EN 61000-4-6:2009

SLOVENSKI STANDARD
01-september-2009
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Electromagnetic compatibility (EMC) -- Part 4-6: Testing and measurement techniques -
Immunity to conducted disturbances, induced by radio-frequency fields
Elektromagnetische Verträglichkeit (EMV) – Teil 4-6: Prüf- und Messverfahren –
Störfestigkeit gegen leitungsgeführte Störgrößen, induziert durch hochfrequente Felder
Compatibilité électromagnétique (CEM) -- Partie 4-6: Techniques d'essai et de mesure -
Immunité aux perturbations conduites, induites par les champs radioélectriques
Ta slovenski standard je istoveten z: EN 61000-4-6:2009
ICS:
33.100.20 Imunost Immunity
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD
EN 61000-4-6
NORME EUROPÉENNE
March 2009
EUROPÄISCHE NORM
ICS 33.100.20 Supersedes EN 61000-4-6:2007 + IS1:2009

English version
Electromagnetic compatibility (EMC) -
Part 4-6: Testing and measurement techniques -
Immunity to conducted disturbances, induced by radio-frequency fields
(IEC 61000-4-6:2008)
Compatibilité électromagnétique (CEM) - Elektromagnetische Verträglichkeit (EMV) -
Partie 4-6: Techniques d'essai Teil 4-6: Prüf- und Messverfahren -
et de mesure - Störfestigkeit gegen leitungsgeführte
Immunité aux perturbations conduites, Störgrößen, induziert
induites par les champs radioélectriques durch hochfrequente Felder
(CEI 61000-4-6:2008) (IEC 61000-4-6:2008)

This European Standard was approved by CENELEC on 2009-03-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the
Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: avenue Marnix 17, B - 1000 Brussels

© 2009 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61000-4-6:2009 E
Foreword
The text of document 77B/571/FDIS, future edition 3 of IEC 61000-4-6, prepared by SC 77B, High
frequency phenomena, of IEC TC 77, Electromagnetic compatibility, was submitted to the IEC-CENELEC
parallel vote and was approved by CENELEC as EN 61000-4-6 on 2009-03-01.
This European Standard supersedes EN 61000-4-6:2007 + corrigendum August 2007 + IS1:2009.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2009-12-01
– latest date by which the national standards conflicting
(dow) 2012-03-01
with the EN have to be withdrawn
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 61000-4-6:2008 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards indicated:
IEC 61000-4-3 NOTE  Harmonized as EN 61000-4-3:2006 (not modified).
CISPR 16-1-2 NOTE  Harmonized as EN 55016-1-2:2004 (not modified).
CISPR 20 NOTE  Harmonized as EN 55020:2007 (not modified).
__________
- 3 - EN 61000-4-6:2009
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year

1)
IEC 60050-161 - International Electrotechnical Vocabulary - -
(IEV) -
Chapter 161: Electromagnetic compatibility

1)
Undated reference.
IEC 61000-4-6
Edition 3.0 2008-10
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-6: Testing and measurement techniques – Immunity to conducted
disturbances, induced by radio-frequency fields

Compatibilité électromagnétique (CEM) –
Partie 4-6: Techniques d'essai et de mesure – Immunité aux perturbations
conduites, induites par les champs radioélectriques

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
XA
CODE PRIX
ICS 33.100.20 ISBN 2-8318-1004-4
– 2 – 61000-4-6 © IEC:2008
CONTENTS
FOREWORD.5
INTRODUCTION.7
1 Scope and object .8
2 Normative references.8
3 Terms and definitions .8
4 General .10
5 Test levels .10
6 Test equipment.11
6.1 Test generator .11
6.2 Coupling and decoupling devices .12
6.2.1 Coupling/decoupling networks (CDNs) .12
6.2.2 Clamp injection devices .13
6.2.3 Direct injection devices .14
6.2.4 Decoupling networks.14
6.3 Verification of the common mode impedance at the EUT port of coupling and
decoupling devices .14
6.3.1 Insertion loss of the 150 Ω to 50 Ω adapters.15
6.4 Setting of the test generator.15
6.4.1 Setting of the output level at the EUT port of the coupling device.15
7 Test set-up for table-top and floor-standing equipment .16
7.1 Rules for selecting injection methods and test points.16
7.1.1 Injection method .16
7.1.2 Ports to be tested .17
7.2 Procedure for CDN injection application .18
7.3 Procedure for clamp injection when the common-mode impedance
requirements can be met .18
7.4 Procedure for clamp injection when the common-mode impedance

requirements cannot be met .19
7.5 Procedure for direct injection .19
7.6 EUT comprising a single unit .19
7.7 EUT comprising several units.20
8 Test procedure .20
9 Evaluation of the test results .21
10 Test report.21
Annex A (normative) Additional information regarding clamp injection.33
Annex B (informative) Selection criteria for the frequency range of application .38
Annex C (informative) Guide for selecting test levels .40
Annex D (informative) Information on coupling and decoupling networks.41
Annex E (informative) Information for the test generator specification .45
Annex F (informative) Test set-up for large EUTs .46
Annex G (informative) Measurement uncertainty of test instrumentation.49
Bibliography .56

Figure 1 – Rules for selecting the injection method .17

61000-4-6 © IEC:2008 – 3 –
Figure 2 – Immunity test to RF conducted disturbances .23
Figure 3 – Test generator set-up .24
Figure 4 – Open circuit waveforms at the EUT port of a coupling device for test level 1.24
Figure 5 – Principle of coupling and decoupling .27
Figure 6 – Principle of coupling and decoupling according to the clamp injection method .27
Figure 7 – Details of set-ups and components to verify the essential characteristics of
coupling and decoupling devices and the 150 Ω to 50 Ω adapters .29
Figure 8 – Set-up for level setting (see 6.4.1) .30
Figure 9 – Example of test set-up with a single unit EUT.31
Figure 10 – Example of a test set-up with a multi-unit EUT .32
Figure A.1 – Circuit for level setting set-up in a 50 Ω test Jig .34
Figure A.2 – The 50 Ω test jig construction .34
Figure A.3 – Construction details of the EM clamp.35
Figure A.4 – Concept of the EM clamp (electromagnetic clamp).36
Figure A.5 – Coupling factor of the EM clamp .36
Figure A.6 – General principle of a test set-up using injection clamps .37
Figure A.7 – Example of the test unit locations on the ground plane when using
injection clamps (top view) .37
Figure B.1 – Start frequency as function of cable length and equipment size.39
Figure D.1 – Example of a simplified diagram for the circuit of CDN-S1 used with
screened cables (see 6.2.1) .42
Figure D.2 – Example of simplified diagram for the circuit of CDN-M1/-M2/-M3 used
with unscreened supply (mains) lines (see 6.2.1.1) .
Figure D.3 – Example of a simplified diagram for the circuit of CDN-AF2 used with
unscreened non-balanced lines (see 6.2.1.3).43
Figure D.4 – Example of a simplified diagram for the circuit of a CDN-T2, used with an
unscreened balanced pair (see 6.2.1.2) .43
Figure D.5 – Example of a simplified diagram of the circuit of a CDN-T4 used with
unscreened balanced pairs (see 6.2.1.2) .44
Figure D.6 – Example of a simplified diagram of the circuit of a CDN-T8 used with
unscreened balanced pairs (see 6.2.1.2) .
...