Standard Test Method for Analysis of Ni-Base Alloys by Wavelength Dispersive X-Ray Fluorescence Spectrometry

SIGNIFICANCE AND USE
5.1 This procedure is suitable for manufacturing control and for verifying that the product meets specifications. It provides rapid, multi-element determinations with sufficient accuracy to assure product quality. The analytical performance data included may be used as a benchmark to determine if similar X-ray spectrometers provide equivalent precision and accuracy, or if the performance of a particular spectrometer has changed.
SCOPE
1.1 This test method covers the analysis of Ni-base alloys by wavelength dispersive X-ray Fluorescence Spectrometry for the determination of the following elements:    
Element  
Composition Range  
Manganese  
0.06 % to 1.6 %  
Phosphorus  
0.008 % to 0.015 %  
Silicon  
0.08 % to 0.6 %  
Chromium  
1.6 % to 22 %  
Nickel  
23 % to 77 %  
Aluminum  
0.20 % to 1.3 %  
Molybdenum  
0.03 % to 10 %  
Copper  
0.007 % to 2.5 %  
Titanium  
0.11 % to 3.0 %  
Niobium  
0.55 % to 5.3 %  
Iron  
0.17 % to 46 %  
Tungsten  
0.06 % to 0.50 %  
Cobalt  
0.04 % to 0.35 %
Note 1: Unless exceptions are noted, ranges can be extended by the use of suitable reference materials. Once these element ranges are extended they must be verified by some experimental means. This could include but not limited to Gage Repeatability and Reproducibility studies, Interlaboratory Round Robin studies, or both. Once these studies are completed, they will satisfy the ISO/IEC 17025 requirements for capability.  
1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.  
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.  
1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

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This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the
Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
Designation: E2465 − 19
Standard Test Method for
Analysis of Ni-Base Alloys by Wavelength Dispersive X-Ray
1
Fluorescence Spectrometry
This standard is issued under the fixed designation E2465; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope 2. Referenced Documents
2
1.1 This test method covers the analysis of Ni-base alloys 2.1 ASTM Standards:
bywavelengthdispersiveX-rayFluorescenceSpectrometryfor E29 Practice for Using Significant Digits in Test Data to
the determination of the following elements: Determine Conformance with Specifications
E135 Terminology Relating to Analytical Chemistry for
Element Composition Range
Manganese 0.06 % to 1.6 %
Metals, Ores, and Related Materials
Phosphorus 0.008 % to 0.015 %
E1361 Guide for Correction of Interelement Effects in
Silicon 0.08 % to 0.6 %
X-Ray Spectrometric Analysis
Chromium 1.6 % to 22 %
Nickel 23 % to 77 %
E1601 Practice for Conducting an Interlaboratory Study to
Aluminum 0.20 % to 1.3 %
Evaluate the Performance of an Analytical Method
Molybdenum 0.03 % to 10 %
E1621 Guide for ElementalAnalysis by Wavelength Disper-
Copper 0.007 % to 2.5 %
Titanium 0.11 % to 3.0 %
sive X-Ray Fluorescence Spectrometry
Niobium 0.55 % to 5.3 %
2.2 Other Documents:
Iron 0.17 % to 46 %
Tungsten 0.06 % to 0.50 %
ISO/IEC 17025 General requirements for the competence of
Cobalt 0.04 % to 0.35 %
testing and calibration laboratories
3
NOTE 1—Unless exceptions are noted, ranges can be extended by the
2.3 U.S. Government Standards:
use of suitable reference materials. Once these element ranges are
10 CFR Part 19 Notices, Instructions and Reports to Work-
extended they must be verified by some experimental means. This could
ers: Inspection and Investigations
include but not limited to Gage Repeatability and Reproducibility studies,
10 CFR Part 20 Standards for Protection Against Radiation
Interlaboratory Round Robin studies, or both. Once these studies are
completed, they will satisfy the ISO/IEC 17025 requirements for capabil-
ity.
3. Terminology
1.2 The values stated in SI units are to be regarded as
3.1 Definitions—For definitions of terms used in this test
standard. No other units of measurement are included in this
method, refer to Terminology E135.
standard.
4. Summary of Test Method
1.3 This standard does not purport to address all of the
safety concerns, if any, associated with its use. It is the
4.1 Thetestspecimenisfinishedtoaclean,uniformsurface,
responsibility of the user of this standard to establish appro-
then irradiated with an X-ray beam of high energy. The
priate safety, health, and environmental practices and deter-
secondary X-rays produced are dispersed by means of crystals
mine the applicability of regulatory limitations prior to use.
and the intensities are measured by suitable detectors at
1.4 This international standard was developed in accor-
selected wavelengths. The outputs of the detectors in voltage
dance with internationally recognized principles on standard-
pulsesarecounted.Radiationmeasurementsaremadebasedon
ization established in the Decision on Principles for the
the time required to reach a fixed number of counts, or on the
Development of International Standards, Guides and Recom-
total counts obtained for a fixed time (generally expressed in
mendations issued by the World Trade Organization Technical
counts or kilocounts per unit time).
Barriers to Trade (TBT) Committee.
2
For referenced ASTM standards, visit the ASTM website, www.astm.org, or
1
This test method is under the jurisdiction of ASTM Committee E01 on contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM
Analytical Chemistry for Metals, Ores, and Related Materials and is the direct Standards volume information, refer to the standard’s Document Summary page on
responsibility of Subcommittee E01.08 on Ni and Co and HighTemperatureAlloys. the ASTM website.
3
Current edition approved Oct. 1, 2019. Published November 2019. Originally Available from the U.S. Nuclear Regulatory Commission, Public Document
approved in 2006. Last previous edition approved in 2013 as E2465–13. DOI: Room, One White Flint North, 11555 Rockville Pike, Rockville, MD 20852-2738,
10.1520/E2465-19. http://www.nrc.gov.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
1

---------------------- Page: 1 ----------------------
E2465 − 19
4.2 Mass fractions of the elements ar
...

This document is not an ASTM standard and is intended only to provide the user of an ASTM standard an indication of what changes have been made to the previous version. Because
it may not be technically possible to adequately depict all changes accurately, ASTM recommends that users consult prior editions as appropriate. In all cases only the current version
of the standard as published by ASTM is to be considered the official document.
Designation: E2465 − 13 E2465 − 19
Standard Test Method for
Analysis of Ni-Base Alloys by Wavelength Dispersive X-Ray
1
Fluorescence Spectrometry
This standard is issued under the fixed designation E2465; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope
1.1 This test method covers the analysis of Ni-base alloys by wavelength dispersive X-ray Fluorescence Spectrometry for the
determination of the following elements:
Element Composition Range
Manganese 0.06 % to 1.6 %
Phosphorus 0.008 % to 0.015 %
Silicon 0.08 % to 0.6 %
Chromium 1.6 % to 22 %
Nickel 23 % to 77 %
Aluminum 0.20 % to 1.3 %
Molybdenum 0.03 % to 10 %
Copper 0.007 % to 2.5 %
Titanium 0.11 % to 3.0 %
Niobium 0.55 % to 5.3 %
Iron 0.17 % to 46 %
Tungsten 0.06 % to 0.50 %
Cobalt 0.04 % to 0.35 %
NOTE 1—Unless exceptions are noted, concentration ranges can be extended by the use of suitable reference materials. Once these element ranges are
extended they must be verified by some experimental means. This could include but not limited to Gage Repeatability and Reproducibility studies and/or
Inter-laboratory studies, Interlaboratory Round Robin studies. studies, or both. Once these studies are completed, they will satisfy the ISOISO/IEC 17025
requirements for capability.
1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility
of the user of this standard to establish appropriate safety safety, health, and healthenvironmental practices and to determine the
applicability of regulatory limitations prior to use.
1.4 This international standard was developed in accordance with internationally recognized principles on standardization
established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued
by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
2. Referenced Documents
2
2.1 ASTM Standards:
E29 Practice for Using Significant Digits in Test Data to Determine Conformance with Specifications
E135 Terminology Relating to Analytical Chemistry for Metals, Ores, and Related Materials
E305 Practice for Establishing and Controlling Atomic Emission Spectrochemical Analytical Curves
E1361 Guide for Correction of Interelement Effects in X-Ray Spectrometric Analysis
E1601 Practice for Conducting an Interlaboratory Study to Evaluate the Performance of an Analytical Method
E1622E1621 Practice for Correction of Spectral Line Overlap in Wavelength-Dispersive X-Ray Guide for Elemental Analysis
by Wavelength Dispersive X-Ray Fluorescence Spectrometry (Withdrawn 2006)
2.2 Other Documents:
ISO 17025ISO/IEC 17025 General requirements for the competence of testing and calibration laboratories
1
This test method is under the jurisdiction of ASTM Committee E01 on Analytical Chemistry for Metals, Ores, and Related Materials and is the direct responsibility of
Subcommittee E01.08 on Ni and Co and High Temperature Alloys.
Current edition approved June 1, 2013Oct. 1, 2019. Published July 2013November 2019. Originally approved in 2006. Last previous edition approved in 20112013 as
ε1
E2465 – 11–13. . DOI: 10.1520/E2465-13.10.1520/E2465-19.
2
For referenced ASTM standards, visit the ASTM website, www.astm.org, or contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM Standards
volume information, refer to the standard’s Document Summary page on the ASTM website.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
1

---------------------- Page: 1 ----------------------
E2465 − 19
3
2.3 U.S. Government Standards:
10 CFR Part 19 Notices, Instructions and Reports to Workers: Inspection and Investigations
10 CFR Part 20 Standards for Protection Against Radiation
3. Terminology
3.1 Definitions—For definitions of terms used in this test method, refer to Terminology E135.
4. Summary of Test Method
4.1 The test specimen is finished to a clean, uniform surface, then irradiated with an X-ray beam of high energy. The secondary
X-rays produced are dispersed by means of crystals and the intensities are measured by suitable detectors at selected wavel
...

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