SIST ISO 11562:2001/TC1:2001
(Main)Geometrical Product Specifications (GPS) - Surface texture:Profile method - Metrological characteristics of phase correct filters
Geometrical Product Specifications (GPS) - Surface texture:Profile method - Metrological characteristics of phase correct filters
Spécification géométrique des produits (GPS) — État de surface: Méthode du profil — Caractéristiques métrologiques des filtres à phase correcte — Rectificatif technique 1
Specifikacija geometrijskih veličin izdelka - Tekstura površine: profilna metoda - Meroslovne značilnosti filtrov za fazno korekcijo - Tehnični popravek 1
General Information
Relations
Frequently Asked Questions
SIST ISO 11562:2001/TC1:2001 is a corrigendum published by the Slovenian Institute for Standardization (SIST). Its full title is "Geometrical Product Specifications (GPS) - Surface texture:Profile method - Metrological characteristics of phase correct filters". This standard covers: Geometrical Product Specifications (GPS) - Surface texture:Profile method - Metrological characteristics of phase correct filters
Geometrical Product Specifications (GPS) - Surface texture:Profile method - Metrological characteristics of phase correct filters
SIST ISO 11562:2001/TC1:2001 is classified under the following ICS (International Classification for Standards) categories: 17.040.20 - Properties of surfaces; 17.040.40 - Geometrical Product Specification (GPS). The ICS classification helps identify the subject area and facilitates finding related standards.
SIST ISO 11562:2001/TC1:2001 has the following relationships with other standards: It is inter standard links to SIST EN ISO 16610-21:2012, SIST ISO 11562:2001; is excused to ISO 11562:1996, SIST ISO 11562:2001. Understanding these relationships helps ensure you are using the most current and applicable version of the standard.
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Standards Content (Sample)
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Geometrical Product Specifications (GPS) — Surface texture:Profile method — Metrological characteristics of phase correct filters17.040.20Lastnosti površinProperties of surfacesICS:Ta slovenski standard je istoveten z:ISO 11562:1996/Cor 1:1998SIST ISO 11562:2001/TC1:2001en01-julij-2001SIST ISO 11562:2001/TC1:2001SLOVENSKI
STANDARD
ICS
17.040.20Ref. No. ISO 11562:1996/Cor.1:1998(E)Descriptors:
surface condition,
surface waviness,
roughness,
roughness measurement,
measuring instruments,
profile meters,
filters,metrological characteristics.©
ISO 1998Printed in SwitzerlandAINTERNATIONAL STANDARD ISO 11562:1996TE
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