17.040.20 - Properties of surfaces

This document specifies biorthogonal wavelets for profiles and contains the relevant concepts. It gives
the basic terminology for biorthogonal wavelets of compact support, together with their usage.

This document specifies biorthogonal wavelets for profiles and contains the relevant concepts. It gives the basic terminology for biorthogonal wavelets of compact support, together with their usage.

This European Standard specifies the mathematical processing of digitized longitudinal profile measurements to produce evenness indices. The document describes the calculation procedure for the International Roughness Index (IRI), Root Mean Square (RMS) and Longitudinal Profile Variance (LPV) from three separate wavelength bands and the σWLP and ΔWLP from the Weighted Longitudinal Profile (WLP).
The purpose of this document is to provide a standard practice for calculating and reporting estimat...view more

This document specifies the mathematical processing of digitized longitudinal profile measurements to produce evenness indices. The document describes the calculation procedure for the International Roughness Index (IRI), Root Mean Square (RMS) and Longitudinal Profile Variance (LPV) from three separate wavelength bands and the σWLP and ΔWLP from the Weighted Longitudinal Profile (WLP).
The purpose of this document is to provide a standard practice for calculating and reporting estimates of roa...view more

This document specifies methods for testing the sound power level of air/water, brine/water, water/water and direct exchange/water heat pump water heaters and heat pump combination heaters with electrically driven compressors and connected to or including a domestic hot water storage tank for domestic hot water production.
This European Standard comprises only the testing procedure for the domestic hot water production of the heat pump system.
NOTE 1   Testing procedures for simultaneous operati...view more

This document specifies the metrological characteristics of areal instruments for measuring surface
topography. Because surface profiles can be extracted from surface topography images, most of the
terms defined in this document can also be applied to profiling measurements.

This document describes the influence quantities and instrument characteristics of confocal
microscopy systems for areal measurement of surface topography. Because surface profiles can be
extracted from surface topography images, the methods described in this document can be applied to
profiling measurements as well.

This document describes the influence quantities and instrument characteristics of confocal microscopy systems for areal measurement of surface topography. Because surface profiles can be extracted from surface topography images, the methods described in this document can be applied to profiling measurements as well.

This document specifies the metrological characteristics of areal instruments for measuring surface topography. Because surface profiles can be extracted from surface topography images, most of the terms defined in this document can also be applied to profiling measurements.

This document describes the influence quantities and instrument characteristics of confocal microscopy systems for areal measurement of surface topography. Because surface profiles can be extracted from surface topography images, the methods described in this document can be applied to profiling measurements as well.

This document specifies the metrological characteristics of areal instruments for measuring surface topography. Because surface profiles can be extracted from surface topography images, most of the terms defined in this document can also be applied to profiling measurements.

This document defines Type S1 and Type S2 software measurement standards (etalons) for verifying
the software of measuring instruments. It also defines the file format of Type S1 software measurement
standards for the calibration of instruments for the measurement of surface texture by the areal
method as defined in the areal surface texture chain of standards, chain link G.
NOTE Throughout this document, the term “softgauge” is used as a substitute for “software measurement
standard Type S...view more

ISO 25178-71:2017 defines Type S1 and Type S2 software measurement standards (etalons) for verifying the software of measuring instruments. It also defines the file format of Type S1 software measurement standards for the calibration of instruments for the measurement of surface texture by the areal method as defined in the areal surface texture chain of standards, chain link G.
NOTE Throughout ISO 25178-71:2017, the term "softgauge" is used as a substitute for "software measurement standard Ty...view more

ISO 25178-71:2017 defines Type S1 and Type S2 software measurement standards (etalons) for verifying the software of measuring instruments. It also defines the file format of Type S1 software measurement standards for the calibration of instruments for the measurement of surface texture by the areal method as defined in the areal surface texture chain of standards, chain link G. NOTE Throughout ISO 25178-71:2017, the term "softgauge" is used as a substitute for "software measurement standard Typ...view more

ISO 2360:2017 specifies a method for non-destructive measurements of the thickness of non-conductive coatings on non-magnetic electrically conductive base metals, using amplitude-sensitive eddy-current instruments.
In ISO 2360:2017, the term "coating" is used for materials such as, for example, paints and varnishes, electroplated coatings, enamel coatings, plastic coatings, claddings and powder coatings. This method is particularly applicable to measurements of the thickness of most oxide coati...view more