EN 62429:2008

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Rast zanesljivosti - Obremenjevalno preskušanje za odkrivanje zgodnjih odpovedi v edinstvenih kompleksnih sistemih (IEC 62429:2007)Zuverlässigkeitswachstum - Beanspruchungsprüfung auf Frühausfälle in einzelnen komplexen SystemenCroissance de fiabilité - Essais de contraintes pour révéler les défaillances précoces d'un système complexe et uniqueReliability growth - Stress testing for early failures in unique complex systems21.020Characteristics and design of machines, apparatus, equipment03.120.01Kakovost na splošnoQuality in generalICS:Ta slovenski standard je istoveten z:EN 62429:2008SIST EN 62429:2008en01-junij-2008SIST EN 62429:2008SLOVENSKI
STANDARD
EUROPEAN STANDARD EN 62429 NORME EUROPÉENNE
EUROPÄISCHE NORM April 2008
CENELEC European Committee for Electrotechnical Standardization Comité Européen de Normalisation Electrotechnique Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2008 CENELEC -
All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 62429:2008 E
ICS 03.120.01; 03.120.99
English version
Reliability growth -
Stress testing for early failures in unique complex systems (IEC 62429:2007)
Croissance de fiabilité -
Essais de contraintes pour révéler
les défaillances précoces
d'un système complexe et unique (CEI 62429:2007)
Zuverlässigkeitswachstum -
Beanspruchungsprüfung auf Frühausfälle in einzelnen komplexen Systemen (IEC 62429:2007)
This European Standard was approved by CENELEC on 2008-03-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom.
Foreword The text of document 56/1232/FDIS, future edition 1 of IEC 62429, prepared by IEC TC 56, Dependability, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 62429 on 2008-03-01. The following dates were fixed: – latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement
(dop)
2008-12-01 – latest date by which the national standards conflicting
with the EN have to be withdrawn
(dow)
2011-03-01 Annex ZA has been added by CENELEC. __________ Endorsement notice The text of the International Standard IEC 62429:2007 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the standards indicated: IEC 60300-1 NOTE
Harmonized as EN 60300-1:2003 (not modified). IEC 60300-2 NOTE
Harmonized as EN 60300-2:2004 (not modified). IEC 60300-3-1 NOTE
Harmonized as EN 60300-3-1:2004 (not modified). IEC 60706-5 NOTE
Harmonized as EN 60706-5:2007 (not modified). IEC 60812 NOTE
Harmonized as EN 60812:2006 (not modified). IEC 61014 NOTE
Harmonized as EN 61014:2003 (not modified). IEC 61025 NOTE
Harmonized as EN 61025:2007 (not modified). IEC 61078 NOTE
Harmonized as EN 61078:2006 (not modified). IEC 61160 NOTE
Harmonized as EN 61160:2005 (not modified). ISO 9000 NOTE
Harmonized as EN ISO 9000:2005 (not modified). __________
- 3 - EN 62429:2008 Annex ZA (normative)
Normative references to international publications with their corresponding European publications
The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.
NOTE
When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies.
Publication Year Title EN/HD Year
IEC 60050-191 1990 International Electrotechnical Vocabulary (IEV) -
Chapter 191: Dependability and quality of service - -
IEC 60300-3-5 -1) Dependability management -
Part 3-5: Application guide - Reliability test conditions and statistical test principles - -
IEC 60605-2 -1) Equipment reliability testing -
Part 2: Design of test cycles - -
IEC 61163-1 2006 Reliability stress screening -
Part 1: Repairable assemblies manufactured in lots EN 61163-1 2006
IEC 61163-2 -1) Reliability stress screening -
Part 2: Electronic components - -
IEC 61164 -1) Reliability growth - Statistical test and estimation methods EN 61164 20042)
IEC 61710 -1) Power law model - Goodness-of-fit tests and estimation methods - -
1) Undated reference. 2) Valid edition at date of issue. SIST EN 62429:2008

IEC 62429Edition 1.0 2007-11INTERNATIONAL STANDARD NORME INTERNATIONALEReliability growth – Stress testing for early failures in unique complex systems
Croissance de fiabilité – Essais de contraintes pour révéler les défaillances précoces d’un système complexe et unique
INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE WICS 03.120.01;
03.120.99 PRICE CODECODE PRIXISBN 2-8318-9427-1
– 2 – 62429 © IEC:2007 CONTENTS FOREWORD.4
1 Scope.6 2 Normative references.6 3 Terms, definitions, abbreviations and symbols.7 3.1 Terms and definitions.7 3.2 Acronyms.9 3.3 Symbols.9 4 General.10 5 Planning and performing a reliability growth test.13 5.1 Step 1 – Should a reliability growth test be used?.13 5.2 Step 2 – Failure definitions and data collection.13 5.3 Step 3 – Stress levels.14 5.3.1 General.14 5.3.2 Increased operating load.14 5.3.3 Increased environmental stress.15 5.4 Step 4 – Failure analysis and classification of failures.15 5.4.1 General.15 5.4.2 Relevant failures.16 5.4.3 Non-relevant failures.17 5.5 Step 5 – Stop criteria.17 5.5.1 General.17 5.5.2 Method 1 – Fixed testing programs.17 5.5.3 Method 2 – Graphical analysis.18 5.5.4 Method 3 – Success ratio test.19 5.5.5 Method 4 – Estimation of reliability.21 5.5.6 Method 5 – Comparison with acceptable instantaneous failure intensity.22 5.5.7 Method 6 – Estimation of remaining latent faults.24 5.5.8 Method 7 – Reliability indicator testing.24 5.6 Step 6 – Verification of repairs and reliability growth.25 5.7 Step 7 – Reporting and feedback.26
Annex A (informative)
Practical example of method 3 – Success ratio test.27 Annex B (informative)
Practical example of method 5 –
Comparison with acceptable instantaneous failure intensity.28 Annex C (informative)
Practical example of method 6 –
Estimation of remaining latent faults.31
Bibliography.33
Figure 1 – The bathtub curve.12 Figure 2 – Evaluating whether the cumulative failure curve has levelled out.18 Figure 3 – Method 2.19 Figure B.1 – A reliability growth plot of the data from Table B.1.29 SIST EN 62429:2008

62429 © IEC:2007 – 3 –
Table 1 – Probability that a system with failure probability of 0,001
will pass N successive tests.21 Table 2 – Probability that a system with failure probability of 0,000 001
will pass N successive tests.21 Table 3 – Correct and incorrect decisions using reliability indicators.25 Table B.1 – Reliability growth and stopping times for the practical example.28 Table C.1 – Determining when to stop the test.32
– 4 – 62429 © IEC:2007 INTERNATIONAL ELECTROTECHNICAL COMMISSION ____________
RELIABILITY GROWTH –
STRESS TESTING FOR EARLY FAILURES
IN UNIQUE COMPLEX SYSTEMS
FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 62429 has been prepared by IEC technical committee 56: Dependability. The text of this standard is based on the following documents: FDIS Report on voting 56/1232/FDIS 56/1249/RVD
Full information on the voting for the ap
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