EN 140400:2003

STANDARDSectional specification: Fixed low power surface mounting (SMD) resistors©
Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljenoReferenčna številkaSIST EN 140400:2004(en)ICS31.040.10

EUROPEAN STANDARD
EN 140400 NORME EUROPÉENNE EUROPÄISCHE NORM
December 2003 CENELEC European Committee for Electrotechnical Standardization Comité Européen de Normalisation Electrotechnique Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2003 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 140400:2003 E
ICS 31.040.10 Supersedes EN 140400:1996 + A1:2001
English version
Sectional specification:
Fixed low power surface mount (SMD) resistors
Spécification intermédiaire:
Résistances fixes à faible dissipation
pour montage en surface (CMS)
Rahmenspezifikation: Oberflächenmontierbare Festwiderstände (SMD) kleiner Belastbarkeit
This European Standard was approved by CENELEC on 2003-09-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member.
This European Standard exists in two official versions (English, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Lithuania, Luxembourg, Malta, Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and United Kingdom.

This European standard was prepared by the CENELEC Technical Committee CLC/TC 40XB, Resistors.
It is based, wherever possible, on the publications of the International Electrotechnical Commission and in particular on IEC 60115-8, Fixed resistors for use in electronic equipment.
This European Standard supersedes EN 140400:1996 + A1:2001.
The text of the draft was submitted to the Unique Acceptance Procedure and was approved by CENELEC as EN 140400 on 2003-09-01.
The following dates were fixed:
- latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2004-09-01
- latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2006-09-01
Annexes designated "normative" are part of the body of the standard.
Annexes designated "informative" are given for information only.
In this standard, Annexes A and C are normative and Annex B is informative.

- 3 - EN 140400:2003 Contents 1 General.4 1.1 Scope.4 1.2 Information to be specified in the detail specification.4 2 Preferred characteristics, ratings and severities for environmental and overload tests.5 2.1 Preferred characteristics.5 2.1.1 Style and dimensions.5 2.1.2 Preferred climatic categories.6 2.1.3 Temperature characteristics and temperature coefficients of resistance.6 2.1.4 Limits of change of resistance.7 2.2 Preferred values of ratings.7 2.2.1 Rated resistance.7 2.2.2 Tolerances on rated resistance.8 2.2.3 Rated dissipation (in the mounted state).8 2.2.4 Limiting element voltage.8 2.2.5 Insulation resistance (insulated styles only).8 2.2.6 Insulation voltage (insulated styles only).8 2.2.7 Combinations of tolerance on rated resistance and temperature coefficient.8 2.3 Preferred test severities for environmental and overload tests.8 2.3.1 Drying.8 2.3.2 Overload (in the mounted state).8 2.3.3 Mounting of components.9 3 Quality assessment procedures.9 3.1 General.9 3.1.1 Structurally similar components.9 3.1.2 Formation of inspection lots.10 3.2 Qualification approval on the basis of the fixed sample size procedure.10 3.3 Quality conformance inspection.10 3.4 Technology approval.10 3.5 Assessed process average procedures.10 3.6 Delayed delivery.10
Annex A (normative) Fixed sample size qualification approval and quality conformance
inspection test schedule for fixed low power surface mount (SMD) resistors.12 Annex B (informative) Letter symbols and abbreviations.18 Annex C (normative) Standards referred to in this detail specification.19

This sectional specification prescribes the preferred values for characteristics and ratings and also the inspection requirements for fixed surface mount resistors of assessed quality. These resistors generally have metallised connecting pads and are intended to be mounted directly on to substrates, for example hybrid integrated circuits or printed boards. It selects from the generic specification, EN 60115-1, the appropriate methods of test to be used in detail specifications derived from this specification.
Associated with this specification are one or more blank detail specifications each reference by an EN number. A blank detail specification which has been completed as specified in 1.2 of this specification forms a detail specification. Such detail specifications may be used for the grant of qualification approval to a resistor and for the performance of quality conformance inspection in accordance with the CECC system. 1.2 Information to be specified in the detail specification
Detail specifications shall be derived from the relevant blank detail specification.
Detail specifications shall not specify requirements inferior to those of the generic, sectional or blank detail specification. When more severe requirements are included, they shall be listed in a subclause of the detail specification and indicated in the test schedules, for example by an asterisk.
The following information shall be specified in each detail specification and the values quoted shall preferably be selected from those given in the appropriate clause of this document.
a) Style and dimensions See 2.1.1 b) Climatic category See 2.1.2 c) Limits of resistance change after testing See 2.1.4 d) Resistance range See 2.2.1 NOTE
Where products approved to the detail specification may have different ranges, the following statement should be made:
The Register of Approval in each style is given in CECC 00 200. e) Tolerances on rated resistance See 2.2.2 NOTE
Where products approved to the detail specification may have different ranges, the following statement should be made:
The Register of Approval in each style is given in CECC 00 200. f) Temperature characteristic of resistance See 2.1.3 The corresponding temperature coefficient of resistance may be quoted for information For preferred combinations of temperature coefficient and tolerance on rated resistance see 2.2.7.

- 5 - EN 140400:2003 g) Rated dissipation See 2.2.3. The mounting conditions are as described in 2.3.3. The information of the derating shall be given either in a diagram or in the form of a statement. The detail specification shall state the maximum dissipation at temperatures other than 70 °C. All break points shall be verified by test. h) Limiting element voltage See 2.2.4. i) Insulation voltage (insulated styles only) See 2.2.17 of EN 60115-1 and 2.2.6 For small size resistors where the dimensions of the test jig given in 4.6 of EN 60115-1 are not adequate, they shall be specified in the detail specification. j) Insulation resistance (insulated styles only) See 2.2.5. For small size resistors where the dimensions of the test jig given in 4.6 of EN 60115-1 are not adequate, they shall be specified in the detail specification. k) Marking Surface mount resistors are generally not marked on the body. However, if some marking is applied to the body, the resistor shall be marked with the rated resistance according to EN 60062, section 3 and as many of the remaining items listed in 2.4.1 of EN 60115-1. All the required information shall be marked on the package. l) Ordering information The detail specification shall specify that the following information is required when ordering resistors:
− the number of the detail specification and style reference; − rated resistance according to EN 60062; − tolerance on rated resistance according to EN 60062; − temperature coefficient of resistance according to Table 2. The detail specification may include additional information (which is not normally required to be verified by the inspection procedure), such as circuit diagrams, curves, drawings and notes needed for the clarification of the detail specification. 2 Preferred characteristics, ratings and severities for environmental and overload tests 2.1 Preferred characteristics The values given in detail specifications shall preferably be selected from the following: 2.1.1 Style and dimensions The preferred styles and dimensions are given in Table 1.

Comparable IEC style: 3514 (L = 3,5 ± 0,2 mm; D = 1,4 ± 0,2 mm) b
Comparable IEC style: 5922 (L = 5,9 ± 0,2 mm; D = 2,2 + 0,3/-0,2 mm) 2.1.2 Preferred climatic categories The resistors covered by the document are classified into climatic categories according to the general rules given in EN 60068-1, Annex A.
The lower and upper category temperature and the duration of the damp heat, steady state test shall be chosen from the following:
-
lower category temperature (LCT): -55 °C; -40 °C; -20 °C and -10 °C;
-
upper category temperature (UCT): +70 °C; +85 °C; +125 °C; +155 °C; +175 °C; +200 °C;
-
duration of damp heat, steady state test: 10 days; 21 days; 56 days.
The severities for the cold and dry heat tests are the lower and upper category temperatures. For some resistors, these temperatures will occur between two of the preferred temperatures given in
EN 60068-2-1 or EN 60068-2-2. In this case, the nearest preferred temperature within the category temperature range of the resistors shall be chosen for this severity.
NOTE
The climatic performance of the resistor is greatly influenced by the circuit board, the assembly method and the final coating. 2.1.3 Temperature characteristics and temperature coefficients of resistance The limits of change in resistance for the temperature characteristic of resistance test are given in Table 2.
Each line in Table 2 gives the preferred temperature coefficient and corresponding temperature characteristic for 20 °C to 70 °C and limits of change in resistance for the measurement of temperature characteristic of resistance (4.8 of EN 60115-1) on the basis of the category temperature ranges for 2.1.2 of this document.

- 7 - EN 140400:2003 Table 2 - Permitted change of resistance Temperature Limit of resistance change (%) coefficient LCT / Reference temperature (°C) Reference temperature / UCT (°C) (ppm/K) Code -55 / 20 -40 / 20 -20 / 20 -10 / 20 20 / 70 20 / 85 20 / 125 20 / 155 20 / 17520 / 200± 250 A ± 1,875 ± 1,5 ± 1 ± 0,75 ± 1,25 ± 1,625 ± 2,625 ± 3,375 ± 3,875 ± 4,5 ± 100 B ± 0,750 ± 0,6 ± 0,4 ± 0,30 ± 0,50 ± 0,650 ± 1,050 ± 1,350 ± 1,550 ± 1,8 ± 50 C ± 0,375 ± 0,3 ± 0,2 ± 0,15 ± 0,25 ± 0,325 ± 0,525 ± 0,675 ± 0,775 ± 0,9 ± 25 D ± 0,188 ± 0,15 ± 0,1 ± 0,075 ± 0,125 ± 0,163 ± 0,263 ± 0,338 ± 0,388 ± 0,45 ± 15 E ± 0,113 ± 0,09 ± 0,06 ± 0,045 ± 0,075 ± 0,098 ± 0,158 ± 0,203 ± 0,233 ± 0,27 ± 10 F ± 0,075 ± 0,060 ± 0,04 ± 0,030 ± 0,050 ± 0,065 ± 0,105 ± 0,135 ± 0,155 ± 0,18 ± 5 G ± 0,038 ± 0,030 ± 0,02 ± 0,015 ± 0,025 ± 0,033 ± 0,053 ± 0,068 ± 0,078 ± 0,09 ± 2 H ± 0,015 ± 0,012 ± 0,008 ± 0,006 ± 0,010 ± 0,013 ± 0,021 ± 0,027 ± 0,031 ± 0,036 ± 1 J ± 0,008 ± 0,006 ± 0,004 ± 0,003 ± 0,005 ± 0,007 ± 0,011 ± 0,014 ± 0,016 ± 0,018 NOTE 1
The combination reference temperature / UCT of 20 °C / 70 °C describes also the temperature characteristic. NOTE 2
Resistors having an upper category temperature of +85 °C need not be measured between 20 °C and 70 °C. NOTE 3
If measurements are required at additional temperatures, these shall be specified in the detail specification. 2.1.4 Limits of change of resistance
Table 3 lists preferred limits for resistance change for all tests listed in the heading. To classify the performance of resistors, they will be assigned to stability classes as listed below.
Table 3 - Limits of change of resistance Stability class EN 60115-1, 4.23 Climatic sequence 4.24 Damp heat, steady state 4.25.3 Endurance at upper category temperature EN 60115-1, 4.25.1 Endurance at 70 °C EN 60115-1, 4.13 Overload 4.18 Resistance to soldering heat 4.19 Rapid change of temperature 4.22 Vibration
1 000 h Extended, 8 000 h 4.33 Substrate bending test 5 ±(5 % R + 0,1 Ω) ±(5 % R + 0,1 Ω) ±(10 % R + 0,1 Ω) ±(1 % R + 0,05 Ω) 2 ±(2 % R + 0,1 Ω) ±(2 % R + 0,1 Ω) ±(5 % R + 0,1 Ω) ±(0,5 % R + 0,05 Ω) 1 ±(1 % R + 0,05 Ω) ±(1 % R + 0,05 Ω) ±(2 % R + 0,05 Ω) ±(0,25 % R + 0,05 Ω) 0,5 ±(0,5 % R + 0,05 Ω) ±(0,5 % R + 0,05 Ω) ±(1 % R + 0,05 Ω) ±(0,1 % R + 0,01 Ω) 0,25 ±(0,25 % R + 0,05 Ω) ±(0,25 % R + 0,05 Ω) ±(0,5 % R + 0,05 Ω) ±(0,05 % R + 0,01 Ω) 0,1 ±(0,1 % R + 0,02 Ω)
±(0,1 % R + 0,02 Ω) ±(0,25 % R + 0,02 Ω) ±(0,05 % R + 0,01 Ω) 0,05 ±(0,05 % R + 0,01 Ω)
±(0,05 % R + 0,01 Ω) ±(0,1 % R + 0,01 Ω) ±(0,025 % R + 0,01 Ω) 0,025 ±(0,025 % R + 0,01 Ω) ±(0,025 % R + 0,01 Ω) ±(0,05 % R + 0,01 Ω) ±(0,01 % R + 0,01 Ω)
2.2 Preferred values of ratings The following values are preferred values to be used in the detail specification. 2.2.1 Rated resistance See EN 60115-1, 2.3.2. and 0 Ω (Jumper).

0/-20 %; 0/-10 % or 20 mΩ
NOTE 1
20 mΩ is intended to be used as the maximum residual resistance value for 0 Ω resistors. NOTE 2
Asymmetric tolerances (e.g. 0/-20 %) are intended to be used for laser trimmable resistors. 2.2.3 Rated dissipation (in the mounted state) The preferred values of rated dissipation are: 0,016 W; 0,032 W; 0,05 W; 0,063 W; 0,1
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