering drawings
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
31.240 Mehanske konstrukcije za Mechanical structures for
elektronsko opremo electronic equipment
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD
EN 60191-6
NORME EUROPÉENNE
December 2009
EUROPÄISCHE NORM
ICS 31.080.01 Supersedes EN 60191-6:2004

English version
Mechanical standardization of semiconductor devices -
Part 6: General rules for the preparation of outline drawings of surface
mounted semiconductor device packages
(IEC 60191-6:2009)
Normalisation mécanique des dispositifs  Mechanische Normung
à semi-conducteurs - von Halbleiterbauelementen -
Partie 6: Règles générales Teil 6: Allgemeine Regeln
pour la préparation des dessins für die Erstellung
d'encombrement des boîtiers von Gehäusezeichnungen
pour dispositifs à semi-conducteurs von SMD-Halbleitergehäusen
pour montage en surface (IEC 60191-6:2009)
(CEI 60191-6:2009)
This European Standard was approved by CENELEC on 2009-12-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the
Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: Avenue Marnix 17, B - 1000 Brussels

© 2009 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60191-6:2009 E
Foreword
The text of document 47D/736/CDV, future edition 3 of IEC 60191-6, prepared by SC 47D, Mechanical
standardization for semiconductor devices, of IEC TC 47, Semiconductor devices, was submitted to the
IEC-CENELEC parallel vote and was approved by CENELEC as EN 60191-6 on 2009-12-01.
This European Standard supersedes EN 60191-6:2004.
− scope is modified to cover all surface-mounted devices discrete semiconductors with lead count of
greater or equal to 8;
− editorial modifications on several pages; and
− technical revision to ball grid array package (BGA) especially its geometrical drawing format. (two
types of BGA would unify as one type as a result of revising drawing format.)
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
(dop) 2010-09-01
national standard or by endorsement
– latest date by which the national standards conflicting
(dow) 2012-12-01
with the EN have to be withdrawn
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 60191-6:2009 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards indicated:
IEC 60191-3 NOTE  Harmonized as EN 60191-3:1999 (not modified).
ISO 2692 NOTE  Harmonized as EN ISO 2692:2006 (not modified).
__________
- 3 - EN 60191-6:2009
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year

IEC 60191-1 2007 Mechanical standardization of semiconductor EN 60191-1 2007
devices -
Part 1: General rules for the preparation of
outline drawings of discrete devices

IEC 60191-4 1999 Mechanical standardization of semiconductor EN 60191-4 1999
A1 2001 devices - A1 2002
A2 2002 Part 4: Coding system and classification into A2 2002
forms of package outlines for semiconductor
device packages
ISO 1101 2004 Geometrical Product Specifications (GPS) - EN ISO 1101 2005
Geometrical tolerancing - Tolerances of form,
orientation, location and run-out

IEC 60191-6 ®
Edition 3.0 2009-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Mechanical standardization of semiconductor devices –
Part 6: General rules for the preparation of outline drawings of surface mounted
semiconductor device packages
Normalisation mécanique des dispositifs à semi-conducteurs –
Partie 6: Règles générales pour la préparation des dessins d'encombrement des
boîtiers pour dispositifs à semi-conducteurs pour montage en surface

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
W
CODE PRIX
ICS 31.080.01 ISBN 2-8318-1069-6
– 2 – 60191-6 © IEC:2009
CONTENTS
FOREWORD.4
1 Scope.6
2 Normative references .6
3 Terms and definitions .6
4 Design rules .7
5 Dimensions to be specified.8
6 Notes .8
Annex A (informative) Illustration of the rules.12
Annex B (informative) Optional table format.36
Bibliography.38

Figure A.1 – Illustrations of terminal projection zone.13
Figure A.2 – Isometric view of an example of gauge .13
Figure A.3a – Top view .14
Figure A.3b – Side view .14
Figure A.3c – Lead section .14
Figure A.3d – Lead side view.14
Figure A.4 – Pattern of terminal position areas .14
Figure A.5a – Top view .17
Figure A.5b – Side view .17
Figure A.5c – Lead section .17
Figure A.5d – Lead side view.17
Figure A.6 – Pattern of terminal position areas .17
Figure A.7a – Top view .20
Figure A.7b – Side view .20
Figure A.7c – Lead section .20
Figure A.7d – Lead side view.20
Figure A.8 – Pattern of terminal position areas .20
Figure A.9a – Top view .23
Figure A.9b – Side view .23
Figure A.9c – Side view .23
Figure A.9d – Lead shape.23
Figure A.9e – Lead side view.23
Figure A.9f – Lead section .23
Figure A.10 – Pattern of terminal position areas .23
Figure A.11a – Top view .26
Figure A.11b – Side view .26
Figure A.11c – Side view .26
Figure A.11d – Lead section .27
Figure A.11e – Lead shape .27
Figure A.11f – Lead side view.27

60191-6 © IEC:2009 – 3 –
Figure A.12 – Pattern of terminal position areas .27
Figure A.13a – Top View.30
Figure A.13b – Side View.30
Figure A.13c – Bottom view .30
Figure A.14 – Pattern of terminal position areas .30
Figure A.15a – Top view .33
Figure A.15b – Side view .33
Figure A.15c – Bottom view .33
Figure A.16 – Pattern of terminal position areas .33

Table 1 – Dimensions to be specified for Group 1 .9
Table 2 – Dimensions to be specified for Group 2 .10

– 4 – 60191-6 © IEC:2009
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
MECHANICAL STANDARDIZATION
OF SEMICONDUCTOR DEVICES –
Part 6: General rules for the preparation of outline drawings
of surface mounted semiconductor device packages

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the elec
...

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