SIST EN 60191-6-21:2010

SLOVENSKI STANDARD
SIST EN 60191-6-21:2010
01-december-2010
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Mechanical standardization of semiconductor devices - Part 6-21: General rules for the
preparation of outline drawings of surface mounted semiconductor device packages -
Measuring methods for package dimensions of small outline packages (SOP) (IEC
60191-6-21:2010)
Mechanische Normung von Halbleiterbauelementen - Teil 6-21: Allgemeine Regeln für
die Erstellung von Gehäusezeichnungen von SMD-Halbleitergehäusen - Messverfahren
für Gehäusemaße von kleinen Gehäusen (SOP) (IEC 60191-6-21:2010)
Normalisation mécanique des dispositifs à semiconducteurs - Part 6-21: Règles
générales pour la préparation des dessins d'encombrement des boîtiers pour dispositifs
à semiconducteurs pour montage en surface - Méthodes de mesure pour les dimensions
des boîtiers de faible encombrement (SOP) (CEI 60191-6-21:2010)
Ta slovenski standard je istoveten z: EN 60191-6-21:2010
ICS:
01.100.25 5LVEHVSRGURþMD Electrical and electronics
HOHNWURWHKQLNHLQHOHNWURQLNH engineering drawings
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
31.240 Mehanske konstrukcije za Mechanical structures for
elektronsko opremo electronic equipment
SIST EN 60191-6-21:2010 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN 60191-6-21:2010

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SIST EN 60191-6-21:2010

EUROPEAN STANDARD
EN 60191-6-21

NORME EUROPÉENNE
October 2010
EUROPÄISCHE NORM

ICS 31.080.01


English version


Mechanical standardization of semiconductor devices -
Part 6-21: General rules for the preparation of outline drawings of surface
mounted semiconductor device packages -
Measuring methods for package dimensions of small outline packages
(SOP)
(IEC 60191-6-21:2010)

Normalisation mécanique des dispositifs à Mechanische Normung von
semiconducteurs - Halbleiterbauelementen -
Part 6-21: Règles générales pour la Teil 6-21: Allgemeine Regeln für die
préparation des dessins d'encombrement Erstellung von Gehäusezeichnungen von
des boîtiers pour dispositifs à SMD-Halbleitergehäusen -
semiconducteurs pour montage en Messverfahren für Gehäusemaße von
surface - kleinen Gehäusen (SOP)
Méthodes de mesure pour les dimensions (IEC 60191-6-21:2010)
des boîtiers de faible encombrement
(SOP)
(CEI 60191-6-21:2010)

This European Standard was approved by CENELEC on 2010-10-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus,
the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy,
Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia,
Spain, Sweden, Switzerland and the United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Management Centre: Avenue Marnix 17, B - 1000 Brussels


© 2010 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60191-6-21:2010 E

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SIST EN 60191-6-21:2010
EN 60191-6-21:2010 - 2 -
Foreword
The text of document 47D/772/FDIS, future edition 1 of IEC 60191-6-21, prepared by SC 47D,
Mechanical standardization for semiconductor devices, of IEC TC 47, Semiconductor devices, was
submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 60191-6-21 on
2010-10-01.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CEN and CENELEC shall not be held responsible for identifying any or all such patent
rights.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2011-07-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2013-10-01
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 60191-6-21:2010 was approved by CENELEC as a European
Standard without any modification.
__________

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SIST EN 60191-6-21:2010
- 3 - EN 60191-6-21:2010
Annex ZA
(normative)

Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.

Publication Year Title EN/HD Year

IEC 60191-4 - Mechanical standardization of semiconductor EN 60191-4 -
devices -
Part 4: Coding system and classification into
forms of package outlines for semiconductor
device packages


IEC 60191-6 - Mechanical standardization of semiconductor EN 60191-6 -
devices -
Part 6: General rules for the preparation of
outline drawings of surface mounted
semiconductor device packages

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SIST EN 60191-6-21:2010

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SIST EN 60191-6-21:2010
IEC 60191-6-21
®
Edition 1.0 2010-08
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE


Mechanical standardization of semiconductor devices –
Part 6-21: General rules for the preparation of outline drawings of surface
mounted semiconductor device packages – Measuring methods for package
dimensions of small outline packages (SOP)

Normalisation mécanique des dispositifs à semiconducteurs –
Partie 6-21: Règles générales pour la préparation des dessins d'encombrement
des boîtiers pour dispositifs à semiconducteurs pour montage en surface –
Méthodes de mesure pour les dimensions des boîtiers de faible encombrement
(SOP)

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
N
CODE PRIX
ICS 31.080.01 ISBN 978-2-88912-168-7
® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale

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SIST EN 60191-6-21:2010
– 2 – 60191-6-21 © IEC:2010
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________

MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES –

Part 6-21: General rules for the preparation of outline drawings
of surface mounted semiconductor device packages –
Measuring methods for package dimensions
of small outline packages (SOP)


FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60191-6-21 has been prepared by subcommittee 47D: Mechanical
standardization of semiconductor devices, of IEC technical committee 47: Semiconductor
devices.
The text of this standard is based on the following documents:
FDIS Report on voting
47D/772/FDIS 47D/776/RVD

Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

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SIST EN 60191-6-21:2010
60191-6-21 © IEC:2010 – 3 –
A list of all the parts in the IEC 60191 series, under the general title Mechanical
standardization of semiconductor devices, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.

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SIST EN 60191-6-21:2010
– 4 – 60191-6-21 © IEC:2010
MECHANICAL STANDARDIZ
...