SIST EN 60862-1:2016

SLOVENSKI STANDARD
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Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
Filtres à ondes acoustiques de surface (OAS) sous assurance de la qualité - Partie 1:
Spécification générique
Ta slovenski standard je istoveten z: EN 60862-1:2015
ICS:
31.160 (OHNWULþQLILOWUL Electric filters
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN 60862-1
NORME EUROPÉENNE
EUROPÄISCHE NORM
November 2015
ICS 31.140 Supersedes EN 60862-1:2003
English Version
Surface acoustic wave (SAW) filters of assessed quality - Part 1:
Generic specification
(IEC 60862-1:2015)
Filtres à ondes acoustiques de surface (OAS) sous Oberflächenwellenfilter (OFW-Filter) mit bewerteter Qualität
assurance de la qualité - Partie 1: Spécification générique - Teil 1: Fachgrundspezifikation
(IEC 60862-1:2015) (IEC 60862-1:2015)
This European Standard was approved by CENELEC on 2015-09-24. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2015 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN 60862-1:2015 E
European foreword
The text of document 49/1151/FDIS, future edition 3 of IEC 60862-1, prepared by IEC/TC 49
"Piezoelectric and dielectric devices for frequency control and selection" was submitted to the
IEC-CENELEC parallel vote and approved by CENELEC as EN 60862-1:2015.
The following dates are fixed:
• latest date by which the document has (dop) 2016-06-24
to be implemented at national level by
publication of an identical national
standard or by endorsement
(dow) 2018-09-24
• latest date by which the national
standards conflicting with the
document have to be withdrawn
This document supersedes EN 60862-1:2003.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such
patent rights.
Endorsement notice
The text of the International Standard IEC 60862-1:2015 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards
indicated:
IEC 60068-2-10:2005 NOTE  Harmonized as EN 60068-2-10:2005 (not modified).
IEC 60862-2:2012 NOTE  Harmonized as EN 60862-2:2012 (not modified).
IEC 60862-3 NOTE  Harmonized as EN 60862-3.
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.

NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here:
www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 60027 series Letter symbols to be used in electrical EN 60027 series
technology
IEC 60050 series International electrotechnical vocabulary - -
IEC 60068-1 2013 Environmental testing -- Part 1: General EN 60068-1 2014
and guidance
IEC 60068-2-1 -  Environmental testing -- Part 2-1: Tests - EN 60068-2-1 -
Test A: Cold
IEC 60068-2-2 -  Environmental testing -- Part 2-2: Tests - EN 60068-2-2 -
Test B: Dry heat
IEC 60068-2-6 -  Environmental testing -- Part 2-6: Tests - EN 60068-2-6 -
Test Fc: Vibration (sinusoidal)
IEC 60068-2-7 -  Basic environmental testing procedures - EN 60068-2-7 -
Part 2-7: Tests - Test Ga and guidance:
Acceleration, steady state
IEC 60068-2-13 -  Basic environmental testing procedures - EN 60068-2-13 -
Part 2-13: Tests - Test M: Low air pressure
IEC 60068-2-14 -  Environmental testing -- Part 2-14: Tests - EN 60068-2-14 -
Test N: Change of temperature
IEC 60068-2-17 1994 Basic environmental testing procedures - EN 60068-2-17 1994
Part 2-17: Tests - Test Q: Sealing
IEC 60068-2-20 -  Environmental testing -- Part 2-20: Tests - EN 60068-2-20 -
Test T: Test methods for solderability and
resistance to soldering heat of devices with
leads
IEC 60068-2-21 -  Environmental testing -- Part 2-21: Tests - EN 60068-2-21 -
Test U: Robustness of terminations and
integral mounting devices
IEC 60068-2-27 -  Environmental testing -- Part 2-27: Tests - EN 60068-2-27 -
Test Ea and guidance: Shock
IEC 60068-2-30 -  Environmental testing -- Part 2-30: Tests - EN 60068-2-30 -
Test Db: Damp heat, cyclic (12 h + 12 h
cycle)
IEC 60068-2-31 -  Environmental testing -- Part 2-31: Tests - EN 60068-2-31 -
Test Ec: Rough handling shocks, primarily
for equipment-type specimens
IEC 60068-2-45 -  Basic environmental testing procedures - EN 60068-2-45 -
Part 2-45: Tests - Test XA and guidance:
Immersion in cleaning solvents
IEC 60068-2-52 -  Environmental testing -- Part 2-52: Tests - EN 60068-2-52 -
Test Kb: Salt mist, cyclic (sodium chloride
solution)
IEC 60068-2-58 -  Environmental testing – Part 2-58: Tests – - -
Test Td: Test methods for solderability,
resistance to dissolution of metallization
and to soldering heat of surface mounting
devices (SMD)
IEC 60068-2-64 -  Environmental testing -- Part 2-64: Tests - EN 60068-2-64 -
Test Fh: Vibration, broadband random and
guidance
IEC 60068-2-78 -  Environmental testing -- Part 2-78: Tests - EN 60068-2-78 -
Test Cab: Damp heat, steady state
IEC 60122-1 -  Quartz crystal units of assessed quality -- EN 60122-1 -
Part 1: Generic specification
IEC 60617 -  Standard data element types with - -
associated classification scheme for
electric components -- Part 4: IEC
reference collection fo standard data
element types and component classes
IEC 60642 -  Piezoelectric ceramic resonators and - -
resonator units for frequency control and
selection - Chapter I: Standard values and
conditions - Chapter II: Measuring and test
conditions
IEC 60695-11-5 -  Fire hazard testing -- Part 11-5: Test EN 60695-11-5 -
flames - Needle-flame test method -
Apparatus, confirmatory test arrangement
and guidance
1)
IEC 60749-28 201X Semiconductor devices - Mechanical and FprEN 60749-28 201X
climatic test methods -- Part 28:
Electrostatic Discharge (ESD) Sensitivity
Testing Direct contact charged device
model (DC-CDM)
IEC 61000-4-2 -  Electromagnetic compatibility (EMC) -- EN 61000-4-2 -
Part 4-2: Testing and measurement
techniques - Electrostatic discharge
immunity test
IEC 61340-3-1 -  Electrostatics -- Part 3-1: Methods for EN 61340-3-1 -
simulation of electrostatic effects - Human
body model (HBM) electrostatic discharge
test waveforms
IEC 61340-3-2 -  Electrostatics -- Part 3-2: Methods for EN 61340-3-2 -
simulation of electrostatic effects -
Machine model (MM) electrostatic
discharge test waveforms
IEC 80000 series Quantities and units EN 80000 series
ISO 80000 series Quantities and units EN ISO 80000 series

1)
To be published.
IEC 60862-1 ®
Edition 3.0 2015-08
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Surface acoustic wave (SAW) filters of assessed quality –

Part 1: Generic specification
Filtres à ondes acoustiques de surface (OAS) sous assurance de la qualité –

Partie 1: Spécification générique

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.140 ISBN 978-2-8322-2863-0

– 22 – IEC 60862-1:2015 © IEC 2015
CONTENTS
FOREWORD . 5
1 Scope . 7
2 Normative references . 7
3 Terms, definitions, units and symbols . 9
3.1 Terms and definitions . 9
3.1.1 General terms . 9
3.1.2 Response characteristics related terms . 12
3.1.3 SAW filter related terms . 16
3.2 Units and symbols. 18
4 Order of precedence of documents . 18
5 Preferred values for ratings and characteristics . 19
5.1 General . 19
5.2 Nominal frequencies . 19
5.2.1 Nominal frequency bands for use in RF applications . 19
5.2.2 Nominal frequency bands for use in IF applications . 19
5.2.3 Nominal frequency values for use in broadcasting IF applications . 19
5.3 Relative attenuation values specifying pass bandwidth for IF applications . 20
5.4 TTE signal suppression . 20
5.5 Operating temperature ranges, in degrees Celsius (°C) . 20
5.6 Climatic category . 20
5.7 Bump severity . 20
5.8 Vibration severity . 21
5.9 Shock severity . 21
5.10 Fine leak rate . 21
6 Marking . 22
6.1 Filter marking . 22
6.2 Package marking . 22
7 Quality assessment procedures . 22
7.1 General . 22
7.2 Primary stage of manufacture . 22
7.3 Structurally similar components . 22
7.4 Subcontracting . 22
7.5 Incorporated components . 23
7.6 Manufacturer’s approval . 23
7.7 Approval procedures . 23
7.7.1 General . 23
7.7.2 Capability approval . 23
7.7.3 Qualification approval . 23
7.8 Procedures for capability approval . 23
7.8.1 General . 23
7.8.2 Eligibility for capability approval . 24
7.8.3 Application for capability approval . 24
7.8.4 Granting of capability approval . 24
7.8.5 Capability manual . 24
7.9 Procedures for qualification approval . 24

IEC 60862-1:2015 © IEC 2015 – 3 –
7.9.1 General . 24
7.9.2 Eligibility for qualification approval . 24
7.9.3 Application for qualification approval . 24
7.9.4 Granting of qualification approval . 24
7.9.5 Quality conformance inspection . 24
7.10 Test procedures . 24
7.11 Screening requirements . 24
7.12 Rework and repair work . 25
7.12.1 Rework . 25
7.12.2 Repair work . 25
7.13 Certified records of released lots . 25
7.14 Validity of release . 25
7.15 Release for delivery . 25
7.16 Unchecked parameters . 25
8 Test and measurement procedures . 25
8.1 General . 25
8.2 Test and measurement conditions . 25
8.2.1 Standard conditions for testing . 25
8.2.2 Precision of measurement . 26
8.2.3 Precautions . 26
8.2.4 Alternative test methods . 26
8.3 Visual inspection . 26
8.3.1 General . 26
8.3.2 Visual test A . 26
8.3.3 Visual test B . 26
8.3.4 Visual test C . 27
8.4 Dimensions and gauging procedures . 27
8.4.1 Dimensions test A . 27
8.4.2 Dimensions test B . 27
8.5 Electrical test procedures . 27
8.5.1 General . 27
8.5.2 Insertion attenuation measurement . 27
8.5.3 Phase measurement . 29
8.5.4 Group delay measurement . 29
8.5.5 Return attenuation measurement . 30
8.5.6 Unwanted signal measurement . 32
8.5.7 Intermodulation distortion measurement . 34
8.5.8 Measurement of insertion attenuation, phase, and group delay
characteristics at specified terminating impedances and at standard
atmospheric conditions . 35
8.5.9 Measurement of insertion attenuation, phase, and group delay
characteristics as a function of temperature . 35
8.5.10 Measurement of return attenuation at specified terminating impedance
and at the standard atmospheric conditions . 35
8.5.11 Measurement of unwanted signals at standard atmospheric conditions . 35
8.5.12 Measurement of intermodulation distortion at standard atmospheric
conditions . 36
8.5.13 Measurement method for the balanced type filter . 36
8.5.14 Insulation resistance . 38

– 44 – IEC 60862-1:2015 © IEC 2015
8.5.15 Voltage proof . 38
8.6 Mechanical and environmental test procedures . 38
8.6.1 Robustness of terminations (destructive) . 38
8.6.2 Sealing tests (non-destructive) . 38
8.6.3 Soldering (solderability and resistance to soldering heat) (destructive) . 39
8.6.4 Rapid change of temperature: severe shock by liquid immersion (non-
destructive). 40
8.6.5 Rapid change of temperature with prescribed time of transition (non-
destructive). 40
8.6.6 Bump (destructive) . 40
8.6.7 Vibration (destructive). 40
8.6.8 Shock (destructive) . 41
8.6.9 Free fall (destructive) . 41
8.6.10 Acceleration, steady state (non-destructive) . 41
8.6.11 Low air pressure (non-destructive) . 42
8.6.12 Dry heat (non-destructive) . 42
8.6.13 Damp heat, cyclic (destructive) . 42
8.6.14 Cold (non-destructive) . 42
8.6.15 Climatic sequence (destructive) . 42
8.6.16 Damp heat, steady state (destructive) . 42
8.6.17 Salt mist cyclic (destructive) . 42
8.6.18 Immersion in cleaning solvents (non-destructive) . 43
8.6.19 Flammability test (destructive) . 43
8.6.20 Electrostatic discharge (ESD) sensitivity test (destructive) . 43
8.7 Endurance test procedure . 43
Bibliography . 44

Figure 1 – Frequency response of a SAW filter . 18
Figure 2 – Insertion attenuation, phase, and group delay measurement . 28
Figure 3 – Return attenuation measurement . 31
Figure 4 – Unwanted signal measurement . 33
Figure 5 – Unwanted signals measured on time domain . 34
Figure 6 – Intermodulation distortion measurement . 35
Figure 7 – Four-port network analyzer measurement for balanced-balanced connection
filter . 37
Figure 8 – Three-port network analyzer measurement for balanced-unbalanced
connection filter . 37

IEC 60862-1:2015 © IEC 2015 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SURFACE ACOUSTIC WAVE (SAW) FILTERS
OF ASSESSED QUALITY –
Part 1: Generic specification
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60862-1 has been prepared by IEC technical committee 49:
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency
control, selection and detection.
This third edition cancels and replaces the second edition published in 2003. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
• the terms and definitions from IEC 60862-2:2002 are included;
• the measurement method for the balanced type filter is described;
• the electrostatic discharge (ESD) sensitivity test procedure is considered.

– 66 – IEC 60862-1:2015 © IEC 2015
The text of this standard is based on the following documents:
FDIS Report on voting
49/1151/FDIS 49/1164/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 60862 series, published under the general title Surface acoustic
wave (SAW) filters of assessed quality, can be found on the IEC web site.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC website under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IEC 60862-1:2015 © IEC 2015 – 7 –
SURFACE ACOUSTIC WAVE (SAW) FILTERS
OF ASSESSED QUALITY –
Part 1: Generic specification
1 Scope
This part of IEC 60862 specifies the methods of test and general requirements for SAW filters
of assessed quality using either capability approval or qualification approval procedures.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for its application. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60027 (all parts), Letter symbols to be used in electrical technology
IEC 60050 (all parts), International Electrotechnical Vocabulary (available at
www.electropedia.org)
IEC 60068-1:2013, Environmental testing – Part 1: General and guidance
IEC 60068-2-1, Environmental testing – Part 2-1: Tests – Test A: Cold
IEC 60068-2-2, Environmental testing – Part 2-2: Tests – Test B: Dry heat
IEC 60068-2-6, Environmental testing – Part 2-6: Tests – Test Fc: Vibration (sinusoidal)
IEC 60068-2-7, Basic environmental testing procedures – Part 2-7: Tests – Test Ga and
guidance: Acceleration, steady state
IEC 60068-2-13, Basic environmental testing procedures – Part 2-13: Tests – Test M: Low air
pressure
IEC 60068-2-14, Environmental testing – Part 2-14: Tests – Test N: Change of temperature
IEC 60068-2-17:1994, Basic environmental testing procedures– Part 2-17: Tests – Test Q:
Sealing
IEC 60068-2-20, Environmental testing – Part 2-20: Tests – Test T: Test methods for
solderability and resistance to soldering heat of devices with leads
IEC 60068-2-21, Environmental testing – Part 2-21: Tests – Test U: Robustness of
terminations and integral mounting devices
IEC 60068-2-27, Environmental testing – Part 2-27: Tests – Test Ea and guidance: Shock
IEC 60068-2-30, Environmental testing – Part 2-30: Tests – Test Db and guidance: Damp
+ 12 h cycle)
heat, cyclic (12 h
– 88 – IEC 60862-1:2015 © IEC 2015
IEC 60068-2-31, Environmental testing – Part 2-31: Tests – Test Ec: Rough handling shocks,
primarily for equipment-type specimens
IEC 60068-2-45, Basic environmental testing procedures – Part 2-45: Tests – Test XA and
guidance: Immersion in cleaning solvents
IEC 60068-2-52, Environmental testing – Part 2-52: Tests – Test Kb: Salt mist, cyclic (sodium
chloride solution)
IEC 60068-2-58, Environmental testing – Part 2-58: Tests – Test Td: Test methods for
solderabilitly, resistance to dissolution of metallization and to soldering heat of surface
mounting devices (SMD)
IEC 60068-2-64, Environmental testing – Part 2-64: Tests – Test Fh: Vibration, broad-band
random and guidance
IEC 60068-2-78, Environmental testing – Part 2-78: Tests – Test Cab: Damp heat, steady
state
IEC 60122-1, Quartz crystal units of assessed quality – Part 1: Generic specification
IEC 60617, Graphical symbols for diagrams (available at http://std.iec.ch/iec60617)
IEC 60642, Piezoelectric ceramic resonators and resonator units for frequency control and
selection – Chapter I: Standard values and conditions – Chapter II: Measuring and test
conditions
IEC 60695-11-5, Fire hazard testing – Part 11-5: Test flames – Needle-flame test method –
Apparatus, confirmatory test arrangement and guidance
IEC 60749-28 , Semiconductor devices – Mechanical and climatic test methods – Part 28:
Electrostatic discharge (ESD) sensitivity testing direct contact charged device model (DC-
CDM)
IEC 61000-4-2, Electromagnetic compatibility (EMC) – Part 4-2: Testing and measurement
techniques – Electrostatic discharge immunity test
IEC 61340-3-1, Electrostatics – Part 3-1: Methods for simulation of electrostatic effects –
Human body model (HBM) electrostatic discharge test waveforms
IEC 61340-3-2, Electrostatics – Part 3-2: Methods for simulation of electrostatic effects –
Machine model (MM) electrostatic discharge test waveforms
IEC 80000 (all parts), Quantities and units
ISO 80000 (all parts), Quantities and units
_____________
To be published.
IEC 60862-1:2015 © IEC 2015 – 9 –
3 Terms, definitions, units and symbols
3.1 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
3.1.1 General terms
3.1.1.1
surface acoustic wave
SAW
acoustic wave, propagating along a surface of an elastic material, whose amplitude decays
exponentially with the depth
3.1.1.2
surface acoustic wave filter
SAW filter
filter characterized by one or more surface acoustic wave transmission line or resonant
elements, where the surface acoustic wave is usually generated by an interdigital transducer
and propagates along a material surface
3.1.1.3
power flow vector
vector, analogous to a Poynting vector, characterizing energy propagation caused by a
surface acoustic wave
3.1.1.4
propagation vector
vector characterizing the phase progression of a wave
3.1.1.5
power flow angle
angle between the direction of the power flow vector and the direction of the propagation
vector
3.1.1.6
SAW beam steering
SAW propagation phenomenon in anisotropic materials described by an angle of powerflow
which is not zero
3.1.1.7
SAW diffraction
phenomenon, analogous to diffraction of light from a source of finite aperture, which causes
SAW beam spreading and wave-front distortion
3.1.1.8
SAW coupling coefficient
k
s
electromechanical coupling coefficient defined as follows:
∆ν
2 s
k = 2
s
ν
s
where
v is the SAW propagation velocity on the free surface;
s
∆v is the change of SAW velocity due to short-circuiting the surface potential;
s
– 1010 – IEC 60862-1:2015 © IEC 2015
∆v /v is the relative velocity change produced by short-circuiting the surface potential from
s s
the open-circuit condition
3.1.1.9
interdigital transducer
IDT
SAW transducer made of two comb-like conductive structures deposited on a piezoelectric
substrate transforming electrical energy into acoustic energy or vice versa
3.1.1.10
unidirectional interdigital transducer
UDT
transducer capable of radiating and receiving surface acoustic waves in or from a single
direction
3.1.1.11
multiphase transducer
interdigital transducer having more than two inputs which are driven in different phases
Note 1 to entry: Usually used as a unidirectional transducer.
3.1.1.12
finger
element of the IDT comb electrode
3.1.1.13
solid finger
finger formed of one element with a period of a half wavelength along the propagation
direction
3.1.1.14
split finger
finger formed of more than one element, so as to produce antireflection properties in a
surface acoustic wave filter
3.1.1.15
dummy finger
passive finger which may be included in order to suppress wave-front distortion
3.1.1.16
bus bar
common electrode which connects individual fingers together and also connects the filter to
an external circuit
3.1.1.17
weighted-response transducer
transducer intended to produce a specified impulse response by design of the structure
Note 1 to entry: See 3.1.1.18 to 3.1.1.23.
3.1.1.18
finger overlap or source strength
length of a finger pair between which only electromechanical interaction is generated
3.1.1.19
apodization
weighting produced by the change of finger overlap over the length of the IDT

IEC 60862-1:2015 © IEC 2015 – 11 –
3.1.1.20
withdrawal weighting
weighting by removal of fingers or sources
3.1.1.21
capacitive weighting
weighting by change of capacitance between electrodes
3.1.1.22
series weighting
weighting by separation of a finger into individual elements having capacitive coupling
between them
Note 1 to entry: The elements may be separated from the bus bar.
3.1.1.23
phase weighting
weighting by change in period of finger arrangement inside the IDT
3.1.1.24
aperture
normalized beamwidth of the SAW generated at the centre frequency and normalized to the
corresponding wavelength
3.1.1.25
multistrip coupler
MSC
array of additional metal strips deposited on a piezoelectric substrate in a direction transverse
to the propagation direction, which transfers acoustic power from one acoustic track to an
adjacent track
3.1.1.26
reflector
SAW reflecting component which normally makes use of the periodic discontinuity provided by
a metal strip array or a grooved array
3.1.1.27
spurious reflection
unwanted signal caused by reflection of SAW or bulk waves from substrate edges or
electrodes
3.1.1.28
triple transit echo
TTE
unwanted signals in a SAW filter which have traversed three times the propagation path
between input and output IDTs caused by reflections from output and input transducers
3.1.1.29
bulk wave signal
unwanted signal caused by bulk wave excitation and detected at the filter output
3.1.1.30
feed through signal
signal of electromagnetic interference
unwanted signal from the input appearing at the filter output due to stray capacitances and
other electromagnetic couplings

– 1212 – IEC 60862-1:2015 © IEC 2015
3.1.1.31
suppression corrugation
grooves in the non-active side of a substrate for suppressing bulk wave signals
3.1.1.32
acoustic absorber
material with high acoustic loss placed on any part of the substrate for acoustic absorption
purposes
3.1.1.33
shielding electrode
electrode intended for the reduction of electromagnetic interference signals
3.1.1.34
interdigitated interdigital transducer
IIDT
SAW transducer made of a combination of three or more interdigital transducers
Note 1 to entry: Same as a muti-IDT in the IEC 60862 series , IIDT(or multi-IDT) resonator filter is used to refer to
SAW resonator filters composed of a number of IDTs for input and output in a line alternately with grating reflectors
at both ends.
3.1.2 Response characteristics related terms
3.1.2.1
nominal frequency
frequency given by the manufacturer or the specification to identify the filter
3.1.2.2
centre frequency
arithmetic mean of the cut-off frequencies
SEE: Figure 1.
3.1.2.3
reference frequency
frequency defined by the specification to which other frequencies may be referred
SEE: Figure 1.
3.1.2.4
cut-off frequency
frequency of the pass band at which the relative attenuation reaches a specified value
SEE: Figure 1.
3.1.2.5
total power loss
logarithmic ratio of the available power at the given source to the power that the SAW filter
delivers to a load impedance under specified operating conditions
3.1.2.6
insertion attenuation
logarithmic ratio of the power delivered directly to the load impedance before insertion of the
filter to the power delivered to the load impedance after insertion of the filter

IEC 60862-1:2015 © IEC 2015 – 13 –
3.1.2.7
nominal insertion attenuation
insertion attenuation at a specified reference frequency
SEE: Figure 1.
3.1.2.8
relative attenuation
difference between the attenuation at a given frequency and the attenuation at the reference
frequency
SEE: Figure 1.
3.1.2.9
pass band
band of frequencies in which the relative attenuation is equal to or less than a specified value
3.1.2.10
pass bandwidth
separation of frequencies between which the relative attenuation is equal to or less than a
specified value
3.1.2.11
pass band ripple
maximum variation in attenuation characteristics within a specified pass band
SEE: Figure 1.
3.1.2.12
TTE ripple
maximum variation in attenuation characteristics caused by TTE within a specified pass band
SEE: Figure 1.
3.1.2.13
minimum insertion attenuation
minimum value of insertion attenuation in the pass band
SEE: Figure 1.
3.1.2.14
maximum insertion attenuation
maximum value of insertion attenuation in the pass band
SEE: Figure 1.
3.1.2.15
stop band
band of frequencies in which the relative attenuation is equal to or greater than a specified
value
3.1.2.16
stop bandwidth
separation of frequencies between which the relative attenuation is equal to or greater than a
specified value
3.1.2.17
stop band rejection
minimum relative attenuation at a specified stop band

– 1414 – IEC 60862-1:2015 © IEC 2015
3.1.2.18
shape factor
ratio of the two bandwidths at specified values of relative attenuation
3.1.2.19
group delay
time equal to the first derivative of the phase shift, in radians, with respect to the angular
frequency
3.1.2.20
nominal group delay
group delay at a specified reference frequency
SEE: Figure 1.
3.1.2.21
group delay distortion
difference between the lowest value and highest value of group delay in a specified frequency
band
SEE: Figure 1.
3.1.2.22
trap frequency
specified frequency at which the relative attenuation is equal to or greater than a specified
value
3.1.2.23
trap attenuation
relative attenuation at a specified trap frequency
3.1.2.24
transition band
band of frequencies between the cut-off frequency and the nearest point of the adjacent stop
band
3.1.2.25
reflectivity
dimensionless measure of the degree of mismatch between two impedances Z and Z :
a b
Z − Z
a b
,
Z + Z
a b
where Z and Z represent, respectively, the input and source impedance or the output and
a b
load impedance
Note 1 to entry: The absolute value of reflectivity is called the reflection coefficient.
3.1.2.26
return attenuation
value of the reflection coefficient given by the sign changed expression in decibels:
Z − Z
a b
– 20 log dB
Z + Z
a b
IEC 60862-1:2015 © IEC 2015 – 15 –
3.1.2.27
reflected wave signal suppression
rela
...