EN IEC 60749-12:2018

SLOVENSKI STANDARD
01-maj-2018
1DGRPHãþD
SIST EN 60749-12:2004
Polprevodniški elementi - Mehanske in klimatske preskusne metode - 12. del:
Vibracije, spremenljiva frekvenca (IEC 60749-12:2017)
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration,
variable frequency (IEC 60749-12:2017)
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 12:
Schwingen, variable Frequenz (IEC 60749-12:2017)
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie
12: Vibrations, fréquences variables (IEC 60749-12:2017)
Ta slovenski standard je istoveten z: EN IEC 60749-12:2018
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN IEC 60749-12

NORME EUROPÉENNE
EUROPÄISCHE NORM
March 2018
ICS 31.080.01 Supersedes EN 60749-12:2002
English Version
Semiconductor devices - Mechanical and climatic test methods -
Part 12: Vibration, variable frequency
(IEC 60749-12:2017)
Dispositifs à semiconducteurs - Méthodes d'essais Halbleiterbauelemente - Mechanische und klimatische
mécaniques et climatiques - Partie 12: Vibrations, Prüfverfahren - Teil 12: Schwingen, variable Frequenz
fréquences variables (IEC 60749-12:2017)
(IEC 60749-12:2017)
This European Standard was approved by CENELEC on 2018-01-17. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden,
Switzerland, Turkey and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2018 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN IEC 60749-12:2018 E

European foreword
The text of document 47/2386/CDV, future edition 2 of IEC 60749-12, prepared by IEC/TC 47
"Semiconductor devices" was submitted to the IEC-CENELEC parallel vote and approved by
CENELEC as EN IEC 60749-12:2018.

The following dates are fixed:
(dop) 2018-10-17
• latest date by which the document has to be
implemented at national level by
publication of an identical national
standard or by endorsement
• latest date by which the national (dow) 2021-01-17
standards conflicting with the
document have to be withdrawn
This document supersedes EN 60749-12:2002.

Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.

Endorsement notice
The text of the International Standard IEC 60749-12:2017 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following note has to be added for the standard indicated:

IEC 60068-2-6 NOTE Harmonized as EN 60068-2-6.

IEC 60749-12 ®
Edition 2.0 2017-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Semiconductor devices – Mechanical and climatic test methods –

Part 12: Vibration, variable frequency

Dispositifs à semiconducteurs – Méthodes d’essais mécaniques et climatiques –

Partie 12: Vibrations, fréquences variables

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.080.01 ISBN 978-2-8322-5156-0

– 2 – IEC 60749-12:2017 © IEC 2017
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms and definitions . 5
4 Test apparatus . 5
5 Test method . 5
6 Examination and test measurements . 6
7 Failure criteria . 6
8 Summary . 6
Bibliography . 7

Table 1 – Test conditions . 6

IEC 60749-12:2017 © IEC 2017 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES – MECHANICAL
AND CLIMATIC TEST METHODS –
Part 12: Vibration, variable frequency

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opini
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