SIST EN 60325:2005

SLOVENSKI SIST EN 60325:2005

STANDARD
julij 2005
Oprema za zaščito pred sevanjem – Merilniki in monitorji za nadzorovanje
kontaminacije z alfa, beta in alfa/beta (energija beta > 60 keV)
Radiation protection instrumentation – Alpha, beta and alpha/beta (beta energy > 60
keV) contamination meters and monitors
ICS 13.280 Referenčna številka
SIST EN 60325:2005(en)
©  Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno

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EUROPEAN STANDARD EN 60325
NORME EUROPÉENNE
EUROPÄISCHE NORM July 2004

ICS 13.280


English version


Radiation protection instrumentation -
Alpha, beta and alpha/beta (beta energy > 60 keV)
contamination meters and monitors
(IEC 60325:2002, modified)


Instrumentation pour la radioprotection - Strahlenschutz-Messgeräte -
Contaminamètres et moniteurs de Alpha-, Beta- und Alpha/Beta-
contamination alpha, bêta et alpha/bêta (Betaenergie > 60 keV)
(énergie des bêta > 60 keV) Kontaminationsmessgeräte und -monitore
(CEI 60325:2002, modifiée) (IEC 60325:2002, modifiziert)






This European Standard was approved by CENELEC on 2004-05-01. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, Czech
Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Slovakia, Slovenia, Spain, Sweden,
Switzerland and United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: rue de Stassart 35, B - 1050 Brussels


© 2004 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.

Ref. No. EN 60325:2004 E

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EN 60325:2004 – 2 –

Foreword
The text of the International Standard IEC 60325:2002, prepared by SC 45B, Radiation protection
instrumentation, of IEC TC 45, Nuclear instrumentation, together with the common modifications prepared
by the CENELEC BTTF 111-3, Instrumentation for ionizing radiation measurement and protection, was
submitted to the formal vote and was approved by CENELEC as EN 60325 on 2004-05-01.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2005-05-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2007-05-01
Annex ZA has been added by CENELEC.
__________

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– 3 – EN 60325:2004

Endorsement notice
The text of the International Standard IEC 60325:2002 was approved by CENELEC as a European
Standard with agreed common modifications as given below.
COMMON MODIFICATIONS
1 Scope and object
In line 4, delete “γ”.
2 Normative references
Replace the text of Clause 2, Normative references, by:
NOTE Normative references to international publications are listed in Annex ZA (normative).
3 Terms and definitions
3.2 Replace by:
3.2
surface emission rate (of a source)
number of particles of a given type above a given energy emerging from face of the source or
its window per unit time
3.3 Replace by:
3.3
source efficiency
largest of the two quotients, of the surface emission rate by the number of particles of the same
type created or released per unit time either within the source thickness or within the source
saturation layer
3.6 In the second line, replace “sensitive” by “active surface”.
3.9 Delete the first note.
M ” by “v” and “M ” by “v ”.
3.10 Replace “
i t c
3.11 Replace by:
3.11
response (of a radiation measuring assembly)
ratio, under specified conditions, given by the relation:
v
R =
v
c

where ν is the value of the quantity measured by the equipment or assembly under test and ν
c
is the conventionally true value of this quantity

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EN 60325:2004 – 4 –

3.12 Replace the formula by:
vv−
c
I (%) =
x 100
v
c

where ν is the indicated value of a quantity and ν is the conventionally true value of the quantity
c
at the point of measurement.
3.15 Replace the explanation of the first variable for the formula by:
S  is the surface emission rate response (see 3.6);
(nuclide)
3.16 Replace by:
3.16
conventionally true value of a quantity
best estimate of the value of a quantity used for a given purpose
NOTE A conventionally true value is, in general, regarded as sufficiently close to the true value for the difference to be
insignificant for the given purpose. For example, a value determined from a primary or secondary standard or by a
reference instrument, may be taken as the conventionally true value.
7 General test procedures
7.2 Replace reference to “9.3.2” by reference to “9.4.2.2” in the first line.
8 Electrical characteristics
8.1 Replace the title of the subclause by:
8.1 Influence of statistical fluctuations
8.1.1 Replace the second paragraph by:
The coefficient of variation of the indication due to the statistical nature of the radiation detected
shall be less than 0,2.
8.3 Replace the first paragraph by:
The response time and coefficient of variation of the statistical fluctuations are interdependent
characteristics, acceptable limits of which are given in 8.1 and 8.2.
8.5.2 Replace the first sentence by:
For this test, a pulse generator set to give pulses of an amplitude just in excess of the threshold
setting (between 1 and 1,1 times the value of the setting) of the assembly and of a rate within
the range of the assembly as well as a high voltage meter to monitor the high voltage supply to
the detector are required.

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– 5 – EN 60325:2004

Replace the third paragraph by:
Switch the assembly on and take readings of the assembly and the high voltage meter every
10 s from 60 s to 120 s after switching on. 15 min after switching on, take the final values. The
values indicated by the meter up to 1 min and after shall be within ± 10 % of final value and
those at 2 min shall be within ± 5 % of the final value. The reading of the high voltage meter
shall be within ± 2 % of the final value after 1 min and ± 1 % of the final value after 2 min.
8.6.3 In the second sentence of the second paragraph, replace “a small reduction” by “a reduction of
about 25 %”.
9 Radiation characteristics
9.2 Replace the title of the subclause by:
9.2 Surface emission rate response
Replace “instrument efficiency” by “surface emission rate response” in the text of whole
subclause.
9.2.1 Replace the first sentence by:
The measurement of surface emission rate response (see 3.6) is a routine test and shall be
performed on each production assembly.
9.3.2 In the first line, replace “near” by “nearly”.
In the fourth paragraph, replace “radius of this is 25 mm” by “diameter of this is 25 mm”.
9.4.1 In the first line, replace “E” by “I”.
9.4.2.3 Replace “I” by “C” and “i” by “c” as well as “E” by “I” in the text.
Replace the formula by:
 cQ
I (%) = 1 −  × 100
 
Cq
 
9.4.2.4 Replace reference to “9.4.2” by reference to “9.4.1” in two places.
Replace “E” by “I” in three places.
In the last line, replace “20 %” by “± 10 %”.
9.6.3 In the second line of last paragraph, replace “activity” by “surface emission rate”.
9.6.4 Replace the third paragraph by:
The response shall be given in counts per unit time per unit surface emission rate of the alpha
emitter, or activity or activity per unit area per unit surface emission rate of the alpha emitter in
the case of readouts in terms of activity or activity per unit area.

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EN 60325:2004 – 6 –

10 Environmental influences
10.4.1.2 Replace the title of the subclause by:
10.4.1.2 Method of test
10.4.2.2 Replace the second sentence by:
The electromagnetic field strength shall be 10 V/m and in the frequency range of 80 MHz to
1 GHz in steps of 1 % (severity level 3 as described in IEC 61000-4-3).
10.4.5.2 Add “of that document” after the reference to “6.5.2”.
10.4.6.1 In the penultimate line, replace “GHz” by “1 GHz”.
Replace the two first rows by:
Surface emission rate To be stated by 9.2.3.1 9.2.3.2
response manufacturer
Dependence of surface To be stated by 9.3.2 9.3.2
emission rate response manufacturer and < 50 %
on source position of maximum
th
Replace the 7 row by:
Alpha meters, monitors
In the presence of a and detectors: ± 25 %
source of not less than Dual purpose (alpha and
Beta radiation 9.6.3 9.6.3
370 kBq at a distance of beta meters and
not more than 5 mm monitors to be stated by
the manufacturer)
th
Replace the 11 row by:
± 25 %  8.5.1
1 min
± 10 % and ± 2 % of
8.5.2
high voltage
Warm-up (portable
assemblies)
± 20 %  8.5.1
2 min
± 5 % and ± 1 % of high
8.5.2
voltage
th
Replace the 12 row by:
Activity corresponding to
10 times the activity that To remain in excess of
Overload 8.7.2 8.7.2
would give full scale full scale for 5 min
deflection on each range
th
In the 16 row (last page), replace the entry for “Conducted disturbances induced by fast
transient/burst” by:
Conducted disturbances As in 10 % of count rate 10.4.3.2 10.4.3.2
induced by bursts and IEC 61000-4-4
radio frequencies and IEC 61000-4-6
th
Replace the 17 row (last page) by:
Less than 0,1 V/m from
Radiated emissions See 10.4.60 10.4.6.210.4.6.2
1 kHz to 1 GHz

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– 7 – EN 60325:2004

Annex ZA
(normative)

Normative references to international publications
with their corresponding European publications
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year
1)
IEC 60038 (mod) 1983 IEC Standard voltages HD 472 S1 1989
+ corr. February 2002
IEC 60050-151 2001 International Electrotechnical Vocabulary (IEV) - -
Part 151: Electrical and magnetic devices
IEC 60050-393 1996 Chapter 393: Nuclear instrumentation: Physical - -
phenomena and basic concepts
IEC 60050-394 1995 Chapter 394: Nuclear instrumentation: - -
Instruments
IEC 60068-2-27 1987 Basic environmental testing procedures EN 60068-2-27 1993
Part 2-27: Tests – Test Ea and guidance: Shock
IEC 61000-4-2 1995 Electromagnetic compatibility (EMC) EN 61000-4-2 1995
Part 4-2: Testing and measurement techniques -
Electrostatic discharge immunity test
2)
IEC 61000-4-3 (mod) 1995 Part 4-3: Testing and measurement techniques - EN 61000-4-3
1996
Radiated, radio-frequency, electromagnetic field
immunity test
IEC 61000-4-4 1995 Part 4-4: Testing and measurement techniques - EN 61000-4-4 1995
Electrical fast transient/burst immunity test
IEC 61000-4-5 1995 Part 4-5: Testing and measurement techniques - EN 61000-4-5 1995
Surge immunity test
IEC 61000-4-6 1996 Part 4-6: Testing and measurement techniques - EN 61000-4-6 1996
Immunity to conducted disturbances, induced by
radio-frequency fields
IEC 61000-4-11 1994 Part 4-11: Testing and measurement techniques EN 61000-4-11 1994
- Voltage dips, short interruptions and voltage
variations immunity tests
IEC 61187 (mod) 1993 Electrical and electronic measuring equipment - EN 61187 1994
Documentation + corr. March 1995
ISO 7503 series Evaluation of surface contamination - -
———————
1)
The title of HD 472 S1 is: Nominal voltages for low voltage public electricity supply systems.
2)
EN 61000-4-3:1996 is superseded by EN 61000-4-3:2002, which is based on IEC 61000-4-3:2002.

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EN 60325:2004 – 8 –

Publication Year Title EN/HD Year
ISO 8769 1988 Reference sources for the calibration of surface - -
contamination monitors
Beta-emitters (maximum beta energy greater
than 0,15 MeV) and alpha-emitters
ISO 11929-1 2000 Determination of the detection limit and decision - -
threshold for ionizing radiation measurements
Part 1: Fundamentals and application to counting
measurements without the influence of sample
treatment

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NORME CEI
INTERNATIONALE
IEC
60325
INTERNATIONAL
Troisième édition
STANDARD
Third edition
2002-06
Instrumentation pour la radioprotection –
Contaminamètres et moniteurs de
contamination alpha, bêta et alpha/bêta
(énergie des bêta >60 keV)
Radiation protection instrumentation –
Alpha, beta and alpha/beta (beta energy
>60 keV) contamination meters and monitors
© IEC 2002 Droits de reproduction réservés ⎯ Copyright - all rights reserved
Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized in any
utilisée sous quelque forme que ce soit et par aucun procédé, form or by any means, electronic or mechanical, including
électronique ou mécanique, y compris la photocopie et les photocopying and microfilm, without permission in writing from
microfilms, sans l'accord écrit de l'éditeur. the publisher.
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmail@iec.ch  Web: www.iec.ch
CODE PRIX
PRICE CODE W
Commission Electrotechnique Internationale
International Electrotechnical Commission
ɆɟɠɞɭɧɚɪɨɞɧɚɹɗɥɟɤɬɪɨɬɟɯɧɢɱɟɫɤɚɹɄɨɦɢɫɫɢɹ
Pour prix, voir catalogue en vigueur
For price, see current catalogue

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60325 © IEC:2002 – 3 –
CONTENTS
FOREWORD.7
1 Scope and object.9
2 Normative references .11
3 Terms and definitions .13
4 Units.19
5 Classification of assemblies.19
6 General characteristics.21
6.1 Detection assemblies .21
6.2 Ease of decontamination .21
6.3 Sealing.21
6.4 Alarm threshold .21
6.5 Instrument indication .23
6.6 Effective range of measurement .23
6.7 Display.25
6.8 Mechanical shocks .25
6.9 Setting up and maintenance facilities for electronic equipment .25
7 General test procedures .25
7.1 Tests.25
7.2 General .27
7.3 Background .29
7.4 Statistical fluctuations .29
8 Electrical characteristics.29
8.1 Statistical fluctuations .29
8.2 Response time .31
8.3 Interrelationship between response time and statistical fluctuations .33
8.4 Alarm threshold drift .33
8.5 Warm-up time test (for portable assemblies).35
8.6 Resolution time .37
8.7 Overload protection .39
8.8 Operating plateau (for detection assemblies only) .39
8.9 Threshold (for detection assemblies only) .41
9 Radiation characteristics .41
9.1 General .41
9.2 Instrument efficiency .41
9.3 Variation of response over the surface of the detector.43
9.4 Relative intrinsic error .45
9.5 Variation of surface emission rate response with radiation energy.47
9.6 Response to other ionizing radiations.49
9.7 Background count rate .53
10 Environmental influences.55
10.1 Ambient temperature .55
10.2 Relative humidity.57
10.3 Power supply.57
10.4 Electromagnetic compatibility .63

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60325 © IEC:2002 – 5 –
11 Storage .67
11.1 General .67
11.2 Mechanical shock.67
12 Documentation .67
12.1 Identification certificate .67
Table 1 – Reference conditions and standard test conditions .71
Table 2 – Test performed under standard test conditions .73
Table 3 – Test performed with variation of influence quantities .75

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60325 © IEC:2002 – 7 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
RADIATION PROTECTION INSTRUMENTATION –
ALPHA, BETA AND ALPHA/BETA (BETA ENERGY >60 keV)
CONTAMINATION METERS AND MONITORS
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, the IEC publishes International Standards. Their preparation is
entrusted to technical committees; any IEC National Committee interested in the subject dealt with may
participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. The IEC collaborates closely with the International
Organization for Standardization (ISO) in accordance with conditions determined by agreement between the
two organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an
international consensus of opinion on the relevant subjects since each technical committee has representation
from all interested National Committees.
3) The documents produced have the form of recommendations for international use and are published in the form
of standards, technical specifications, technical reports or guides and they are accepted by the National
Committees in that sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject
of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60325 has been prepared by subcommittee 45B: Radiation
protection instrumentation, of IEC technical committee 45: Nuclear instrumentation.
This third edition cancels and replaces the second edition published in 1981. This third edition
constitutes a technical revision.
The text of this standard is based on the following documents:
FDIS Report on voting
45B/354/FDIS 45B/363/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 3.
The committee has decided that the contents of this publication will remain unchanged until
2007. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.

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60325 © IEC:2002 – 9 –
RADIATION PROTECTION INSTRUMENTATION –
ALPHA, BETA AND ALPHA/BETA (BETA ENERGY >60 keV)
CONTAMINATION METERS AND MONITORS
1 Scope and object
This International Standard is applicable to radiation meters and monitors designed for the
direct measurement or the direct detection of surface contamination by alpha and/or beta
radiation emitting nuclides and which comprise at least:
– a detection assembly (comprising γ counter tube, scintillation detector or semiconductor
detector, etc), which may be connected either rigidly or by means of a flexible cable or
incorporated into a single assembly.
– a measurement assembly.
Some meters and monitors consist of detection assemblies and measurement assemblies
where it is possible to separate the detector assembly and use alternative detection
assemblies. Conformity with the standard can either be achieved by:
All combinations of the detection assembly and the measurement assembly conforming to the
requirements of this standard.
or
The detection assembly and the measurement assembly separately conforming to the
relevant parts of this standard in isolation.
NOTE The use of the latter criteria verifies conformance with this standard but does not infer that calibration of a
particular combination of instruments is interchangeable with any other combination.
The use of the latter criteria could allow a purchaser to use combinations of assemblies from different
manufacturers with confidence.
The standard is applicable to:
– alpha surface contamination meters;
– alpha surface contamination monitors;
– beta surface contamination meters;
– beta surface contamination monitors;
– alpha/beta surface contamination meters;
– alpha/beta surface contamination monitors.
The latter two are equipment capable of determining alpha and beta contamination
simultaneously and displaying the measurement of either:
– Alpha (beta, alpha/beta) surface contamination meter
An assembly including one or more radiation detectors and associated assemblies or
basic function units, designed to measure alpha (beta, alpha/beta) surface emission rate
associated with the contamination of the surface under examination.
– Alpha (beta, alpha/beta) surface contamination monitor.
This standard is also applicable to special purpose assemblies and to assemblies specifically
designed for a surface of a particular nature. However, some of the requirements may need to
be amended or supplemented according to the particular requirements applicable to such
assemblies.

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60325 © IEC:2002 – 11 –
If an assembly has been designed to carry out combined functions, it must comply with the
requirements pertaining to these different functions. If, on the other hand, it has been
designed to perform one function, and, in addition, it is also capable of carrying out other
functions, then it must comply with the requirements for the first function, and it would be
desirable for it to comply with requirements pertaining to the others.
This standard is not applicable to radiation monitors or meters designed to measure or detect
beta particles with E < 60 keV.
max
The object of this standard is to lay down standard requirements and to give examples of
acceptable methods, and also to specify general characteristics, general test conditions,
radiation characteristics, electrical safety, environmental characteristics, and the requirements
of the identification certificate for alpha, beta and alpha-beta contamination meters and
monitors.
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60038:1983, IEC standard voltages
IEC 60050-151:2001, International Electrotechnical Vocabulary – Part 151: Electrical and
magnetic devices
IEC 60050(393):1996, International Electrotechnical Vocabulary (IEV) – Chapter 393: Nuclear
instrumentation: Physical phenomena and basic concepts
IEC 60050(394):1995, International Electrotechnical Vocabulary (IEV) – Chapter 394: Nuclear
instrumentation: Instruments
IEC 60068 (all parts): Environmental testing
IEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4: Testing and measuring
techniques – Section 2: Electrostatic discharge immunity test
IEC 61000-4-3:1995, Electromagnetic compatibility (EMC) – Part 4: Testing and measurement
techniques – Section 3: Radiated, radio-frequency, electromagnetic field immunity test
IEC 61000-4-4:1995, Electromagnetic compatibility (EMC) – Part 4: Testing and measurement
techniques – Section 4: Electrical fast transient/burst immunity test
IEC 61000-4-5:1995, Electromagnetic compatibility (EMC) – Part 4: Testing and measurement
techniques – Section 5: Surge immunity test
IEC 61000-4-6:1996, Electromagnetic compatibility (EMC) – Part 4: Testing and measurement
techniques – Section 6: Immunity to conducted disturbances, induced by radio-frequency
fields
IEC 61000-4-11:1994, Electromagnetic compatibility (EMC) – Part 4: Testing and measurement
techniques – Section 11: Voltage dips, short interruptions and voltage variations immunity
tests

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60325 © IEC:2002 – 13 –
IEC 61187:1993, Electrical and electronic measuring equipment – Documentation
ISO 7503 (all parts), Evaluation of surface contamination
ISO 8769:1988, Refe
...