EN 61000-4-6:2007/IS1:2009
Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields
Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields
Superseded by EN 61000-4-6:2009
Elektromagnetische Verträglichkeit (EMV) - Teil 4-6: Prüf- und Messverfahren - Störfestigkeit gegen leitungsgeführte Störgrößen, induziert durch hochfrequente Felder
Compatibilité électromagnétique (CEM) - Partie 4-6: Techniques d'essai et de mesure - Immunité aux perturbations conduites, induites par les champs radioélectriques
Elektromagnetna združljivost (EMC) - 4-6. del: Preskusne in merilne tehnike - Odpornost proti motnjam po vodnikih, ki jih inducirajo radiofrekvenčna polja * Tolmačenje 5. točke standarda
General Information
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Standards Content (Sample)
SLOVENSKI STANDARD
01-september-2009
(OHNWURPDJQHWQD]GUXåOMLYRVW(0&GHO3UHVNXVQHLQPHULOQHWHKQLNH
2GSRUQRVWSURWLPRWQMDPSRYRGQLNLKNLMLKLQGXFLUDMRUDGLRIUHNYHQþQDSROMD
7ROPDþHQMHWRþNHVWDQGDUGD
Electromagnetic compatibility (EMC) -- Part 4-6: Testing and measurement techniques -
Immunity to conducted disturbances, induced by radio-frequency fields * Interpretation of
Clause 5
Ta slovenski standard je istoveten z: EN 61000-4-6:2007/IS1:2009
ICS:
33.100.20 Imunost Immunity
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
EN 61000-4-6/IS1
Interpretation Sheet 1
EN 61000-4-6:2007
English version
___________
Foreword
This Interpretation Sheet to the European Standard EN 61000-4-6:2007 was prepared by the
Interpretation Panel of the Technical Committee CENELEC TC 210, Electromagnetic compatibility (EMC).
The text of the draft was submitted to the Unique Acceptance Procedure and was approved by CENELEC
on 2008-11-14.
Clause 5 Test levels
Table 1 – Test levels
Question:
How to apply the test levels ?
Interpretation:
The test levels are to be applied as stated in Table 1, or as defined in the product standard, without any
increase to take into account uncertainties in the setting of the output level at the EUT port of the coup
...
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