ASTM E2642-09
(Terminology)Standard Terminology for Scientific Charge-Coupled Device (CCD) Detectors
Standard Terminology for Scientific Charge-Coupled Device (CCD) Detectors
SIGNIFICANCE AND USE
This terminology was drafted to exclude any commercial relevance to any one vendor by using only general terms that are acknowledged by all vendors and should be revised as charge-coupled device (CCD) technology matures. This terminology uses standard explanations, symbols, and abbreviations.
SCOPE
1.1 This terminology brings together and clarifies the basic terms and definitions used with scientific grade cooled charge-coupled device (CCD) detectors, thus allowing end users and vendors to use common documented terminology when evaluating or discussing these instruments. CCD detectors are sensitive to light in the region from 200 to 1100 nm and the terminology outlined in the document is based on the detection technology developed around CCDs for this range of the spectrum.
1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
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Designation:E2642 −09
StandardTerminology for
1
Scientific Charge-Coupled Device (CCD) Detectors
This standard is issued under the fixed designation E2642; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision.Anumber in parentheses indicates the year of last reapproval.A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope values, which are specified in terms of bits that can be
manipulated by the computer.
1.1 This terminology brings together and clarifies the basic
terms and definitions used with scientific grade cooled charge-
anti-blooming structure, n—a structure built into the pixel to
coupled device (CCD) detectors, thus allowing end users and
prevent signal charge above full-well capacity from bloom-
vendors to use common documented terminology when evalu-
ing into adjacent pixels.
ating or discussing these instruments. CCD detectors are
DISCUSSION—Anti-blooming structures bleed off any excess charge
sensitive to light in the region from 200 to 1100 nm and the
before they can overflow the pixel and thereby stop blooming. These
terminologyoutlinedinthedocumentisbasedonthedetection structures can reduce the effective quantum efficiency and introduce
nonlinearity into the sensor.
technology developed around CCDs for this range of the
spectrum.
antireflective (AR) coating, n—a coating applied to either the
1.2 The values stated in SI units are to be regarded as
frontsurfaceoftheCCDorthevacuumwindowsurfaces,to
standard. No other units of measurement are included in this
minimizetheamountofreflectedenergy(orelectromagnetic
standard.
radiation) so as to maximize the amount of transmitted
energy.
2. Referenced Documents
back-illuminated CCD (BI CCD), n—atypeofCCDthathas
2
2.1 ASTM Standards:
been uniformly reduced in thickness on the side away from
E131Terminology Relating to Molecular Spectroscopy
the gate structure (see Fig. 1b) and positioned such that the
photons are detected on that side.
3. Significance and Use
DISCUSSION—A BI CCD leads to an improvement in sensitivity to
3.1 This terminology was drafted to exclude any commer-
incoming photons from the soft X-ray to the near-infrared (NIR)
cial relevance to any one vendor by using only general terms
regions of the spectrum with the highest response in the visible region.
that are acknowledged by all vendors and should be revised as
However, compared to a front-illuminated CCD, it suffers from higher
dark currents and interference fringe formation (etaloning) usually in
charge-coupled device (CCD) technology matures.This termi-
the NIR region. Also called back-thinned CCD.
nologyusesstandardexplanations,symbols,andabbreviations.
binning, n—the process of combining charge from adjacent
4. Terminology
pixels in a CCD prior to read out.
4.1 Definitions:
DISCUSSION—There are two main types of binning: (1) vertical
advanced inverted mode operation (AIMO), n—a commer-
binningand (2)horizontalbinning(seeFig.2).Summingchargeonthe
cial tradename given to a method of reducing the rate of CCD and doing a single readout results in better noise performance
thanreadingoutseveralpixelsandthensummingtheminthecomputer
generation of dark current. Also known as multi-pinned
memory. This is because each act of reading out contributes to noise
phase operation.
(see noise).
analog-to-digital (A/D) converter, n—an electronic circuitry
CCD bias, n—the minimum analog offset added to the signal
in a CCD detector that converts an analog signal into digital
before the A/D converter to ensure a positive digital output
each time a signal is read out.
1
This terminology is under the jurisdiction of ASTM Committee E13 on DISCUSSION—The CCD bias is set at the time of manufacture and
Molecular Spectroscopy and Separation Science and is the direct responsibility of
remains set over the lifetime of the camera.
Subcommittee E13.08 on Raman Spectroscopy.
Current edition approved April 15, 2009. Published May 2009. Originally
charge, n—measure of number of electrons that are contained
approved in 2008. Last previous edition approved in 2008 as E2642–08. DOI:
in a pixel potential well.
10.1520/E2642-09.
2
For referenced ASTM standards, visit the ASTM website, www.astm.org, or
charge-coupled device (CCD), n—a silicon-based semicon-
contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM
ductor chip consisting of a two-dimensional matrix of photo
Standards volume information, refer to the standard’s Document Summary page on
the ASTM website. sensors or pixels (see Fig. 3).
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
1
---------------------- Page: 1 ----------------------
E2642−09
FIG. 1 Cross Sections of Front-Ill
...
This document is not anASTM standard and is intended only to provide the user of anASTM standard an indication of what changes have been made to the previous version. Because
it may not be technically possible to adequately depict all changes accurately, ASTM recommends that users consult prior editions as appropriate. In all cases only the current version
of the standard as published by ASTM is to be considered the official document.
Designation:E2642–08 Designation: E 2642 – 09
Standard Terminology for
1
Scientific Charge-Coupled Device (CCD) Detectors
This standard is issued under the fixed designation E 2642; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope
1.1 This terminology brings together and clarifies the basic terms and definitions used with scientific grade cooled
charge-coupled device (CCD) detectors, thus allowing end users and vendors to use common documented terminology when
evaluating or discussing these instruments. CCD detectors are sensitive to light in the region from 200 to 1100 nm and the
terminology outlined in the document is based on the detection technology developed around CCDs for this range of the spectrum.
1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
2. Referenced Documents
2
2.1 ASTM Standards:
E 131 Terminology Relating to Molecular Spectroscopy
3. Significance and Use
3.1 This terminology was drafted to exclude any commercial relevance to any one vendor by using only general terms that are
acknowledged by all vendors and should be revised as charge-coupled device (CCD) technology matures. This terminology uses
standard explanations, symbols, and abbreviations.
4. Terminology
4.1 Definitions:
advanced inverted mode operation (AIMO), n—a commercial tradename given to a method of reducing the rate of generation
of dark current. Also known as multi-pinned phase operation.
analog-to-digital (A/D) converter, n— an electronic circuitry in a CCD detector that converts an analog signal into digital values,
which are specified in terms of bits that can be manipulated by the computer.
anti-blooming structure, n—a structure built into the pixel to prevent signal charge above full-well capacity from blooming into
adjacent pixels.
DISCUSSION—Anti-blooming structures bleed off any excess charge before they can overflow the pixel and thereby stop blooming. These structures
can reduce the effective quantum efficiency and introduce nonlinearity into the sensor.
antireflective (AR) coating, n—a coating applied to either the front surface of the CCD or the vacuum window surfaces, to
minimize the amount of reflected energy (or electromagnetic radiation) so as to maximize the amount of transmitted energy.
back-illuminated CCD (BI CCD), n— a type of CCD that has been uniformly reduced in thickness on the side away from the
gate structure (see Fig. 1b) and positioned such that the photons are detected on that side.
DISCUSSION—A BI CCD leads to an improvement in sensitivity to incoming photons from the soft X-ray to the near-infrared (NIR) regions of the
spectrum with the highest response in the visible region. However, compared to a front-illuminated CCD, it suffers from higher dark currents and
interference fringe formation (etaloning) usually in the NIR region. Also called back-thinned CCD.
binning, n—the process of combining charge from adjacent pixels in a CCD prior to read out.
DISCUSSION—There are two main types of binning: (1) vertical binning and (2) horizontal binning (see Fig. 2). Summing charge on the CCD and
doing a single readout results in better noise performance than reading out several pixels and then summing them in the computer memory. This is
because each act of reading out contributes to noise (see noise ).
1
This terminology is under the jurisdiction ofASTM Committee E13 on Molecular Spectroscopy and Separation Science and is the direct responsibility of Subcommittee
E13.08 on Raman Spectroscopy.
Current edition approved Nov. 1, 2008. Published December 2008.
Current edition approved April 15, 2009. Published May 2009. Originally approved in 2008. Last previous edition approved in 2008 as E 2642 – 08.
2
For referencedASTM standards, visit theASTM website, www.astm.org, or contactASTM Customer Service at service@astm.org. For Annual Book of ASTM Standards
volume information, refer to the standard’s Document Summary page on the ASTM website.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.
1
---------------------- Page: 1 ----------------------
E2642–09
FIG. 1 Cross Sections of Front-Illuminated (a) and Back-Illuminated (b) CCDs
FIG. 2 Example of a 2 3 2 Vertical and Horizontal
...
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