SIST-TS CEN ISO/TS 80004-6:2021

SLOVENSKI STANDARD
01-junij-2021
Nadomešča:
SIST-TS CEN ISO/TS 80004-6:2015
Nanotehnologije - Slovar - 6. del: Karakterizacija nanoobjektov (ISO/TS 80004-
6:2021)
Nanotechnologies - Vocabulary - Part 6: Nano-object characterization (ISO/TS 80004-
6:2021)
Nanotechnologien - Fachwörterverzeichnis - Teil 6: Charakterisierung von Nanoobjekten
(ISO/TS 80004-6:2021)
Nanotechnologies - Vocabulaire - Partie 6: Caractérisation des nano-objets (ISO/TS
80004-6:2021)
Ta slovenski standard je istoveten z: CEN ISO/TS 80004-6:2021
ICS:
01.040.07 Naravoslovne in uporabne Natural and applied sciences
vede (Slovarji) (Vocabularies)
07.120 Nanotehnologije Nanotechnologies
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

CEN ISO/TS 80004-6
TECHNICAL SPECIFICATION
SPÉCIFICATION TECHNIQUE
April 2021
TECHNISCHE SPEZIFIKATION
ICS 01.040.07; 07.120 Supersedes CEN ISO/TS 80004-6:2015
English Version
Nanotechnologies - Vocabulary - Part 6: Nano-object
characterization (ISO/TS 80004-6:2021)
Nanotechnologies - Vocabulaire - Partie 6: Nanotechnologien - Fachwörterverzeichnis - Teil 6:
Caractérisation des nano-objets (ISO/TS 80004- Charakterisierung von Nanoobjekten (ISO/TS 80004-
6:2021) 6:2021)
This Technical Specification (CEN/TS) was approved by CEN on 25 December 2020 for provisional application.

The period of validity of this CEN/TS is limited initially to three years. After two years the members of CEN will be requested to
submit their comments, particularly on the question whether the CEN/TS can be converted into a European Standard.

CEN members are required to announce the existence of this CEN/TS in the same way as for an EN and to make the CEN/TS
available promptly at national level in an appropriate form. It is permissible to keep conflicting national standards in force (in
parallel to the CEN/TS) until the final decision about the possible conversion of the CEN/TS into an EN is reached.

CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia,
Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway,
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United Kingdom.
EUROPEAN COMMITTEE FOR STANDARDIZATION
COMITÉ EUROPÉEN DE NORMALISATION

EUROPÄISCHES KOMITEE FÜR NORMUNG

CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2021 CEN All rights of exploitation in any form and by any means reserved Ref. No. CEN ISO/TS 80004-6:2021 E
worldwide for CEN national Members.

Contents Page
European foreword . 3

European foreword
This document (CEN ISO/TS 80004-6:2021) has been prepared by Technical Committee ISO/TC 229
"Nanotechnologies" in collaboration with Technical Committee CEN/TC 352 “Nanotechnologies” the
secretariat of which is held by AFNOR.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CEN shall not be held responsible for identifying any or all such patent rights.
This document supersedes CEN ISO/TS 80004-6:2015.
According to the CEN-CENELEC Internal Regulations, the national standards organizations of the
following countries are bound to announce this Technical Specification: Austria, Belgium, Bulgaria,
Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland,
Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Republic of
North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the
United Kingdom.
Endorsement notice
The text of ISO/TS 80004-6:2021 has been approved by CEN as CEN ISO/TS 80004-6:2021 without any
modification.
TECHNICAL ISO/TS
SPECIFICATION 80004-6
Second edition
2021-03
Nanotechnologies — Vocabulary —
Part 6:
Nano-object characterization
Nanotechnologies — Vocabulaire —
Partie 6: Caractérisation des nano-objets
Reference number
ISO/TS 80004-6:2021(E)
©
ISO 2021
ISO/TS 80004-6:2021(E)
© ISO 2021
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Published in Switzerland
ii © ISO 2021 – All rights reserved

ISO/TS 80004-6:2021(E)
Contents Page
Foreword .iv
Introduction .v
1 Scope . 1
2 Normative references . 1
3 Terms and definitions (General terms) . 1
4 Terms related to size and shape measurement . 3
4.1 Terms related to measurands for size and shape . 3
4.2 Terms related to scattering techniques . 4
4.3 Terms related to aerosol characterization . 6
4.4 Terms related to separation techniques . 7
4.5 Terms related to microscopy . 9
4.6 Terms related to surface area measurement .12
5 Terms related to chemical analysis .13
6 Terms related to measurement of other properties .18
6.1 Terms related to mass measurement .18
6.2 Terms related to thermal measurement .18
6.3 Terms related to crystallinity measurement .19
6.4 Terms related to charge measurement in suspensions .19
Bibliography .21
Index .23
ISO/TS 80004-6:2021(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.
ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the
different types of ISO documents should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2 (see www .iso .org/ directives).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of
any patent rights identified during the development of the document will be in the Introduction and/or
on the ISO list of patent declarations received (see www .iso .org/ patents).
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and
expressions related to conformity assessment, as well as information about ISO’s adherence to the
World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT), see www .iso .org/
iso/ foreword .html.
This document was prepared by Technical Committee ISO/TC 229, Nanotechnologies, in collaboration
with Technical Committee IEC/TC 113, Nanotechnology for electrotechnical products and systems
and with the European Committee for Standardization (CEN) Technical Committee CEN/TC 352,
Nanotechnologies, in accordance with the Agreement on technical cooperation between ISO and CEN
(Vienna Agreement).
This second edition cancels and replaces the first edition (ISO/TS 80004-6:2013), which has been
technically revised throughout.
A list of all parts in the ISO/TS 80004 series can be found on the ISO website.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at www .iso .org/ members .html.
iv © ISO 2021 – All rights reserved

ISO/TS 80004-6:2021(E)
Introduction
Measurement and instrumentation techniques have effectively opened the door to modern
nanotechnology. Characterization is key to understanding the properties and function of all nano-
objects.
Nano-object characterization involves interactions between people with different backgrounds
and from different fields. Those interested in nano-object characterization might, for example, be
materials scientists, biologists, chemists or physicists, and might have a background that is primarily
experimental or theoretical. Those making use of the data extend beyond this group to include
regulators and toxicologists. To avoid any misunderstandings, and to facilitate both comparability and
the reliable exchange of information, it is essential to clarify the concepts, to establish the terms for use
and to establish their definitions.
The terms are classified under the following broad headings:
— Clause 3: General terms;
— Clause 4: Terms related to size and shape measurement;
— Clause 5: Terms related to chemical analysis;
— Clause 6: Terms related to measurement of other properties.
These headings are intended as a guide only, as some techniques can determine more than one property.
Subclause 4.1 lists the overarching measurands that apply to the rest of Clause 4. Other measurands are
more technique-specific and are placed in the text adjacent to the technique.
It should be noted that most techniques require analysis in a non-native state and involve sample
preparation, e.g. placing the nano-objects on a surface or placing them in a specific fluid or vacuum.
This could change the nature of the nano-objects.
The order of the techniques in this document should not be taken to indicate a preference and the
techniques listed in this document are not intended to be exhaustive. Equally, some of the techniques
listed in this document are more popular than others in their usage in analysing certain properties of
nano-objects. Table 1 lists alphabetically the common techniques for nano-object characterization.
Subclause 4.5 provides definitions of microscopy methods and related terms. When abbreviated terms
are used, note that the final “M”, given as “microscopy”, can also mean “microscope” depending on the
context. For definitions relating to the microscope, the word “method” can be replaced by the word
“instrument” where that appears.
Clause 5 provides definitions of terms related to chemical analysis. For these abbreviated terms, note
that the final “S”, given as “spectroscopy”, can also mean “spectrometer” depending on the context. For
definitions relating to the spectrometer, the word “method” can be replaced by the word “instrument”
where that appears.
This document is intended to serve as a starting reference for the vocabulary that underpins
measurement and characterization efforts in the field of nanotechnologies.
ISO/TS 80004-6:2021(E)
Table 1 — Alphabetical list of the common techniques for nano-object characterization
Property Common techniques
Size centrifugal liquid sedimentation (CLS)
atomic-force microscopy (AFM)
differential mobility analysing system (DMAS)
dynamic light scattering (DLS)
variants of inductively coupled plasma mass spectrometry (ICP-MS)
particle tracking analysis (PTA)
scanning electron microscopy (SEM)
small-angle X-ray scattering (SAXS)
transmission electron microscopy (TEM)
Shape atomic-force microscopy (AFM)
scanning electron microscopy (SEM)
transmission electron microscopy (TEM)
Surface area Brunauer–Emmett–Teller (BET) method
“Surface” chemistry Raman spectroscopy
secondary-ion mass spectrometry (SIMS)
X-ray photoelectron spectroscopy (XPS)
Chemistry of the energy-dispersive X-ray spectroscopy (EDX)
“bulk” sample
inductively coupled plasma mass spectrometry (ICP-MS)
nuclear magnetic resonance (NMR) spectroscopy
Crystallinity selected area electron diffraction (SAED)
X-ray diffraction (XRD)
Electrokinetic electrophoretic mobility
potential in
suspensions
vi © ISO 2021 – All rights reserved

TECHNICAL SPECIFICATION ISO/TS 80004-6:2021(E)
Nanotechnologies — Vocabulary —
Part 6:
Nano-object characterization
1 Scope
This document defines terms related to the characterization of nano-objects in the field of
nanotechnologies.
It is intended to facilitate communication between organizations and individuals in research, industry
and other interested parties and those who interact with them.
2 Normative references
There are no normative references in this document.
3 Terms and definitions (General terms)
ISO and IEC maintain terminological databases for use in standardization at the following addresses:
— ISO Online browsing platform: available at https:// www .iso .org/ obp
— IEC Electropedia: available at http:// www .electropedia .org/
3.1
nanoscale
length range approximately from 1 nm to 100 nm
Note 1 to entry: Properties that are not extrapolations from a larger size are predominantly exhibited in this
length range.
[SOURCE: ISO/TS 80004-1:2015, 2.1]
3.2
nano-object
discrete piece of material with one, two or three external dimensions in the nanoscale (3.1)
Note 1 to entry: The second and third external dimensions are orthogonal to the first dimension and to each other.
[SOURCE: ISO/TS 80004-1:2015, 2.5]
3.3
nanoparticle
nano-object (3.2) with all external dimensions in the nanoscale (3.1) where the lengths of the longest
and the shortest axes of the nano-object do not differ significantly
Note 1 to entry: If the dimensions differ significantly (typically by more than three times), terms such as nanofibre
(3.6) or nanoplate (3.4) may be preferred to the term “nanoparticle”.
[SOURCE: ISO/TS 80004-2:2015, 4.4]
ISO/TS 80004-6:2021(E)
3.4
nanoplate
nano-object (3.2) with one external dimension in the nanoscale (3.1) and the other two external
dimensions significantly larger
Note 1 to entry: The larger external dimensions are not necessarily in the nanoscale.
Note 2 to entry: See 3.3, Note 1 to entry.
[SOURCE: ISO/TS 80004-2:2015, 4.6]
3.5
nanorod
solid nanofibre (3.6)
[SOURCE: ISO/TS 80004-2:2015, 4.7]
3.6
nanofibre
nano-object (3.2) with two external dimensions in the nanoscale (3.1) and the third dimension
significantly larger
Note 1 to entry: The largest external dimension is not necessarily in the nanoscale.
Note 2 to entry: The terms “nanofibril” and “nanofilament” can also be used.
Note 3 to entry: See 3.3, Note 1 to entry.
[SOURCE: ISO/TS 80004-2:2015, 4.5]
3.7
nanotube
hollow nanofibre (3.6)
[SOURCE: ISO/TS 80004-2:2015, 4.8]
3.8
quantum dot
nanoparticle (3.3) or region which exhibits quantum confinement in all three spatial directions
[SOURCE: ISO/TS 80004-12:2016, 4.1, modified — Note 1 to entry has been deleted.]
3.9
particle
minute piece of matter with defined physical boundaries
Note 1 to entry: A physical boundary can also be described as an interface.
Note 2 to entry: A particle can move as a unit.
Note 3 to entry: This general particle definition applies to nano-objects (3.2).
[SOURCE: ISO/TS 80004-2:2015, 3.1]
3.10
agglomerate
collection of weakly or medium strongly bound particles (3.9) where the resulting external surface area
is similar to the sum of the surface areas of the individual components
Note 1 to entry: The forces holding an agglomerate together are weak forces, for example van der Waals forces or
simple physical entanglement.
Note 2 to entry: Agglomerates are also termed “secondary particles” and the original source particles are termed
“primary particles”.
2 © ISO 2021 – All rights reserved

ISO/TS 80004-6:2021(E)
[SOURCE: ISO/TS 80004-2:2015, 3.4]
3.11
aggregate
particle (3.9) comprising strongly bonded or fused particles where the resulting external surface area
is significantly smaller than the sum of surface areas of the individual components
Note 1 to entry: The forces holding an aggregate together are strong forces, for example covalent or ionic bonds,
or those resulting from sintering or complex physical entanglement, or otherwise combined former primary
particles.
Note 2 to entry: Aggregates are also termed “secondary particles” and the original source particles are termed
“primary particles”.
[SOURCE: ISO/TS 80004-2:2015, 3.5]
3.12
aerosol
system of solid and/or liquid particles (3.9) suspended in gas
[SOURCE: ISO 15900:2020, 3.1]
3.13
suspension
heterogeneous mixture of materials comprising a liquid and a finely dispersed solid material
[SOURCE: ISO 4618:2014, 2.246]
3.14
dispersion
multi-phase system in which discontinuities of any state (solid, liquid or gas: discontinuous phase) are
distributed in a continuous phase of a different composition or state
Note 1 to entry: This term also refers to the act or process of producing a dispersion; in this context the term
“dispersion process” should be used.
Note 2 to entry: If solid particles (3.9) are distributed in a liquid, the dispersion is referred to as a suspension (3.13).
If the dispersion consists of two or more immiscible liquid phases, it is termed an “emulsion”. A suspoemulsion
consists of both solid and liquid phases distributed in a continuous liquid phase.
[SOURCE: ISO/TR 13097:2013, 2.5, modified — In the definition, “in general, microscopic” has been
deleted and “distributed” has replaced “dispersed”. Notes 1 and 2 to entry have replaced the original
Note 1 to entry.]
4 Terms related to size and shape measurement
4.1 Terms related to measurands for size and shape
4.1.1
particle size
linear dimension of a particle (3.9) determined by a specified measurement method and under specified
measurement conditions
Note 1 to entry: Different methods of analysis are based on the measurement of different physical properties.
Independent of the particle property actually measured, the particle size can be reported as a linear dimension,
e.g. as the equivalent spherical diameter.
ISO/TS 80004-6:2021(E)
4.1.2
particle size distribution
distribution of the quantity of particles (3.9) as a function of particle size (4.1.1)
Note 1 to entry: Particle size distribution may be expressed as cumulative distribution or a distribution density
(distribution of the fraction of material in a size class, divided by the width of that class).
Note 2 to entry: The quantity can be, for example, number, mass or volume based.
4.1.3
particle shape
external geometric form of a particle (3.9)
[SOURCE: ISO 3252:2019, 3.1.59, modified — “powder” has been deleted before “particle”.]
4.1.4
aspect ratio
ratio of length of a particle (3.9) to its width
[SOURCE: ISO 14966:2019, 3.7]
4.1.5
equivalent diameter
diameter of a sphere that produces a response by a given particle-size measurement method that is
equivalent to the response produced by the particle (3.9) being measured
Note 1 to entry: Physical properties are, for example, the same settling velocity or electrolyte solution displacing
volume or projection area under a microscope. The physical property to which the equivalent diameter refers
should be indicated using a suitable subscript (see ISO 9276-1:1998), e.g. subscript “V” for equivalent volume
diameter and subscript “S” for equivalent surface area diameter.
Note 2 to entry: For discrete-particle-counting, light-scattering instruments, an equivalent optical diameter is used.
Note 3 to entry: Other parameters, e.g. the effective density of the particle in a fluid, are used for the calculation
of the equivalent diameter such as Stokes diameter or sedimentation equivalent diameter. The parameters used
for the calculation should be reported additionally.
Note 4 to entry: For inertial instruments, the aerodynamic diameter is used. Aerodynamic diameter is the
−3
diameter of a sphere of density 1 000 kg m that has the same settling velocity as the particle in question.
4.2 Terms related to scattering techniques
4.2.1
radius of gyration
measure of the distribution of mass about a chosen axis, given as the square root of the moment of
inertia about that axis divided by the mass
Note 1 to entry: For nano-object (3.2) characterization, physical methods that measure radius of gyration to
determine particle size (4.1.1) include static light scattering, small-angle neutron scattering (4.2.2) and small-angle
X-ray scattering (4.2.4).
[SOURCE: ISO 14695:2003, 3.4, modified — Note 1 to entry has been added.]
4.2.2
small-angle neutron scattering
SANS
method in which a beam of neutrons is scattered from a sample and the scattered neutron intensity is
measured for small angle deflection
Note 1 to entry: The scattering angle is usually between 0,5° and 10° in order to study the structure of a material
on the length scale of approximately 1 nm to 200 nm. The method provides information on the sizes of the
particles (3.9) and, to a limited extent, the shapes of the particles dispersed in a homogeneous medium.
4 © ISO 2021 – All rights reserved

ISO/TS 80004-6:2021(E)
4.2.3
neutron diffraction
application of elastic neutron scattering for the determination of the atomic or magnetic structure
of matter
Note 1 to entry: The neutrons emerging from the experiment have approximately the same energy as the incident
neutrons. A diffraction pattern is formed that provides information on the structure of the material.
4.2.4
small-angle X-ray scattering
SAXS
method in which the elastically scattered intensity of X-rays is measured for small-angle deflections
Note 1 to entry: The angular scattering is usually measured within the range 0,1° to 10°. This provides structural
information on macromolecules as well as periodicity on length scales typically larger than 5 nm and less than
200 nm for ordered or partially ordered systems.
[SOURCE: ISO 18115-1:2013, 3.18, modified — Notes 2 and 3 to entry have been deleted.]
4.2.5
light scattering
change in propagation of light at the interface of two media having different optical properties
4.2.6
hydrodynamic diameter
equivalent diameter (4.1.5) of a particle (3.9) in a liquid having the same diffusion coefficient as a
spherical particle with no boundary layer in that liquid
Note 1 to entry: In practice, nanoparticles (3.3) in solution can be non-spherical, dynamic and solvated.
Note 2 to entry: A particle in a liquid will have a boundary layer. This is a thin layer of fluid or adsorbates close
to the solid surface, within which shear stresses significantly influence the fluid velocity distribution. The fluid
velocity varies from zero at the solid surface to the velocity of free stream flow at a certain distance away from
the solid surface.
4.2.7
dynamic light scattering
DLS
photon correlation spectroscopy
PCS
DEPRECATED: quasi-elastic light scattering
DEPRECATED: QELS
method in which particles (3.9) in a liquid suspension (3.13) are illuminated by a laser and the time
dependant change in intensity of the scattered light due to Brownian motion is used to determine
particle size (4.1.1)
Note 1 to entry: Analysis of the time-dependent intensity of the scattered light can yield the translational
diffusion coefficient and hence the particle size as the hydrodynamic diameter (4.2.6) using the Stokes–Einstein
relationship.
Note 2 to entry: The analysis is applicable to nanoparticles (3.3) as the size of particles detected is typically in the
range 1 nm to 6 000 nm. The upper limit is due to limited Brownian motion and sedimentation.
Note 3 to entry: DLS is typically used in dilute suspensions where the particles do not interact amongst
themselves.
ISO/TS 80004-6:2021(E)
4.2.8
nanoparticle tracking analysis
NTA
particle tracking analysis
PTA
method in which particles (3.9) undergoing Brownian and/or gravitational motion in a suspension (3.13)
are illuminated by a laser and the change in position of individual particles is used to determine particle
size (4.1.1)
Note 1 to entry: Analysis of the time-dependent particle position yields the translational diffusion coefficient and
hence the particle size as the hydrodynamic diameter (4.2.6) using the Stokes-Einstein relationship.
Note 2 to entry: The analysis is applicable to nanoparticles (3.3) as the size of particles detected is typically in the
range 10 nm to 2 000 nm. The lower limit requires particles with high refractive index and the upper limit is due
to limited Brownian motion and sedimentation.
Note 3 to entry: NTA is often used to describe PTA. NTA is a subset of PTA since PTA covers larger range of
particle sizes than nanoscale (3.1).
4.2.9
static multiple light scattering
SMLS
technique in which transmitted or backscattered light intensity is measured after multiple successive
scattering events of incident light in a random scattering medium
1)
[SOURCE: ISO/TS 21357:— , 3.1]
4.3 Terms related to aerosol characterization
4.3.1
condensation particle counter
CPC
instrument that measures the particle (3.9) number concentration of an aerosol (3.12) using a
condensation effect to increase the size of the aerosolized particles
Note 1 to entry: The sizes of particles detected are usually smaller than several hundred nanometres and larger
than a few nanometres.
Note 2 to entry: A CPC is one possible detector suitable for use with a differential electrical mobility classifier
(DEMC) (4.3.2).
Note 3 to entry: In some cases, a condensation particle counter may be called a “condensation nucleus
counter (CNC)”.
[SOURCE: ISO/TS 12025:2012, 3.2.8, modified — Note 4 to entry has been deleted.]
4.3.2
differential electrical mobility classifier
DEMC
classifier able to select aerosol (3.12) particles (3.9) according to their electrical mobility and pass them
to its exit
Note 1 to entry: A DEMC classifies aerosol particles by balancing the electrical force on each particle with its
aerodynamic drag force in an electrical field. Classified particles are in a narrow range of electrical mobility
determined by the operating conditions and physical dimensions of the DEMC, while they can have different sizes
due to difference in the number of charges that they have.
[SOURCE: ISO 15900:2020, 3.11]
1) Under preparation. Stage at the time of publication: ISO/DTS 21357:2020.
6 © ISO 2021 – All rights reserved

ISO/TS 80004-6:2021(E)
4.3.3
differential mobility analysing system
DMAS
system to measure the size distribution of submicrometre aerosol (3.12) particles (3.9) consisting of a
differential electrical mobility classifier (DEMC) (4.3.2), flow meters, a particle detector, interconnecting
plumbing, a computer and suitable software
[SOURCE: ISO 15900:2020, 3.12]
4.3.4
Faraday-cup aerosol electrometer
FCAE
system designed for the measurement of electrical charges carried by aerosol (3.12) particles (3.9)
Note 1 to entry: A FCAE consists of an electrically conducting and electrically grounded cup as a guard to cover
the sensing element that includes aerosol filtering media to capture charged aerosol particles, an electrical
connection between the sensing element and an electrometer circuit, and a flow meter.
[SOURCE: ISO 15900:2020, 3.15, “system” has replaced “electrometer” and “aerosol particles” has
replaced “an aerosol” in the definition.]
4.4 Terms related to separation techniques
4.4.1
field-flow fractionation
FFF
separation technique whereby a field is applied to a suspension (3.13) passing along a narrow channel
in order to cause separation of the particles (3.9) present in the liquid, dependent on their differing
mobility under the force exerted by the field
Note 1 to entry: The field can be, for example, gravitational, centrifugal, a liquid flow, electrical or magnetic.
Note 2 to entry: Using a suitable detector after or during separation allows determination of the size and size
distribution of nano-objects (3.2).
4.4.2
asymmetrical-flow field-flow fractionation
AF4
separation technique that uses a cross flow field applied perpendicular to the channel flow to achieve
separation based on analyte diffusion coefficient or size
Note 1 to entry: Cross flow occurs by means of a semipermeable (accumulation) wall in the channel, while cross
flow is zero at an opposing nonpermeable (depletion) wall.
Note 2 to entry: By comparison, in symmetrical flow, the cross flow enters through a permeable wall (frit) and
exits through an opposing semipermeable wall and is generated separately from the channel flow.
Note 3 to entry: Nano-objects (3.2) generally fractionate by the “normal” mode, where diffusion dominates and
the smallest species elute first. In the micrometre size range, the “steric-hyperlayer” mode of fractionation is
generally dominant, with the largest species eluting first. The transition from normal to steric-hyperlayer mode
can be affected by material properties or measurement parameters, and therefore is not definitively identified;
however, the transition can be defined explicitly for a given experimental set of conditions; typically, the
transition occurs over a particle size (4.1.1) range from about 0,5 µm to 2 µm.
Note 4 to entry: Including both normal and steric-hyperlayer modes, the technique has the capacity to separate
particles (3.9) ranging in size from approximately 1 nm to about 50 µm.
[SOURCE: ISO/TS 21362:2018, 3.4, modified — The abbreviated term “AF4” has been added.]
ISO/TS 80004-6:2021(E)
4.4.3
centrifugal field-flow fractionation
CF3
separation technique that uses a centrifugal field applied perpendicular to a circular channel that spins
around its axis to achieve size separation of particles (3.9) from roughly 10 nm to roughly 50 µm
Note 1 to entry: Separation is governed by a combination of size and effective particle density.
Note 2 to entry: Applicable size range is dependent on and limited by the effective particle density.
[SOURCE: ISO/TS 21362:2018, 3.5, modified — The abbreviated term “CF3” has been added.]
4.4.4
analytical centrifugation
centrifugal liquid sedimentation
CLS
method in which the size or effective density of particles (3.9) in a suspension (3.13) is measured based
on their sedimentation rates in a centrifugal field
Note 1 to entry: This includes both line-start (where the sample is introduced at a defined position) and
homogeneous start (where the sample is introduced with an initial equilibrium distribution) instruments.
Note 2 to entry: This includes both disc-type and cuvette-type instruments.
4.4.5
line-start incremental disc-type centrifugal liquid sedimentation
line-start incremental disc-type CLS
differential centrifugal sedimentation
DCS
analytical centrifugation (4.4.4) in which the sample is introduced at a defined position in a rotating disc
partially filled with a fluid
Note 1 to entry: Normally the fluid has a density gradient to ensure uniform sedimentation
Note 2 to entry: Normally there is one detector at a pre-determined position and the times taken for the particles
(3.9) to reach this detector are recorded.
Note 3 to entry: Depending on the effective density of the particles, the technique can measure particle size (4.1.1)
and particle size distribution (4.1.2) between 2 nm and 10 µm, and can resolve particles differing in size by less
than 2 %.
4.4.6
size-exclusion chromatography
SEC
liquid chromatographic technique in which the separation is based on the hydrodynamic volume of
molecules eluting in a column packed with porous non-adsorbing material having pore dimensions that
are similar in size to the molecules being separated
Note 1 to entry: SEC can be coupled with a detector, e.g. dynamic light scattering (DLS) (4.2.7), for determination
of the size and size distribution of the eluting species.
4.4.7
resistive pulse sensing
RPS
electrical sensing zone method
Coulter counter
DEPRECATED: electrical zone sensing
method for counting and size measurement of particles (3.9) in electrolytes by measuring a drop in
electrical current or voltage as a particle passes through an aperture between two chambers
Note 1 to entry: The drop in current or voltage is proportional to the particle volume (Coulter principle).
8 © ISO 2021 – All rights reserved

ISO/TS 80004-6:2021(E)
Note 2 to entry: The particles are driven through the aperture by pressure or an electric field.
Note 3 to entry: The aperture can be nanoscale (3.1) in size allowing the size measurement of individual nano-
objects (3.2).
4.4.8
single-particle inductively coupled plasma mass spectrometry
sp-ICP-MS
method using inductively coupled plasma mass spectrometry (5.23) whereby a dilute suspension (3.13) of
nano-objects (3.2) is analysed and the ICP-MS signals collected at high time resolution, allowing particle-
by-particle detection at specific mass peaks and number concentration, size and size distribution to be
determined
4.5 Terms related to microscopy
4.5.1
scanning probe microscopy
SPM
method of imaging surfaces by mechanically scanning a probe over the surface under study, in which
the concomitant response of a detector is measured
Note 1 to entry: This generic term encompasses many methods including atomic-force microscopy (AFM) (4.5.2),
scanning near-field optical microscopy (SNOM) (4.5.4), scanning ion conductance microscopy (SICM) and scanning
tunnelling microscopy (STM) (4.5.3).
Note 2 to entry: The resolution varies from that of STM, where individual atoms can be resolved, to scanning
thermal microscopy (SThM), in which the resolution is generally limited to around 1 μm.
[SOURCE: ISO 18115-2:2013, 3.30, modified — The list of methods in Note 1 to entry has been changed.]
4.5.2
atomic-force microscopy
AFM
DEPRECATED: scanning force microscopy
DEPRECATED: SFM
method for imaging surfaces by mechanically scanning their surface contours, in which the deflection
of a sharp tip sensing the surface forces, mounted on a compliant cantilever, is monitored
Note 1 to entry: AFM can provide a quantitative height image of both insulating and conducting surfaces.
Note 2 to entry: Some AFM instruments move the sample in the x-, y- and z-directions while keeping the tip
position constant and others move the tip while keeping the sample position constant.
Note 3 to entry: AFM can be conducted in vacuum, a liquid, a controlled atmosphere or air. Atomic resolution may
be attainable with suitable samples, with sharp tips and by using an appropriate imaging mode.
Note 4 to entry: Many types of force can be measured, such as the normal forces or the lateral, friction or shear
force. When the latter is measured, the technique is referred to as lateral, frictional or shear force microscopy.
This generic term encompasses all of these types of force microscopy.
Note 5 to entry: AFMs can be used to measure surface normal forces at individual points in the pixel array used
for imaging.
Note 6 to entry: For typical AFM tips with radii < 100 nm, the normal force should be less than about 0,1 μN,
depending on the sample material, or irreversible surface deformation and excessive tip wear occurs.
[SOURCE: ISO 18115-2:2013, 3.2]
ISO/TS 80004-6:2021(E)
4.5.3
scanning tunnelling microscopy
STM
scanning probe microscopy (SPM) (4.5.1) mode for imaging conductive surfaces by mechanically scanning
a sharp, voltage-biased, conducting probe tip over their surface, in which the data of the tunnelling
current and the tip-surface separation are used in generating the image
Note 1 to entry: STM can be conducted in vacuum, a liquid or air. Atomic resolution can be achieved with
suitable samples and sharp probes and can, with ideal samples, provide localized bonding information around
surface atoms.
Note 2 to entry: Images can be formed from the height data at a constant tunnelling current or the tunnelling
current at a constant height or other modes at defined relative potentials of the tip and sample.
Note 3 to entry: STM can be used to map the densities of states at surfaces or, in ideal cases, around individual
atoms. The surface images can differ significantly, depending on the tip bias, even for the same topography.
[SOURCE: ISO 18115-2:2013, 3.34]
4.5.4
near-field scanning optical microscopy
NSOM
scanning near-field optical microscopy
SNOM
method of imaging surfaces optically in transmission or reflection by mechanically scanning an
optically active probe much smaller than the wavelength of light over the surface whilst monitoring the
transmitted or reflected light or an associated signal in the near-field regime
Note 1 to entry: Topography is important and the probe is scanned at constant height. Usually the probe is
oscillated in the shear mode to detect and set the height.
Note 2 to entry: Where the extent of the optical probe is defined by an aperture, the aperture size is typically
in the range 10 nm to 100 nm, and this largely defines the resolution. This form of instrument is often called
an aperture NSOM or aperture SNOM to distinguish it from a scattering NSOM or scattering SNOM (previously
called apertureless NSOM or apertureless SNOM) although, generally, the adjective “aperture” is omitted. In the
apertureless form, the extent of the optically active probe is defined by an illuminated sharp metal or metal-
coated tip with a radius typically in the range 10 nm to 100 nm, and this largely defines the resolution.
Note 3 to entry: In addition to the optical image, NSOM can provide a quantitative image of the surface contours
similar to that available in atomic-force microscopy (AFM) (4.5.2) and allied scanning-probe techniques.
[SOURCE: ISO 18115-2:2013, 3.17, modified — Note 1 to entry has been deleted and the following
Notes 2, 3 and 4 to entry renumbered accordingly. Note 5 to entry has been deleted.]
4.5.5
scanning electron microscopy
SEM
method that examines and analyses the physical information (such as secondary electron, backscattered
electron, absorbed electron and X-ray radiation) obtained by generating electron beams and scanning
the surface of the sample in order to determine the structure, composition and topography of the sample
4.5.6
transmission electron microscopy
TEM
method that produces magnified images or diffraction patterns of the sample by an electron beam
which passes through the sample and interacts with it
[SOURCE: ISO 29301:2017, 3.34, modified — In the term, “microscopy” has replaced “microscope”. In
the definition, “instrument” has replaced “method” and sample” has twice replaced “specimen”.]
10 © ISO 2021 – All rights reserved

ISO/TS 80004-6:2021(E)
4.5.7
scanning transmission electron microscopy
STEM
method that produces magnified images or diffraction patterns of the sample by a finely focused
electron beam, scanned over the surface and which passes through the sample and interacts with it
Note 1 to entry: Typically uses an electron beam with a diameter of less than 1 nm.
Note 2 to entry: Provides high-resolution imaging of the inner microstructure and the surface of a thin sample
[or small particles (3.9)], as well as the possibility of chemical and structural characterization of micrometre and
sub-micrometre domains through evaluation of the X-ray spectra and the electron diffraction pattern.
[SOURCE: ISO/TS 10797:2012, 3.10, modified — In the term, “microscopy” has replaced “mi
...