SIST EN 16602-70-02:2015

SLOVENSKI STANDARD
SIST EN 16602-70-02:2015
01-januar-2015
1DGRPHãþD
SIST EN 14091:2004
Zagotavljanje varnih proizvodov v vesoljski tehniki - Preskus s toplotnim
vakuumskim odplinjanjem za presejanje vesoljskih materialov
Space product assurance - Thermal vacuum outgassing test for the screening of space
materials
Raumfahrtproduktsicherung - Thermo-Vakuum-Ausgasungstest für die Auswahl von
Raumfahrtmaterialien
Assurance produit des projets spatiaux - Essai de dégazage sous vide thermique pour
sélection des matériaux d'un projet spatial
Ta slovenski standard je istoveten z: EN 16602-70-02:2014
ICS:
49.025.01 Materiali za letalsko in Materials for aerospace
vesoljsko gradnjo na splošno construction in general
49.140 Vesoljski sistemi in operacije Space systems and
operations
SIST EN 16602-70-02:2015 en,fr,de
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN 16602-70-02:2015


EUROPEAN STANDARD
EN 16602-70-02

NORME EUROPÉENNE

EUROPÄISCHE NORM
October 2014
ICS 49.140 Supersedes EN 14091:2002
English version
Space product assurance - Thermal vacuum outgassing test for
the screening of space materials
Assurance produit des projets spatiaux - Essai de Raumfahrtproduktsicherung - Thermo-Vakuum-
dégazage sous vide thermique pour sélection des Ausgasungstest für die Auswahl von Raumfahrtmaterialien
matériaux d'un projet spatial
This European Standard was approved by CEN on 13 March 2014.

CEN and CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving
this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning
such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CEN and CENELEC
member.

This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CEN and CENELEC member into its own language and notified to the CEN-CENELEC Management Centre
has the same status as the official versions.

CEN and CENELEC members are the national standards bodies and national electrotechnical committees of Austria, Belgium, Bulgaria,
Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece,
Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Slovakia,
Slovenia, Spain, Sweden, Switzerland, Turkey and United Kingdom.






CEN-CENELEC Management Centre:
Avenue Marnix 17, B-1000 Brussels
© 2014 CEN/CENELEC All rights of exploitation in any form and by any means reserved Ref. No. EN 16602-70-02:2014 E
worldwide for CEN national Members and for CENELEC
Members.

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Table of contents
Foreword . 4
Introduction . 5
1 Scope . 6
2 Normative references . 7
3 Terms, definitions and abbreviated terms . 8
3.1 Terms defined in other standards . 8
3.2 Terms specific to the present standard . 8
3.3 Abbreviated terms. 9
4 Test overview . 11
4.1 Test process description . 11
4.2 Acceptance limits . 14
5 Requirements . 15
5.1 General requirements . 15
5.2 Preparatory conditions . 15
5.2.1 Hazards, health and safety precautions . 15
5.2.2 Material samples . 16
5.2.3 Facilities . 18
5.2.4 Equipment . 18
5.3 Test procedure . 20
5.3.1 General requirements . 20
5.3.2 Test process for general spacecraft application . 20
5.4 Reporting of test data . 23
5.5 Acceptance limits . 24
5.5.1 General requirements . 24
5.5.2 Acceptance limits for a retest of the material . 24
5.5.3 Acceptance limits for application of a material . 25
5.6 Quality assurance . 27
5.6.1 Data . 27
5.6.2 Calibration . 27
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5.7 Audit of the Micro-VCM test apparatus . 27
5.7.1 General . 27
5.7.2 Initial audit of the system (acceptance) . 28
5.7.3 Annual regular review (maintenance) of the system . 29
5.7.4 Special review . 30
Annex A (normative) Materials identification card (MIC) - DRD . 31
Annex B (normative) Micro-VCM worksheet - DRD . 34
Annex C (normative) Micro-VCM datasheet - DRD . 37
Annex D (normative) Thermal vacuum outgassing test report - DRD . 40
Annex E (normative) Certificate of conformity for Micro-VCM - DRD . 42
Bibliography . 44

Figures
Figure 4-1: Flow chart of preparation and initial measurements . 11
Figure 4-2: Flow chart of test process . 12
Figure 4-3: Parameters for sample . 13
Figure 4-4: Parameters for collector plate . 13
Figure 5-1: Micro-VCM equipment . 20
Figure A-1 : Example of filled MIC . 33
Figure B-1 : Example of filled in Micro-VCM worksheet . 36
Figure C-1 : Example of filled in Micro-VCM datasheet . 39
Figure E-1 : Example of a certificate of conformity for Micro-VCM . 43

Tables
Table B-1 : Outgassing screening properties . 35

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Foreword
This document (EN 16602-70-02:2014) has been prepared by Technical Committee
CEN/CLC/TC 5 “Space”, the secretariat of which is held by DIN.
This standard (EN 16602-70-02:2014) originates from ECSS-Q-ST-70-02C.
This European Standard shall be given the status of a national standard, either by
publication of an identical text or by endorsement, at the latest by April 2015, and
conflicting national standards shall be withdrawn at the latest by April 2015.
Attention is drawn to the possibility that some of the elements of this document
may be the subject of patent rights. CEN [and/or CENELEC] shall not be held
responsible for identifying any or all such patent rights.
This document supersedes EN 14091:2002.
This document has been prepared under a mandate given to CEN by the
European Commission and the European Free Trade Association.
This document has been developed to cover specifically space systems and has
therefore precedence over any EN covering the same scope but with a wider
domain of applicability (e.g. : aerospace).
According to the CEN-CENELEC Internal Regulations, the national standards
organizations of the following countries are bound to implement this European
Standard: Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France,
Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania,
Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Slovakia,
Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom.
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Introduction
The kinetics of an outgassing process is influenced by vacuum and temperature
conditions.
The method described in this Standard gives reliable data for material screening
use exclusively. The nominal temperature for the screening test, as described in
this standard is 125 °C. Results from the nominal screening test can be used for
the screening of materials that have an operational temperature below 50 °C,
especially if they are exposed for an extended period of time (in the order of
weeks and above).
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1
Scope
This Standard describes a thermal vacuum test to determine the outgassing
screening properties of materials proposed for use in the fabrication of spacecraft
and associated equipment, for vacuum facilities used for flight hardware tests
and for certain launcher hardware.
This Standard covers the following:
• critical design parameters of the test system;
• critical test parameters such as temperature, time, pressure;
• material sample preparation;
• conditioning parameters for samples and collector plates;
• presentation of the test data;
• acceptance criteria;
• certification of test systems and their operators by audits and round robin
tests.
The test described in this Standard is applicable for all unmanned spacecraft,
launchers, payloads, experiments. The test is also valid for external hardware of
inhabited space systems and for hardware to be used in terrestrial vacuum test
facilities.
The outgassing and condensation acceptance criteria for a material depend upon
the application and location of the material and can be more severe than the
standard requirements as given in clause 5.5.3.1.
This standard may be tailored for the specific characteristics and constrains of a
space project in conformance with ECSS-S-ST-00.
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2
Normative references
The following normative documents contain provisions which, through reference
in this text, constitute provisions of this ECSS Standard. For dated references,
subsequent amendments to, or revision of any of these publications do not apply,
However, parties to agreements based on this ECSS Standard are encouraged to
investigate the possibility of applying the more recent editions of the normative
documents indicated below. For undated references, the latest edition of the
publication referred to applies.

EN reference Reference in text Title
EN 16601-00-01 ECSS-S-ST-00-01 ECSS system – Glossary of terms
EN 16602-10 ECSS-Q-ST-10 Space product assurance – Product assurance
management
EN 16602-10-09 ECSS-Q-ST-10-09 Space product assurance – Nonconformance control
system

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3
Terms, definitions and abbreviated terms
3.1 Terms defined in other standards
For the purpose of this Standard, the terms and definitions from ECSS-S-ST-00-01
and ECSS-Q-ST-70 apply.
3.2 Terms specific to the present standard
3.2.1 bakeout
activity of increasing the temperature of hardware to accelerate its outgassing
rates with the intent of reducing the content of molecular contaminants within
the hardware
NOTE Bakeout is usually performed in a vacuum
environment but may be done in a controlled
atmosphere.
3.2.2 cleanroom
room in which the concentration of airborne particles is controlled, and which is
constructed and used in a manner to minimize the introduction, generation, and
retention of particles inside the room, and in which other relevant parameters,
e.g. temperature, humidity, and pressure, are controlled as necessary
[ISO 14644-6]
3.2.3 collected volatile condensable material (CVCM)
quantity of outgassed matter from a test specimen that condenses on a collector
maintained at a specific temperature for a specific time
NOTE CVCM is expressed as a percentage of the initial
specimen mass and is calculated from the
condensate mass determined from the difference in
mass of the collector plate before and after the test.
3.2.4 outgassing
release of gaseous species from a specimen under high vacuum conditions
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3.2.5 quartz crystal microbalance (QCM)
device for measuring small quantities of mass deposited on a quartz crystal using
the properties of a crystal oscillator
3.2.6 recovered mass loss (RML)
total mass loss of the specimen itself without the absorbed water
NOTE 1 The following equation holds:
RML = TML - WVR.
NOTE 2 The RML is introduced because water is not always
seen as a critical contaminant in spacecraft materials.
3.2.7 sticking coefficient
probability that a molecule, colliding with a surface, stays on that surface before
thermal re-evaporation of that molecule occurs
3.2.8 total mass loss (TML)
total mass loss of material outgassed from a specimen that is maintained at a
specific constant temperature and operating pressure for a specified time
NOTE TML is calculated from the mass of the specimen as
measured before and after the test and is expressed
as a percentage of the initial specimen mass.
3.2.9 water vapour regained (WVR)
mass of the water vapour regained by the specimen after the optional
reconditioning step
NOTE WVR is calculated from the differences in the
specimen mass determined after the test for TML
and CVCM and again after exposure to atmospheric
conditions and 65 % relative humidity at room
temperature (22 ± 3) °C.
3.3 Abbreviated terms
For the purpose of this Standard, the abbreviated terms from ECSS-S-ST-00-01
and the following apply:

Abbreviation Meaning
CVCM collected volatile condensable material
EOL end-of-life
IR infrared
MIC materials identification card
PTFE polytetrafluorethylene
QCM quartz crystal microbalance
RH relative humidity
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RML recovered mass loss
RT room temperature
TML total mass loss
VCM volatile condensable material
WVR water vapour regained

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4
Test overview
4.1 Test process description
Figure 4-1 and Figure 4-2 are included as a guide to the test procedures. The
sequence for the test is given in the flow chart (Figure 4-2).


Figure 4-1: Flow chart of preparation and initial measurements

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Figure 4-2: Flow chart of test process
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Wo
RML
Wr
TML
WVR
Wf
Conditioning
Outgassing test
Conditioning
(22 ± 3) °C at
24 h at 125 °C
(22 ± 3) °C at
-3
(55 ± 10) % RH
Vacuum ≤ 10 Pa
(55 ± 10) % RH
0 24 48 72
Time (hours)

Figure 4-3: Parameters for sample
Wg
CVCM
Wp
Bakeout
Outgassing test
Conditioning
Temp > 125 °C
24 h at 125 °C
RT in desiccator
-3
Time ≥ 16 h
Vacuum ≤ 10 Pa
0 % RH
-3
Vacuum ≤ 10 Pa
Collector 25 °C
Time ≥ 24 h
0 24 48
-16
Time (hours)

Figure 4-4: Parameters for collector plate

13
Mass collector
Mass sample

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4.2 Acceptance limits
The validity of this screening test as a means for determining the suitability of a
material for a specific application depends on the environmental conditions
during the lifetime of the material as well as the vicinity of critical or sensitive
surfaces.
Especially, in cases were the expected maximum temperature of a material
during the lifetime is exceeding 50 °C for an extended period of time, the use of
such material are evaluated further through a test programme, mutually agreed
between customer and supplier.
Such programme ensures that the characteristics of the material at the EOL are
still within the specified requirements.
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5
Requirements
5.1 General requirements
a. For those materials that are subjected, during the mission, to temperature
above 125 °C for short period of time (in the order of hours) or above 50 °C
for an extended period of time (in the order of weeks or above), dedicated
tests shall be performed at conditions representative of the real application
(i.e. higher temperature tests).
b. Limits for elevated temperature testing shall be specified case by case.
NOTE 1 For example, limits are specified by the requesting
project.
NOTE 2 For accelerated tests (i.e. higher temperature testing
to take into account long exposures) there can be a
limit, above which, the phenomenon is governed by
different mechanisms other than those that really
interest the material during its on-orbit phase; in
such a case, a different kind of test, like a dynamic
characterization, can be more pertinent.
c. The measurement of contamination potential shall be only used in a
comparative way and is strictly valid only for collectors at 25 °C with
similar sticking coefficients.
d. The data obtained from this test shall not be used for contamination
predictions.
e. Modelling of the outgassing phenomenon shall be based on dynamic test
results only and not on screening results obtained from this Standard.
5.2 Preparatory conditions
5.2.1 Hazards, health and safety precautions
a. The supplier shall take the following health and safety precautions:
1. Control and minimize hazards to personnel, equipment and
materials.
2. Locate items and controls in such a way that personnel are not
exposed to hazards such as burns, electric shock, cutting edges,
sharp points or toxic atmospheres.
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3. Provide warning and caution notes in operations, storage, transport,
testing, assembly, maintenance and repair instructions and
distinctive markings on hazardous items, equipment or facilities for
personal protection.
5.2.2 Material samples
5.2.2.1 Configuration
5.2.2.1.1 Preparation
a. If the material is made up of several items, the sample shall be prepared
according to the process specification or manufacturer’s data.
b. A minimum of 12 g of the material sample shall be prepared.
NOTE The reason of this quantity is to provide
representative samples (10 g for the initial test and
2 g for subsequent retest if needed).
c. The material sample shall be made according to the same process
parameters as the relevant material to be applied for spacecraft use.
NOTE Typical process parameters are curing and baking.
5.2.2.1.2 Material cuttings
a. Three test specimens of each material shall be prepared as follows:
NOTE The material cuttings are in general made by the test
house concerned.
1. For potting materials and bulky adhesives do the following:
(a) Cast them on a PTFE sheet so that a sample of a few
millimetres thick (preferably 2 mm) can be separated from the
PTFE after curing;
(b) Cut the sample into cubes (1,5 mm to 2 mm per side) before
testing.
2. For thin films, coatings, adhesives and adhesive tapes do the
following:
(a) Apply them to a degreased, dried metal foil of known
thickness;
NOTE The metal foil can be aluminium and an aluminium
-3 2
foil is typically 16 µm (4 × 10 g/cm ) thick.
(b) Cut them into strips 10 mm wide;
(c) Roll up them in such a way that the specimen cup is fit;
3. For non-curing adhesives do the following:
(a) Apply them between thin metal foils.
(b) Prepare them as specified in 5.2.2.1.2a.2.
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(c) If the substrate is non-metallic, submit a sample of that
substrate for separate testing;
4. When materials are prepared on substrates, submit a substrate
sample with the material sample.
5. When primers are applied, test the complete system.
6. Cut materials such as wires, cables or sleeves, the smallest
dimension of which is less that 1,5 mm, into pieces 10 mm long.
7. Test materials containing metal parts without the metal parts or, if
this is not possible, state the ratio of metal mass to total mass.
NOTE Typical materials with metal parts are electrical
wires or connectors.
8. Place liquids and greases in a specimen cup and state the ratio of
filler mass to total mass if a filler is used.
NOTE In some cases, it can be more practical to mix the
liquid with a neutral filler powder such as silica
before placing it in a cup.
5.2.2.2 Cleaning
a. The cleaning and other treatment of the samples shall be the same as that
applied to the flight hardware, which the sample is intended to represent,
prior to integration into the spacecraft.
b. The supplier shall test the materials as received without any further
cleaning or treatment, unless otherwise specified by the customer.
5.2.2.3 Handling and storage
a. Samples shall only be handled with clean nylon or lint-free gloves.
b. Samples shall be stored in a controlled area, with an ambient temperature
of (22 ± 3) °C and relative humidity of (55 ± 10) %.
c. Polyethylene or polypropylene bags or sheets shall be used.
NOTE This is to shield coated surfaces from contact.
d. The polyethylene or polypropylene-wrapped workpieces shall be packed
in clean, dust- and lint-free material.
NOTE This is to avoid physical damage.
e. Limited-life materials shall be labelled with their shelf lives and dates of
manufacture or date of delivery if date of manufacture is not known.
5.2.2.4 Identification of materials
a. The customer shall accompany materials submitted for testing by a
completed materials identification card in conformance with Annex A.
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5.2.3 Facilities
5.2.3.1 Cleanliness
a. The supplier shall keep the work area clean from dust as achieved with
normal house-keeping.
NOTE A cleanroom environment is not necessary.
b. The supplier shall filter the air used for ventilation.
NOTE This is to prevent contamination of the sample.
5.2.3.2 Environmental conditions
a. During the conditioning of the prepared material samples, the supplier
shall ensure an ambient temperature of (22 ± 3) °C with a relative humidity
of (55 ± 10) %.
5.2.4 Equipment
5.2.4.1 Test equipment
a. The supplier shall use measuring instruments which are capable of
monitoring the following items:
1. Temperature from 10 °C to 130 °C with ± 1 °C accuracy.
2. Humidity from 40 % to 80 % RH with ± 1 % RH accuracy.
-4
Pa with ± 10 % accuracy.
3. Vacuum at 10
b. If requested, the supplier shall use an infrared spectrometer of such a
sensitivity that an infrared spectrum of the condensed contaminants in the
range 2,5 µm to 16 µm is obtained.
-6 -6
c. The supplier shall use a microbalance from 1 × 10 g to 5 × 10 g.
d. The supplier shall use a vacuum oven able to guarantee a maximum
pressure of 1 Pa and a temperature of at least 150 °C.
5.2.4.2 Special apparatus
a. The apparatus shall consist of an insert located in a common-type vacuum
system suitably dimensioned with respect to the insert, able to
accommodate the necessary feedthroughs.
b. The insert should consist of a bar (or bars) accommodating a minimum of 6
regularly spaced specimen compartments 16 mm ± 0,1 mm in diameter and
9,6 mm ± 0,8 mm deep.
c. The distance between two adjacent specimen compartments shall be
50 mm ± 0,8 mm.
d. The open ends of the specimen compartments shall face the collector plates
on the cooling plate(s).
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e. The dimensions of the open ends shall be as follows:
1. 6,3 mm ± 0,1 mm in diameter,
2. 12,7 mm ± 0,3 mm long.
f. The cooling plate(s) shall be provided with attachments ensuring a good
thermal contact with the collector plates.
g. The distance between the open ends of the specimen compartments and
the cooling plate(s) shall be 13,45 mm ± 0,1 mm.
h. Cross contamination between different compartments shall be reduced by
a separator plate(s) 0,75 mm ± 0,1 mm thick and perforated with
11,1 mm ± 0,1 mm diameter holes in front of each specimen compartment.
i. The separator plate(s) shall be situated between the heater bar(s) and the
cooling plate(s) at a distance of 9,65 mm ± 0,1 mm from the latter.
j. Standard collectors shall be made of chromium-plated aluminium plates
33,0 mm ± 0,1 mm in diameter and 0,65 mm ± 0,1 mm thick.
k. Standards collectors shall be replaceable by sodium-chloride or
germanium collector plates.
NOTE Infrared analysis of the condensed materials can be
performed when sodium-chloride or germanium
collectors are used instead of the standard ones.
l. Alignment between the hot bar and the cooling plate(s) shall be verified
(see Figure 5-1)
-4
m. A pressure of 10 Pa shall be reached within one hour with an unloaded
system.
n. The vacuum system shall be checked to be oil free during each test with
the aid of three blank collector plates placed at random.
o. The capability to maintain the heater bars and the cooling plates at
temperatures other than those mentioned further in this Standard shall be
demonstrated.
NOTE It is advisable to make provision for a bakeout, at a
temperature of 25 °C above the maximum test
temperature, of the vacuum system as a means of
cleaning it in the event of heavy contamination.
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Figure 5-1: Micro-VCM equipment
5.3 Test procedure
5.3.1 General requirements
a. The supplier shall perform the screening test with the minimal and
nominal temperature of 125 °C.
NOTE This outgassing temperature can be raised to a
mutual agreed level between the customer and the
supplier.
5.3.2 Test process for general spacecraft
application
5.3.2.1 Cleaning of cups and collector plates
a. The supplier shall clean specimen cups and collector plates with a
compatible solvent.
NOTE Solvent compatibilities with different materials are
provided in ECSS-Q-ST-70-01.
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5.3.2.2 Conditioning of cups and collector plates
a. The supplier shall condition the specimen cups for at least 24 hours in an
environment of (22 ±3) °C and (55 ± 10) % RH.
b. The supplier shall perform a bakeout of the collector plates for at least
...