SIST EN 60393-1:2009

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Potenciometri za elektronsko opremo - 1. del: Rodovna specifikacija (IEC 60393-1:2008)Potentiometer zur Verwendung in Geräten der Elektronik - Teil 1: Fachgrundspezifikation (IEC 60393-1:2008)Potentiomètres utilisés dans les équipements électroniques - Partie 1: Spécification générique (CEI 60393-1:2008)Potentiometers for use in electronic equipment - Part 1: Generic specification (IEC 60393-1:2008)31.040.20Potenciometri, spremenljivi uporiPotentiometers, variable resistorsICS:Ta slovenski standard je istoveten z:EN 60393-1:2009SIST EN 60393-1:2009en01-oktober-2009SIST EN 60393-1:2009SLOVENSKI
STANDARD



SIST EN 60393-1:2009



EUROPEAN STANDARD EN 60393-1 NORME EUROPÉENNE
EUROPÄISCHE NORM July 2009
CENELEC European Committee for Electrotechnical Standardization Comité Européen de Normalisation Electrotechnique Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: Avenue Marnix 17, B - 1000 Brussels
© 2009 CENELEC -
All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60393-1:2009 E
ICS 31.040.20 Supersedes CECC 41 000:1976
English version
Potentiometers for use in electronic equipment -
Part 1: Generic specification (IEC 60393-1:2008)
Potentiomètres utilisés
dans les équipements électroniques -
Partie 1: Spécification générique (CEI 60393-1:2008)
Potentiometer zur Verwendung
in Geräten der Elektronik -
Teil 1: Fachgrundspezifikation (IEC 60393-1:2008)
This European Standard was approved by CENELEC on 2009-07-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom.
SIST EN 60393-1:2009



EN 60393-1:2009 - 2 -
Foreword The text of document 40/1897/FDIS, future edition 3 of IEC 60393-1, prepared by IEC TC 40, Capacitors and resistors for electronic equipment, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 60393-1 on 2009-07-01. This European Standard supersedes CECC 41 000:1976. The following dates were fixed: – latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement
(dop)
2010-04-01 – latest date by which the national standards conflicting
with the EN have to be withdrawn
(dow)
2012-07-01 Annex ZA has been added by CENELEC. __________ Endorsement notice The text of the International Standard IEC 60393-1:2008 was approved by CENELEC as a European Standard without any modification. __________
SIST EN 60393-1:2009



- 3 - EN 60393-1:2009 Annex ZA (normative)
Normative references to international publications with their corresponding European publications
The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.
NOTE
When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies.
Publication Year Title EN/HD Year
IEC 60027-1 -1) Letter symbols to be used in electrical technology -
Part 1: General EN 60027-1 20062)
IEC 60050 Series International Electrotechnical Vocabulary (IEV) - -
IEC 60062 -1) Marking codes for resistors and capacitors EN 60062 + corr. January
20052) 2007
IEC 60063 A1 A2 1963 1967 1977 Preferred number series for resistors and capacitors - -
IEC 60068-1 + corr. October
+ A1 1988 1988 1992 Environmental testing -
Part 1: General and guidance
EN 60068-1
1994
IEC 60068-2-1 A1 A2 1990 1993 1994 Environmental testing -
Part 2: Tests - Tests A: Cold EN 60068-2-13) A1 A2
1993 1993 1994
IEC 60068-2-2 A1 A2 1974 1993 1994 Environmental testing -
Part 2: Tests - Tests B: Dry heat EN 60068-2-24)
A1 A2
1993 1993 1994
IEC 60068-2-6 -1) Environmental testing -
Part 2: Tests - Test Fc: Vibration (sinusoidal) EN 60068-2-6 20082)
IEC 60068-2-13 -1) Environmental testing -
Part 2: Tests - Test M: Low air pressure EN 60068-2-13 19992)
IEC 60068-2-14 + A1 1984 1986 Environmental testing -
Part 2: Tests - Test N: Change of
temperature
EN 60068-2-14
1999
IEC 60068-2-17 -1) Environmental testing -
Part 2: Tests - Test Q: Sealing EN 60068-2-17 19942)
IEC 60068-2-20 + A2 1979 1987 Environmental testing -
Part 2: Tests - Test T: Soldering
HD 323.2.20 S35)
1988
IEC 60068-2-21 -1) Environmental testing -
Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices EN 60068-2-21 20062)
1)
Undated reference. 2)
Valid edition at date of issue. 3)
EN 60068-2-1 is superseded by EN 60068-2-1:2007, which is based on IEC 60068-2-1:2007. 4)
EN 60068-2-2 includes supplement A:1976 to IEC 60068-2-2; it is superseded by EN 60068-2-2:2007, which is based on IEC 60068-2-2:2007 5)
HD 323.2.20 S3 is superseded by EN 60068-2-20:2008, which is based on IEC 60068-2-20:2008. SIST EN 60393-1:2009



EN 60393-1:2009 - 4 -
Publication Year Title EN/HD Year
IEC 60068-2-27 -1) Environmental testing -
Part 2: Tests - Test Ea and guidance: Shock EN 60068-2-27 20092)
IEC 60068-2-29 -1) Environmental testing -
Part 2: Tests - Test Eb and guidance: Bump EN 60068-2-296)
19932)
IEC 60068-2-30 -1) Environmental testing -
Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle) EN 60068-2-30 20052)
IEC 60068-2-45 A1 1980 1993 Environmental testing -
Part 2: Tests - Test XA and guidance: Immersion in cleaning solvents EN 60068-2-45 A1 1992 1993
IEC 60068-2-58 -1) Environmental testing -
Part 2-58: Tests - Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD) EN 60068-2-58 + corr. December
20042) 2004
IEC 60068-2-78 -1) Environmental testing -
Part 2-78: Tests - Test Cab: Damp heat, steady state EN 60068-2-78 20012)
IEC 60410 -1) Sampling plans and procedures
for inspection by attributes - -
IEC 60617 Data-base Graphical symbols for diagrams - -
IEC 60915 -1) Capacitors and resistors for use in electronic equipment - Preferred dimensions of shaft ends, bushes and for the mounting of single-hole, bush-mounted, shaft-operated electronic components EN 60915 + corr. April
20072) 2009
IEC 61249-2-7 -1) Materials for printed boards and other interconnecting structures -
Part 2-7: Reinforced base materials, clad and unclad - Epoxide woven E-glass laminated sheet of defined flammability (vertical burning test), copper-clad EN 61249-2-7 + corr. September 20022) 2005
IEC QC 001002-3 -1) IEC Quality Assessment System
for Electronic Components (IECQ) - Rules of Procedure -
Part 3: Approval procedures - -
IEC QC 001005 -1) IEC Quality Assessment System
for Electronic Components (IECQ) - Register of films, products and services approved under the IECQ system, including ISO 9000 - -
ISO 1000 -1) SI units and recommendations for the use of their multiples and of certain other units - -
ISO 9000 -1) Quality management systems -
Fundamentals and vocabulary EN ISO 9000 20052)
6)
EN 60068-2-29 is superseded by EN 60068-2-27:2009, which is based on IEC 60068-2-27:2008. SIST EN 60393-1:2009



IEC 60393-1Edition 3.0 2008-05INTERNATIONAL STANDARD
Potentiometers for use in electronic equipment –
Part 1: Generic specification INTERNATIONAL ELECTROTECHNICAL COMMISSION XDICS 31.040.20 PRICE CODEISBN 2-8318-9748-3
SIST EN 60393-1:2009



– 2 – 60393-1 © IEC:2008(E) CONTENTS FOREWORD.6
1 General.8 1.1 Scope.8 1.2 Normative references.8 2 Technical data.10 2.1 Units and symbols.10 2.2 Terms and definitions.10 2.3 Preferred values.28 2.4 Marking.28 3 Assessment procedures.28 4 Test and measurement procedures.28 4.1 General.28 4.2 Standard atmospheric conditions.29 4.3 Drying.30 4.4 Visual examination and check of dimensions.30 4.5 Continuity (except for continuously rotating potentiometers).32 4.6 Element resistance.32 4.7 Terminal resistance.33 4.8 Maximum attenuation.33 4.9 Resistance law (conformity).33 4.10 Matching of the resistance law (for ganged potentiometers only).34 4.11 Switch contact resistance (when appropriate).34 4.12 Voltage proof (insulated styles only).38 4.13 Insulation resistance (insulated styles only).39 4.14 Variation of resistance with temperature.40 4.15 Rotational noise.42 4.16 Contact resistance at low-voltage levels.44 4.17 Setting ability (adjustability) and setting stability.45 4.18 Starting torque.49 4.19 Switch torque.49 4.20 End stop torque.50 4.21 Locking torque.50 4.22 Thrust and pull on shaft.51 4.23 Shaft run-out.52 4.24 Lateral run-out.53 4.25 Pilot (or spigot) diameter run-out.53 4.26 Shaft end play.54 4.27 Backlash.55 4.28 Dither.57 4.29 Output smoothness.58 4.30 Robustness of terminals.59 4.31 Sealing.60 4.32 Solderability.61 4.33 Resistance to soldering heat.61 4.34 Change of temperature.62 SIST EN 60393-1:2009



60393-1 © IEC:2008(E) – 3 – 4.35 Vibration.63 4.36 Bump.64 4.37 Shock.64 4.38 Climatic sequence.65 4.39 Damp heat, steady state.67 4.40 Mechanical endurance (potentiometers).68 4.41 AC endurance testing of mains switches on capacitive loads.71 4.42 DC endurance testing of switches.73 4.43 Electrical endurance.74 4.44 Component solvent resistance.78 4.45 Solvent resistance of the marking.78 4.46 Microlinearity.79 4.47 Mounting (for surface mount potentiometers).81 4.48 Shear (adhesion) test.83 4.49 Substrate bending test (formerly bond strength of the end face plating).83 4.50 Solderability (for surface mount potentiometers).83 4.51 Resistance to soldering heat (for surface mount potentiometers).83
Annex A (normative)
Rules for the preparation of detail specifications for capacitors
and resistors for electronic equipment.84 Annex B (normative)
Interpretation of sampling plans and procedures as described
in IEC 60410 for use within the IEC Quality Assessment System
for Electronic Components.85 Annex C (normative)
Measuring methods for rotational noise.86 Annex D (normative)
Apparatus for measuring mechanical accuracy.89 Annex E (normative)
Measuring method for microlinearity.90 Annex F (normative)
Preferred dimensions of shaft ends, bushes and for the mounting hole, bush-mounted, shaft-operated electronic components.92 Annex G (informative)
Example of common potentiometer’s law.93 Annex H (normative)
Quality assessment procedures.95
Figure 1 – Shaft-sealed potentiometer.14 Figure 2 – Shaft- and panel-sealed potentiometer.14 Figure 3 – Fully sealed potentiometer.14 Figure 4 – Linear law.16 Figure 5 – Logarithmic law.16 Figure 6 – Inverse logarithmic law.16 Figure 7 – Output ratio.17 Figure 8 – Loading error.18 Figure 9 – Total mechanical travel (or angle of rotation).18 Figure 10 – Conformity.20 Figure 11 – Absolute conformity.20 Figure 12 – Linearity.21 Figure 13 – Independent linearity.22 Figure 14 – Zero-based linearity.23 Figure 15 – Absolute linearity.24 SIST EN 60393-1:2009



– 4 – 60393-1 © IEC:2008(E) Figure 16 – Terminal based linearity.25 Figure 17 – Effective tap width.25 Figure 18 – Backlash.27 Figure 19 – Example of insulation resistance and voltage proof
test jig for surface mount potentiometers.39 Figure 20 – Test circuit contact resistance.45 Figure 21 – Measuring circuit for setting ability (as divider).46 Figure 22 – Measuring circuit for setting ability (as current controller).47 Figure 23 – Shaft run-out.52 Figure 24 – Lateral run-out.53 Figure 25 – Pilot (spigot) diameter run-out.54 Figure 26 – Shaft end play.55 Figure 27 – Test circuit for measurement of backlash.56 Figure 28 – Measurement of backlash.57 Figure 29 – Test circuit for measurement of output smoothness.58 Figure 30 – The circuit for continuous monitoring of the contact resistance.71 Figure 31 – Test circuit a.c. endurance testing.72 Figure 32 – Test circuit d.c. endurance testing.73 Figure 33 – Example of microlinearity measurement.79 Figure 34 – Block diagram of a circuit for evaluation of microlinearity.80 Figure 35 – Example of simultaneous evaluation of linearity and microlinearity.80 Figure 36 – Suitable substrate for mechanical and electrical tests
(may not be suitable for impedance measurements).82 Figure 37 – Suitable substrate for electrical tests.82 Figure C.1 – Measuring circuit for method A, rotational noise.87 Figure C.2 – Measuring circuit for CRV.87 Figure C.3 – Measuring circuit for ENR.88 Figure E.1 – Block diagram of a digital reference unit
(synthetic high-precision master).90 Figure G.1 – Definition of rotation (shaft-end view).93 Figure G.2 – Linear law, without centre tap.94 Figure G.3 – Linear law, with centre tap.94 Figure G.4 – Logarithmic law, without tap.94 Figure G.5 – Logarithmic law, with tap.94 Figure G.6 – Inverse logarithmic law without tap.94 Figure G.7 – Inverse logarithmic law with tap.94 Figure H.1 – General scheme for capability approval.98
Table 1 – Standard atmospheric conditions.30 Table 2 – Measuring voltages.32 Table 3 – Calculation of resistance value(R) and change in resistance (ûR).41 Table 4 – Calculation of temperature differences (∆T).41 Table 5 – Current values (IBb).43 Table 6 – Moving contact current.48 Table 7 – End stop torque.50 SIST EN 60393-1:2009



60393-1 © IEC:2008(E) – 5 – Table 8 – Locking torque.50 Table 9 – Shaft torque.51 Table 10 – Thrust and pull.51 Table 11 – Thrust and pull.52 Table 12 – Backlash.57 Table 13 – Dither for non-wire wound types.57 Table 14 – Dither for wire wound types (under consideration).58 Table 15 – Tensile force.59 Table 16 – Number of cycles.66 Table 17 – Number of cycles.69 Table 18 – Number of operations.73 Table 19 – Panel size.75 Table G.1 – Resistance law and code letter.93
SIST EN 60393-1:2009



– 6 – 60393-1 © IEC:2008(E) INTERNATIONAL ELECTROTECHNICAL COMMISSION ____________
POTENTIOMETERS FOR USE IN ELECTRONIC EQUIPMENT –
Part 1: Generic specification
FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60393-1 has been prepared by IEC technical committee 40: Capacitors and resistors for electronic equipment. This third edition cancels and replaces the second edition published in 1989 and constitutes a technical revision, including minor revisions related to tables, figures and references. This edition contains the following significant technical changes with respect to the previous edition: • implementation of Annex H which replaces Section 3 of the previous edition. The text of this standard is based on the following documents: FDIS Report on voting 40/1897/FDIS 40/1914/RVD
Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. SIST EN 60393-1:2009



60393-1 © IEC:2008(E) – 7 – This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all the parts of the IEC 60393 series, under the general title Potentiometers for use in electronic equipment, can be found on the IEC web site. T
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